A power management circuit includes both a power on reset (POR) circuit and a voltage monitoring circuit. Explicit testing of these circuits is accomplished by controlling voltages applied to the circuits and monitoring an output signal responsive to a logical combination of outputs from the POR circuit and voltage monitoring circuit. The applied voltages are controlled with respect to timing of application, fixing of voltages and varying of voltages in a manner where a certain one of the circuits for explicit test is isolated with change in logic state of the output signal being indicative of operation of that isolated circuit.

A power management circuit includes both a power on reset (POR) circuit and a voltage monitoring circuit. Explicit testing of these circuits is accomplished by controlling voltages applied to the circuits and monitoring an output signal responsive to a logical combination of outputs from the POR circuit and voltage monitoring circuit. The applied voltages are controlled with respect to timing of application, fixing of voltages and varying of voltages in a manner where a certain one of the circuits for explicit test is isolated with change in logic state of the output signal being indicative of operation of that isolated circuit.

Implementations of conductive energy weapons (CEWs) may include a shock generating circuit configured to couple to a power source, two electrodes operatively coupled to the shock generating circuit, and a safety circuit operatively coupled to the shock generating circuit. The shock generating circuit may be configured to generate a first pulse train and deliver the first pulse train to a target, and may be configured to generate at least a second pulse train and deliver the at least second pulse train to a target. The safety circuit may be configured to prevent the CEW from applying pulse trains to the target after a predetermined number of pulse trains. The first pulse train may include two or more pulses having waveforms substantially identical with each other, each of the waveforms of the two or more pulses having both a positive voltage segment and a negative voltage segment.

Implementations of conductive energy weapons (CEWs) may include a shock generating circuit configured to couple to a power source, two electrodes operatively coupled to the shock generating circuit, and a safety circuit operatively coupled to the shock generating circuit. The shock generating circuit may be configured to generate a first pulse train and deliver the first pulse train to a target, and may be configured to generate at least a second pulse train and deliver the at least second pulse train to a target. The safety circuit may be configured to prevent the CEW from applying pulse trains to the target after a predetermined number of pulse trains. The first pulse train may include two or more pulses having waveforms substantially identical with each other, each of the waveforms of the two or more pulses having both a positive voltage segment and a negative voltage segment.

A comparator circuit according to this embodiment includes: a comparator element configured to output a matching signal indicating whether or not a value of a first input signal matches a value of a second input signal; a flip-flop circuit configured to hold a data of a data input terminal based on a comparator clock signal and configured to output an enable signal for stopping an operation of the comparator element; and an internal signal generation circuit configured to output an internal signal to the data input terminal based on the matching signal and an output signal output from the flip-flop circuit.

A comparator circuit according to the present embodiment: including a comparator element configured to output a matching signal indicating whether or not a value of a first input signal matches a value of a second input signal; a flip-flop circuit including a data input terminal to which a constant potential is supplied and a clock input terminal and configured to hold a value of the data input terminal based on a self-clock signal input to the clock input terminal; and a clock generation circuit configured to generate the self-clock signal based on the matching signal.

Microelectronic circuit com-prises a plurality of logic units and register circuits, arranged into a plu-rality of processing paths, and a plu-rality of monitoring units associated with respective ones of said processing paths. Each of said monitoring units is configured to produce an observation signal as a response to anomalous opera-tion of the respective processing path. Each of said plurality of logic units belongs to one of a plurality of delay classes according to an amount of delay that it is likely to generate. Said de-lay classes comprise first, second, and third classes, of which the first class covers logic units that are likely to generate longest delays, the second class covers logic units that are likely to generate shorter delays than said first class, and the third class covers logic units that are likely to generate shorter delays than said second class. At least some of said plurality of pro-cessing paths comprise logic units be-longing to said second class but are without monitoring units. At least some of said plurality of processing paths comprise logic units belonging to said third class but have monitoring units associated with them.

Microelectronic circuit com-prises a plurality of logic units and register circuits, arranged into a plu-rality of processing paths, and a plu-rality of monitoring units associated with respective ones of said processing paths. Each of said monitoring units is configured to produce an observation signal as a response to anomalous opera-tion of the respective processing path. Each of said plurality of logic units belongs to one of a plurality of delay classes according to an amount of delay that it is likely to generate. Said de-lay classes comprise first, second, and third classes, of which the first class covers logic units that are likely to generate longest delays, the second class covers logic units that are likely to generate shorter delays than said first class, and the third class covers logic units that are likely to generate shorter delays than said second class. At least some of said plurality of pro-cessing paths comprise logic units be-longing to said second class but are without monitoring units. At least some of said plurality of processing paths comprise logic units belonging to said third class but have monitoring units associated with them.

A method monitors a sensor clock signal in a sensor unit, which is generated and output for a data transfer between the sensor unit and a control unit with a predefined period duration. A reference clock signal having a predefined reference period duration is received. The sensor clock signal is compared to the reference clock signal. Based on the comparison, a deviation of the current period duration of the sensor clock signal from a target period duration is detected. Based on the detected deviation, a counting pulse or a reset pulse is emitted.

A method monitors a sensor clock signal in a sensor unit, which is generated and output for a data transfer between the sensor unit and a control unit with a predefined period duration. A reference clock signal having a predefined reference period duration is received. The sensor clock signal is compared to the reference clock signal. Based on the comparison, a deviation of the current period duration of the sensor clock signal from a target period duration is detected. Based on the detected deviation, a counting pulse or a reset pulse is emitted.