Display and manufacturing method for a display
11430378 · 2022-08-30
Assignee
Inventors
Cpc classification
G09G2330/08
PHYSICS
G09G2300/0443
PHYSICS
G09G2300/08
PHYSICS
H01L33/62
ELECTRICITY
H01L33/0095
ELECTRICITY
G09G3/006
PHYSICS
H01L27/1255
ELECTRICITY
G09G2300/0452
PHYSICS
International classification
H01L27/12
ELECTRICITY
H01L33/00
ELECTRICITY
H01L33/62
ELECTRICITY
H01L25/075
ELECTRICITY
Abstract
A display includes a plurality of pixels. The pixels include at least one emitter unit. The emitter units each include a primary emitter and a secondary emitter for generating light of the same color. The secondary emitter is associated with the primary emitter of the corresponding emitter unit. The primary emitters and the secondary emitters are based on at least one semiconductor material. The emitter units each include a correction circuit. The correction circuits are each configured to be able to switch the generation of light from the primary emitter to the associated secondary emitter in case of a defect of the associated primary emitter.
Claims
1. A display comprising a plurality of pixels, wherein at least some of the pixels comprise an emitter unit, the emitter units each comprise a primary emitter and a secondary emitter for generating light of the same color and the secondary emitter is associated with the primary emitter, the primary emitters and the secondary emitters are based on at least one semiconductor material each emitter unit comprises a correction circuit, the correction circuit is configured to be able to switch the generation of light from the primary emitter to the associated secondary emitter in case of a defect of the primary emitter, the primary emitter and the associated secondary emitter are electrically connected in series, and in each emitter unit, an antifuse is electrically connected in parallel with the primary emitter and a fuse is electrically connected in parallel with the secondary emitter, or in each emitter unit a field-effect transistor is electrically connected in parallel with the primary emitter and a fuse is electrically connected in parallel with the secondary emitter, or a control electrode of the field-effect transistor is connected to a negative supply voltage and to a positive supply voltage as long as the correction circuit is not actuated, and the control electrode is connected via a resistor only to the negative supply voltage when the correction circuit has been actuated.
2. The display according to claim 1, in which the secondary emitters are each uniquely assigned to a primary emitter and the primary emitters and secondary emitters assigned to one another are identical in construction.
3. The display according to claim 1, in which the secondary emitter of the respective emitter unit does not emit light as long as the correction circuit is not actuated.
4. The display according to claim 1, in which the correction circuit comprises at least one transistor, at least one fuse and at least one antifuse.
5. A display comprising a plurality of pixels, wherein at least some of the pixels comprise an emitter unit, at least some of the pixels comprise subpixel for the generation of green light, red light, and blue light, each emitter unit forms a subpixel, each emitter unit comprises a primary emitter and a secondary emitter for generating light of the same color and the secondary emitter is associated with the primary emitter, the primary emitters and the secondary emitters are based on at least one semiconductor material, the emitter units each comprise a correction circuit, the correction circuit is configured to be able to switch the generation of light from the primary emitter to the associated secondary emitter in case of a defect of the primary emitter, and the primary emitter and the associated secondary emitter are connected to a common electrode with low-resistance.
6. The display according to claim 5, in which a first fuse and the primary emitter are electrically connected in series, wherein the secondary emitter and a field-effect transistor are electrically connected in series.
7. The display according to claim 6, in which a control electrode of the field-effect transistor is connected to a positive supply voltage via a second fuse and to a negative supply voltage via a resistor, wherein, if the correction circuit has not yet been actuated, the fuses are still connected through.
8. The display according to claim 5, in which the primary emitter and the secondary emitter are each electrically connected in series to a fuse, wherein the primary emitter and the secondary emitter are each electrically connected to a field-effect transistor with low-resistance as long as the correction circuit has not yet been actuated.
9. The display according to claim 8, in which the field-effect transistor provided for actuating the correction circuit is at the same time a power transistor for the associated emitter unit.
10. The display according to claim 5, in which each correction circuit of the emission units is at least partially freely accessible from one emission side of the display.
11. The display according to claim 5, in which each correction circuit of the emission units is at least partially freely accessible from a rear side of the display and no light generated in the display is emitted at the rear side in intended operation.
