Provided is a digital circuit (30) that comprises: a switching circuit (31) having first transistors (32, 33) supplied with power supply potentials (VDD, VSS): correcting circuits (34, 36) connected between an input terminal (IN) inputted with an input signal and control terminals (gates) of the first transistors; capacitors (C2, C3) connected between the control terminals and the input terminal; diode-connected second transistors (35, 37) that are provided between nodes (N5, N6) between the capacitors and the control terminals and the power supply potentials and have the substantially same threshold voltage as the first transistors; and switches (SW2, SW3) connected in series with the second transistors.

A semiconductor device may include a division control circuit and a latch circuit. The division control circuit may be configured to divide an external clock to generate a first preliminary divided clock and a second preliminary divided clock. The division control circuit may be configured to output the first and second preliminary divided clocks or any one of the first and second preliminary divided clocks as first and second divided clocks. The latch circuit may be configured to latch an external control signal in response to the first and second divided clocks and configured to output latched signals as first and second latch control signals.

Provided is a digital circuit (30) that comprises: a switching circuit (31) having first transistors (32, 33) supplied with power supply potentials (VDD, VSS); correcting circuits (34, 36) connected between an input terminal (IN) inputted with an input signal and control terminals (gates) of the first transistors; capacitors (C2, C3) connected between the control terminals and the input terminal; diode-connected second transistors (35, 37) that are provided between nodes (N5, N6) between the capacitors and the control terminals and the power supply potentials and have the substantially same threshold voltage as the first transistors; and switches (SW2, SW3) connected in series with the second transistors.

A true random-number generator generating a random variable is provided. A first delay circuit delays an input signal to generate a first delayed signal. A second delay circuit delays the first delayed signal to generate a second delayed signal. A first sampling circuit samples the input signal according to a clock signal to generate a first sampled signal. A second sampling circuit samples the first delayed signal according to the clock signal to generate a second sampled signal. A third sampling circuit samples the second delayed signal according to the clock signal to generate a third sampled signal. An operational circuit generates the random variable and adjusts a count value according to the first sampled signal, the second sampled signal, and the third sampled signal. The operational circuit adjusts the clock signal according to the count value.

An embodiment of the present invention relates to a low-power broadband asynchronous BPSK demodulation method and a configuration of a circuit thereof. In connection with a configuration of a BPSK demodulation circuit, there may be provided a low-power wideband asynchronous binary phase shift keying demodulation circuit comprising: a sideband separation and lower sideband signal delay unit; a data demodulation unit; and a data clock restoration unit.

A low pin count (LPC) bus serial interrupt system includes: an interrupt direction signal generator configured to determine a current interrupt direction signal according to whether a host currently sends a first interrupt signal to an external device; and a level-shifter configured to convert a voltage level of a signal exchanged between the host and the external device according to the current interrupt direction signal.

The present disclosure belongs to the technical field of analog or digital-analog hybrid integrated circuits, and relates to a high-speed SAR_ADC digital logic circuit, in particular to a high-speed digital logic circuit for SAR_ADC and a sampling adjustment method. The digital logic circuit includes a comparator, a logic control unit parallel to the comparator, and a capacitor array DAC. The comparator and the logic control unit are simultaneously triggered by a clock signal. The comparator outputs a valid comparison result Dp/Dn, the logic control unit outputs a corresponding rising edge signal, the rising edge signal is slightly later than Dp/Dn output by the comparator through setting a delay match, Dp/Dn is captured by the corresponding rising edge signal, thereby settling a capacitor array. The present disclosure eliminates the disadvantage of the improper settling of the capacitor array of the traditional parallel digital logic.

The present disclosure belongs to the technical field of analog or digital-analog hybrid integrated circuits, and relates to a high-speed SAR_ADC digital logic circuit, in particular to a high-speed digital logic circuit for SAR_ADC and a sampling adjustment method. The digital logic circuit includes a comparator, a logic control unit parallel to the comparator, and a capacitor array DAC. The comparator and the logic control unit are simultaneously triggered by a clock signal. The comparator outputs a valid comparison result Dp/Dn, the logic control unit outputs a corresponding rising edge signal, the rising edge signal is slightly later than Dp/Dn output by the comparator through setting a delay match, Dp/Dn is captured by the corresponding rising edge signal, thereby settling a capacitor array. The present disclosure eliminates the disadvantage of the improper settling of the capacitor array of the traditional parallel digital logic.

A data processing apparatus is provided. An A×B multiplier array has a group of logic gates clocked by a first clock signal, where A and B are both integers. A C×D multiplier array, separate from the A×B multiplier array, has second group of logic gates clocked by a second clock signal, where C and D are both integers. Addition circuitry performs an addition operation between a first at least partial product produced by the A×B multiplier array and a second at least partial product produced by the C×D multiplier array.

Provided is a digital circuit (30) that comprises: a switching circuit (31) having first transistors (32, 33) supplied with power supply potentials (VDD, VSS); correcting circuits (34, 36) connected between an input terminal (IN) inputted with an input signal and control terminals (gates) of the first transistors; capacitors (C2, C3) connected between the control terminals and the input terminal; diode-connected second transistors (35, 37) that are provided between nodes (N5, N6) between the capacitors and the control terminals and the power supply potentials and have the substantially sanle threshold voltage as the first transistors; and switches (SW2, SW3) connected in series with the second transistors.