Hybrid package
11189557 · 2021-11-30
Assignee
Inventors
- Akhilesh Kumar Singh (Austin, TX, US)
- Nishant LAKHERA (Austin, TX, US)
- CHEE SENG FOONG (AUSTIN, TX, US)
Cpc classification
H01L21/4853
ELECTRICITY
H01L2924/00012
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L2224/97
ELECTRICITY
H01L24/97
ELECTRICITY
H01L23/3128
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L2924/00012
ELECTRICITY
H01L2224/32225
ELECTRICITY
H01L23/49861
ELECTRICITY
H01L23/49816
ELECTRICITY
H01L2224/32225
ELECTRICITY
H01L21/4842
ELECTRICITY
H01L21/4839
ELECTRICITY
H01L2224/97
ELECTRICITY
H01L24/73
ELECTRICITY
International classification
H01L23/498
ELECTRICITY
Abstract
A method of manufacturing a hybrid package including a flat package and a Wafer Level Chip Scale Package (WLCSP) is disclosed. The method includes fabricating a strip including a plurality of flat packages attached to each other via metal pins, turning the strip upside down, applying a layer of a thermal interface material (TIM) on each of the flat packages while the each of the flat packages is turned upside down, mounting the WLCSP on the layer of the TIM such that a top side of the WLCSP is interfaced with the layer of the TIM, curing the layer of the TIM and singulating each of the flat packages by cutting the metal pins and bending the metal pins.
Claims
1. A method of manufacturing a hybrid package including a flat package and a Wafer Level Chip Scale Package (WLCSP), the method comprising: (a) fabricating a strip including a plurality of flat packages attached to each other via metal pins; (b) turning the strip upside down; (c) applying a layer of a thermal interface material (TIM) on each of the flat packages while the each of the flat packages is turned upside down; (d) mounting the WLCSP on the layer of the TIM such that a top side of the WLCSP is interfaced with the layer of the TIM, wherein a bottom side of the WLCSP includes a plurality of solder balls or solder pads; (e) curing the layer of the TIM; and (f) singulating each of the flat packages by cutting the metal pins and bending the metal pins.
2. The method of claim 1, wherein length of each of the metal pins is greater than height of the WLCSP.
3. The method of claim 1, wherein a protruding extreme tip of each of the mental pins is at a same plane as a bottom extreme tip of each of solder balls or solder pads.
4. The method of claim 1, wherein the layer of the TIM uses a material that provides a transfer of heat from the WLCSP to the flat package.
5. The method of claim 1, wherein the flat package is of type quad flat package (QFP).
6. The method of claim 1, wherein the strip is a lead frame.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) So that the manner in which the above recited features of the present invention can be understood in detail, a more particular description of the invention, briefly summarized above, may be had by reference to embodiments, some of which are illustrated in the appended drawings. It is to be noted, however, that the appended drawings illustrate only typical embodiments of this invention and are therefore not to be considered limiting of its scope, for the invention may admit to other equally effective embodiments. Advantages of the subject matter claimed will become apparent to those skilled in the art upon reading this description in conjunction with the accompanying drawings, in which like reference numerals have been used to designate like elements, and in which:
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(8) Note that figures are not drawn to scale. Intermediate steps between figure transitions have been omitted so as not to obfuscate the disclosure. Those intermediate steps are known to a person skilled in the art.
DETAILED DESCRIPTION
(9) Electronic devices continue to be smaller in physical dimensions year by year. Yet there is a market need to pack more features in the same or smaller space. To save lateral space on a PCB, components such as integrated circuits are now stacked up in Z direction. A three-dimensional integrated circuit (3D IC) is an integrated circuit manufactured by stacking silicon wafers or dies and interconnecting them vertically using, for instance, through-silicon vias (TSVs) or Cu—Cu connections, so that they behave as a single device to achieve performance improvements at reduced power and smaller footprint than conventional two dimensional processes. 3D IC is just one of a host of 3D integration schemes that exploit the z-direction to achieve electrical performance benefits. However, since all components in 3D IC are fabricated on a same wafer, 3D IC are not suitable to combine certain types of sub-systems in the same 3D IC. For example, it may not be desirable to stack a microwave or high frequency sub-system with a sub-system that may be sensitive to high frequency noise or emissions.
