Stable Power Modules By Thermoelectric Cooling
20230038175 · 2023-02-09
Inventors
- John E. McConnell (Simpsonville, SC, US)
- John Bultitude (Simpsonville, SC, US)
- Allen Templeton (Simpsonville, SC, US)
Cpc classification
H01G9/0003
ELECTRICITY
H05K7/2039
ELECTRICITY
H01G2/08
ELECTRICITY
H05K2201/066
ELECTRICITY
International classification
Abstract
Provided is an electronic module comprising at least one electronic component. A thermoelectric cooler is in thermal contact with the electronic component. A temperature controller is capable of determining a device temperature of the electronic component is provided and capable of providing current to the thermoelectric cooler proportional to a deviation of the device temperature from an optimal temperature range.
Claims
1. An electronic module comprising: electronic components; a thermoelectric cooler in thermal contact with an electronic component of said electronic components wherein at least one electronic component of said electronic components is a capacitor; a temperature controller capable of determining a device temperature of said capacitor and capable of providing current to said thermoelectric cooler proportional to a deviation of said device temperature from an optimal temperature range wherein a measurement of current of said capacitor correlates to said device temperature.
2. The electronic module of claim 1 wherein said current of said capacitor is measured from one external termination of said capacitor to an external termination of opposite polarity of said capacitor.
3. The electronic module of claim 1 wherein each said electronic component is a capacitor.
4. The electronic module of claim 1 wherein said capacitor is a multilayered ceramic capacitor.
5. The electronic module of claim 1 wherein said capacitor is a film capacitor.
6. The electronic module of claim 1 wherein said capacitor is an electrolytic capacitor.
7. The electronic module of claim 6 wherein said electrolytic capacitor comprises at least one channel with at least one said thermoelectric cooler in said at least one channel.
8. The electronic module of claim 7 wherein said at least one channel is a mandrel.
9. The electronic module of claim 1 comprising additional electronic components in thermal contact with said thermoelectric cooler.
10. The electronic module of claim 1 comprising additional thermoelectric coolers in thermal contact with said electronic component.
11. The electronic module of claim 1 comprising additional electronic components.
12. The electronic module of claim 11 wherein each said electronic component of said electronic components is a multi-layered ceramic capacitor.
13. The electronic module of claim 1 wherein said electronic module further comprises a sensor selected from the group consisting of a varistor, a resistive temperature detector, a thermistor, an infrared detector, a bi-metallic sensor, a silicone diode, a semiconductor with temperature sensitive voltage vs. current, a thermocouple and an optical sensor.
14. The electronic module of claim 1 wherein said current provided to said thermoelectric cooler proportionally lowers said device temperature.
15. The electronic module of claim 1 wherein said current provided to said thermoelectric cooler proportionally raises said device temperature.
16. The electronic module of claim 1 further comprising a circuit board.
17. The electronic module of claim 16 wherein at least a portion of said temperature controller is mounted to said circuit board.
18. The electronic module of claim 16 wherein said circuit board comprises an inorganic material selected from the group consisting of a ceramic; G10; an FR material; a Composite Epoxy Material (CEM), insulated metal substrate, and flexible substrate.
19. The electronic module of claim 18 wherein said circuit board comprises a material selected from the group consisting of alumina; aluminum nitride; silicon nitride and beryllium oxide.
20. The electronic module of claim 16 wherein said circuit board comprises a material selected from the group consisting of organic materials FR 1, FR 2, FR 3, FR 4, FR 5, FR 6, CEM 1, CEM 2, CEM 3, CEM 4, CEM 5 and polyimide.
21. The electronic module of claim 16 wherein said electronic component is between said circuit board and said thermoelectric cooler.
22. The electronic module of claim 16 wherein said thermoelectric cooler is between said circuit board and said electronic component.
23. The electronic module of claim 1 further comprising an overmolding over at least a portion of said electronic module.
