Patent classifications
H04B10/073
Integrated coherent receiver for distributed fiber sensing apparatus
A distributed fiber sensing system may use an integrated coherent receiver. The integrated coherent receiver may include a planar lightwave circuit including various optical components.
Integrated coherent receiver for distributed fiber sensing apparatus
A distributed fiber sensing system may use an integrated coherent receiver. The integrated coherent receiver may include a planar lightwave circuit including various optical components.
Methods for estimating modal bandwidth spectral dependence
Methods for estimating the Effective Modal Bandwidth (EMB) of laser optimized Multimode Fiber (MMF) at a specified wavelength, λ.sub.S, based on the measured EMB at a first reference measurement wavelength, λ.sub.M. In these methods the Differential Mode Delay (DMD) of a MMF is measured and the Effective Modal Bandwidth (EMB) is computed at a first measurement wavelength. By extracting signal features such as centroids, peak power, pulse widths, and skews, as described in this disclosure, the EMB can be estimated at a second specified wavelength with different degrees of accuracy. The first method estimates the EMB at the second specified wavelength based on measurements at the reference wavelength. The second method predicts if the EMB at the second specified wavelength is equal or greater than a specified bandwidth limit.
Wavelength demultiplexer, optical transceiver front-end module, photonic circuit, and wavelength demultiplexing control method
A wavelength demultiplexer includes a photonic circuit and a control circuit that adjusts wavelength characteristics of the photonic circuit. The photonic circuit converts two orthogonal polarized waves contained in the incident light into two same polarized waves, which are supplied to a first optical demultiplexing circuit and a second optical demultiplexing circuit provided in the photonic circuit and having the same configuration. The photonic circuit supplies a total output power of monitor lights extracted from the same positions in the first optical demultiplexing circuit and the second optical demultiplexing circuit to the control circuit. The control circuit controls a first wavelength characteristic of the first optical demultiplexing circuit and a second wavelength characteristic of the second optical demultiplexing circuit based on the total output power of the monitor lights.
Wavelength demultiplexer, optical transceiver front-end module, photonic circuit, and wavelength demultiplexing control method
A wavelength demultiplexer includes a photonic circuit and a control circuit that adjusts wavelength characteristics of the photonic circuit. The photonic circuit converts two orthogonal polarized waves contained in the incident light into two same polarized waves, which are supplied to a first optical demultiplexing circuit and a second optical demultiplexing circuit provided in the photonic circuit and having the same configuration. The photonic circuit supplies a total output power of monitor lights extracted from the same positions in the first optical demultiplexing circuit and the second optical demultiplexing circuit to the control circuit. The control circuit controls a first wavelength characteristic of the first optical demultiplexing circuit and a second wavelength characteristic of the second optical demultiplexing circuit based on the total output power of the monitor lights.
Multi-lane optical-electrical device testing using automated testing equipment
A hybrid automated testing equipment (ATE) system can simultaneously test electrical and optical components of a device under test, such as an optical transceiver. The device under test can be a multilane optical transceiver that transmits different channels of data on different lanes. The hybrid ATE system can include one or more light sources and optical switches in an optical test lane selector to selectively test and calibrate each optical and electrical components of each lane of the device under test.
Systems and methods for wafer-level photonic testing
A semiconductor wafer includes a semiconductor chip that includes a photonic device. The semiconductor chip includes an optical fiber attachment region in which an optical fiber alignment structure is to be fabricated. The optical fiber alignment structure is not yet fabricated in the optical fiber attachment region. The semiconductor chip includes an in-plane fiber-to-chip optical coupler positioned at an edge of the optical fiber attachment region. The in-plane fiber-to-chip optical coupler is optically connected to the photonic device. A sacrificial optical structure is optically coupled to the in-plane fiber-to-chip optical coupler. The sacrificial optical structure includes an out-of-plane optical coupler configured to receive input light from a light source external to the semiconductor chip. At least a portion of the sacrificial optical structure extends through the optical fiber attachment region.
Pathloss optimization for optical systems
Methods include, for each of a plurality of pluggable optical transceivers that are fiber-coupled to respective inputs of a passive wavelength division multiplexer having a predetermined loss profile defining a path specific loss between each input and a common output, sending an optical output signal along an optical signal path while the other optical transceivers of the plurality are not sending optical output signals and measuring an optical power of the sent optical output signal at an input of a local optical amplifier downstream from an output of the wavelength division multiplexer, wherein the local optical amplifier is configured to transmit the optical output signals to a distant location, and, based on the measured optical powers, determining a loss distribution across the optical output signals at the input of the local optical amplifier by subtracting the predetermined path specific losses of the wavelength division multiplexer, comparing a variation in the loss distribution to a nominal variation to determine a defect in a transceiver fiber path associated with a higher loss component of the distribution where the variation exceeds the nominal variation, comparing an average or maximum loss in the loss distribution to a nominal average or maximum allowable loss to determine a defect in a common fiber path downstream from the multiplexer, and adjusting one or more of the optical powers of the optical output signals produced by the optical transceivers before transmission through the multiplexer, by an optical power offset that produces a predetermined flat optical power spectrum profile at the input of the local optical amplifier and that increases a transmission distance over which the optical output signals decodably propagate.
DEVICES, SYSTEMS, AND METHODS FOR PROCESSING OPTICAL COMPONENTS
A method comprising: receiving optical output data of an optical device; supplying the optical output data to a trained neural network configured to transform optical output data to optical performance metrics; and executing the trained neural network to transform the supplied optical output data to optical performance metrics for the optical device.
OPTICAL COMMUNICATION SYSTEM, OPTICAL COMMUNICATION DEVICE, OPTICAL COMMUNICATION METHOD, AND STORAGE MEDIUM
In order to measure the signal quality of each of optical signals transmitted/received via a plurality of transmission lines, an optical communication system 1 is provided with a dummy light source 10 for outputting dummy light, a switching means 20 for outputting the dummy light to a first transmission line 40a, and a light-receiving means 30 for acquiring first signal quality from the dummy light received via the first transmission line 40a, the switching means 20 switching the output destination of the dummy light from the first transmission line 40a to a second transmission line 40b, and the light-receiving means 30 acquiring second signal quality from the dummy light received via the second transmission line 40b.