An analog-to-digital converter and a clock generation circuit thereof are provided. The clock generation circuit comprises cascaded clock generation modules. The clock generation module at each stage is configured to generate a corresponding internal clock signal, and each stage of the clock generation module comprises a delay module and a logic gate module. The second input end of the N-th stage of the logic gate module is connected to the output end of the previous stage of the logic gate module, and the output end of the logic gate module is configured to output an internal clock, so that each stage of the clock generation module can generate one internal clock signal.

As paths for a current flowing through a conductor, a first current path through which a current flows from a first conductive portion to a second conductive portion, and a second current path through which a current flows from a third conductive portion to the second conductive portion are provided. Each of the first conductive portion, the second conductive portion, and the third conductive portion has a plate shape, a point P1 is located on a plate surface of the first conductive portion, and a point P2 is located on a plate surface of the second conductive portion. A current detecting circuit detects a value related to a potential difference between the points P1 and P2, and outputs a voltage value corresponding to a values of a current flowing through each of the first current path and the second current path.

An impedance sensing circuit includes first and second current sources and first and second bias current sources that are appropriately coupled to first and second resistors. The impedance sensing circuit also includes a comparator that compares a first voltage based on the first terminal of the first resistor to a second voltage based on the first terminal of the second resistor to generate a comparator output signal. Either the comparator output signal or a digital signal based on the comparator output signal operates to regulate the current signals output from the first and second current sources so that the first voltage is same as the second voltage. The comparator output signal and the digital signal is representative of a difference between the first voltage and the second voltage that is based on an impedance difference between the first resistor and the second resistor.

In accordance with the present invention a system and method for calibration of the current steering DAC is elaborated which helps to reduce design complexity and reduce silicon area required in the design. Present invention is utilising a clocked comparator and plurality of switch transistors 405,305 and AUX DAC in conjunction with digital estimator and digital compensator blocks to estimate the errors in the current sources 406 and compensate the errors using same AUX DAC during normal operation mode.

A Successive Approximation Register, SAR, Analog to Digital Converter, ADC, (50) achieves high speed and accuracy by (1) alternating at least some decisions between sets of comparators having different accuracy and noise characteristics, and (2) unevenly allocating redundancy (in the form of LSBs of range) for successive decisions according to the accuracy/noise of the comparator used for the preceding decision. The redundancy allocation is compensated by the addition of decision cycles. Alternating between different comparators removes the comparator reset time (treset) from the critical path, at least for those decision cycles. The uneven allocation of redundancy—specifically, allocating more redundancy to decision cycles immediately following the use of a lower accuracy/higher noise comparators—compensates for the lower accuracy and prevents the need for larger redundancy (relative to the full-scale range of a decision cycle) later in the ADC process.

A confined data communication system includes a reference generation circuit operable to produce one or more analog reference signals, an analog to digital converter circuit operable to process an analog signal to produce a digital representative signal, a digital filtering circuit operable to filter the digital representative signal to produce an affect value, a data processing module operable to interpret the affect value to produce processed output data, and a processing module operable to set frequency and waveform for each of the one or more analog reference signals, set digital filtering parameters for the digital filtering circuit, set a sampling rate for the analog to digital converter circuit, and set data interpretation parameters for the data processing module.

The invention relates to a method for synchronizing a plurality of analogue-digital or digital-analogue converters (CONV_k), the converters (CONV_k) all being connected to a control unit (UC), and to a clock (CLK) that has a predefined clock period (T.sub.clk), the converters being also chained step-by-step so as to form a chain of converters, each converter (CONV_k) generating an internal synchronization signal (internal_sync_k) configured to supply a time reference on the transmission of data by the converter (CONV_k).

The method allows the synchronization of the converters to be guaranteed using a process of learning and of configuration of the converters. The method allows any line distance constraint on the synchronization signal to be overcome.

A high resolution analog to digital converter (ADC) with improved bandwidth senses an analog signal (e.g., a load current) to generate a digital signal. The ADC operates based on a load voltage produced based on charging of an element (e.g., a capacitor) by a load current and a digital to analog converter (DAC) output current (e.g., from a N-bit DAC). The ADC generates a digital output signal representative of a difference between the load voltage and a reference voltage. This digital output signal is used directly, or after digital signal processing, to operate an N-bit DAC to generate a DAC output current that tracks the load current. In addition, quantization noise is subtracted from the digital output signal thereby extending the operational bandwidth of the ADC. In certain examples, the operational bandwidth of the ADC extends up to 100s of kHz (e.g., 200-300 kHz), or even higher.

Aspects of the disclosure are directed to compensating for errors in in an analog-to-digital converter circuit (ADC). As may be implemented in accordance with one or more embodiments, an apparatus and/or method involves an ADC that converts an analog signal into a digital signal using an output from a digital-to-analog converter circuit (DAC). A compensation circuit generates a compensation output by, for respective signal portions provided to the DAC, generating a feedback signal based on an incompatibility between the conversion of the signal portions into an analog signal and the value of the signal portions provided to the DAC. A compensation output is generated based on the signal input to the DAC with a gain applied thereto, based on the feedback signal. Hereby, the digital inputs provided to the DACs are non-randomized.

A device includes a first compensation circuit configured to adjust an analog front end (AFE) output to generate a first adjusted AFE output, a first data slicer configured to output a first voltage based on the first adjusted AFE output. The first compensation circuit includes a first path between a voltage source and a ground, including a first transistor, a first adjustable current source, a first input voltage node configured to receive the AFE output, and a first output voltage node coupled to the first data slicer, a second path between the voltage source and the ground, including a second transistor, a second adjustable current source, a second input voltage node configured to receive the AFE output, and a second output voltage node coupled to the second data slicer, and a configurable resistance resistor and a configurable capacitance capacitor coupled in parallel across the first path and the second path.