DISCRETE METAL-INSULATOR-METAL (MIM) ENERGY STORAGE COMPONENT AND MANUFACTURING METHOD
20220013305 · 2022-01-13
Inventors
- Vincent Desmaris (GÖTEBORG, SE)
- Rickard Andersson (GÖTEBORG, SE)
- Muhammad Amin Saleem (GÖTEBORG, SE)
- Maria Bylund (GÖTEBORG, SE)
- Anders Johansson (ÖCKERÖ, SE)
- Fredrik Liljeberg (Göteborg, SE)
- Ola Tiverman (VÄSTRA FRÖLUNDA, SE)
- M Shafiqul Kabir (VÄSTRA FRÖLUNDA, SE)
Cpc classification
Y02P70/50
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
B82Y40/00
PERFORMING OPERATIONS; TRANSPORTING
H01G4/33
ELECTRICITY
H01M10/0585
ELECTRICITY
B82Y10/00
PERFORMING OPERATIONS; TRANSPORTING
Y02E60/10
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H01M50/11
ELECTRICITY
H01G11/36
ELECTRICITY
International classification
H01G11/36
ELECTRICITY
H01M10/0585
ELECTRICITY
H01M50/11
ELECTRICITY
Abstract
A discrete metal-insulator-metal (MIM) energy storage component, the energy storage component comprising: a MIM-arrangement comprising: a first electrode layer; a plurality of conductive nanostructures grown from the first electrode layer; a conduction controlling material covering each nanostructure in the plurality of conductive nanostructures and the first electrode layer uncovered by the conductive nanostructures; and a second electrode layer covering the conduction controlling material; a first connecting structure for external electrical connection of the capacitor component; a second connecting structure for external electrical connection of the capacitor component; and an electrically insulating encapsulation material at least partly embedding the MIM-arrangement.
Claims
1. A discrete metal-insulator-metal (MIM) energy storage component, comprising: a MIM-arrangement comprising: a first electrode layer; a plurality of conductive nanostructures grown from said first electrode layer; a conduction controlling material covering each conductive nanostructure in said plurality of conductive nanostructures and said first electrode layer left uncovered by said conductive nano structures; and a second electrode layer covering said conduction controlling material; a first connecting structure for external electrical connection of said discrete MIM energy storage component; a second connecting structure for external electrical connection of said discrete MIM energy storage component; and an electrically insulating encapsulation material at least partly embedding said MIM-arrangement.
2. The discrete MIM energy storage component according to claim 1, wherein the conduction controlling material is conformally coating each conductive nanostructure in said plurality of conductive nanostructures and said first electrode layer left uncovered by said conductive nanostructures.
3. The discrete MIM energy storage component according to claim 1, wherein the electrically insulating encapsulation material leaves the first connecting structure and the second connecting structure uncovered by the encapsulation material.
4. The discrete MIM energy storage component according to claim 1, wherein the electrically insulating encapsulation material at least partly forms an outer boundary surface of the discrete MIM energy storage component.
5. The discrete MIM energy storage component according to claim 1, wherein each of the first connecting structure and the second connecting structure at least partly forms an outer boundary surface of the discrete MIM energy storage component.
6. The discrete MIM energy storage component according to claim 1, wherein said second electrode layer completely fills a space between adjacent conductive nanostructures in said plurality of conductive nanostructures, at least halfway between a base and a top of the conductive nanostructures.
7. The discrete MIM energy storage component according to claim 6, wherein said second electrode layer completely fills the space between adjacent conductive nanostructures in said plurality of conductive nanostructures, all the way between the base and the top of the conductive nanostructures.
8. The discrete MIM energy storage component according to claim 1, wherein said second electrode layer comprises: a first sub-layer conformally coating said conduction controlling material; and a second sub-layer formed on said first sub-layer.
9. The discrete MIM energy storage component according to claim 8, wherein said second electrode layer comprises a third sub-layer between said first sub-layer and said second sub-layer, said third sub-layer conformally coating said first sub-layer.
10. The discrete MIM energy storage component according to claim 1, wherein said conductive nanostructures are carbon nanofibers (CNF).
11. The discrete MIM energy storage component according to claim 10, wherein said carbon nanofibers are at least partly formed by amorphous carbon.
12. The discrete MIM energy storage component according to claim 10, wherein said carbon nanofibers have a corrugated surface structure and/or are branched nanofibers.
13. The discrete MIM energy storage component according to claim 1, wherein said MIM-arrangement further comprises a catalyst layer between said first electrode layer and the conductive nanostructures in said plurality of conductive nanostructures.
