A comparator including: first and second input transistors connected to control signals at first and second nodes of the comparator; latch circuitry; at least one controllable offset-correction component having an input terminal and connected to control the signal at one of the first and second nodes based on an offset-correction signal provided at its input terminal; for each controllable offset-correction component, an offset correction circuit configured to provide the offset-correction signal provided at its input terminal; and control circuitry. The control circuitry controls the at least one offset-correction circuit to: control an amount by which the offset-correction signal is adjusted; and/or in a bypass operation, connect the input terminal of the at least one controllable offset-correction component to a bypass-operation reference voltage supply; and/or in a maintenance operation, control the charging-operation voltage supply and/or the bypass-operation voltage supply to control leakage of the charge stored on the holding capacitor.

A circuit includes a digital-to-analog converter (DAC) and a compensation circuit. The DAC has first and second terminals. The compensation circuit includes a capacitor and a transistor. The capacitor has first and second terminals, with the first terminal of the capacitor coupled to the first terminal of the DAC. The transistor has a source coupled to the second terminal of the capacitor, and has a gate coupled to the second terminal of the DAC.

An ADC circuit (50) is disclosed. It comprises a global input configured to receive an input voltage (V.sub.in) and a plurality of converter circuits (105.sub.1-105.sub.N). Each converter circuit (105.sub.j) comprises a comparator circuit (70.sub.j) having a first input connected to the global input, a second input, and an output configured to output a one-bit output signal of the comparator circuit (70.sub.j). Furthermore, each converter circuit (105.sub.j) comprises a one-bit current-output DAC (110.sub.j) having an input directly controlled from the output of the comparator circuit (70.sub.j) and an output connected to the second input of the comparator circuit (70.sub.j). The second inputs of all comparator circuits are interconnected. The ADC circuit (50) further comprises a digital output circuit (130) configured to generate an output signal z[n] of the ADC circuit (50) in response to the one-bit output signals of the comparator circuits (70.sub.j).

An analog-to-digital converting device includes: a main analog-to-digital converter configured to convert an analog signal output from a sensor to a digital signal; and a monitoring unit configured to monitor the digital signal converted by the main analog-to-digital converter. The main analog-to-digital converter is provided by a special purpose IC arranged separately from a microcomputer for controlling the main analog-to-digital converter. The monitoring unit includes multiple sub analog-to-digital converters each of which having a conversion accuracy lower than that of the main analog-to-digital converter and converting the analog signal output from the sensor to a digital signal. The monitoring unit sets a predetermined threshold based on conversion values of the digital signals converted by the multiple sub analog-to-digital converters, and compares a conversion value of the digital signal converted by the main analog-to-digital converter with the predetermined threshold.

A ratiometric analog-to-digital conversion circuit includes a first voltage range operation circuit configured to use a first power supply voltage of a first voltage range, and output an analog signal corresponding to an external input signal; and a second voltage range operation circuit configured to use a second power supply voltage of a second voltage range, generate a digital value by analog-to-digital converting the analog signal, feed back the digital value for analog-to-digital conversion, and output a digital signal corresponding to the digital value and proportional to the input signal.

A switched-capacitor amplifier comprises a comparator, sample and amplification capacitors and a controller to control charge and discharge current sources in dependence on an output signal of the comparator. A closed loop control circuit is configured to determine the delay of the comparator and control an offset of the comparator in response to the determined delay.

An apparatus and a method of correcting a mismatch of a time-interleaved analog-to-digital converter are provided. The apparatus may include: a time-interleaved analog-to-digital converter configured to receive a non-return-to-zero (NRZ) signal in a correction mode and generate a first output signal, and including a plurality of analog-to-digital converters; and a mismatch corrector configured to generate a second output signal by processing the first output signal of the time-interleaved analog-to-digital converter based on parameters, wherein the parameters may be generated based on the first output signal of the time-interleaved analog-to-digital converter in the correction mode, and a period of the NRZ signal may be different from a product of a sampling period of the time-interleaved analog-to-digital converter and a number of the plurality of analog-to-digital converters included in the time-interleaved analog-to-digital converter.

A digital to time converter (DTC). The DTC includes a lookup table, a divider, a thermometric array and a switched capacitor array. The lookup table is configured to generate one or more corrections based on thermometric bits of an input signal. The divider is configured to generate a plurality of divider signals from an oscillator signal based on the one or more corrections. The thermometric array is configured to generate a medium approximation signal from the plurality of divider signals based on the one or more corrections. The switched capacitor array is configured to generate a digital delay signal from the medium approximation signal based on the one or more corrections and switched capacitor bits of the input signal.

A digital to time converter (DTC). The DTC includes a lookup table, a divider, a thermometric array and a switched capacitor array. The lookup table is configured to generate one or more corrections based on thermometric bits of an input signal. The divider is configured to generate a plurality of divider signals from an oscillator signal based on the one or more corrections. The thermometric array is configured to generate a medium approximation signal from the plurality of divider signals based on the one or more corrections. The switched capacitor array is configured to generate a digital delay signal from the medium approximation signal based on the one or more corrections and switched capacitor bits of the input signal.

An asynchronous successive approximation register analog-to-digital converter (SAR ADC), which utilizes one or more overlapping redundant bits in each digital-to-analog converter (DAC) code word, is operable to generate an indication signal that indicates completion of each comparison step and indicates that an output decision for each comparison step is valid. A timer may be initiated based on the generated indication signal. A timeout signal may be generated that preempts the indication signal and forces a preemptive decision, where the preemptive decision sets one or more remaining bits up to, but not including, the one or more overlapping redundant bits in a corresponding digital-to-analog converter code word for a current comparison step to a particular value. For example, the one or more remaining bits may be set to a value that is derived from a value of a bit that was determined in an immediately preceding decision.