Patent classifications
H05H1/0075
Langmuir Probe Operating at Fixed Voltages
In one embodiment, systems and methods include using a Langmuir probe to measure a plasma. The Langmuir probe comprises a housing, wherein the housing comprises an outer diameter and an inner diameter, wherein the inner diameter defines an internal cavity. The Langmuir probe further comprises a plurality of bodies, wherein the plurality of bodies is disposed at least partially within the inner cavity, wherein each of the plurality of bodies comprise a set of internal cavities. The Langmuir probe further comprises a plurality of double Langmuir probes disposed each set of the internal cavities.
Langmuir probe
A method of determining payload potential may include the steps of receiving data on a first bias voltage and a resulting first collected current of a first needle of a multi-needle Langmuir probe, receiving data on a second bias voltage and a resulting second collected current of a second needle of the multi-needle Langmuir probe, assigning a value for the electron temperature in which the multi-needle Langmuir probe was operating, and using the current and voltage data, the assigned electron temperature value and Langmuir probe theory to calculate the platform potential of the multi-needle Langmuir probe.
Langmuir probe operating at fixed voltages
In one embodiment, systems and methods include using a Langmuir probe to measure a plasma. The Langmuir probe comprises a housing, wherein the housing comprises an outer diameter and an inner diameter, wherein the inner diameter defines an internal cavity. The Langmuir probe further comprises a plurality of bodies, wherein the plurality of bodies is disposed at least partially within the inner cavity, wherein each of the plurality of bodies comprise a set of internal cavities. The Langmuir probe further comprises a plurality of double Langmuir probes disposed each set of the internal cavities.