14. The discrete MIM energy storage component according to claim 13, wherein said catalyst layer is a pre-patterned catalyst layer.
15. The discrete MIM energy storage component according to claim 14, wherein said catalyst layer is pre-patterned in a periodic configuration.
16. The discrete MIM energy storage component according to claim 13, wherein each conductive nanostructure in the plurality of conductive nanostructures comprised in said MIM-arrangement includes catalyst material at a tip of said conductive nanostructure.
17. The discrete MIM energy storage component according to claim 1, wherein a surface density of the conductive nanostructures in the plurality of conductive nanostructures comprised in said MIM-arrangement is at least 1000 per mm.sup.2.
18. The discrete MIM energy storage component according to claim 1, further comprising a substrate directly supporting said first electrode layer.
19. The discrete MIM energy storage component according to claim 18, wherein said substrate is electrically non-conducting.
20. The discrete MIM energy storage component according to claim 1, wherein: said discrete MIM energy storage component has as top surface, a bottom surface, and a side surface connecting said top surface and said bottom surface; said first connecting structure constitutes a first portion of the top surface; and said second connecting structure constitutes a second portion of the top surface.
21. The discrete MIM energy storage component according to claim 1, wherein: said discrete MIM energy storage component has as top surface, a bottom surface, and a side surface connecting said top surface and said bottom surface; said first connecting structure constitutes a portion of the top surface; and said second connecting structure constitutes a portion of the bottom surface.
22. The discrete MIM energy storage component according to claim 1, wherein: said discrete MIM energy storage component has as top surface, a bottom surface, and a side surface connecting said top surface and said bottom surface; said first connecting structure constitutes a portion of the side surface; and said second connecting structure constitutes a portion of the side surface.
23. The discrete MIM energy storage component according to claim 20, wherein said discrete MIM energy storage component further comprises at least one via extending from said bottom surface to said top surface.
24. The discrete MIM energy storage component according to claim 1, wherein: said first connecting structure is electrically conductively connected to the first electrode layer of said MIM-arrangement; and said second connecting structure is electrically conductively connected to the second electrode layer of said MIM-arrangement.
25. The discrete MIM energy storage component according to claim 1, comprising at least a first MIM-arrangement and a second MIM-arrangement, each of the at least first and second MIM-arrangements comprising: a first electrode layer; a plurality of conductive nanostructures vertically grown from said first electrode layer; a conduction controlling material covering each conductive nanostructure in said plurality of conductive nanostructures and said first electrode layer uncovered by said conductive nano structures; and a second electrode layer covering said conduction controlling material.
26. The discrete MIM energy storage component according to claim 25, wherein: said first connecting structure is connected to one of the first electrode layer and the second electrode layer of said first MIM-arrangement; the other one of the first electrode layer and the second electrode layer of said first MIM-arrangement is connected to one of the first electrode layer and the second electrode layer of said second MIM-arrangement; and said second connecting structure is connected to the other one of the first electrode layer and the second electrode layer of said second MIM-arrangement.
27. The discrete MIM energy storage component according to claim 25, wherein: said first connecting structure is connected to the first electrode layer of said first MIM-arrangement and to one of the first electrode layer and the second electrode layer of said second MIM-arrangement; and said second connecting structure is connected to the second electrode layer of said first MIM-arrangement and to the other one of the first electrode layer and the second electrode layer of said second MIM-arrangement.
28. The discrete MIM energy storage component according to claim 26, wherein said first MIM-arrangement and said second MIM-arrangement are arranged in a layered configuration.
29. The discrete MIM energy storage component according to claim 1, wherein the conduction controlling material is a solid dielectric, and the discrete MIM energy storage component is a nanostructure capacitor component.
30. The discrete MIM energy storage component according to claim 1, wherein the conduction controlling material is an electrolyte, and the discrete MIM energy storage component is a nano structure battery component.
31. The discrete MIM energy storage component according to claim 1, wherein the conduction controlling material comprises a solid dielectric and an electrolyte in a layered configuration.
32. An electronic device comprising: a printed circuit board (PCB); an integrated circuit (IC) on the PCB; and the discrete MIM energy storage component according to claim 1 connected to the IC.
