METHOD FOR MANUFACTURING ELECTRICAL INTERCONNECTION STRUCTURE
20180013251 ยท 2018-01-11
Inventors
- Yeong Uk SEO (Bundang-gu, Seongnam-si, KR)
- Yeong Joo MOON (Jungwon-gu. Seongnam-si, KR)
- Chong Kwang YOON (Sujeong-gu, Seongnam-si, KR)
- Young Soo KIM (Jungwon-gu, Seongnam-si, KR)
Cpc classification
H01R12/59
ELECTRICITY
H05K2203/308
ELECTRICITY
H05K3/4092
ELECTRICITY
H05K2201/0367
ELECTRICITY
H01L25/50
ELECTRICITY
H01L2225/06513
ELECTRICITY
H01R12/73
ELECTRICITY
H01L24/00
ELECTRICITY
H01L23/498
ELECTRICITY
H05K2201/0311
ELECTRICITY
H05K3/326
ELECTRICITY
H01L23/49811
ELECTRICITY
H01L2924/19104
ELECTRICITY
H01L2224/16227
ELECTRICITY
H01L2224/16237
ELECTRICITY
H01L2225/06541
ELECTRICITY
International classification
H01R43/00
ELECTRICITY
H01R12/59
ELECTRICITY
Abstract
Provided is a method of manufacturing an electrical connection structure which includes a female connection structure having an inner conductive material inside an insertion hole of a female connection member, and a male connection structure having a conductive column configured to be inserted into and fixed to the insertion hole to be in contact with the inner conductive material, and formed to protrude from a male connection member. The method includes preparing insulating members used for the female connection member and the male connection member, and forming the inner conductive material and the column by patterning a conductive material on each of the insulating member using a photolithography process.
Claims
1. A method of manufacturing an electrical connection structure which includes a female connection structure having an inner conductive material inside an insertion hole of a female connection member, and a male connection structure having a conductive column configured to be inserted into and fixed to the insertion hole to be in contact with the inner conductive material, and formed to protrude from a male connection member, comprising: preparing insulating members used for the female connection member and the male connection member; and forming the inner conductive material and the column by patterning a conductive material on each of the insulating members using a photolithography process.
2. The method of claim 1, wherein the female connection structure is manufactured by the following processes: forming the insertion hole in the insulating member; stacking an electrode layer and a first dry film on the insulating member; forming a pattern hole having a shape corresponding to the insertion hole in the first dry film using a photolithography process; filling the insertion hole with a conductive material using an electrical plating process; and forming the inner conductive material by etching the conductive material in the insertion hole.
3. The method of claim 2, wherein a structure configured to form a pad connected to the inner conductive material is electrically plated at the same time when the inner conductive material is electrically plated.
4. The method of claim 1, wherein the male connection structure is manufactured by following processes: stacking an electrode layer and a second dry film on the insulating member; forming a column hole in the second dry film using a photolithography process; and forming the column by filling the column hole with a conductive material using an electrical plating process.
5. The method of claim 4, wherein the male connection structure is manufactured by adding following processes: stacking a third dry film and a fourth dry film on both sides surfaces of the insulating member before stacking the second dry film; forming a pattern hole for forming a pad in the third dry film and the fourth dry film using a photolithography process; and forming the pad by filling the pattern hole in the third dry film and the fourth dry film with a conductive material using an electrical plating process.
6. The method of claim 4, wherein the male connection structure is manufactured by adding following processes: stacking a fifth dry film to cover the column; forming a pattern hole having a shape corresponding to an elastic fin in the fifth dry film using a photolithography process; and forming the elastic fin by filling the pattern hole in the fifth dry film with a conductive material using an electrical plating process.
7. The method of claim 4, wherein the male connection structure is manufactured by adding following processes: stacking an elastic fin separately manufactured on the column.
