LEADFRAME PACKAGE USING SELECTIVELY PRE-PLATED LEADFRAME
20200373230 ยท 2020-11-26
Inventors
Cpc classification
H01L2924/00012
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L21/4821
ELECTRICITY
H01L2924/00014
ELECTRICITY
H01L2924/00012
ELECTRICITY
H01L2224/92247
ELECTRICITY
H01L2224/92247
ELECTRICITY
H01L2224/48249
ELECTRICITY
H01L2924/00
ELECTRICITY
H01L24/73
ELECTRICITY
H01L2924/00
ELECTRICITY
International classification
H01L21/48
ELECTRICITY
Abstract
The present disclosure is directed to a leadframe package with a surface mounted semiconductor die coupled to leads of the leadframe package through wire bonding. The leads are partially exposed outside the package and configured to couple to another structure, like a printed circuit board (PCB). The exposed portions, namely outer segments, of the leads include a plating or coating layer of a material that enhances the solder wettability of the leads to the PCB through solder bonding. The enclosed portions, namely inner segments, of the leads do not include the plating layer of the outer segment and, thus, include a different surface material or surface finish.
Claims
1. A leadframe, comprising: a die pad; and a sheet structure defining a void surrounding the die pad and including a plurality of leads each, each lead of the plurality of leads including a first portion and a second portion, the second portion being further from the die pad than the first portion, the first portion having a first surface material, the second portion having a second surface material that is different from the first surface material.
2. The leadframe of claim 1, wherein the first surface material includes one or more of silver, a silver alloy or gold.
3. The leadframe of claim 1, wherein the second surface material includes one or more of bismuth or a bismuth alloy.
4. The leadframe of claim 3, wherein the second portion includes a base material under the second surface material and different from the second surface material.
5. The leadframe of claim 4, wherein the base material is one or more of copper, a copper alloy or a nickel iron alloy.
6. The leadframe of claim 4, wherein the base material is a same conductive material as the first surface material.
7. The leadframe of claim 4, wherein a cross-section of a lead at a cut-off line from the sheet structure includes the base material exposed from the second surface material.
8. The leadframe of claim 1, wherein the sheet structure include one or more guide holes.
9. The leadframe of claim 1, further comprising one or more link bars that mechanically connect the sheet structure to the die pad.
10. A structure, comprising: a die pad; and a lead including: a first surface of a first surface material; a second surface of a second surface material that is different from the first surface material; and a first edge surface and a second edge surface, the second edge surface being closer to the die pad than the first edge surface.
11. The structure of claim 10, wherein the first edge surface includes a third surface material different from the first surface material and the second surface material.
12. The structure of claim 11, wherein the first edge surface includes the second surface material.
13. The structure of claim 11, wherein the third surface material is a same material as the die pad.
14. The structure of claim 11, further comprising an encapsulant material encapsulating the die pad and the lead, wherein a first portion of the second surface material of the lead is exposed from the encapsulant material and a second portion of the second surface material of the lead is covered by the encapsulant material.
15. The structure of claim 14, wherein a portion of the third surface material is exposed from the encapsulant material.
16. The structure of claim 10, wherein the first surface material includes one or more of silver, a silver alloy or gold.
17. The structure of claim 10, wherein the second surface material includes one or more of bismuth or a bismuth alloy.
18. A leadframe, comprising: a central portion of a first conductive material; and a peripheral portion coupled to the central portion, the peripheral portion including: a plurality of leads, each lead of the plurality of leads including the first conductive material and a second conductive material covering the first conductive material; and one or more link bars coupled between the peripheral portion and the central portion.
19. The leadframe of claim 18, wherein the second conductive material is one or more of bismuth or a bismuth alloy.
20. The leadframe of claim 18, wherein the peripheral portion includes one or more guide holes.
Description
BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
[0008] In the drawings, identical reference numbers identify similar elements or acts unless the context indicates otherwise. The sizes and relative positions of elements in the drawings are not necessarily drawn to scale.
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DETAILED DESCRIPTION
[0017] In the following description, certain specific details are set forth in order to provide a thorough understanding of various embodiments of the disclosure. However, one skilled in the art will understand that the disclosure may be practiced without these specific details. In other instances, well-known structures associated with electronic components and fabrication techniques have not been described in detail to avoid unnecessarily obscuring the descriptions of the embodiments of the present disclosure.
[0018] Unless the context requires otherwise, throughout the specification and claims that follow, the word comprise and variations thereof, such as comprises and comprising, are to be construed in an open, inclusive sense, that is, as including, but not limited to.
[0019] The use of ordinals such as first, second and third does not necessarily imply a ranked sense of order, but rather may only distinguish between multiple instances of an act or structure.