12. A manufacturing method for a display according to claim 1, the method comprising the following steps in the order given: providing of the emitter units with the correction circuits, wherein the correction circuits have not yet been actuated, testing the emitter units, determining whether at least one primary emitter is defective, and actuating at least those correction circuits to which a defective primary emitter is assigned so that the associated secondary emitter is permanently configured to generate light, wherein in each emitter unit, the antifuse is electrically connected in parallel with the primary emitter and the fuse is electrically connected in parallel with the secondary emitter, or in each emitter unit the field-effect transistor is electrically connected in parallel with the primary emitter and the fuse is electrically connected in parallel with the secondary emitter, or the control electrode of the field-effect transistor is connected to the negative power supply voltage and to the positive supply voltage as long as the correction circuit is not actuated, and the control electrode is connected via the resistor only to the negative supply voltage when the correction circuit has been actuated, or the primary emitter and the associated secondary emitter are connected to a common electrode with low-resistance.
13. The method according to claim 12, wherein the at least one defective primary emitter exhibits an electrical resistance increased by at least a factor 3 or reduced by at least a factor 2 with respect to functional primary emitters.
14. The display according to claim 1, wherein each correction circuit of the emission units is at least partially freely accessible from one emission side of the display.
15. The display according to claim 1, wherein each correction circuit of the emission units is at least partially freely accessible from a rear side of the display and no light generated in the display is emitted at the rear side in intended operation.
Description
(1) In the figures:
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
(10)
(11)
(12) For the adjustment of the emission colors non-drawn phosphors may be present, in particular for the generation of green and red light by full conversion from blue light or for the generation of green, red and blue light by full conversion from UV radiation.
(13) The semiconductor layer sequence 60 comprises an active zone 66 for radiation generation. It is possible that second contact electrodes 62 pass through the active zone 66 from a rear side 15 to an emission side 10. Thus, in particular an n-side of the semiconductor layer sequence 60 is electrically contacted at a side facing away from a carrier 5 close to the emission side 10 via the second contact electrodes 62.
(14) In particular, a p-side of the semiconductor layer sequence 60 on the carrier 5 can be contacted via, for example, a planar first contact electrodes 61. The first contact electrode 61 can extend continuously over all emitter units 21, 22, 23. To simplify the illustration, electrical insulations between the contact electrodes 61, 62 are not drawn. The second contact electrodes 62 are formed in particular as cathode and the first contact electrode 61 accordingly as anode.
(15) The emitter units 21, 22, 23 are controlled, for example, via control circuits 52, which may be integrated in carrier 5. The carrier 5 is, for example, a silicon carrier. Alternatively, the carrier 5 may be a printed circuit board, for example. The control circuits 52 comprise in particular transistors, current sources, interfaces, address units and/or memory modules.
(16) The carrier 5 can also be a so-called backplane made of glass or polyimide with applied semiconductor layers for the transistors, in short TFT for thin film transistor, and with structures made of indium-gallium-zinc-oxide, in short IGZO, and/or of low-temperature silicon, also known as Low Temperature Poly Silicon or in short LIPS. This also applies to all other exemplary embodiments.
(17) Deviating from the illustration in
(18) Each of the emitter units 21, 22, 23 comprises a primary emitter 31 and a secondary emitter 32. The emitters 31, 32 are designed as LED units. Redundancy to the primary emitters 31 is achieved via the secondary emitters 32.
(19) In order to address the primary emitters 31 and the assigned secondary emitters 32 of the respective emitter units 21, 22, 23, one correction circuit 4 each is provided in the emitter units 21, 22, 23. Preferably, at least a part of the correction circuits 4 is freely accessible, for example at the carrier 5 from the emission side 10. Corresponding conductor tracks 51 may be provided for electrical wiring. External electrical connection points for the display 1 are not drawn to simplify the representation.
(20)
(21) Furthermore,
(22) Furthermore, according to
(23) If the emitters 31, 32 within the emitter units 21, 22, 23 comprise a smaller distance to each other than adjacent emitter units 21, 22, 23 to each other, it is also possible, deviating from the illustration in
(24) The different variants of the attachment of the exposed parts of the correction circuits 4, the control circuits 52 as well as the design of the semiconductor layer sequence 60, in particular between the emitter units 21, 22, 23, as shown in
(25)
(26) With all examples according to
(27) The circuit in
(28) In the example in
(29) If the primary emitter 31 is defective and forms a “short” or an “open”, this will be detected during a test of the display 1. Thereupon the two fuses F1, F2 of the correction circuit 4 are opened in a defined manner and the assigned electrical connections are interrupted. This is carried out, for example, by a laser. By opening the fuse F2, the transistor T is switched conductive and the secondary emitter 32 can emit light as a replacement for the primary emitter 31.