8. A method of manufacturing an electrical connection structure which includes a female connection structure having an inner conductive material inside an insertion hole of a female connection member, and a male connection structure having a conductive column configured to be inserted into and fixed to the insertion hole to be in contact with the inner conductive material, formed to protrude from a male connection member, and having an elastic fin around the column, wherein the male connection structure is manufactured by following processes: preparing a metal plate used for the elastic fin; forming the column on the metal plate using a photolithography process and a plating process; and stacking an insulating member used for the male connection member on the column.
9. The method of claim 1, wherein the female connection member or the male connection member includes at least one of an active device, a passive device, a connector for electrical connection, a semiconductive material chip package, an interposer applied to a semiconductive material package, a semiconductive material chip and package having a three dimensional multilayered structure, and a multilayered ceramic capacitor.
10. The method of claim 2, wherein the female connection member or the male connection member includes at least one of an active device, a passive device, a connector for electrical connection, a semiconductive material chip package, an interposer applied to a semiconductive material package, a semiconductive material chip and package having a three dimensional multilayered structure, and a multilayered ceramic capacitor.
11. The method of claim 3, wherein the female connection member or the male connection member includes at least one of an active device, a passive device, a connector for electrical connection, a semiconductive material chip package, an interposer applied to a semiconductive material package, a semiconductive material chip and package having a three dimensional multilayered structure, and a multilayered ceramic capacitor.
12. The method of claim 4, wherein the female connection member or the male connection member includes at least one of an active device, a passive device, a connector for electrical connection, a semiconductive material chip package, an interposer applied to a semiconductive material package, a semiconductive material chip and package having a three dimensional multilayered structure, and a multilayered ceramic capacitor.
13. The method of claim 5, wherein the female connection member or the male connection member includes at least one of an active device, a passive device, a connector for electrical connection, a semiconductive material chip package, an interposer applied to a semiconductive material package, a semiconductive material chip and package having a three dimensional multilayered structure, and a multilayered ceramic capacitor.
14. The method of claim 6, wherein the female connection member or the male connection member includes at least one of an active device, a passive device, a connector for electrical connection, a semiconductive material chip package, an interposer applied to a semiconductive material package, a semiconductive material chip and package having a three dimensional multilayered structure, and a multilayered ceramic capacitor.
15. The method of claim 7, wherein the female connection member or the male connection member includes at least one of an active device, a passive device, a connector for electrical connection, a semiconductive material chip package, an interposer applied to a semiconductive material package, a semiconductive material chip and package having a three dimensional multilayered structure, and a multilayered ceramic capacitor.
16. The method of claim 8, wherein the female connection member or the male connection member includes at least one of an active device, a passive device, a connector for electrical connection, a semiconductive material chip package, an interposer applied to a semiconductive material package, a semiconductive material chip and package having a three dimensional multilayered structure, and a multilayered ceramic capacitor.
Description
DESCRIPTION OF DRAWINGS
[0022]
[0023]
[0024]
[0025]
[0026]
[0027]
[0028]
MODES OF THE INVENTION
[0029] An electrical connection structure disclosed in the present invention is a concept which covers all structures for electrical connecting between printed circuit boards applied to all types of electronic devices such as all types of mobile phones, display devices and the like, and electronic devices mounted on the printed circuit board, and a printed circuit board and electrical components. The electrical connection structure is capable of being applied to electronic devices such as all types of mobile phone, and display devices, and in this case, an electrical connection structure of the present invention may be provided in a housing configured to form an appearance of an electronic device. One exemplary embodiment of this may be an electrical connection structure between a printed circuit board installed in a housing and electronic components mounted thereon.
[0030] Hereinafter, a detachable electrical connection structure related to the present invention will be described in detail with reference to accompanying drawings.
[0031]
[0032] As illustrated in
[0033] The female connection structure 100 and the male connection structure 200 may be formed in the printed circuit board or may be a stand-alone component configured to be mounted on a printed circuit board. For example, the female connection structure 100 or the male connection structure 200 may include at least one of an active device, a passive device, a connector, an interposer applied to a semiconductive material package, a semiconductive material chip package, a semiconductive material chip and package having a three dimensional multilayered structure, and a multilayered ceramic capacitor.
