THIN FILM OPTICAL LENS AND METHOD FOR COATING A LENS
20200341168 ยท 2020-10-29
Assignee
Inventors
- Norman L. Kester (Rogue River, OR, US)
- Nicholas M. Hall (Talent, OR, US)
- Richard D. Unbankes (Medford, OR, US)
Cpc classification
G02B1/10
PHYSICS
G02B5/208
PHYSICS
G02B5/282
PHYSICS
International classification
G02B1/10
PHYSICS
C03C17/34
CHEMISTRY; METALLURGY
G02B27/00
PHYSICS
Abstract
A thin film optical lens and method for coating an optical substrate serves to apply alternating layers, with varying thicknesses, of a high index dielectric material and a low index dielectric material on first and second surfaces of an optical substrate. The high and low index dielectric materials are layered through thin film deposition. The low index dielectric material is SiO.sub.2. The high index dielectric material is ZrO.sub.2 and/or Indium Zinc Oxide. The spectral results from application of high and low index dielectric materials reduce infrared radiation, block HEV light transmission, and reduce backside ultraviolet reflections, while also increasing visible (ultraviolet) light transmission through the optical substrate. Thus, the layering of dielectric materials on the first surface of optical substrate reflects up to 40% of the infrared radiation; and the second surface of optical substrate transmits up to 99% of ultraviolet light in the wavelength range between 300 to 400 nanometers.
Claims
1. A method of coating a thin film optical lens, the method comprising: providing an optical substrate, the optical substrate comprising a first surface and an opposing second surface, the first surface being operable to at least partially reflect infrared radiation, the second surface being operable to at least partially transmit ultraviolet light in the wavelength range between 300 to 400 nanometers; cleaning the surfaces of the optical substrate; applying a low index dielectric material and a high index dielectric material on at least one of the first and second surfaces of the optical substrate, the low index dielectric material and the high index dielectric material being applied in the following order: applying about 145.00 nanometers of the low index dielectric material on at least one of the first and second surfaces of the optical substrate; applying about 15.00 nanometers of the high index dielectric material on at least one of the first and second surfaces of the optical substrate; applying about 17.00 nanometers of the low index dielectric material on at least one of the first and second surfaces of the optical substrate; applying about 104.50 nanometers of the high index dielectric material on at least one of the first and second surfaces of the optical substrate; applying about 153.00 nanometers of the low index dielectric material on at least one of the first and second surfaces of the optical substrate; applying about 103.00 nanometers of the high index dielectric material on at least one of the first and second surfaces of the optical substrate; and applying about 75.00 nanometers of the low index dielectric material on at least one of the first and second surfaces of the optical substrate, whereby the applied dielectric materials enable the first surface to reflect up to 40 percent of the infrared radiation, whereby the applied dielectric materials enable the second surface to transmit about 99 percent of the ultraviolet light in the wavelength range between 300 to 400 nanometers.
2. The method of claim 1, further comprising hand-cleaning the surfaces of the optical substrate.
3. The method of claim 1, further comprising flipping the optical substrate from the first surface to the second surface during application of the dielectric materials.
4. The method of claim 1, wherein the optical substrate comprises a viewing lens.
5. The method of claim 1, further comprising integrating the optical substrate into a device.
6. The method of claim 1, wherein the low index dielectric material comprises SiO.sub.2.
7. The method of claim 6, wherein the SiO.sub.2 comprises a refractive index of 1.46.
8. The method of claim 1, wherein the high index dielectric material comprises ZrO.sub.2.
9. The method of claim 8, wherein the ZrO.sub.2 comprises a refractive index of 2.06.
10. The method of claim 1, wherein the high index dielectric material comprises Indium Zinc Oxide.
11. The method of claim 1, wherein the dielectric materials are applied with a thin film deposition mechanism.
12. The method of claim 11, wherein the thin film deposition mechanism comprises an electron beam evaporation and a magnetron reactive sputtering.