(30) The transistor T is preferably selected such that the threshold voltage of the transistor T is less than the sum of the forward voltage of the secondary emitter 32 and the voltage at the drain-source path.
(31) By interrupting the fuse F1, for example with a laser, the primary emitter 31 is cut off. By interrupting the fuse F2, for example again with a laser, the gate-source path of the transistor T, which was previously short-circuited, is now pulled via resistor R to the negative supply voltage Vn. This makes the transistor T conductive and secondary emitter 32 can emit light.
(32) This procedure is the same regardless of whether the primary emitter 31 shows a “short” with a reduced electrical resistance or an “open” with an increased electrical resistance as an error. As a result, the emitter units 21, 22, 23 will emit light normally, using secondary emitter 32 as a light source instead of primary emitter 31.
(33) If both emitters 31, 32 are faulty, the fault cannot be remedied with the circuit shown in
(34) In the case of a comparatively ideal “open”, i.e. in the case of a defective primary emitter 31 with resistance increased 31 by at least a factor of 10 or 50 or 100 or approaching infinitely compared to a functioning primary emitter, the opening of the fuse F1 can also be omitted, since the primary emitter 31 carries practically no current. In case of a “short” both fuses F1, F2 have to be opened.
(35) In the circuit shown in
(36) Towards the positive supply voltage Vp the emitters 31, 32 are connected to the transistor T. The transistor T can be the power transistor of the emitter unit 21, 22, 23. A control electrode G of the transistor T is connected to a control voltage Vc, whereby a source circuit of the transistor T can be given via a capacitor C. The control voltage Vc can be equal to the supply voltage Vp when the display 1 is in operation, but when the correction circuit 4 is actuated, the control voltage Vc is different from the supply voltage Vp. A so-called 2T1C pixel driver circuit may be present. The transistor T is preferably a MOS-FET, in particular a PFET, as also possible in all other exemplary embodiments.
(37) Thus the transistor T corresponds to the power transistor of the subpixel 21, 22, 23 and the control voltage Vc corresponds to an input signal of the emitters 31, 32. If both emitters 31, 32 are intact, the current is divided according to the internal resistances of the LED units 31, 32. If this is not desired, one of the fuses F1, F2 could be opened by means of a laser, for example.
(38) If one of the emitters 31, 32 is “open” in case of an error and thus shows a very high resistance, no further action is necessary. The current then flows through the intact emitter 32, 31.
(39) If one of the emitters 31, 32, on the other hand, forms a short circuit, i.e. a “short”, the positive supply voltage Vp is applied to a voltage that corresponds to the voltage drop of the emitters 31, 32 at nominal current. For example, this is about 6 V for semiconductor emitters based on InGaN for green and blue light and about 4 V for semiconductor emitters based on InGaAlP for red light.
(40) The control voltage Vc is set to a minimum value, for example about 0.2 V, determined by the driver for the source of transistor T. Furthermore, the negative supply voltage Vn is set to 0.
(41) Thus the voltage between gate and source at transistor T becomes maximum and current flows through the short-circuited emitter 31, 32. Depending on the design and characteristics of the short circuit, the current is preferably increased at least 2-times or 3-times, for example approximately 4-times, compared to a nominal current. Due to the comparatively high current intensity, the corresponding fuse F1, F2 is opened.
(42) After opening the corresponding fuse F1, F2, the intact emitter 31, 32 carries the current, thus pinching off transistor T, since the voltage drop across emitter 31, 32 at the nominal current corresponds to the total available voltage drop.
(43) In the example of
(44) In the exemplary embodiment in
(45) If both emitters 31, 32 are intact, the control electrode G of transistor T, which is manufactured in PMOS technology, for example, is connected to the positive supply voltage Vp via fuse F2. Thus the transistor T is switched to high resistance. If the fuse F1 is closed, the current is completely conducted only through the primary emitter 31 and no action with respect to the correction circuit 4 is necessary, in particular no laser cutting.
(46) If the primary emitter 31 shows an “open” with an increased resistance, none of the emitters 31, 32 emit light. In this case the two fuses F1, F2 are opened, for example by laser radiation. The control electrode G of the transistor T is pulled to the negative supply voltage Vn via the resistor R, thus switching the transistor T to low-resistance. Thus, the primary emitter 31 is bridged and current is only conducted via the secondary emitter 32.