(10) Embodiments described herein provides stacking different types of packages to save lateral space on the PCB. In addition, the combined package relieves the need for using an underfill to adhere an underlying package to the PCB to provide mechanical stability and board level reliability. Furthermore, since the two packages being combined are fabricated and packaged separately on separate wafers, different types of applications may be combined in a same hybrid package. For example, a high frequency package can be stacked on top of a high frequency noise sensitive package.
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(13) The TIM layer 110 enables channeling stress and heat from the WLCSP package 102 towards the top when the hybrid package, as described here, is surface mounted on the PCB 104. In some embodiments, a heat sink may be mounted on top of the QFP package 108 after the hybrid package is surface mounted on the PCB 104. In some examples, depending on the size of the WLCSP package 102, the pins 112 of the QFP package 108 may be made wider to provider better mechanical stability to the hybrid package that includes the QFP package 108 and the WLCSP package 102. Each of the pins 112 is longer than the height of the WLCSP package 102 to enable the protruding end of each of the pins 112 to reach the top surface of the PCB 104 when the hybrid package is mounted on the PCB 104. The extreme tip of the protruding pin is in a same plane 130 as the bottom extreme tip of a solder ball that is affixed to the WLCSP package 102. In some embodiments, an adhesive material such as epoxy may be used instead of the thermal interface material in the layer 110.
(14) After mounting the WLCSP package 102 on the TIM layer 110, the hybrid packages are singulated and pins 112 protruding from the QFP packages 108 are bent.
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(16) Some or all of these embodiments may be combined, some may be omitted altogether, and additional process steps can be added while still achieving the products described herein. Thus, the subject matter described herein can be embodied in many different variations, and all such variations are contemplated to be within the scope of what is claimed.
(17) While one or more implementations have been described by way of example and in terms of the specific embodiments, it is to be understood that one or more implementations are not limited to the disclosed embodiments. To the contrary, it is intended to cover various modifications and similar arrangements as would be apparent to those skilled in the art. Therefore, the scope of the appended claims should be accorded the broadest interpretation so as to encompass all such modifications and similar arrangements.
(18) The use of the terms “a” and “an” and “the” and similar referents in the context of describing the subject matter (particularly in the context of the following claims) are to be construed to cover both the singular and the plural, unless otherwise indicated herein or clearly contradicted by context. Recitation of ranges of values herein are merely intended to serve as a shorthand method of referring individually to each separate value falling within the range, unless otherwise indicated herein, and each separate value is incorporated into the specification as if it were individually recited herein. Furthermore, the foregoing description is for the purpose of illustration only, and not for the purpose of limitation, as the scope of protection sought is defined by the claims as set forth hereinafter together with any equivalents thereof entitled to. The use of any and all examples, or exemplary language (e.g., “such as”) provided herein, is intended merely to better illustrate the subject matter and does not pose a limitation on the scope of the subject matter unless otherwise claimed. The use of the term “based on” and other like phrases indicating a condition for bringing about a result, both in the claims and in the written description, is not intended to foreclose any other conditions that bring about that result. No language in the specification should be construed as indicating any non-claimed element as essential to the practice of the invention as claimed.
(19) Preferred embodiments are described herein, including the best mode known to the inventor for carrying out the claimed subject matter. Of course, variations of those preferred embodiments will become apparent to those of ordinary skill in the art upon reading the foregoing description. The inventor expects skilled artisans to employ such variations as appropriate, and the inventor intends for the claimed subject matter to be practiced otherwise than as specifically described herein. Accordingly, this claimed subject matter includes all modifications and equivalents of the subject matter recited in the claims appended hereto as permitted by applicable law. Moreover, any combination of the above-described elements in all possible variations thereof is encompassed unless otherwise indicated herein or otherwise clearly contradicted by context.