33. A discrete metal-insulator-metal (MIM) energy storage component, comprising: at least a first and a second MIM-arrangement, each comprising: a first electrode layer; a plurality of conductive nanostructures vertically grown from said first electrode layer; a conduction controlling material covering each conductive nanostructure in said plurality of conductive nanostructures and said first electrode layer uncovered by said conductive nano structures; and a second electrode layer covering said conduction controlling material; a first connecting structure for external electrical connection of said discrete MIM energy storage component, said first connecting structure being electrically conductively connected to the first electrode layer of said first MIM-arrangement; a second connecting structure for external electrical connection of said discrete MIM energy storage component, said second connecting structure being electrically conductively connected to the second electrode layer of said first MIM-arrangement; a third connecting structure for external electrical connection of said discrete MIM energy storage component, said third connecting structure being electrically conductively connected to the first electrode layer of said second MIM-arrangement; a fourth connecting structure for external electrical connection of said discrete MIM energy storage component, said fourth connecting structure being electrically conductively connected to the second electrode layer of said second MIM-arrangement; and an electrically insulating encapsulation material at least partly embedding said at least first and second MIM-arrangements.
34. An electronic device comprising: a printed circuit board (PCB); an integrated circuit (IC) on the PCB; and the discrete MIM energy storage component according to claim 33 connected to the IC.
35. A method of manufacturing a discrete metal-insulator-metal (MIM) energy storage component, comprising the steps of: providing a substrate; forming a MIM-arrangement on said substrate; forming a first connecting structure for external electrical connection of said discrete MIM energy storage component; forming a second connecting structure for external electrical connection of said discrete MIM energy storage component; and at least partly embedding said MIM-arrangement in an electrically insulating encapsulation material.
36. The method according to claim 35, wherein the step of forming said MIM-arrangement comprises the steps of: forming a first electrode layer on said substrate; growing a plurality of conductive nanostructures from said first electrode layer; covering each conductive nanostructure in said plurality of conductive nanostructures and said first electrode layer uncovered by said conductive nanostructures with a conduction controlling material; and forming a second electrode layer to cover said conduction controlling material.
37. The method according to claim 36, wherein the step of forming said second electrode layer comprises the steps of: conformally coating said conduction controlling material by a first metallic sub-layer; and providing a second metallic sub-layer on said first metallic sub-layer.
38. The method according to claim 37, wherein said first metallic sub-layer is deposited directly on said conduction controlling material using atomic layer deposition.
39. The method according to claim 37, wherein said second metallic sub-layer is provided using electro-plating.
40. The method according to claim 36, wherein said conductive nanostructures are grown using materials and process settings resulting in formation of carbon nanofibers (CNF).
41. The method according to claim 35, further comprising the step of: removing said substrate after the step of forming said MIM-arrangement.
42. The method according to claim 35, wherein the substrate is provided in the form of a wafer.
43. The method according to claim 35, wherein the substrate is provided in the form of a panel.
44. The method according to claim 35, wherein the substrate is provided in the form of a film on a roll.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0051] These and other aspects of the present invention will now be described in more detail, with reference to the appended drawings showing an example embodiment of the invention, wherein:
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DETAILED DESCRIPTION OF EXAMPLE EMBODIMENTS
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[0066] In
[0067] To provide for even more compact electronic devices, with even higher processing speeds, it would be desirable to reduce the space occupied by the capacitors 7 needed for decoupling and temporary energy storage, and to reduce the distance between an IC 5 and the capacitors 7 serving that IC 5.
[0068] This can be achieved using discrete MIM-energy storage components according to embodiments of the present invention, in this case MIM-capacitor components, since such MIM-capacitor components can be made with a considerably smaller package height than conventional MLCCs with the same capacitance and footprint.
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[0071] A first example configuration of the MIM-arrangement 13 will now be described with reference to
[0072] As can be seen in the enlarged view of the boundary between nanostructure 23 and second electrode layer 27 in
[0073] Moreover, additional sub layer(s) for example as metal diffusion barrier not shown in the figure may conveniently be present in accordance with the present invention disclosure.
[0074] The dielectric material layer 25 may be a multi-layer structure, which may include sub-layers of different material compositions.
[0075] A second example configuration of the MIM-arrangement 13 will now be described with reference to
[0076] Moreover, additional sub layer(s) for example as metal diffusion barrier not shown in the figure may conveniently be present in accordance with the present invention disclosure.