(47) If the secondary emitter 32 shows an “open” or “short”, no action is necessary.
(48) If the primary emitter 31 shows a “short” with a reduced resistance, the procedure is analogous to the case where the primary emitter 31 shows an “open” with an increased resistance. In the “short” case, it is also possible to optionally omit the cutting of the fuse F2. Thus the practically short-circuited primary emitter 31 would not be bridged by transistor T and the current for the secondary emitter 32 would flow through the “short” of the primary emitter 31.
(49) The control voltage Vc, the positive supply voltage Vp, the capacitor C as well as the transistor T can form a classical driver circuit for emitter units with a storage capacitor and a driver transistor and can thus form the control circuit 52. A corresponding current source can also be used in all other exemplary embodiments.
(50) As in the exemplary embodiment of
(51) In the example of
(52) If the primary emitter 31 is functional, no further action is required. The antifuse A is normally non-conductive. The antifuse A is formed in such a way that it becomes conductive at voltages higher than the maximum forward voltage of primary emitter 31 plus an additional safety puffer. If the primary emitter 31 is defective, the fuse F can be opened, for example, by means of laser radiation, whereby the secondary emitter 32 is switched on as a replacement LED unit.
(53) Thus, if the primary emitter 31 shows a “short” with a reduced resistance, the fuse F can be cut, for example by means of lasers. The previously short-circuited secondary emitter 32 can now serve as a replacement and current flows only via the secondary emitter 32 and the primary emitter 31 which is to be treated as a short.
(54) If the primary emitter 31 shows an “open” with an increased resistance, the fuse F is interrupted by means of a laser, for example. If the current source is switched on and the primary emitter 31 is interrupted according to an “open”, the current source goes into its voltage maximum, which is applied to the antifuse A. The antifuse A is switched conductive, i.e. it short-circuits due to alloying, for example. If the fuse F is interrupted, current can flow through the secondary emitter 32 and the antifuse A and the secondary emitter 32 emits light.
(55)
(56) There is also the possibility to cut open the fuse F by migration, which is different from thermal melting. This effect is called electromigration and could be used to separate conductor tracks by migration instead of melting them by overheating.
(57)
(58) Also in the exemplary embodiment of
(59) For this purpose, a transparent conductive layer 63 is formed over the emitter units 21, 22, 23 starting from metallic connection points of the second contact electrode 62. The transparent conductive layer 63 is made of ITO, for example. The transparent conductive layer 63 is preferably a component of the correction circuits 4.
(60) Optionally, a filling 64 is provided between the emitters 31, 32 for planarization. The filling 64 is preferably transparent or opaque, in particular black. To increase the contrast between pixels 2, the filling 64 is preferably non-reflective, especially not diffusely reflective.
(61) In the top view of
(62) In general, the prerequisite for the laser cuts 81 is that the laser is set in such a way that it cuts only fuse F1 and/or fuse F2 and no other functional components. Advantageously all important electrical lines and/or components, for example, that are not to be damaged by the laser are placed where no laser cut is intended.
(63)
(64) An alternative design for the fuse F2 is illustrated for emitter unit 22. Here, the fuse F2 is cut with a separate laser cut 82.
(65) Based on
(66) The invention described here is not limited by the description using the exemplary embodiments. Rather, the invention comprises each new feature as well as each combination of features, which in particular includes each combination of features in the claims, even if this feature or combination itself is not explicitly specified in the claims or exemplary embodiments.
(67) This patent application claims the priority of the German patent application 10 2018 120 730.1, the disclosure content of which is hereby incorporated by reference.
REFERENCES
(68) 1 Display 10 Emission side 15 Rear side 2 Pixel 21, 22, 23 Emitter unit 31 Primary emitter 32 Secondary emitter 4 Correction circuit 5 carrier 51 conductor tracks 52 control circuit 59 constriction 60 Semiconductor layer sequence 61 first contact electrode 62 second contact electrode 63 transparent conductive layer 64 filling 66 active zone 7 LED chip 81 laser cut 82 laser cut A Antifuse C capacitor F fuse G control electrode of the field-effect transistor I current source R resistor T field-effect transistor Vc control voltage Vn negative supply voltage Vp positive supply voltage