A nanoscale temperature sensor is presented that is based on mechano-optical sensing. The temperature sensor features a nanoscale bilayer sensing member with a footprint of <100 nm. The sensing member is composed of two layers of materials with similar elastic modulus but different coefficients of thermal expansion. This difference in coefficients of thermal expansion causes the sensing member to mechanically deform upon temperature change. The deformation of the sensing member alters its optical properties, allowing the temperature measurement to be achieved by far field imaging with high throughput. Both the mechanical and optical properties of the sensing member are reversible thus allow stable and repeatable measurement.

There is provided a semiconductor nanocrystal or quantum dot comprising a core made of a material and at least one shell made of another material. Also there is provided a composite comprising a plurality of such nanocrystals or quantum dots. Moreover, there is provided a method of measuring the temperature of an object or area, comprising using a temperature sensor comprising a semiconductor nanocrystal or quantum dot of the invention.

A temperature measuring device, a process for manufacturing the device, and a system for measuring an impact point incorporating the device. According to one aspect, a temperature measuring device includes a thin film sheet made of magneto-metallic material such that, in use and the presence of an applied magnetic field, a change of temperature in one region of the sheet generates an electric voltage in the region, the generated electric voltage being readable through means for reading electric voltage corresponding to the region. According to another aspect, there is a process for manufacturing the device. According to yet another aspect, there is a system for measuring an impact point, of radiation or particles, incorporating the device.

The present invention, in one embodiment, provides a method of measuring pressure or temperature using a sensor including a sensor element composed of a plurality of carbon nanotubes. In one example, the resistance of the plurality of carbon nanotubes is measured in response to the application of temperature or pressure. The changes in resistance are then recorded and correlated to temperature or pressure. In one embodiment, the present invention provides for independent measurement of pressure or temperature using the sensors disclosed herein.

Various techniques are provided to utilize nanostructures for process monitoring and feedback control. In one example, a method includes forming a layer of material including nanostructures distributed therein. Each nanostructure includes a quantum dot and a shell encompassing the quantum dot. The shells and quantum dots are configured to emit a first and second wavelength, respectively, in response to an excitation signal. The method further includes applying the excitation signal to at least a portion of the layer of material. The method further includes detecting an emitted signal from the portion of the layer of material, where the emitted signal is provided by at least a subset of the nanostructures in response to the excitation signal. The method further includes determining whether a manufacturing characteristic has been satisfied based at least on a wavelength of the emitted signal. Related systems and products are also provided.

Various techniques are provided to utilize nanostructures for process monitoring and feedback control. In one example, a method includes forming a layer of material including nanostructures distributed therein. Each nanostructure includes a quantum dot and a shell encompassing the quantum dot. The shells and quantum dots are configured to emit a first and second wavelength, respectively, in response to an excitation signal. The method further includes applying the excitation signal to at least a portion of the layer of material. The method further includes detecting an emitted signal from the portion of the layer of material, where the emitted signal is provided by at least a subset of the nanostructures in response to the excitation signal. The method further includes determining whether a manufacturing characteristic has been satisfied based at least on a wavelength of the emitted signal. Related systems and products are also provided.

There is provided a semiconductor nanocrystal or quantum dot comprising a core made of a material and at least one shell made of another material. Also there is provided a composite comprising a plurality of such nanocrystals or quantum dots. Moreover, there is provided a method of measuring the temperature of an object or area, comprising using a temperature sensor comprising a semiconductor nanocrystal or quantum dot of the invention.

The present invention relates to an article suitable to act as a thermal switch device, the article having a surface resistance of more than 10.sup.5 ohms and formed from a polymer composition comprising from 50 to 99.9 wt % relative to the total weight of the polymer composition, of a polymer being selected from an amorphous polymer having a glass transition temperature Tg, a semi-crystalline polymer having a melting temperature Tm or a mixture thereof, and from 0.1 to 50 wt % relative to the total weight of the polymer composition, of a conductive material, wherein the surface resistance of the article is divided by at least 10, preferably by at least 100, when said article is submitted for a determined period of time of less than 5 minutes to a temperature of switch i) ranging from Tg+10 C. to Tg+250 C. if the polymer composition comprises an amorphous polymer, or ii) ranging from Tm80 C. to Tm+250 C. if the polymer composition comprises a semi-crystalline polymer.

Various techniques are provided to utilize nanostructures for process monitoring and feedback control. In one example, a method includes forming a layer of material including nanostructures distributed therein. Each nanostructure includes a quantum dot and a shell encompassing the quantum dot. The shells and quantum dots are configured to emit a first and second wavelength, respectively, in response to an excitation signal. The method further includes applying the excitation signal to at least a portion of the layer of material. The method further includes detecting an emitted signal from the portion of the layer of material, where the emitted signal is provided by at least a subset of the nanostructures in response to the excitation signal. The method further includes determining whether a manufacturing characteristic has been satisfied based at least on a wavelength of the emitted signal. Related systems and products are also provided.

The present invention relates to an article suitable to act as a thermal switch device, the article having a surface resistance of more than 10.sup.5 ohms and formed from a polymer composition comprising from 50 to 99.9 wt % relative to the total weight of the polymer composition, of a polymer being selected from an amorphous polymer having a glass transition temperature Tg, a semi-crystalline polymer having a melting temperature Tm or a mixture thereof, and from 0.1 to 50 wt % relative to the total weight of the polymer composition, of a conductive material, wherein the surface resistance of the article is divided by at least 10, preferably by at least 100, when said article is submitted for a determined period of time of less than 5 minutes to a temperature of switch i) ranging from Tg+10 C. to Tg+250 C. if the polymer composition comprises an amorphous polymer, or ii) ranging from Tm80 C. to Tm+250 C. if the polymer composition comprises a semi-crystalline polymer.