Halogen Selective Detection Gas Chromatography for the On-Line Analysis and Control of Selective Oxidation Chemical Production Processes

Abstract

A method for process monitoring and control of a chemical reactor in which a chemical reaction utilizing a halogenated selectivity modifier is performed includes: measuring a level of halogenated components in an inlet stream of a reactor inlet; measuring a level of halogenated components in an outlet stream of a reactor outlet; based on the level of halogenated components at the inlet stream and the outlet stream, determining a process performance indicator associated with a halogenated component; and adjusting an amount of halogenated selectivity modifier added to the reactor based on the process performance indicator.

Claims

1. A method for process monitoring and control of a chemical reactor in which a chemical reaction utilizing a halogenated selectivity modifier is performed comprising: measuring a level of halogenated components in an inlet stream of a reactor inlet; measuring a level of halogenated components in an outlet stream of a reactor outlet; based on the level of halogenated components at the inlet stream and the outlet stream, determining a process performance indicator associated with a halogenated component; and adjusting an amount of halogenated selectivity modifier added to the reactor, an amount of reactor feedstock, a flow rate, and/or a reactor temperature, based on the process performance indicator.

2. The method of claim 1, wherein the level of halogenated components in the inlet stream and the outlet stream includes all halogenated components contained in the inlet stream and outlet stream.

3. The method of claim 1, wherein the level of halogenated components in the inlet stream and outlet stream is measured with a halogen-selective detector using gas chromatography.

4. The method of claim 1, wherein the level of halogenated components in the inlet stream and outlet stream is measured without significant chemical interference.

5. The method of claim 1, further comprising separating halogenated components from the inlet stream and/or the outlet stream using a separation column.

6. The method of claim 3, further comprising admitting a reference gas into the halogen-selective detector as a drift correction standard.

7. The method of claim 6, wherein the reference gas comprises a halogenated component.

8. The method of claim 3, further comprising admitting a plurality of calibration gases into the halogen-selective detector using an automation system to calibrate response vs. concentration.

9. The method of claim 8, wherein the automation system comprises a switching valve to introduce the plurality of calibration gases from a plurality of cylinders.

10. The method of claim 8, wherein the automation system comprises a permeation or effusion device to produce multiple level calibration gas standards in situ.

11. The method of claim 8, wherein the automation system comprises a pressure or flow controlled serial dilution system configured to produce accurate dilutions of a single master calibration gas.

12. The method of claim 3, wherein the halogen-selective detector comprises a gas or liquid phase electrolytic conductivity detector.

13. The method of claim 3, wherein the halogen-selective detector comprises an electron capture detector (ECD).

14. The method of claim 3, wherein the halogen-selective detector comprises a mass spectrometer.

15. The method of claim 3, wherein the halogen-selective detector comprises an atomic emission detector.

16. The method of claim 1, wherein the process performance indicator comprises a process performance indicator (K) determined according to the following formula, or inverse thereof:
K=[total molar halogens].sub.out/[total molar halogens].sub.in.

17. The method of claim 1, wherein the process performance indicator comprises a process performance indicator (D) determined according to the following formula, or inverse thereof:
D=[total molar halogens].sub.in[total molar halogens].sub.out.

18. The method to claim 1, wherein the process performance indicator comprises a process performance indicator (ln(K.sub.eq, T1/K.sub.eq, T2)) used to predict changes required in modifier levels as the reactor temperature is changed, determined according to the following formula or rearrangements thereof:
ln(K.sub.eq, T1/K.sub.eq, T2)=H.sup.0/R(1/T.sub.21/T.sub.1), wherein H.sup.0 is enthalpy of reaction, T.sub.1=a first reactor temperature at a first time; T.sub.2=a second reactor temperature at a second time, R is molar gas constant, K.sub.eq, T1=[total molar halogens].sub.out/[total molar halogens].sub.in at T.sub.1, and K.sub.eq, T2=[total molar halogens].sub.out/[total molar halogens].sub.in at T.sub.2.

19. The method to claim 1, wherein the process performance indicator comprises a process performance indicator based on adsorption isotherm theory to predict a required partial pressure of modifier required when the reactor temperature is changed.