[0020] Reference throughout this specification to one embodiment or an embodiment means that a particular feature, structure or characteristic described in connection with the embodiment is included in at least one embodiment. Thus, the appearances of the phrases in one embodiment or in an embodiment in various places throughout this specification are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
[0021] As used in this specification and the appended claims, the singular forms a, an, and the include plural referents unless the content clearly dictates otherwise. It should also be noted that the term or is generally employed in its sense including and/or unless the content clearly dictates otherwise.
[0022] The present disclosure is generally directed to a leadframe package, e.g., a quad flat no-lead package (QFN), with a surface mounted structure and a leadframe having selectively or locally plated external lead or pin segments. An example leadframe package (device) 100 is shown in
[0023] A semiconductor die 130 is attached to the die pad (not shown in
[0024] Outer segment 122 is selectively plated or pre-plated with a noble metal or metal alloy material that is different from a surface material of inner segment 124. The noble metal or alloy plating is resistant to corrosion and oxidation. In an embodiment, the plating material for the outer segment 122 is chosen to have good soldering properties, solderable, with respect to a solder material that is used to solder outer segment 122 to connection pads of a PCB. The good soldering properties may include solder wettability (or bondability), mechanical properties, thermal properties and electrical properties. For example, the plating material of outer segment 122 has good soldering properties with the Tin (Sn) and Silver (Ag) based non-lead (Pb) solder material. In addition, as outer segment 122 is pre-plated, the plating material has a thermal property that enables it to sustain the high processing temperatures of the chip packaging processes. For example, when molding compounds are used to form the encapsulation layer 150, the plating material of outer segment 122 is chosen to have a melting point higher than about 230 C. In an embodiment, the plating material of the outer segment 122 includes bismuth (Bi) or a Bi alloy. Inevitable or accidental impurities are also included, which do not change the scope of the disclosure. In an embodiment, the plated bismuth or bismuth alloy layer has a thickness of about 10 microns.
[0025] It should be appreciated that as leadframe 110, or specifically outer segment 122 of lead 120, is pre-plated, i.e., plated before the encapsulation layer 150 is applied, outer segment 122 may be partially enclosed within encapsulation layer 150 and inner segment 124 may be partially exposed out of encapsulation layer 150. Outer segment 122 and inner segment 124 are not literally defined based on whether they are inside or outside of encapsulation layer 150, but are defined relative to one another and based on the different surface materials. Namely, outer segment 122 is outer to die 130 (or the die pad of leadframe 110) relative to inner segment 124.
[0026]
[0027] In an example, as shown in
[0028]
[0029] Center portion 122EC of end surface 122E may include the base metal of leadframe 110. The base metal may be copper, copper alloy, alloy 42 or other suitable base metals for a leadframe. In an embodiment, one or more additional plating or coating layers may exist between the plating layer 126 and the base metal. The additional plating or coating layer may include nickel and/or palladium or other suitable coating materials. In an embodiment, center portion 122EC of end surface 122E includes a same surface material as that of inner portion 124, which may be a base metal material of leadframe 110 or may be any intermediate or underlying coating between surface plating layer 126 and the base metal material.
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[0034] Optionally, inner segment 124 of lead 120 also includes a plating layer 132 on one or more surfaces. Plating layer 132 is also formed through a pre-plating process and includes a different material than plating layer 126. As inner segment 124 is dedicated for wire bonding with die 130, the plating layer 132 may include a material suitable for electrical connectivity and/or for enhancing electrical connectivity. For example, the plating layer 132 may include copper (Cu), silver (Ag) or gold (Au) or other suitable materials for enhancing electrical connectivity for wire bond 140.
[0035]
[0036] In an embodiment, as shown in
[0037] As shown in
[0038]
[0039]
[0040] Exposed lower surface 122L and one end surface 122E are each substantially coplanar with and embedded in a respective exterior surface of encapsulation layer 150. The plating layer 126 may be on one or more of the exposed surfaces of the outer segment 122.
[0041] As shown in
[0042] For the example QFN package 100, or generally for a non-lead package 100, lower surface 122L or plating layer 126 is substantially coplanar with lower surface 152 of package 100. This is an advantage and a difference of pre-plated plating layer 126 over post-plating, because post-plating will form a raise-up plating film that bumps up from the bottom surface 152 of package 100.
[0043] End surface 122E is substantially flush with a respective side surface 154 of encapsulation layer 150 of package 100. End surface 122E includes a center portion 122EC of a material different than those of plating layer 126 and that of a peripheral portion 122EP, which is an edge of plating layer 126. In an embodiment, center portion 122EC includes a base metal material of lead 120 and any intermediate plating or coating materials between the base metal and plating layer 126.