24. The electronic module of claim 1 further comprising a heat sink in thermal contact with said thermoelectric cooler.
25. The electronic module of claim 24 wherein said heat sink is in thermal contact with said thermoelectric cooler opposite said electronic component.
26. A method for controlling a device temperature of a capacitor comprising: forming an electronic module comprising at least one capacitor wherein said capacitor comprises an optimal temperature range; placing a thermoelectric cooler in thermal contact with said capacitor; and providing a thermal controller comprising a temperature sensor capable of predicting said device temperature of said capacitor by measuring a secondary parameter of said capacitor wherein said secondary parameter is selected from current, resistance and capacitance and wherein said secondary parameter correlates to said device temperature; and providing a current to said thermoelectric cooler wherein said current is proportional to a deviation of said device temperature from said optimal temperature range.
27. The method for controlling a device temperature of a capacitor of claim 26 wherein said secondary parameter is measured from one external termination of said capacitor to an external termination of opposite polarity of said capacitor.
28. The method for controlling a device temperature of a capacitor of claim 26 wherein said capacitor is a multilayered ceramic capacitor.
29. The method for controlling a device temperature of a capacitor of claim 26 wherein said capacitor is a film capacitor.
30. The method for controlling a device temperature of a capacitor of claim 26 wherein said capacitor is an electrolytic capacitor.
31. The method for controlling a device temperature of a capacitor of claim 30 wherein said electrolytic capacitor comprises at least one channel with at least one said thermoelectric cooler in said at least one channel.
32. The method for controlling a device temperature of a capacitor of claim 31 wherein said at least one channel is a mandrel.
33. The method for controlling a device temperature of a capacitor of claim 26 comprising multiple electronic components in thermal contact with said thermoelectric cooler.
34. The method for controlling a device temperature of a capacitor of claim 26 comprising multiple thermoelectric coolers in thermal contact with said capacitor.
35. The method for controlling a device temperature of a capacitor of claim 26 wherein said electronic module further comprises at least one additional multi-layered ceramic capacitor.
36. The method for controlling a device temperature of a capacitor of claim 26 wherein said current provided to said thermoelectric cooler proportionally lowers said device temperature.
37. The method for controlling a device temperature of a capacitor of claim 26 wherein said current provided to said thermoelectric cooler proportionally raises said device temperature.
38. The method for controlling a device temperature of a capacitor of claim 26 wherein said electronic module further comprising a circuit board.
39. The method for controlling a device temperature of a capacitor of claim 38 wherein at least a portion of said temperature controller is mounted to said circuit board.
40. The method for controlling a device temperature of a capacitor of claim 39 wherein said thermoelectric cooler is between said capacitor and said circuit board.
41. The method for controlling a device temperature of a capacitor of claim 38 wherein said circuit board comprises an inorganic material selected from the group consisting of a ceramic; G10; an FR material; a Composite Epoxy Material (CEM), insulated metal substrate and flexible circuits.
42. The method for controlling a device temperature of a capacitor of claim 41 wherein said circuit board comprises a material selected from the group consisting of alumina; aluminum nitride; silicon nitride and beryllium oxide.
43. The method for controlling a device temperature of a capacitor of claim 41 wherein said material is selected from the group consisting of FR 1, FR 2, FR 3, FR 4, FR 5, FR 6, CEM 1, CEM 2, CEM 3, CEM 4, CEM 5, 96% AI.sub.2O.sub.3 and 99.6% AI.sub.2O.sub.3.
44. The method for controlling a device temperature of a capacitor of claim 38 wherein said capacitor is between said circuit board and said thermoelectric cooler.
45. The method for controlling a device temperature of a capacitor of claim 38 wherein said thermoelectric cooler is between said circuit board and said capacitor.
46. The method for controlling a device temperature of a capacitor of claim 26 wherein said electronic module further comprises an overmolding over at least a portion of said electronic module.