20. The method of claim 1, wherein the process performance indicator comprises an amount or ratio of a marker compound.

21. The method of claim 1, wherein the chemical reaction comprises a selective oxidation of ethylene to form ethylene oxide (EO).

22. A system for process control of a chemical reactor in which a chemical reaction utilizing a halogenated selectivity modifier is performed comprising: a chemical reactor in which a chemical reaction occurs which utilizes a halogenated selectivity modifier, wherein the chemical reactor comprises: an inlet comprising an inlet stream comprising reactants and a halogenated component; and an outlet comprising an outlet stream comprising reactants, products, and a halogenated component; a halogen-selective detector in fluid communication with the inlet stream and the outlet stream and configured to measure a level of halogenated components in the inlet stream and the outlet stream; an analyzer configured to determine a process performance indicator associated with a halogenated component based on a level of halogenated components in the inlet stream and outlet stream; and a modifier input configured to adjust an amount of halogenated selectivity modifier added to the chemical reactor based on the process performance indicator.

23. A method for process monitoring and control of a chemical reactor in which a chemical reaction utilizing a halogenated selectivity modifier is performed comprising: providing an inlet or outlet reactor sample stream; providing a gas chromatograph configured with a halogen selective detector in fluid communication with the reactor inlet or outlet stream; and analyzing halogenated catalyst modifier compounds in the reactor inlet or outlet streams to monitor or control modifier addition rates.

24. The method of claim 23, wherein a complete halide analysis is performed to produce halide analysis data, wherein the halide analysis data is used to compute a process performance indicator.

25. The method of claim 24, wherein the halide analysis data is used to adjust a feedstock composition, a flow rate, and/or a reactor temperature.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0036] FIG. 1 shows a series of adsorption isotherms (each curve represents coverage () as a function of partial pressure at a fixed temperature). The points P1,T1 and P2,T2 represent constant coverage (=0.3) intersects of T1 and T2 isotherms where T1<T2 and P1<P2. This example illustrates a method based on adsorption theory where catalyst surface modification required for optimal catalyst selectivity can be predicted as reactor temperatures are adjusted during the lifetime of the catalyst.

[0037] FIG. 2 shows a plot of ln P as a function of 1/T where, each point is the intersect of adsorption isotherms at constant coverage as described in FIG. 1. The linear relationship is based on Clausius-Clapeyron expression describing transitions between a gas phase and a condensed phase. The approximate linear relationship provides a useful tool as a predictive means for adjusting the partial pressures of catalyst modifying agents as a function of temperature. The slope of this line is H.sub.abs/R provided H.sub.abs remains constant over the temperature range considered. When the plot of ln P as a function of 1/T is not linear, a correction for changes in H.sub.abs should be applied as described within. A similar relationship is derived from chemical equilibrium theory.

[0038] FIG. 3 shows a simplified diagram of several key sampling points in an EO plant for measurement using the current invention. We point out three key sampling points, namely, a cycle gas sample point, an inlet sample point, and an outlet sample point. Measurements made using the current invention at the reactor inlet and outlet sample points lead to either differential or ratio (equilibrium/adsorption) representation of the precise mass balance of modifier agents across the reactor catalyst bed. Measurements made using the current invention at the outlet sample point and the cycle gas sample point permit a differential expression of modifier agents lost to downstream processing units.

[0039] FIG. 4 shows one preferred embodiment of the invention where a single two position gas sampling valve is used to introduce sample and cut sample light ends prior to component separation and detection using a halogen selective detector.

[0040] FIG. 5 is a typical chromatogram obtained using the preferred embodiment illustrating use of an internal reference drift correction component and the separation of the five process target components (MC, VC, EC, AC, and EDC) blended at 2-5 ppm in a simulated process gas background.

