Analog calibration (ACAL) circuits supporting iterative measurement of an input signal from a measured circuit, and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare the input reference voltage to an input circuit voltage of a measured circuit and generate a digital measurement signal based on the comparison. To provide for the ACAL circuit to more precisely measure the input circuit voltage, the voltage reference generation circuit is programmable and is configured to a generate the input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit can be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for a more precise measurement of the input circuit voltage.

According to an example, an electronic device includes a component, a supply line providing a supply voltage, a transistor with a control input, a linear first control loop, and a non-linear second control loop. The transistor outputs an output voltage to the component depending on a signal applied to the control input. The linear first control loop includes an ADC to convert an analog output voltage level into a digital measurement signal, a controller to generate a digital control signal for the transistor depending on the digital measurement signal, and a DAC to convert the digital control signal into a first analog control signal. The non-linear second control loop is configured to generate a second analog control signal depending on the analog output voltage level. The second analog control signal is superimposed with the first analog control signal and the combined control signals are fed to the control input of the transistor.

In some embodiments, a digital-to-analog converter (DAC) architecture can include an array having a total number of bit cells, and a control system configured to activate a selected number of the total number of bit cells and to deactivate the remaining bit cells. The selected number can be variable, such that the array consumes a quiescent current that depends on the selected number. The control system can be further configured to change the selected number when a signal condition exceeds a threshold duration.

In some embodiments, a calibration circuit can include a first circuit configured to generate a first output voltage based on a first reference voltage, and a second circuit configured to compare the first output voltage and a second reference voltage. The calibration circuit can further include a calibration block configured to provide an adjustment to the first circuit based on the comparison of the first output voltage and the second reference voltage, with the adjustment being configured to compensate for a change in the first reference voltage. In some embodiments, such a calibration circuit can be utilized for and/or be a part of a digital-to-analog converter for wireless audio applications.

Systems and methods provide a fractional signal from a delta sigma modulator to a summer, a combination of an integer value and the fractional signal to a divider, and a divided clock signal from the divider in response to the combination and the input clock signal. The systems and methods also delay the divided clock signal in response to a truncation phase error and gain calibration factor from a calibration unit to provide an output clock signal having equal periods.

A digital modulator according to the present disclosure includes a polar converter that generates a phase signal and an amplitude signal from a baseband signal, an RF phase signal generator that generates an RF phase signal on the basis of the phase signal, a rectangulating unit that generates a rectangular RF phase signal by converting the RF phase signal into a rectangular shape, a time interleaver that time interleaves the amplitude signal and outputs first and second time interleaved signals, a ΔΣ modulator that ΔΣ modulates the first and second time interleaved signals on the basis of the rectangular RF phase signal and outputs first and second ΔΣ modulated signals, and a selector that selects and outputs one of the first and second ΔΣ modulated signals on the basis of the rectangular RF phase signal.

Analog calibration (ACAL) circuits supporting iterative measurement of an input signal from a measured circuit, and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare the input reference voltage to an input circuit voltage of a measured circuit and generate a digital measurement signal based on the comparison. To provide for the ACAL circuit to more precisely measure the input circuit voltage, the voltage reference generation circuit is programmable and is configured to a generate the input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit can be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for a more precise measurement of the input circuit voltage.

An oversampling filter oversamples a digital audio signal. A ΔΣ modulator delta-sigma modulates a signal output from the oversampling filter. A D/A converter converts a signal output from the ΔΣ modulator into an analog audio signal. The oversampling filter includes a processor configured to run firmware and a computational algorithm is configurable based on the firmware.

An Artificial Neural Network (ANN) processing system includes artificial neurons (processing elements) and an analog to digital converter (ADC). An artificial neuron includes a digital to analog converter (DAC) and a low pass filter (LPF) configured to generate a first filtered analog current signal. Also, the artificial neuron includes a delta-sigma DAC configured to generate an M-bit current signal based on a digital weight value. The artificial neuron also includes a multiplier configured to generate a first output current source signal based on the first filtered analog current signal and the M-bit current signal. The ADC is operably coupled to a common node via a single line and configured to generate a digital output signal based on an input voltage of the ADC. The digital output signal is representative of a summation of output analog current signals at a common node to which the ADC is operably coupled.

A calibration circuit, including: a signal generator circuit configured to generate a modulated analog input signal, which is based on a digital input word that is modulated; an Analog-to-Digital Converter (ADC) configured to convert an analog reference signal to a digital calibration word, wherein the analog reference signal is a low-pass-filtered version of the analog input signal generated by the signal generator circuit; and a feedback circuit configured to output the digital input word by adjusting the digital calibration word depending on a digital feedback signal, which is based on a modulated version of the analog reference signal, wherein the signal generator circuit, the ADC, and the feedback circuit are provided on a same chip.