The present disclosure relates to a solid state imaging device and an electronic device from which a holding unit for holding information in a pixel can be eliminated. When a charge distribution unit distributes a pixel signal SIG to a first ADC, a pixel signal representing only reflection light is divided for allocation. When the charge distribution unit distributes a pixel signal SIG to a second ADC, a pixel signal representing background light and reflection light (partial) is divided for allocation. When the charge distribution unit distributes a pixel signal SIG to a third ADC, a pixel signal representing background light and reflection light (the rest) is divided for allocation. During a period in which no signal is acquired, a discharge transistor functions as an overflow portion for releasing electrical charge. The present disclosure can be applied to, for example, a solid state imaging device used for an imaging device.

In a solid-state imaging device, a first substrate has a plurality of pixels and a plurality of first control signal lines. The plurality of first control signal lines are connected to pixels of each row. The second substrate includes a plurality of second control signal lines and a control circuit. The arrangement of each of the plurality of second control signal lines on the second substrate corresponds to the arrangement of a corresponding one of the plurality of first control signal lines on the first substrate. The connection portion has a plurality of control connections and a plurality of readout connections. Each of the plurality of control connections is connected to one of the plurality of first control signal lines and a corresponding one of the plurality of second control signal lines.

A light sensor is disclosed. The light sensor comprises a first pixel and a second pixel. The light sensor comprises measurement circuitry. The first pixel is configured to accumulate a first charge and the second pixel is configured to accumulate a second charge when the light sensor is exposed to light. The first pixel is configured to trigger the measurement circuitry to measure the second charge when the first charge reaches a threshold capacity of the first pixel. Also disclosed is an active pixel sensor comprising the light sensor, an image sensor and a device incorporating the light sensor.

An imaging device includes a varifocal lens and an imaging sensor which outputs a signal corresponding to light. The imaging sensor includes a photoelectric conversion unit which converts light into an electric charge, electric charge reading regions, transfer control electrodes, a gate control circuit which sequentially applies control signals to the transfer control electrodes to correspond to the position of the focal point of the varifocal lens, and a reading circuit which outputs a signal corresponding to the amount of the electric charge transferred to the electric charge reading regions. The gate control circuit repeats an operation of outputting each of the control signals when the position of the focal point is located in the focal ranges during a frame period.

An infrared processing system includes a first thermal image generating unit, an object extracting unit, a second thermal image generating unit, and an object temperature calculating unit. The first thermal image generating unit generates, using a first temperature correction value, a first thermal image based on the output signal of the image sensor. The object extracting unit extracts the object from the first thermal image. The second thermal image generating unit generates, using a second temperature correction value corresponding to the object that has been extracted by the object extracting unit, a second thermal image based on the output signal of the image sensor. The object temperature calculating unit calculates, based on the second thermal image that has been generated by the second thermal image generating unit, a temperature of the object that has been extracted by the object extracting unit.

In one example, an apparatus comprises: a memory to store input data and weights, the input data comprising groups of data elements, each group being associated with a channel of channels, the weights comprising weight tensors, each weight tensor being associated with a channel of the channels; a data sparsity map generation circuit configured to generate, based on the input data, a channel sparsity map and a spatial sparsity map, the channel sparsity map indicating channels associated with first weights tensors to be selected, the spatial sparsity map indicating spatial locations of first data elements; a gating circuit configured to: fetch, based on the channel sparsity map and the sparsity map, the first weights tensors and the first data elements from the memory; and a processing circuit configured to perform neural network computations on the first data elements and the first weights tensors to generate a processing result.

To control an excess bias to an appropriate value in a light detection device. A solid-state image sensor includes a photodiode, a resistor, and a control circuit. In this solid-state image sensor, the photodiode photoelectrically converts incident light and outputs a photocurrent. Furthermore, in the solid-state image sensor, the resistor is connected to a cathode of the photodiode. Furthermore, in the solid-state image sensor, the control circuit supplies a lower potential to an anode of the photodiode as a potential of the cathode of when the photocurrent flows through the resistor is higher.

A system includes a processor, a light source controlled by the processor and configured to emit a light, and an event based vision sensor controlled by the processor. The sensor includes a plurality of pixels. At least one of the plurality of pixels includes a photosensor configured to detect incident light and first circuitry configured to output a first signal based on an output from the photosensor. The first signal indicates a change of amount of incident light. The sensor includes a comparator configured to output a comparison result based on the first signal and at least one of a first reference voltage and a second reference voltage. The processor is configured to apply one of the first reference voltage and the second reference voltage to the comparator selectively based on an operation of the light source.

A sensor device is provided. The sensor device includes an image sensor having a plurality of photo-sensitive pixels configured to measure light received from a scene. The image sensor is configured to output image data indicative of measurement values of at least part of the plurality of photo-sensitive pixels. Additionally, the sensor device includes processing circuitry configured to determine a histogram based on the image data. The histogram represents a distribution of the measurement values. The processing circuitry is further configured to determine whether an object is present in the scene based on the histogram. In addition, the sensor device includes interface circuitry configured to output presence data indicating whether the object is present in the scene.

Pixel values are read out of an OB pixel region under a predetermined exposure condition, and predetermined processing is performed on the pixel values to derive a dark current component value. The dark current component value of a segmented pixel region is estimated from the OB dark current component value by taking into account the difference between the exposure conditions of the OB pixel region and the segmented pixel region. Specifically, a conversion ratio for calculating the dark current component value from the OB dark current component value is derived based on the ratios between exposure time and gain in the exposure conditions of the two pixel regions. This conversion ratio is applied to the pixel values of the OB pixel region or the OB dark current component value calculated from them to thereby calculate an estimated dark current component value for the exposure condition of the segmented pixel region.