DESCRIPTION OF THE INVENTION

[0041] A method for precise and robust measurement of ppb-ppm levels of halogenated reaction modifier components for a catalyst surface is described. This method utilizes gas chromatography (GC) with a simplified chromatographic train, a halogen selective detector, an internal reference component for drift correction, and automated introduction of standards for calibration. The method produces complete halide (halogen containing component) measurement data in both reactor inlet and outlet streams for production processes, where an organohalide (organic halogen containing component) modifier is added at low levels to tailor catalyst properties. This design avoids complex chromatographic trains, provides sufficient detector specificity to minimize interferences present in most process gas matrices with component detection limits 10-100 better than traditional methods. Use of this method with extended engineering calculations significantly improves the precision and accuracy for reactor control.

[0042] In addition to improved analytical data, the method also leads to additional key performance indicators (KPI). The use of halogen selective detection coupled with the proper chromatographic conditions creates a survey method where all halogenated components, organic and inorganic, can be located within the process stream chromatography. As used herein, the term halogenated or halide component refers to any chemical species containing a halogen atom. This allows the method to compile a complete and accurate assessment of all halide components, and the generation of quantitative data to produce a chloride mass balance from reactor inlet and outlet sample analyses. The ability to express halide changes across the reactor directly through direct measurement data, rather than through inference, leads to unique KPI. These KPI can be in the form of a delta (differential) indicator or a thermodynamic (equilibrium) indicator.

[0043] A second type of KPI arises from the identification and quantification of all halide components and the opportunity to identify halide marker compounds for optimizing process conditions.

[0044] Optionally, with appropriate GC class separation coupled with a backflush step to the halogen selective detector a total halogen measurement (all species) can be made very rapidly on inlet or outlet reactor streams.

[0045] The present invention of novel process analytical chemistry methods is used to support the measurement and calculation of key parameters for proper process control. Feedback control of concentrations of reactants and modifiers using process analytics is a very important consideration in selectively oxidizing hydrocarbons using heterogeneous catalysis. The catalyst comprises a solid state and the reactants and products are fluids which are analyzed using this method. The selective oxidation of hydrocarbons leads to products and important intermediates for the petrochemical industry (ie. ethylene oxide (EO)).

[0046] The selectivity of these various processes to produce a desired product is often achieved using heterogeneous catalysis, a process where the activation energy for product formation is lowered (compared with that of competing processes) due to specific chemical interactions and reactions at a tailored catalyst surface. Improvements in selectivity can often be achieved using catalyst modifier agents. Organohalide compounds are an important type of selectivity modifier added to improve yield of the desired product for many of these reactions. Organohalide compounds can be abbreviated RX where the halogen portion X=fluorine (F), chlorine (Cl), bromine (Br) or iodine (I) and R=any hydrocarbon substituent. These modifier components act through various mechanisms, including electronic modification of the catalyst surface characteristics, adjustment of the available surface area of the catalyst, and participation in transition state thermodynamics.

[0047] We describe the invention herein using the example of the selective oxidation of ethylene to form ethylene oxide (EO), but the methods are equally applicable for other selective oxidation reactions where halogenated compounds are used as catalyst modifiers. The EO (C.sub.2H.sub.4O) process commonly uses a silver catalyst activated by various alkali metals and other promoter systems generally supported on alumina. A mixture of ethylene (C.sub.2H.sub.4) and oxygen (O.sub.2) are passed over a fixed bed of catalyst maintained at a sufficiently high reaction temperature. Since the ethylene conversion rate is low, the process is re-cycle gas based. The reactor effluent is passed through a scrubber where EO is removed, and a CO.sub.2 removal unit, with the bulk of the remaining gases recycled. The new feed gas composition for the reactor is fortified with additional reactants and modifiers based on analyzer measurements.

[0048] The desired reaction (1) produces the cyclic ether EO, while the main competing reactions (2) and (4) produce CO.sub.2. Reaction (3) is a minor side reaction producing the aldehyde. Reaction (4) is the result of EO oxidation at the surface of the catalyst before it becomes gas phase. Certain alkali metal promoters and organohalide modifiers suppress reactions (2) and (4).