13. A method of coating a thin film optical lens, the method comprising: providing an optical substrate, the optical substrate comprising a first surface and an opposing second surface, the first surface being operable to at least partially reflect infrared radiation, the second surface being operable to at least partially transmit ultraviolet light in the wavelength range between 300 to 400 nanometers; hand-cleaning the surfaces of the optical substrate; applying SiO.sub.2 and ZrO.sub.2 on at least one of the first and second surfaces of the optical substrate, the SiO.sub.2 and the ZrO.sub.2 being applied in the following order: applying about 145.00 nanometers of the SiO.sub.2 on at least one of the first and second surfaces of the optical substrate; applying about 15.00 nanometers of the ZrO.sub.2 on at least one of the first and second surfaces of the optical substrate; applying about 17.00 nanometers of the SiO.sub.2 on at least one of the first and second surfaces of the optical substrate; applying about 104.50 nanometers of the ZrO.sub.2 on at least one of the first and second surfaces of the optical substrate; applying about 153.00 nanometers of the SiO.sub.2 on at least one of the first and second surfaces of the optical substrate; applying about 103.00 nanometers of the ZrO.sub.2 on at least one of the first and second surfaces of the optical substrate; applying about 75.00 nanometers of the SiO.sub.2 on at least one of the first and second surfaces of the optical substrate; and flipping the optical substrate from the first surface to the second surface during application of the dielectric materials, whereby the applied dielectric materials enable the first surface to reflect up to 40 percent of the infrared radiation, whereby the dielectric materials enable the second surface to transmit about 99 percent of the ultraviolet light in the wavelength range between 300 to 400 nanometers.
14. The method of claim 13, further comprising integrating the optical substrate into a viewing device.
15. The method of claim 13, wherein the SiO.sub.2 comprises a refractive index of 1.46.
16. The method of claim 13, wherein the ZrO.sub.2 comprises a refractive index of 2.06.
17. The method of claim 13, further comprising a step of applying Indium Zinc Oxide on at least one of the first and second surfaces of the optical substrate.
18. The method of claim 13, wherein the dielectric materials are applied with a thin film deposition mechanism.
19. The method of claim 18, wherein the thin film deposition mechanism comprises an electron beam evaporation and a magnetron reactive sputtering.
20. A thin film optical lens, the lens comprising: an optical substrate comprising a first surface and an opposing second surface, the first surface being operable to at least partially reflect infrared radiation, the second surface being operable to at least partially transmit ultraviolet light in the wavelength range between 300 to 400 nanometers; a cleaner operable to clean the surfaces of the optical substrate; and a low index dielectric material comprising SiO.sub.2; and a high index dielectric material comprising ZrO.sub.2 or Indium Zinc Oxide, whereby the dielectric materials are applied on at least one of the first and second surfaces of the optical substrate in the following order: about 145.00 nanometers of the low index dielectric material, about 15.00 nanometers of the high index dielectric material, about 17.00 nanometers of the low index dielectric material, about 104.50 nanometers of the high index dielectric material, about 153.00 nanometers of the low index dielectric material, about 103.00 nanometers of the high index dielectric material, about 75.00 nanometers of the low index dielectric material, whereby the applied dielectric materials enable the first surface to reflect up to 40 percent of the infrared radiation, whereby the dielectric materials enable the second surface to transmit about 99 percent of the ultraviolet light in the wavelength range between 300 to 400 nanometers.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0038] The invention will now be described, by way of example, with reference to the accompanying drawings, in which:
[0039]
[0040]
[0041]
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[0043]
[0044]
[0045]
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[0047] Like reference numerals refer to like parts throughout the various views of the drawings.