47. The method for controlling a device temperature of a capacitor of claim 26 wherein said electronic module further comprises a heat sink in thermal contact with said thermoelectric cooler.
48. The method for controlling a device temperature of a capacitor of claim 47 wherein said heat sink is in thermal contact with said thermoelectric cooler opposite said capacitor.
49. An electronic module comprising: electronic components; a thermoelectric cooler in thermal contact with an electronic component of said electronic components wherein at least one electronic component of said electronic components is a capacitor; a temperature controller capable of determining a device temperature of said capacitor and capable of providing current to said thermoelectric cooler proportional to a deviation of said device temperature from an optimal temperature range wherein said device temperature is determined by a predictive method by a measurement of a secondary parameter of said capacitor wherein said secondary parameter correlates to said device temperature and wherein said secondary parameter is selected from the group consisting of current and resistance.
50. The electronic module of claim 49 wherein said secondary parameter is measured from one external termination of said capacitor to an external termination of opposite polarity of said capacitor.
Description
BRIEF DESCRIPTION OF DRAWINGS
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[0033]
DESCRIPTION
[0034] The present invention is related to an improved electronic module preferably comprising a capacitor which is thermally stabilized by an integral thermoelectric cooler. In particular the present invention is related to an improved electronic module comprising a multilayered ceramic capacitor (MLCC), electrolytic capacitor or film capacitor which is thermally stabilized by an integral thermoelectric cooler More specifically, the present invention allows an MLCC, electrolytic, or film capacitor or an electronic module to be maintained within a predetermined temperature range thereby improving the functionality of the capacitor and module comprising the capacitor.
[0035] A thermoelectric cooler (TEC) is a solid-state device, based on an application of Peltier Effect, which functions as a solid-state heating or cooling generator based on semi-conductor technology. When current is passed through a TEC one side becomes hot while the other side becomes cold and when the current flow is reversed the hot and cold sides flip positions thus creating a solid-state heater or cooler having no moving parts. When multiple blocks of this material are connected in series circuit, the heat generation or cooling effect can be increased by stacking the TEC with the hot side of one TEC in contact with the cold side of a second TEC.
[0036] The application described herein provides an electronic module utilizing TEC’s with temperature feedback to one or multiple electronic components, preferably MLCC’s, that will maintain an optimum operating temperature range. The electronic component and TEC are in thermal contact defined herein as a relationship wherein the TEC can heat or cool the capacitor in response to a current applied to the TEC. When the capacitor element is being used in a resonator circuit it is particularly essential to maintain a tight control of capacitance which in many capacitors requires a narrow range of temperature to be maintained. The TEC allows the capacitor temperature to be controlled within a narrow range by either heating or cooling.
[0037] Certain dielectrics used in MLCC’s have specific dielectric properties that provide optimal capacitance properties for an MLCC. However, some dielectrics are sensitive to heat and a decrease in their capacitance can occur as the temperature of the MLCC increases. In these instances, it becomes desirable to maintain an optimum component temperature thereby allowing the component to operate at its maximum capacitance capability. This is particularly an issue with MLCC’s wherein the capacitance is temperature sensitive. Temperature control can be achieved by mounting the electronic component to the TEC and utilizing surface mounted circuitry as described in U.S. Pat. No. 8,904,609, which is incorporated herein by reference, to incorporate a temperature sensing closed loop control circuit within the envelope of the electronic component.
[0038] The temperature can be determined by a predictive method, a direct method or a combination thereof. A predictive method would include a determination of temperature based on the direct measurement of a secondary parameter through and/ or across the external terminations of a capacitor from one external termination of the capacitor to an external termination of opposite polarity wherein the secondary parameter correlates to temperature such as current, resistance or capacitance. A direct method is a measurement of temperature by a temperature sensor which can be a contact sensor or a remote sensor. Sensors which can be employed for a direct method of measurement include a varistor, resistive temperature detector, thermistor, infrared detector, bi-metallic sensor, silicon diode, semiconductor with temperature sensitive voltage vs. current, thermocouple, optical sensor or any other temperature sensing device capable of sensing the temperature of the electronic component or environment within which the electronic component resides. It is preferable that the direct measurement be an integral part of the temperature control circuit wherein the temperature control circuit varies the current flow to the TEC, thus, heating or cooling the electronic component to maintain an operating temperature within a preferred operating temperature range. The application of utilizing the TEC as a temperature controller can be utilized for many capacitor assembly designs and may include additional components.
