A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

An apparatus and method are disclosed with some embodiments including an analog and time to digital converter (ATDC) including a receiver, the receiver for receiving an analog channel input for conversion to a digital data, the digital data having at least one bit, and a defined absolute reference time stamp, the defined absolute reference time stamp representing an absolute reference time associated with conversion of the analog channel input to the digital data and an analog-to-digital converter, the converter converting the analog channel input to the digital data.

A combined I/Q DAC is provided with a plurality of sources corresponding to a plurality of selectors in which the corresponding source drives the corresponding selector with a source signal to produce a corresponding pair of in-phase and quadrature-phase analog input signals to a summation network. Each selector routes its source signal responsive to a digital value of a corresponding in-phase and quadrature-phase bit pair.

A combined I/Q DAC is provided with a plurality of sources corresponding to a plurality of selectors in which the corresponding source drives the corresponding selector with a source signal to produce a corresponding pair of in-phase and quadrature-phase analog input signals to a summation network. Each selector routes its source signal responsive to a digital value of a corresponding in-phase and quadrature-phase bit pair.

Digital-to-analog converters (DACs) having a multiple-gate (multi-gate) transistor-like structure are disclosed herein. The DAC structures have a similar structure to a transistor (e.g., a MOSFET) and include source and drain regions. However, instead of employing only one gate between the source and drain regions, multiple distinct gates are employed. Each distinct gate can represent a bit for the DAC and can include different gate lengths to enable providing different current values, and thus, unique outputs. Further, N number of inputs can be applied to N number of gates employed by the DAC. The DAC structure may be configured such that the longest gate controls the LSB of the DAC and the shortest gate controls the MSB, or vice versa. In some cases, the multi-gate DAC employs high-injection velocity materials that enable compact design and routing, such as InGaAs, InP, SiGe, and Ge, to provide some examples.

A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

Provided is programmable circuit for interfacing with a field device. The circuit includes only one analog-to-digital converter (ADC) configured to receive from the field device one from the group including a current signal and a voltage signal. The received one signal has frequency shift keying tones (FSK) superimposed thereon, the ADC being configured to extract information from the received one signal and the FSK tones simultaneously. Also included is only one digital-to-analog converter configured to drive an output signal to the field device, the output signal (i) including one from the group including a current signal and a voltage signal and (ii) being summed with an FSK-modulated signal.

A reference time generator including a first clock source including a reference synthesizer and cesium atomic clock configured to produce a cesium reference signal and a cesium QOT metric, a second clock source including a reference synthesizer and rubidium atomic clock configured to produce a rubidium reference signal and a rubidium QOT metric, and a circuit for selecting from the clock sources one reference signal based on the best QOT metric.

A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

A combined I/Q DAC is provided with a plurality of sources corresponding to a plurality of selectors in which the corresponding source drives the corresponding selector with a source signal to produce a corresponding pair of in-phase and quadrature-phase analog input signals to a summation network. Each selector routes its source signal responsive to a digital value of a corresponding in-phase and quadrature-phase bit pair.