Problem: To reduce the likelihood of insufficient electrical continuity in wiring in a semiconductor device. Solution: A method for manufacturing a semiconductor device includes placing, on a substrate surface, a first semiconductor element having a first surface on which a first pillar electrode is formed, via a surface opposite to the first surface, sealing a substrate-side pillar electrode and the first pillar electrode with a first sealant, removing a part of the first sealant to expose an end of the substrate-side pillar electrode and an end of the first pillar electrode, forming, on the first sealant, a plating layer electrically connected to the substrate-side pillar electrode and the first pillar electrode by plating, removing a part of the plating layer to form a residual plating layer, coupling a second semiconductor element onto the residual plating layer or a metal layer or a wiring layer formed on the residual plating layer, and sealing the residual plating layer and the second semiconductor element using a second sealant such that the first sealant is in contact with the second sealant.

A field effect transistor has a negative capacitance gate structure. The field effect transistor comprises a channel and a gate dielectric arranged over the channel. The negative capacitance gate structure comprises a bottom electrode structure comprising a bottom electrode, a multi-domain structure, and a top electrode structure. The multi-domain structure comprises a multi-domain element arranged over the bottom electrode, the multi-domain element comprising a plurality of topological domains and at least one topological domain wall. The top electrode structure comprises a top electrode arranged over the multi-domain element. At least a section of the bottom electrode structure of the negative capacitance gate structure is arranged over the gate dielectric and adapted to be coupled to the channel through the gate dielectric.

Reliability of a semiconductor device is improved. A power device includes: a semiconductor chip; a chip mounting part; a solder material electrically coupling a back surface electrode of the semiconductor chip with an upper surface of the chip mounting part; a plurality of inner lead parts and a plurality of outer lead parts electrically coupled with an electrode pad of the semiconductor chip through wires; and a sealing body for sealing the semiconductor chip and the wires. Further, a recess is formed in a peripheral region of the back surface of the semiconductor chip. The recess has a first surface extending to join the back surface and a second surface extending to join the first surface. Also, a metal film is formed over the first surface and the second surface of the recess.

A semiconductor device includes a semiconductor region with a charge balance region on a junction blocking region, the junction blocking region having a lower doping concentration. The junction blocking region extends between a pair of trench structures in cross-sectional view. The trench structures are provided in the semiconductor region and include at least one insulated electrode. In some embodiments, the semiconductor device further includes a first doped region disposed between the pair of trench structures. The semiconductor device may further include one or more features configured to improve operating performance. The features include a localized doped region adjoining a lower surface of a first doped region and spaced apart from the trench structure, a notch disposed proximate to the lower surface of the first doped region, and/or the at least one insulated electrode configured to have a wide portion adjoining a narrow portion.

A conductive structure and a manufacturing method thereof, an array substrate and a display device. The conductive structure includes a plurality of first metal layers made of aluminum, and between every two first metal layers that are adjacent, there is also provided a second metal layer, which is made of a metal other than aluminum. With the conductive structure, the hillock phenomenon that happens to the conductive structure when it is heated can be decreased without reducing the overall thickness of the conductive structure.

A semiconductor apparatus includes: a gate electrode in a trench and facing a p type base region with a gate insulating film interposed therebetween on a portion of a side wall; a shield electrode in the trench and between the gate electrode and a bottom of the trench; an electric insulating region in the trench, the electric insulating region extending between the gate electrode and the shield electrode, and further extending along the side wall and the bottom of the trench to separate the shield electrode from the side wall and the bottom; a source electrode electrically connected to an n.sup.+ type source region and the shield electrode. The shield electrode has high resistance regions at positions where the high resistance regions face the side walls of the trench, and a low resistance region at a position where the low resistance region is sandwiched between the high resistance regions.

One illustrative method disclosed includes, among other things, forming an initial conductive source/drain structure that is conductively coupled to a source/drain region of a transistor device, performing a recess etching process on the initial conductive source/drain structure to thereby define a stepped conductive source/drain structure with a cavity defined therein, forming a non-conductive structure in the cavity, forming a layer of insulating material above the gate structure, the stepped conductive source/drain structure and the non-conductive structure, forming a gate contact opening in the layer of insulating material and forming a conductive gate contact in the gate contact opening that is conductively coupled to the gate structure.

A 3-dimensional hybrid package including an integrated circuit chip stack formed on a laminate, the integrated chip stack further including a first chip and a second chip. The first chip is connected to the laminate through first solder bumps, each associated with a first through-silicon via (TSV), and first metal leads embedded in a first polymer tape that extends from first peripheral metal pads formed on a back side of the first chip to the laminate. The second chip is connected to the first peripheral metal pads on the back side of the first chip through second solder bumps formed on a front side of the second chip. The second chip is connected to the laminate by second metal leads, embedded in a second polymer tape that extend from second peripheral metal pads formed on a back side of the second chip to the laminate.

According to one embodiment, a semiconductor device is provided. The semiconductor device has a first region formed of semiconductor and a second region formed of semiconductor which borders the first region. An electrode is formed to be in ohmic-connection with the first region. A third region is formed to sandwich the first region. A first potential difference is produced between the first and the second regions in a thermal equilibrium state, according to a second potential difference between the third region and the first region.

The method of manufacturing a semiconductor device, including preparing a semiconductor substrate, forming a first insulating layer over said semiconductor substrate, forming first grooves in the first insulating film, forming a gate electrode and a first interconnect in the first grooves, respectively, forming a gate insulating film over the gate electrode, forming a semiconductor layer over the gate insulating, forming a second insulating layer over the semiconductor layer and the first insulating film, forming a via in the second insulating layer, and forming a second interconnect such that the second interconnect is connected to the semiconductor layer through the via. The gate electrode, the first interconnect and the second interconnect are formed by Cu or Cu alloy, respectively.