[0034] The female connection structure 100 includes a female connection member 110 having insertion holes 113, and inner conductive materials 120 provided in the insertion holes 113.
[0035] The female connection member 110 may be formed of an insulating material, or a combination of an insulating material and a conductive material. A raw material of the female connection member 110 may be one or a combination of more than one of a ceramic, a polymer, silicon, glass, a metal and the like.
[0036] The inner conductive material 120 is provided on an inner wall of an insertion hole 113 formed in the female connection member 110. According to an exemplary embodiment of the present invention insertion, the insertion hole 113 may have a shape resulting from recessing a surface (a lower surface in
[0037] The inner conductive material 120 may have a shape stacked on the inner wall of the insertion hole 113 at a predetermined thickness. According to an exemplary embodiment of the present invention the inner conductive material 120 is formed along an edge of the inner wall of the insertion hole 113.
[0038] The male connection structure 200 includes a male connection member 210, columns 220 protruding from the male connection member 210, and elastic fins 230 extending toward an outer direction from the column 220.
[0039] As in the female connection member 110, the male connection member 210 may be formed of an insulating material, or a combination of an insulating material and a conductive material.
[0040] The column 220 includes a conductive material and a structure protruding from the male connection member 120. In the exemplary embodiment of the present invention, as an example, the column 220 is mounted on a pad 240 connected to a circuit pattern of the male connection member 210.
[0041] The entire column 220 may be formed of a conductive material, or an outside surface thereof may be formed of a conductive material and an inside thereof may be formed of an insulating material. As one example of the latter, the inside of the column 220 may be formed of a polymer, silicon, glass and the like, and only the outside surface thereof may be formed of the conductive material. As illustrated in
[0042] The inner conductive material 120 and the column 220 may be disposed in an array shape on the female connection member 110 and the male connection member 210. For example, it is possible for the inner conductive material 120 and the column 220 to be disposed in a matrix shape having a predetermined number of columns and rows, or other various shapes.
[0043]
[0044] The elastic fin 230 has a surface having a conductive material and configured to extend outside the column 220. The elastic fin 230 is configured to elastically contact the inner conductive material 120 by being elastically deformed when the column 220 is inserted into the insertion hole 113.
[0045] The elastic fins 230 may be bent in a direction opposite to an insertion direction of the column 220 when the column 220 is inserted into the insertion hole 113, and may have an integrated structure with the column 220 or have a configuration in which an additional layer is stacked on an upper surface of the column 220.
[0046] The elastic fin 230 may be formed of a conductive material (for example, a metal) capable of being elastically deformed, or may be formed by a surface of an elastic material (for example, a polymer, a fiber) being coated with a conductive material (for example, a metal).
[0047] It is preferable to form the elastic fins 230 as a plurality so as to be in contact with a plurality of areas of the inner conductive material 120, and as illustrated in
[0048] The female connection member 110 and the male connection member 210 respectively include a first connection portion and a second connection portion, and may respectively have a plurality of numbers thereof. The first connection portion and the second connection portion refer to objects configured to be electrically connected by a connection between the female connection member 110 and the male connection member 210, and examples thereof may include pads, circuit patterns, bumps, solder balls, via holes and the like.
[0049] According to an exemplary embodiment of the present invention, a pad 130 formed on upper surface of the female connection member 110 is provided as one example of the first connection portion, and a pad 250 formed on a lower surface of the male connection member 210 is provided as one example of the second connection portion.
[0050] The inner conductive material 120 formed of a conductive material (for example, a metal) is electrically connected to the first connection portion, and as an example, the inner conductive material 120 in
[0051] The column 220 is electrically connected to the second connection portion of the male connection member 210, the pad 250 of the lower surface of the male connection member 210 is capable of being electrically connected through a conductive structure such as a pad 240 of an upper surface of the male connection member 210 and a via hole.
[0052] Hereinafter, an operation state of an electrical connection structure of the present invention.