[0039] In a particularly preferred embodiment a combination of predictive and direct temperature sensors can be employed. Based on parameters monitored by the predictive method the TEC may be activated before a temperature change can be detected by direct methods and before a threshold temperature is achieved and the current to the TEC may be proportional to the temperature difference relative to a predetermined temperature or temperature range thereby allowing for proportional temperature correction. The direct temperature method can provide redundancy or confirmation of the temperature of the electronic component. Alternatively, the direct temperature method may be monitored for determination of a threshold temperature above which a predictive method is monitored for effectiveness of temperature alteration by the TEC.
[0040] The invention will be described with reference to the figures forming an integral component of the instant disclosure without limit thereto. Throughout the various figures similar elements will be numbered accordingly.
[0041] An embodiment of the invention is illustrated in schematic perspective view in
[0042] An embodiment of the invention will be illustrated with reference to
[0043] An embodiment of the invention is illustrated in perspective schematic view in
[0044] An embodiment of the invention is illustrated in schematic view in
[0045] An electrolytic capacitor is illustrated in schematic perspective view in
[0046] An embodiment of the invention is illustrated in cross-sectional schematic view in
[0047] The shape of the channel is not limited with the proviso that it is preferable to maximize the contact area between the TEC and channel and therefore flattened portions are preferred.
[0048] An embodiment of the invention is illustrated in an electrical schematic view in
[0049] In operation, if the temperature sensor senses a resistance, current or capacitance consistent with a temperature of the component which is outside a predetermined optimal temperature range an appropriate signal is relayed to the temperature control circuit and the appropriate current is applied to the TEC thereby returning the component to a temperature within the predetermined range as determined by the resistance, current or capacitance of the component as measured across the external terminations. As would be realized the temperature of the component can be raised or lowered with a preference for lowering the temperature particularly when the component is a capacitor.
[0050] Thermoelectric materials are typically fabricated from bismuth telluride (Bi.sub.2Te.sub.3), antimony telluride (Sb.sub.2Te.sub.3), lead telluride (PbTe) or alloys thereof such as Bi.sub.0.5Sb.sub.1.5Te.sub.3 which is typically capable of achieving temperature change of about 81 K at a near ambient temperature of 300 K.
[0051] TEC’s are commercially available in a variety of sizes and configurations from various companies including Marlow Industries, Inc. of Dallas, TX. The TEC is preferably mounted to either the electronic component or circuit board by thermal epoxy, soldering, TLPS or by compression methods using thermal grease. It is preferably to control the TEC using linear proportional temperature control.
[0052] The circuit board preferably comprises a material selected from the group consisting of ceramic such as alumina such as 96% AI.sub.2O.sub.3 or 99.6 % AI.sub.2O.sub.3; aluminum nitride; silicon nitride or beryllium oxide; G10; FR (Flame Retardant) materials such as FR 1-6, FR 4 which is a composite of epoxy and glass, FR2 utilizing phenolic paper or phenolic cotton and paper; Composite Epoxy Materials (CEM) such as CEM 1, 2, 3, 4, 5; insulated metal substrates such as aluminum substrates available from Berquist Mfg. and flex circuits comprising materials such as polyimide.