DETAILED DESCRIPTION OF THE INVENTION
[0048] The following detailed description is merely exemplary in nature and is not intended to limit the described embodiments or the application and uses of the described embodiments. As used herein, the word exemplary or illustrative means serving as an example, instance, or illustration. Any implementation described herein as exemplary or illustrative is not necessarily to be construed as preferred or advantageous over other implementations. All of the implementations described below are exemplary implementations provided to enable persons skilled in the art to make or use the embodiments of the disclosure and are not intended to limit the scope of the disclosure, which is defined by the claims. For purposes of description herein, the terms upper, lower, left, rear, right, front, vertical, horizontal, and derivatives thereof shall relate to the invention as oriented in
[0049] A thin film optical lens 100 and method 800 for coating a lens is referenced in
[0050] The dielectric materials 106, 202, 204 that are applied to the surfaces of the optical substrate 102 include a unique combination of low index dielectric materials 106 and high index dielectric materials 202, 204. The dielectric materials are applied in alternating layers on at least one of the surfaces of the optical substrate 102. The method 800 also makes use of a thin film deposition mechanism 300, such as electron beam evaporation and magnetron reactive sputtering to apply the dielectric materials 106, 202, 204.
[0051] Those skilled in the art will recognize that the human eye sees a wide range of light in many spectrum ranges. The most desirable viewing range for humans are the visible ranges in wavelength from approximately 400 nanometers (410.sup.7 mviolet) to 700 nm (710.sup.7 mred). Other light wavelengths can, however, create less desirable ultraviolet light, high-energy light, and infrared radiation. These lights are not efficacious for enhanced viewing. It is also known that the human eye does not perceive the UV wavelengths of light. The method 800 treats an optical substrate 102 to create a novel thin film optical lens designed to reduce infrared radiation, block HEV light transmission, increase visible light transmission, and eliminate backside ultraviolet reflection.
[0052] Looking now at
[0053] In one possible embodiment, the optical substrate 102 comprises a first surface 104 and an opposing second surface 200. The optical substrate 102 also has an edge, of varying thicknesses, that forms a perimeter nexus between the first and second surfaces 104, 200. The surfaces 104, 200 are treated by coating with varying thicknesses of dielectric materials 106, 202, 204 independently of each other, so as to achieve a desired light reflection or transmission characteristic.
[0054] As
[0055] In some embodiments, the method 800 coats the optical substrate 102 with a low index dielectric material 106 and/or a high index dielectric material 202 on at least one of the surfaces 104, 200, or possibly both surfaces simultaneously. The dielectric materials may include substances that are poor conductor of electricity, but also possess the characteristics of supporting electrostatic fields. The low index dielectric material 106 and the high index dielectric material 202 are layered onto the first and second surfaces 104, 200 in varying thicknesses (nanometer thickness). In any case, different variations of nanometer thickness, low index dielectric material 106, and high index dielectric material 202 may also be used.
[0056] In one non-limiting embodiment, the low index dielectric material 106 is SiO.sub.2. In some embodiments, the low index dielectric material 106 is a material having a low refractive index, indicating the speed through which light passes therethrough. For example, the low index material has a refractive index of about 1.46. In one non-limiting embodiment, the high index dielectric material 202 is ZrO.sub.2, or in alternative embodiments, Indium Zinc Oxide 204. The high index dielectric material 202 is a material having a high refractive index, which is an indication of the speed through which light passes through the optical substrate 102. In one non-limiting embodiment, the high index material has a refractive index of 2.06. In alternative embodiments, additional index dielectric materials that can be applied on the surfaces of the optical substrate 102 may include, without limitation, Ag, Al, Al.sub.2O.sub.3, Au, Fe, Ge, MgF, Ti, TiO.sub.2, and Zn.
[0057] As
[0058] In one non-limiting embodiment, the dielectric materials are applied to at least one of the first and second surfaces 104, 200 in a specific, layered arrangement. After cleaning the surfaces of the optical substrate 102, the layering of dielectric materials is as follows:
[0059] About 145.00 nanometers of the SiO.sub.2 (low index dielectric material 106) is applied to one or both surfaces of the optical substrate 102. Next, a layer of about 15.00 nanometers of the ZrO.sub.2 (high index dielectric material 202) is applied. In alternative embodiments, Indium Zinc Oxide 204 (IZO) can be used instead of, or in conjunction with, the ZrO.sub.2. Continuing with the application of the dielectric material through the thin film deposition mechanism 300, about 17.00 nanometers of the SiO.sub.2 is applied. An additional layer includes about 104.50 nanometers of the ZrO.sub.2 material. Continuing with the layering, about 153.00 nanometers of the SiO.sub.2 is next applied to at least one of the surfaces. The method 800 then requires that about 103.00 nanometers of the ZrO.sub.2 material is applied. Finally, about 75.00 nanometers of the SiO.sub.2 material is applied. While the following thicknesses of low and high index materials are listed, the thicknesses of dielectric materials may be increased or decreased to accommodate different types of optical substrates.