[0053] From a state in which the female connection structure 100 and the male connection structure 200 are separated from each other as illustrated in
[0054] Meanwhile, as the elastic fin 230 electrically connected to the second connection portion of the male connection member 210 is in contact with the inner conductive material 120 electrically connected to the first connection portion of the female connection member 110, it is possible to electrically connect the first connection portion and the second connection portion.
[0055] As described above, an additional physical coupling structure is not required due to implementing an electrical connection structure and a physical coupling structure together, and there is advantage in that a total thickness of the electrical connection structure is capable of being decreased by implementing the electrical connection structure in a horizontal contact structure at an inside of the female connection member 110. In addition, there are advantages in that an electrical signal speed may be increased by implementing the electrical connection structure in a low height and nearly linear structure, and a signal quality may be increased by reducing a signal loss.
[0056] Meanwhile, even though a structure in which the elastic fin 230 is provided on an outside surface of the column 220 is described as a structure of the male connection structure 200, a structure is possible in which the elastic fin 230 is not provided, and the column 220 is inserted into and coupled to the insertion hole 113, and the column 220 is in directly contact with the inner conductive material 120.
[0057] Hereinafter, a method of manufacturing an electrical connection structure according to an exemplary embodiment of the present invention will be described with reference to
[0058] A method of manufacturing an electrical connection structure according to the present invention includes an process of preparing insulating members 101 and 201 used for the female connection member 110 and the male connection member 210, and an process of forming the inner conductive material 120 and the column 220 by patterning a conductive material on each of the insulating members 101 and 201 using a photolithography process.
[0059] Hereinafter, each of manufacturing processes of the female connection structure 100 and the male connection structure 200 will be described in detail.
[0060]
[0061] As illustrated in
[0062] Then, an electrode layer 102 is stacked as illustrated in
[0063] Next, as illustrated in
[0064] At this time, another dry film 103 is adhered to a side opposite to the insertion hole 113, a pattern hole 133 corresponding to the pad 130 may be formed using a photolithography process. The photolithography processes which form each of the pattern holes 123 and 133 may be performed at the same time.
[0065] Next, as illustrated in
[0066] Next, as illustrated in
[0067]
[0068] As illustrated in
[0069] Next, as illustrated in
[0070] Next, as illustrated in
[0071] Next, as illustrated in
[0072] Next, as illustrated in
[0073] As illustrated in
[0074] Next, as illustrated in
[0075]
[0076] The male connection structure according to an exemplary embodiment of the present invention has the same process as the previous embodiment except the process of forming the elastic fin 230. That is, processes
[0077] The method of manufacturing the male connection structure in this embodiment of the present invention is the same until the process of forming the column 220, since then, as illustrated in
[0078]
[0079] The method of manufacturing the male connection structure according to an exemplary embodiment of the present invention has a reverse order with the previous embodiments, that is, includes a method in which the column 220 and the insulating member 210 are sequentially stacked on a metal plate 301 used for the elastic fin 230.
[0080] As illustrated in
[0081] Next, as illustrated in
[0082] Next, as illustrated in
[0083] Next, as illustrated in
[0084] Next, as illustrated in
[0085]
[0086]
[0087] For example, it is possible to design the structure D which avoids an arrangement location of a screw hole 15.
[0088] Furthermore, there is an advantage in that the inner conductive material 120 or the column 220 may be disposed in the female connection member 110 or the male connection member 210 in various shapes as illustrated by an enlarged view of the structure A in
[0089] The electrical connection structure and the method of manufacturing the same related to the present invention described above may be applied to various fields such as connectors for electrical connections, semiconductive material package assemblies, mutual connection structures for flip chips, mutual connection structures for capacitors of a multilayer ceramic capacitor (MLCC) and other components (or substrates), etc.
[0090] Meanwhile, the electrical connection structure and the method of manufacturing the same described above are not limited to the configurations and the methods of the embodiments described above, and various changes to the embodiments may be made by selectively combining all or a part of each of the embodiments, and the various changes may be made by those skilled in the art without departing from the spirit and scope of the present invention.