Patent classifications
H03K5/15073
Comparators
A comparator includes a first-stage op amp circuit, a second-stage op amp circuit, a bias circuit and a clamping circuit. The first-stage op amp circuit includes two voltage input terminals and a voltage output terminal; the second-stage op amp circuit is connected with the bias circuit and the voltage output terminal of the first-stage op amp circuit; and the clamping circuit is connected with the voltage output terminal of the first-stage op amp circuit. By adding a clamping circuit in the comparator, the highest voltage at the voltage output terminal of the first-stage op amp circuit can be clamped to a preset voltage. During the operation of the comparator, the voltage change range of the voltage output terminal of the first-stage op amp circuit is smaller, which reduces the discharge delay of the voltage output terminal of the first-stage op amp circuit, thereby increasing the flip speed of the comparator.
COMPARATORS
A comparator includes a first-stage op amp circuit, a second-stage op amp circuit, a bias circuit and a clamping circuit. The first-stage op amp circuit includes two voltage input terminals and a voltage output terminal; the second-stage op amp circuit is connected with the bias circuit and the voltage output terminal of the first-stage op amp circuit; and the clamping circuit is connected with the voltage output terminal of the first-stage op amp circuit. By adding a clamping circuit in the comparator, the highest voltage at the voltage output terminal of the first-stage op amp circuit can be clamped to a preset voltage. During the operation of the comparator, the voltage change range of the voltage output terminal of the first-stage op amp circuit is smaller, which reduces the discharge delay of the voltage output terminal of the first-stage op amp circuit, thereby increasing the flip speed of the comparator.
CLOCK GENERATION CIRCUIT AND VOLTAGE GENERATION CIRCUIT INCLUDING THE CLOCK GENERATION CIRCUIT
A clock generation circuit includes a control clock generation circuit and first and second clock synchronization circuits. The control clock generation circuit compares a reference voltage with first and second feedback clock signals to generate first and second control clock signals. The first clock synchronization circuit makes the first and second feedback clock signals transit in synchronization with the first and second control clock signals. The second clock synchronization circuit generates first and second phase clock signals in synchronization with the first feedback clock signal and the second feedback clock signal.
Programmable ask demodulator
Various embodiments relate to an amplitude shift keying (ASK) demodulator for demodulating an input signal, including: a frequency filter configured to receive the input signal, wherein the frequency filter includes adjustable components configured to adjust the frequency response of the frequency filter; a rectifier configured to rectify an output of the frequency filter, wherein the rectifier includes an adjustable current source configured to adjust the current consumption of the rectifier; a reference signal generator configured to produce a reference signal; a current to voltage converter configured to convert the current of the rectified signal to a rectified voltage and to convert the current of the reference signal to a reference voltage; and a comparator configured to compare the rectified voltage to the reference voltage and to produce a demodulated output signal.
PROGRAMMABLE ASK DEMODULATOR
Various embodiments relate to an amplitude shift keying (ASK) demodulator for demodulating an input signal, including: a frequency filter configured to receive the input signal, wherein the frequency filter includes adjustable components configured to adjust the frequency response of the frequency filter; a rectifier configured to rectify an output of the frequency filter, wherein the rectifier includes an adjustable current source configured to adjust the current consumption of the rectifier; a reference signal generator configured to produce a reference signal; a current to voltage converter configured to convert the current of the rectified signal to a rectified voltage and to convert the current of the reference signal to a reference voltage; and a comparator configured to compare the rectified voltage to the reference voltage and to produce a demodulated output signal.
DETECTOR CIRCUIT AND OPERATION METHOD
A detector circuit includes a calculator circuit and a comparator circuit. The calculator circuit is configured to generate a plurality of first calculation values according to a plurality of first calculation symbols of a Pseudo-Noise Sequence and a plurality of second calculation symbols of a received signal, and generate a second calculation value according to the first calculation values. If a sign of a symbol of the Pseudo-Noise Sequence is the same to a sign of an adjacent symbol, the symbol is one of the first calculation symbols, and the second calculation symbols are corresponding to the first calculation symbols respectively. The comparator circuit is configured to generate a comparison result according to the second calculation value and a threshold value. The comparison result is configured for determining whether the detector circuit correctly receives the Pseudo-Noise Sequence.
Detector circuit and operation method
A detector circuit incudes a calculator circuit and a comparator circuit. The calculator circuit is configured to generate a plurality of first calculation values according to a plurality of first calculation symbols of a Pseudo-Noise Sequence and a plurality of second calculation symbols of a received signal, and generate a second calculation value according to the first calculation values. If a sign of a symbol of the Pseudo-Noise Sequence is the same to a sign of an adjacent symbol, the symbol is one of the first calculation symbols, and the second calculation symbols are corresponding to the first calculation symbols respectively. The comparator circuit is configured to generate a comparison result according to the second calculation value and a threshold value. The comparison result is configured for determining whether the detector circuit correctly receives the Pseudo-Noise Sequence.
Multi-state packages
In examples, an integrated circuit package comprises a pin exposed externally to the package; at least one resistor coupled to the pin at a first end of the resistor; a first transistor coupled to the at least one resistor at a second end of the resistor and coupled to a voltage source; a second transistor coupled to the at least one resistor at the second end of the resistor and coupled to a ground connection, the at least one resistor and the first and second transistors couple at a first node, the first and second transistors are of different types; and multiple comparators, each of the multiple comparators coupled to a voltage divider network and to the pin.
MULTI-STATE PACKAGES
In examples, an integrated circuit package comprises a pin exposed externally to the package; at least one resistor coupled to the pin at a first end of the resistor; a first transistor coupled to the at least one resistor at a second end of the resistor and coupled to a voltage source; a second transistor coupled to the at least one resistor at the second end of the resistor and coupled to a ground connection, the at least one resistor and the first and second transistors couple at a first node, the first and second transistors are of different types; and multiple comparators, each of the multiple comparators coupled to a voltage divider network and to the pin.
Multi-state packages
In examples, an integrated circuit package comprises a pin exposed externally to the package; at least one resistor coupled to the pin at a first end of the resistor; a first transistor coupled to the at least one resistor at a second end of the resistor and coupled to a voltage source; a second transistor coupled to the at least one resistor at the second end of the resistor and coupled to a ground connection, the at least one resistor and the first and second transistors couple at a first node, the first and second transistors are of different types; and multiple comparators, each of the multiple comparators coupled to a voltage divider network and to the pin.