[0077] A hybrid-component may include a MIM-arrangement 13 that is a combination of the MIM-arrangements in
[0078] An example method according to an embodiment of the present invention of manufacturing a discrete MIM-capacitor component, including the exemplary MIM-arrangement 13 in
[0079] In a first step 601, there is provided a substrate 39 (see
[0080] In the subsequent step 602, a first electrode layer 21 is formed on the substrate 39. The first electrode layer 21 can be formed via physical vapor deposition (PVD), chemical vapor deposition (CVD), atomic layer deposition (ALD), or any other method used in the industry. In some implementations, the first electrode layer 21 may comprise one or more metals selected from: Cu, Ti, W, Mo, Co, Pt, Al, Au, Pd, Ni, Fe and silicide. In some implementations, the first electrode layer 21 may comprise one or more conducting alloys selected from: TiC, TiN, WN, and AlN. In some implementations, the first metal layer 21 may comprise one or more conducting polymers. In some implementations, the first electrode layer 21 may be metal oxide e.g. LiCoO2, doped silicon. In some implementations, the first metal layer 21 may be the substrate itself e.g. Al/Cu/Ag foil etc.
[0081] In the next step 603, a catalyst layer is provided on the first electrode layer 21. The catalyst can, for example, be nickel, iron, platinum, palladium, nickel-silicide, cobalt, molybdenum, Au or alloys thereof, or can be combined with other materials (e.g., silicon). The catalyst can be optional, as the technology described herein can also be applied in a catalyst-free growth process for nanostructures. Catalyst can also be deposited through spin coating of catalyst particles.
[0082] In some implementations, a layer of catalyst is used to grow the nanostructures as well as to be used as connecting electrodes. In such implementations, the catalyst can be a thick layer of nickel, iron, platinum, palladium, nickel-silicide, cobalt, molybdenum, Au or alloys thereof, or can be combined with other materials from periodic table. The catalyst layer (not shown in
[0083] Nanostructures 23 are grown from the catalyst layer in step 604. As was explained in the Summary section above, the present inventors have found that vertically grown carbon nanofibers (CNF) may be particularly suitable for MIM-capacitor components 11. The use of vertically grown nanostructures allows extensive tailoring of the properties of the nanostructures. For instance, the growth conditions may be selected to achieve a morphology giving a large surface area of each nanostructure, which may in turn increase the charge storing capacitance or capacitance per 2D footprint. As an alternative to CNF, the nanostructures may be metallic carbon nanotubes or carbide-derived carbon nanostructures, nanowires such as copper, aluminum, silver, silicide or other types of nanowires with conductive properties. Advantageously, the catalyst material, and growth gases etc may be selected in, per se, known ways to achieve so-called tip growth of the nanostructures 23, which may result in catalyst layer material at the tips 31 of the nanostructures 23. Following the growth of the vertically aligned conductive nanostructures 23, the nanostructures 23 and the first electrode layer 21 may optionally conformally coated by a metal layer, primarily for improved adhesion between the nanostructures 23 and the conduction controlling material.
[0084] Following the growth of the vertically aligned conductive nanostructures 23, the nanostructures 23, and the portions of the first electrode layer 21 left uncovered by the nanostructures 23, are conformally coated by a layer 25 of a solid dielectric material in step 605. The solid dielectric material layer 25 may advantageously be made of a so-called high-k dielectric. The high k-dielectric materials may e.g. be HfOx, TiOx, TaOx or other well-known high k dielectrics. Alternatively, the dielectric can be polymer based e.g. polypropylene, polystyrene, poly(p-xylylene), parylene etc. Other well-known dielectric materials, such as SiOx or SiNx, etc may also be used as the dielectric layer. Any other suitable conduction controlling materials may appropriately be used. The dielectric materials may be deposited via CVD, thermal processes, atomic layer deposition (ALD) or spin coating or spray coating or any other suitable method used in the industry. In various embodiments it may be advantageous to use more than one dielectric layer or dissimilar dielectric materials with different dielectric constant or different thicknesses of dielectric materials to control the effective dielectric constant or influence the breakdown voltage or the combination of them to control the dielectric film properties. Advantageously, the solid dielectric material layer 25 is coated uniformly with atomic uniformity over the nanostructures 23 such that the dielectric layer covers the entirety of the nanostructures 23 so that the leakage current of the capacitor device is minimized. Another advantage of providing the solid dielectric layer 25 with atomic uniformity is that the solid dielectric layer 25 can conform to the extremely small surface irregularities of the conductive nanostructures 23, which may be introduced during growth of the nanostructures. This provides for an increased total electrode surface area of the MIM-arrangement 13, which in turn provides for a higher capacitance for a given component size. A step of conformally coating a metal layer on the nanostructures may optionally be introduced between step 604 and 605 to, for example, facilitate adhesion of the dielectric layer 25 or, where applicable, an electrolyte layer to the nanostructures 23.
