Patent classifications
H03K21/08
Method of reading data and data-reading device
A method of reading data includes: receiving a digital signal, wherein the digital signal includes a sync signal and a data signal; performing an oversampling operation to the digital signal, and calculating a plurality of sampling points according to the oversampling operation; by a first counter counting the sampling points to obtain a first count value; based on the first count value defining a second count value; defining a unit interval; in the unit interval, defining a data reading range; and in the data reading range, reading the data signal corresponding to data of the unit interval as a first value when a potential of each of the sampling points counted is changed from a first potential to a second potential.
TEST METHOD FOR DELAY CIRCUIT AND TEST CIRCUITRY
A test method for a delay circuit and a test circuitry are provided. The test circuitry incudes the delay circuit that essentially includes multiple serially connected logic gates, a clock pulse generator at an input end of the delay circuit for generating one or more cycles of clock signals, and a counter at an output end of the delay circuit for counting the clock signals passing through the delay circuit. The test circuitry implements a test mode by switching lines to the clock pulse generator and the counter. The test circuitry relies on a comparison result of a counting result made by the counter and a number of the cycles of the clock signals to test any failure of the delay circuit.
TEST METHOD FOR DELAY CIRCUIT AND TEST CIRCUITRY
A test method for a delay circuit and a test circuitry are provided. The test circuitry incudes the delay circuit that essentially includes multiple serially connected logic gates, a clock pulse generator at an input end of the delay circuit for generating one or more cycles of clock signals, and a counter at an output end of the delay circuit for counting the clock signals passing through the delay circuit. The test circuitry implements a test mode by switching lines to the clock pulse generator and the counter. The test circuitry relies on a comparison result of a counting result made by the counter and a number of the cycles of the clock signals to test any failure of the delay circuit.
Calibration methods and circuits to calibrate drive current and termination impedance
Described are on-die termination (ODT) systems and methods that facilitate high-speed communication between a driver die and a receiver die interconnected via one or more signal transmission lines. An ODT control system in accordance with one embodiment calibrates and maintains termination resistances and drive currents to produce optimal output swing voltages. Comparison circuitry employed to calibrate the reference resistance is also used to calibrate the drive current. Termination elements in some embodiments are divided into two adjustable resistive portions, both of which are designed to minimize capacitive loading. One portion is optimized to produce a relatively high range of adjustment, while the other is optimized for fine-tuning and glitch-free switching.
Calibration methods and circuits to calibrate drive current and termination impedance
Described are on-die termination (ODT) systems and methods that facilitate high-speed communication between a driver die and a receiver die interconnected via one or more signal transmission lines. An ODT control system in accordance with one embodiment calibrates and maintains termination resistances and drive currents to produce optimal output swing voltages. Comparison circuitry employed to calibrate the reference resistance is also used to calibrate the drive current. Termination elements in some embodiments are divided into two adjustable resistive portions, both of which are designed to minimize capacitive loading. One portion is optimized to produce a relatively high range of adjustment, while the other is optimized for fine-tuning and glitch-free switching.
Radio frequency generator including pulse generator circuit to provide complex RF pulse pattern
A radio frequency (RF) generator includes a pulse generator circuit configured to receive input signals indicative of a pulse pattern comprising pulse segments, the input signals defining power levels and durations for the pulse segments. The pulse generator circuit generates a pulse modulation control signal for each pulse segment responsive to the input signals. The pulse modulation control signal is coupled to adjust an amplitude and to modulate an RF source signal to generate the pulse RF signal having an envelope defined by the pulse segments of the pulse pattern.
Radio frequency generator including pulse generator circuit to provide complex RF pulse pattern
A radio frequency (RF) generator includes a pulse generator circuit configured to receive input signals indicative of a pulse pattern comprising pulse segments, the input signals defining power levels and durations for the pulse segments. The pulse generator circuit generates a pulse modulation control signal for each pulse segment responsive to the input signals. The pulse modulation control signal is coupled to adjust an amplitude and to modulate an RF source signal to generate the pulse RF signal having an envelope defined by the pulse segments of the pulse pattern.
Fractional frequency divider and flash memory controller
The present invention provides a fractional frequency divider, wherein the fractional frequency divider includes a plurality of registers, a counter, a control signal generator and a clock gating circuit. Regarding the plurality of registers, at least a portion of the registers are set to have values The counter is configured to sequentially generate a plurality of counter values, wherein the plurality of counter values correspond to the at least a portion of the registers, respectively, and the plurality of counter values are generated repeatedly The control signal generator is configured to generate a control signal based on the received counter value and the value of the corresponding register. The clock gating circuit is configured to refer to the control signal to mask or not mask an input clock signal to generate an output clock signal.
RING OSCILLATOR BASED TRUE RANDOM NUMBER GENERATOR AND A METHOD FOR GENERATING A RANDOM NUMBER
A true random number generator circuit includes a ring oscillator and a plurality of sampling circuits. The ring oscillator includes a plurality of series-connected stages coupled together in a ring. An output of a last stage of the ring oscillator is coupled to an input of a first stage of the ring oscillator. A sampling circuit of the plurality of sampling circuits has an input coupled to a node located between two adjacent stages of the plurality of series-connected stages. Every node of the ring oscillator is coupled to a corresponding sampling circuit of the plurality of sampling circuits. In another embodiment, a method for generating a random number is provided.
RING OSCILLATOR BASED TRUE RANDOM NUMBER GENERATOR AND A METHOD FOR GENERATING A RANDOM NUMBER
A true random number generator circuit includes a ring oscillator and a plurality of sampling circuits. The ring oscillator includes a plurality of series-connected stages coupled together in a ring. An output of a last stage of the ring oscillator is coupled to an input of a first stage of the ring oscillator. A sampling circuit of the plurality of sampling circuits has an input coupled to a node located between two adjacent stages of the plurality of series-connected stages. Every node of the ring oscillator is coupled to a corresponding sampling circuit of the plurality of sampling circuits. In another embodiment, a method for generating a random number is provided.