[0060] As a result of this novel application/coating process, the first surface 104 of the optical substrate 102 reflects up to 40% of the infrared radiation, serving to enhance viewing through the optical substrate 102. It is advantageous to reflect as much infrared radiation as possible for optimal viewing through the optical substrate 102.
[0061] Also, the view-enhancing ultraviolet light in the 300-400 nm range is transmitted up to 99% through the optical substrate 102.
[0062] Furthermore, the layered application of the low and high index dielectric materials 202 enables the second surface 200 of the optical substrate 102 to transmit up to 99% of the ultraviolet light in the wavelength range between 300 to 400 nanometers. In this manner, the dielectric materials substantially eliminate reflection of ultraviolet light (300-400 nm) off the surface of the optical substrate 102 into the eye by allowing the ultraviolet light to be transmitted and absorbed by the optical substrate 102 itself. Thus, in the visible spectrum, the layering of dielectric materials increases light transmission to the eye by reducing the surface reflection to approximately 1%. In other words, only 1% of ultraviolet light is blocked by the treated optical substrate 102. This effect on ultraviolet light can be advantageous for enhancing viewing through the optical substrate 102.
[0063] In a graphical illustration of the enhanced viewing, a reflectance spectrum graph 400 for the optical substrate 102 references the amount and effects of the dielectric materials on the optical substrate 102 (See
[0064] As Table 500 in
[0065] Another exemplary reflectance graph 600 is shown in
[0066] As Table 700 in
[0067]
[0068] In some embodiments, the method 800 may include an initial Step 802 of providing an optical substrate 102, the optical substrate 102 comprising a first surface 104 and an opposing second surface 200, the first surface 104 being operable to at least partially reflect infrared radiation, the second surface 200 being operable to at least partially transmit ultraviolet light in the wavelength range between 300 to 400 nanometers. Another Step 804 may include cleaning the surfaces of the optical substrate 102. The cleaning may include simple hand-cleaning of the optical substrate 102 with a lens-friendly cloth.
[0069] The method 800 also includes a Step 806 of applying a low index dielectric material 106 and a high index dielectric material 202 on at least one of the first and second surfaces 104, 200 of the optical substrate 102. In one possible embodiment, the low index dielectric material 106 comprises a SiO.sub.2 material having a refractive index of 1.46. In another embodiment, the high index material is a ZrO.sub.2 material, or possibly an Indium Zinc Oxide 204 (IZO) material. The high index material may have a refractive index of 2.06. The low index dielectric material 106 and the high index dielectric material 202 being applied in a unique order.
[0070] For example, a Step 808 of applying about 145.00 nanometers of the low index dielectric material 106 on at least one of the first and second surfaces 104, 200 of the optical substrate 102. A Step 810 comprises applying about 15.00 nanometers of the high index dielectric material 202 on at least one of the first and second surfaces 104, 200 of the optical substrate 102.
[0071] Another Step 812 comprises applying about 17.00 nanometers of the low index dielectric material 106 on at least one of the first and second surfaces 104, 200 of the optical substrate 102. Yet another Step 814 comprises applying about 104.50 nanometers of the high index dielectric material 202 on at least one of the first and second surfaces 104, 200 of the optical substrate 102. Another Step 816 comprises applying about 153.00 nanometers of the low index dielectric material 106 on at least one of the first and second surfaces 104, 200 of the optical substrate 102.
