A pulse shaping circuit for a spectrometer comprises a circuit input terminal for receiving detector pulses from an analog ion detector, a flip-flop for receiving detector pulses from the circuit input terminal, a delay unit for receiving output pulses from the flip-flop and feeding delayed output pulses to a reset input terminal of said flip-flop, and a circuit output terminal for supplying the output pulses or the delayed output pulses to a counter. The duration of the output pulses and the minimum duration of the interval between the output pulses is determined by the delay unit. The pulse shaping circuit may comprise at least one Schmitt trigger.

In a phase adjustment circuit, a binary circuit is configured to output a binary signal on the basis of an edge of a video signal. A phase-delayed clock signal generation circuit is configured to generate a phase-delayed clock signal having a later phase than a phase of a clock signal by a first delay amount. A delay time control circuit is configured to cause a phase of the binary signal and the phase of the phase-delayed clock signal to match each other by adjusting the first delay amount. A sampling signal generation circuit is configured to generate a sampling signal having a later phase than the phase of the clock signal by a second delay amount. The second delay amount is in accordance with both a phase shift amount, which is based on the clock signal, and the first delay amount.

Systems, methods, and apparatus for use in biasing and driving high voltage semiconductor devices using only low voltage transistors are described. The apparatus and method are adapted to control multiple high voltage semiconductor devices to enable high voltage power control, such as power amplifiers, power management and conversion (e.g. DC/DC) and other applications wherein a first voltage is large compared to the maximum voltage handling of the low voltage control transistors. According to an aspect, timing control of edges of a control signal to the high voltage semiconductor devices is provided by a basic edge delay circuit that includes a transistor, a current source and a capacitor. An inverter can be selectively coupled, via a switch, to an input and/or an output of the basic edge delay circuit to allow for timing control of a rising edge or a falling edge of the control signal.

There are provided a signal width repair circuit and method, and an electronic device. The signal width repair circuit includes: a delay circuit, configured to receive an input signal, and delay the input signal for a preset duration to obtain a delayed signal, the input signal being a high-level signal; a signal reconstruction circuit, configured to receive the input signal and the delayed signal, and repair the input signal and the delayed signal to obtain a repaired signal; and a signal selection circuit, configured to receive the input signal and the repaired signal and select one of the input signal and the repaired signal for output, to obtain a target signal that has a width satisfying a preset width, the preset duration being equal to or greater than a duration with the preset width.

In a phase adjustment circuit, a binary circuit is configured to output a binary signal on the basis of an edge of a video signal. A phase-delayed clock signal generation circuit is configured to generate a phase-delayed clock signal having a later phase than a phase of a clock signal by a first delay amount. A delay time control circuit is configured to cause a phase of the binary signal and the phase of the phase-delayed clock signal to match each other by adjusting the first delay amount. A sampling signal generation circuit is configured to generate a sampling signal having a later phase than the phase of the clock signal by a second delay amount. The second delay amount is in accordance with both a phase shift amount, which is based on the clock signal, and the first delay amount.

There are provided a signal width repair circuit and method, and an electronic device. The signal width repair circuit includes: a delay circuit, configured to receive an input signal, and delay the input signal for a preset duration to obtain a delayed signal, the input signal being a high-level signal; a signal reconstruction circuit, configured to receive the input signal and the delayed signal, and repair the input signal and the delayed signal to obtain a repaired signal; and a signal selection circuit, configured to receive the input signal and the repaired signal and select one of the input signal and the repaired signal for output, to obtain a target signal that has a width satisfying a preset width, the preset duration being equal to or greater than a duration with the preset width.

A pulse shaping circuit for a spectrometer comprises a circuit input terminal for receiving detector pulses from an analog ion detector, a flip-flop for receiving detector pulses from the circuit input terminal, a delay unit for receiving output pulses from the flip-flop and feeding delayed output pulses to a reset input terminal of said flip-flop, and a circuit output terminal for supplying the output pulses or the delayed output pulses to a counter. The duration of the output pulses and the minimum duration of the interval between the output pulses is determined by the delay unit. The pulse shaping circuit may comprise at least one Schmitt trigger.

Systems, methods, and apparatus for use in biasing and driving high voltage semiconductor devices using only low voltage transistors are described. The apparatus and method are adapted to control multiple high voltage semiconductor devices to enable high voltage power control, such as power amplifiers, power management and conversion (e.g. DC/DC) and other applications wherein a first voltage is large compared to the maximum voltage handling of the low voltage control transistors. According to an aspect, timing control of edges of a control signal to the high voltage semiconductor devices is provided by a basic edge delay circuit that includes a transistor, a current source and a capacitor. An inverter can be selectively coupled, via a switch, to an input and/or an output of the basic edge delay circuit to allow for timing control of a rising edge or a falling edge of the control signal.

Various embodiments may provide a comparator circuit arrangement. The comparator circuit arrangement may include a preamplifier having a first input configured to be coupled to a first input voltage, a second input configured to be coupled to a second input voltage, and an output configured to generate a preamplifier output signal based on the first input voltage and the second input voltage. The comparator circuit arrangement may also include a switch circuit arrangement coupled to the preamplifier, the switch circuit arrangement configured to deactivate the preamplifier upon the second input voltage exceeding the first input voltage and further configured to activate the preamplifier upon a fall of the second input voltage, and a pull-up circuit arrangement coupled to the output of the preamplifier, the pull-up circuit arrangement configured to provide a boost voltage to the preamplifier output signal for a predetermined duration upon the fall of the second input voltage.

An electronic device includes a unit interval detector including a plurality of delay cells and that receives a first signal, a second signal, and a third signal and detects a code indicating a unit interval from the first signal, the second signal, and the third signal, a clock recovery circuit that generates a clock signal from the first signal, the second signal, and the third signal in response to the code, and a data recovery circuit that generates a first receive signal, a second receive signal, and a third receive signal from the first signal, the second signal, and the third signal in response to the code and the clock signal. A total delay amount of the delay cells is smaller than a length of the unit interval and the unit interval detector performs a multi-stage detection operation including coarse detection and fine detection by using the delay cells.