[0044] Plating layer 126 includes a plating material suitable for solder wetting. In an embodiment, plating layer 126 includes Done or more of bismuth or bismuth alloy.
[0045] In an embodiment, inner segment 124 of lead 120, which is enclosed within encapsulation layer 150, includes another plating layer 132 for wire bonding. Plating layer 132 may include one or more of Cu, Ag, Ag alloy or Au.
[0046]
[0047] As illustrated herein, leadframe 110 includes a sheet structure(s) 310 (or leadframe sheet 310) that defines a void 312. Guide holes 314 are provided in sheet structure 310 for alignment purposes in die assembly using the leadframe 110. Die pad 160 is disposed in the center of void 312. Die pad 160 is linked to sheet structure 310 and mechanically supported by link bar 316, normally by the four corners of die pad 160. A plurality of leads 120 extend from sheet structure 310 toward die pad 160. Each lead 120 includes an outer segment 122 and an inner segment 124. Outer segment 122 may include plating layer 126 on one or more of upper surface 122U, lower surface 122L and side surface 122S. End surface 126 is a cut-off surface where lead 120 is singulated apart from sheet structure 310. Because plating layer 126 is pre-plated before the die assembly process and lead 120 is singulated from sheet structure 310 in the die assembly process, end surface 126 includes difference surface material at the center portion 122EC than the plating layer 126.
[0048] Lead 120 may also include a different plating layer 132 in inner segment 124.
[0049] In an embodiment, leadframe 110 includes a base metal 318 on lead 120 and die pad 160. The base metal may be copper, copper alloy, iron nickel alloy (alloy 42) and other suitable base metals for leadframe. Plating layer 126 may be one or more of bismuth or bismuth alloy. Plating layer 132 may be one or more of silver, silver alloy or gold.
[0050] The plating process of plating layer 126 of bismuth or bismuth alloy onto outer segment 122 may be achieved through immersion plating or electroplating, or any other suitable plating approaches. For example, in the immersion plating, other portions of leadframe 110 substrate (e.g., of the base metal) may be encapsulated or otherwise covered, exposing the outer segment 126 areas. Then the substrate of the leadframe 110 may be immersed into a bath of bismuth compound and an organic diluent to facilitate a reaction of the bismuth with the substrate containing the base metal. For another example, in the electroplating process, other portions of a substrate of leadframe 110 may be covered by a sample mask, exposing the outer segment 126 areas. Then bismuth or bismuth alloy may be deposited onto the exposed area to form the bismuth or bismuth alloy plating layer 126.
[0051] Plating layers 132 on inner segment 124 and plating layers 134 on die pad 160 may be formed before or after the bismuth or bismuth alloy plating layer 126.
[0052] Plating layers 132, 143 and 126 are all pre-plated before leadframe 110 is used in a semiconductor chip assembly process.
[0053] Plating layer 132 includes a different material than plating layer 126. In an embodiment, plating layer 132 includes one or more of Ag, Ag alloy or Au. Plating layer 126 includes one or more of Bi or Bi alloy.
[0054] Because leadframe 110 include plating layers 126, 132 selectively coated on dedicated local areas of the lead 120 and/or the die pad 160, the cost of the material and the plating process is reduced accordingly. Because plating layers 126, 132 are pre-plated before the die assembly process, the die assembly process using the leadframe 110 is simplified and reliability of the die package is enhanced. For example, assembly and testing does not need to send the die package to a vendor for the post-plating and can conduct chip testing right after the chip assembly process.
[0055] Leads 120 in
[0056] In the description herein, a quad flat package and a quad flat no-lead package are used as an example of a leadframe package and a leadframe for a quad flat package is used as an example of leadframes. It should be appreciated that the disclosure may be applied in any leadframes and any leadframe packages. Further, the described surface mounted structure or device may also be mounted to other structures, like a printed circuit board (PCB), which is also included in the disclosure.
[0057] The various embodiments described above can be combined to provide further embodiments. All of the U.S. patents, U.S. patent application publications, U.S. patent applications, foreign patents, foreign patent applications and non-patent publications referred to in this specification and/or listed in the Application Data Sheet are incorporated herein by reference, in their entirety. Aspects of the embodiments can be modified, if necessary to employ concepts of the various patents, applications and publications to provide yet further embodiments.
[0058] These and other changes can be made to the embodiments in light of the above-detailed description. In general, in the following claims, the terms used should not be construed to limit the claims to the specific embodiments disclosed in the specification and the claims, but should be construed to include all possible embodiments along with the full scope of equivalents to which such claims are entitled. Accordingly, the claims are not limited by the disclosure.