[0072] Yet another Step 818 comprises applying about 103.00 nanometers of the high index dielectric material 202 on at least one of the first and second surfaces 104, 200 of the optical substrate 102. Yet another unique concept of method 800 includes a Step 820, which involves applying about 75.00 nanometers of the low index dielectric material 106 on at least one of the first and second surfaces 104, 200 of the optical substrate 102.
[0073] The application of the low and high index dielectric materials 202 is in an ordered, and specific thickness. Also, the application of dielectric materials is performed through the thin film deposition mechanism 300. As a result of this novel application/coating process, the first surface 104 of the optical substrate 102 reflects up to 40% of the infrared radiation. And further, the second surface 200 of the optical substrate 102 transmits about 99% of the ultraviolet light in the wavelength range between 300 to 400 nanometers.
[0074] Thus, the reflection of a substantial amount of infrared radiation, and the allowance of most of the ultraviolet light in the 300-400 nm range, serve to enhance viewing through the optical substrate 102. This achieves the objective of the present invention, which is to reduce infrared radiation, block HEV light transmission, and reduce backside ultraviolet reflections, while also increasing visible light transmission through an optical substrate 102, such as a viewing lens.
[0075] It is significant to note that the low and high index dielectric materials 202 is applied to one surface, flipping the optical substrate 102 and coating the opposite surface in the same manner, or both sides coated simultaneously. Thus, another Step 822 may include flipping the optical substrate 102 from the first surface 104 to the second surface 200 during application of the dielectric materials. This is the case when either of the dielectric materials is applied to only one of the surfaces. When both the low and high index dielectric materials 202 are applied, however, the optical substrate 102 still requires to be flipped, because the thin film deposition mechanism 300 generally coats layers one side at a time.
[0076] A final Step 824 followed in the method 800 comprises integrating the optical substrate 102 into a viewing device. As discussed above, the reflection of infrared radiation, and the allowance of ultraviolet light in the 300-400 nm range, serve to enhance viewing through the optical substrate 102. Thus, it is advantageous to install the optical substrate 102 into a sight scope, a gun sight, a telescope, a pair of glasses, and a viewing device, for example. The optical lens may, however, be used in any situation that requires viewing through a lens, in general.
[0077] Although the process-flow diagrams show a specific order of executing the process steps, the order of executing the steps may be changed relative to the order shown in certain embodiments. Also, two or more blocks shown in succession may be executed concurrently or with partial concurrence in some embodiments. Certain steps may also be omitted from the process-flow diagrams for the sake of brevity. In some embodiments, some or all the process steps shown in the process-flow diagrams can be combined into a single process.
[0078] In conclusion, the thin film optical lens 100 and method 800 for coating an optical substrate 102 serves to apply alternating layers, with varying thicknesses, of a high index dielectric material 202 and a low index dielectric material 106 on the first and second surfaces 104, 200 of an optical substrate 102. The low and high index dielectric materials 106, 202, 204 are layered through thin film deposition. The low index dielectric material 106 is SiO.sub.2. The high index dielectric material 202 is ZrO.sub.2 and/or Indium Zinc Oxide 204. The spectral results from application of high and low index dielectric materials 106 reduce infrared radiation, block HEV light transmission, and reduce backside ultraviolet reflections, while also increasing visible light transmission through the optical substrate 102. As a result of layering the dielectric materials, the first surface 104 of optical substrate 102 reflects up to 40% of the infrared radiation; and the second surface 200 of optical substrate 102 transmits 99% of ultraviolet light in the wavelength range between 300 to 400 nanometers. Both light effects work to enhance viewing through the optical substrate 102.
[0079] These and other advantages of the invention will be further understood and appreciated by those skilled in the art by reference to the following written specification, claims and appended drawings.
[0080] Because many modifications, variations, and changes in detail can be made to the described preferred embodiments of the invention, it is intended that all matters in the foregoing description and shown in the accompanying drawings be interpreted as illustrative and not in a limiting sense. Thus, the scope of the invention should be determined by the appended claims and their legal equivalence.