[0085] In the next step 606, an adhesion metal layer—the above-mentioned first sub-layer 33 of the second electrode layer 27—is conformally coated on the solid dielectric material layer 25. The adhesion metal layer 33 may advantageously be formed using ALD, and an example of a suitable material for the adhesion metal layer 33 may be Ti, or TiN.
[0086] On top of the adhesion metal layer 33, a so-called seed metal layer 37—the above-mentioned third sub-layer 37 of the second electrode layer 27—may optionally be formed in step 607. The seed metal layer 37 may be conformally coated on the adhesion metal layer 33. The seed metal layer 37 may, for example, be made of Al, Cu or any other suitable seed metal materials.
[0087] Following formation of the seed metal layer 37, the above-mentioned second sub-layer 35 is provided in step 608. This second sub-layer 35 of the second electrode layer 21 may, for example, be formed via chemical method such as electroplating, electroless plating or any other method known in the art. As is schematically indicated in
[0088] The first 15 and second 17 connecting structures, such as bumps, balls or pillars, are formed in step 609, using, per se, known techniques.
[0089] In the subsequent step 610, insulating encapsulation material 19 is provided to at least partly embed the MIM-arrangement 13. Any known suitable encapsulant material can be used for the encapsulant layer, for example, silicone, epoxy, polyimide, BCB, resins, silica gel, epoxy underfill etc. In some aspect, silicone materials can be favorable if it fits with certain other IC packaging schemes. Encapsulant may be cured to form the encapsulation layer. In some aspect of the present invention, the encapsulant layer maybe a curable material so that the passive component can be attached through curing process. In some aspect, the dielectric constant of the encapsulant is different than the dielectric constant of the dielectric materials used in the MIM construction. In some aspects, lower dielectric constant of the encapsulant materials is preferred compared with the dielectric materials used in manufacturing the MIM capacitor. In some aspect, SiN, SiO or spin on glass can also be used as a encapsulant materials. The encapsulant layer can be spin coated and dried, deposited by CVD, or by any other method known in the art.
[0090] After this step, the substrate 39 may optionally be thinned down or completely removed, in optional step 611, depending on the desired configuration of the finished MIM-capacitor component.
[0091] For the case where the substrate is the first electrode, this step is optional unless further thinning is necessary.
[0092] In the following step 612, the panels or wafers are singulated using known techniques to provide the discrete MIM-capacitor components 11.
[0093] Any of the previously described embodiments are suitable to be fabricated at a wafer level processes and panel level processes used in the industry. They may conveniently be referred to as wafer level processing and panel level processing respectively. In wafer level processing typically, a circular shaped substrate is used, size ranging from 2 inch to 12-inch wafers. In the panel level processing, the size is defined by the machine capacity and can be circular or rectangular or square ranging larger sizes typically but not limited to 12 to 100 inches. Panel level processing is typically used in producing smart televisions. Hence the size can be as the size of a television or larger. In an aspect for wafer level processes, at least one of the embodiments described above is processed at a wafer level in a semiconductor processing foundry. In another aspect, for panel level processes, at least one of the embodiments described above is processed using panel level processing. Depending on the design requirements, after processing, the wafer or panel is cut into smaller pieces utilizing standard dicing, plasma dicing or laser cutting. Such singulation process step can be configured through dicing or plasma dicing or laser cutting to tailor the shape and size of the discrete component formed according to the need.
[0094] The present invention is also contemplated to be compatible to be used in the roll to roll manufacturing technology. Roll to roll processing is a method of producing flexible and large-area electronic devices on a roll of plastic or metal foil. The method is also described as printing method. Substrate materials used in roll to roll printing are typically paper, plastic films or metal foils or stainless steel. The roll to roll method enables a much higher throughput than other methods like wafer level or panel levels and have much smaller carbon footprint and utilize less energy. Roll to roll processing is applied in numerous manufacturing fields such as flexible and large-area electronics devices, flexible solar panels, printed/flexible thin-film batteries, fibers and textiles, metal foil and sheet manufacturing, medical products, energy products in buildings, membranes and nanotechnology.
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[0101] The person skilled in the art realizes that the present invention by no means is limited to the preferred embodiments described above. On the contrary, many modifications and variations are possible within the scope of the appended claims.
[0102] In the claims, the word “comprising” does not exclude other elements or steps, and the indefinite article “a” or “an” does not exclude a plurality. A single processor or other unit may fulfill the functions of several items recited in the claims. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage. Any reference signs in the claims should not be construed as limiting the scope.