[0053] The change in internal resistance (IR) as a function of temperature at 25 V DC bias as measured across the capacitor from one external termination to the external termination of opposite polarity is illustrated graphically in
[0054] Current and resistance at a fixed voltage are inversely proportional based on Ohms Law. Therefore, with reference to
[0055] The change in relative capacitance variation relative to a reference capacitor at 25° C. as a function of temperature is illustrated graphically with, and without, 25 V bias in
EXAMPLES
Example 1
[0056] A test fixture was prepared comprising a TEC mounted to a Low R-theta, such as less than 1° C./watt, heat sink on one side and on the other side a stack of commercially available 3640 C0G capacitors available from KEMET having a capacitance of 0.056 .Math.F, a rated voltage of 1000 volts and a nominal size of 9.1 mm × 10.2 mm × 2.7 mm. A 50.8 mm × 25.4 mm FR4 substrate with copper pads was mounted to the capacitor stack opposite the TEC. A power amplifier having a circuit as illustrated schematically in
[0057] The effects of the TEC on the temperature of ten MLCC’s mounted in series is provide in Table 1 measured at a frequency of 563 kHz and an ESR of 1 mΩ wherein at a given AC RMS current (I), dissipated power (DP) in watts, the termination temperature without the TEC energized (Temp 1) the TEC voltage (TEC-V), and TEC current (TEC-I) required to achieve the stated cooled temperature (Temp 2) and the TEC Power (TEC-P) in watts is provided.
TABLE-US-00001 I (A RMS) Temp 1 (°C) DP (W RMS) TEC-V (Vdc) TEC-I (A dc) Temp 2 (°C) TEC-P (Wdc) 0 24 0 10 29 0.1 0.6 0.22 24 0.132 15 35 0.225 1.2 0.44 25 0.528
[0058] As evidenced in Table 1, as the temperature of the MLCC’s increases the dissipated power increases as the temperature can be lowered by the use of a TEC in thermal contact with the MLCC.
Example 2
[0059] The test fixture of Example 1 was loaded with a stack of two commercially available 2220 X7R MLCC capacitors available from KEMET having a capacitance of 0.47 .Math.F, a rated voltage of 50 volts and a nominal size of 5.70 mm × 5.00 mm × 1.85 mm. The effects of the TEC on the performance of the two MLCC’s mounted in series is provide in Table 2 measured at a frequency of 28 kHz and an ESR of 4 mΩ wherein at a given AC RMS current (I), dissipated power (DP) in watts, the termination temperature without the TEC energized (Temp 1) the TEC voltage (TEC-V), and TEC current (TEC-I) required to achieve the stated cooled temperature (Temp 2) are reported. Capacitance Change with Reference to +25° C. and 0 VDC Applied (TCC) as a function of temperature (°C) for a single 2220 X7R MLCC capacitor is provided in Table 3
TABLE-US-00002 I (A RMS) Temp 1 (°C) DP (W RMS) TEC-V (V dc) TEC-I (A de) Temp 2 (°C) 10 40 0.40 2 0.73 27 12 50 0.60 3.5 1.3 30
TABLE-US-00003 Temperature (°C) TCC (%) -55 -4.73 -35 -2.62 -15 -1.50 5 -0.69 25 0.00 45 0.08 65 -1.825 85 -4.393 105 -6.103 125 -6.464 150 -25.343
[0060] As evidenced in Table 3, the temperature coefficient of capacitance for this representative capacitor reaches a threshold temperature at about 125° C. resulting in a significant decrease in capacitance. By maintaining the temperature of the MLCC within a predetermined optimal temperature range which is the range between a low temperature where capacitance changes to an unacceptable amount to a high temperature which is below the temperature at which thermal run-away can occur. By maintaining the temperature within the optimum temperature range thermal run-away can be avoided thereby providing a safer electronic component and ultimately a safer electronic device.
[0061] The invention has been described with reference to the preferred embodiments without limit thereto. Additional embodiments and improvements may be realized which are not specifically set forth herein but which are within the scope of the invention as more specifically set forth in the claims appended hereto.