C.sub.2H.sub.4+O.sub.2.fwdarw.C.sub.2H.sub.4O (EO formation)1)

C.sub.2H.sub.4+3O.sub.2.fwdarw.2CO.sub.2+2H.sub.2O (combustion of ethylene)2)

C.sub.2H.sub.4+O.sub.2.fwdarw.C.sub.2H.sub.4O (acetaldehyde)3)

C.sub.2H.sub.4O+2O.sub.2.fwdarw..sub.2CO.sub.2+2H.sub.2O (combustion of EO)4)

[0049] Currently there are several different variants of catalyst product based on the promoter systems and the amount of silver. These catalyst products have a range of selectivity for EO production as well as other process and financial considerations. All catalysts used commercially for EO production use organohalide modifiers to improve performance High selectivity catalysts (HSC) generally have the greatest requirement for precise measurement and control of the organohalides. Reliable analytical measurements for halide components in the ppb-low ppm range are important to maintaining optimum process conditions.

[0050] With this invention we make improvements in the identification and measurement of targeted and non-targeted organohalide species, including the native addition modifier and halide containing reaction products, both organic and inorganic, using GC with halogen specific detection. Furthermore, through these means the comprehensive fate of the gas phase halogen atoms can be mapped and this information used to enhance process control and understanding for both reactor startup and routine process control purposes.

[0051] The reactor fluid chemical measurements, and the methods for reactor control that result from those measurements, are bounded by process analytic limitations. This invention uses gas chromatography with halogen selective detectors to generate a survey method where all halogenated components can be measured without significant chemical interference on both reactor input and reactor output streams. As used herein, significant chemical interference may be considered a chemical interference of more than 50 ppb. A chemical interference is defined herein as any other bulk matrix constituent which co-elutes chromatographically with a component to be measured where there is no or inadequate detector selectivity to allow differentiation. In addition to providing a simpler hardware and method structure with reduction in chemical interference, this invention also creates unique methods for reactor organohalide control using novel key performance indicators (KPI).

[0052] The present invention uses gas chromatography to separate components of interest from bulk matrix interferences in space and time. Additionally, a halogen selective detector is used to avoid interferences from other bulk matrix major component or ppb-ppm level impurities and byproducts. The selectivity of the particularly preferred detectors (Type 2) is high, around 60,000:1.

[0053] While halogen selective detectors have excellent sensitivity and specificity they often lack the long-term stability required for routine process measurements over time. To address this limitation, the current method invention incorporates a drift correction component which is introduced into the chromatographic flow stream separately from the sample to be measured, periodically, or with each sample. Sample related halogenated components are quantified relative to the drift correction component response. Introduction of the reference component may be made as a separate plug injection through the column, or directly into the detector, the result in both cases is to produce a proportional detector response to the known amount of reference component. The reference component may be any halogenated gas phase component, and should be introduced at an injected mass proportional to that found in the samples. The reference component may contain the same halogen as the analytes. Furthermore, it may be one of the analytes targeted for measurement in the process samples. This procedure cancels most of the quantitative drift contributions related to sample pressure, temperature, and detector output.

[0054] An additional limitation of some halogen selective detectors is response linearity (detector output as a function of concentration). For example, if it is found that a component of interest does not have a perfectly linear response over a desired range of concentration, the quantitative analysis may benefit from use of a multipoint calibration rather than merely a single point calibration. Several points of calibration along the concentration axis allows use of quadratic or other exponential curve fitting procedures to relate concentration to detector response and thereby improve analytical accuracy. The invention incorporates automated multi-point component calibration, where required. This procedure uses either a switching valve to sequentially introduce standards from separate gas bottles, a gas permeation or effusion device (where various levels of concentration can be produced by diffusion or effusion of a standard mixture across permeable membranes or an orifice; these calibrators are available from multiple commercial sources such as KIN-TEK Analytical Inc.), or a mass flow controlled apparatus where flow rates for a high-level standard and a diluent can be varied over a desired range to accurately produce standard gases. For example, when using the current invention four points of calibration is routine, at the nominal 0.05, 0.50, 2.00, and 5.00 ppm levels for each component, for EO commonly, MC, VC, EC, AC, and EDC. In the case where other halogenated reaction products are being observed and measured, it is common practice to use the nearest target neighbor as a surrogate standard. This is a valid assumption since the detector response is based on molar halogen, and to the relative exclusion of other elements.

[0055] The result of the invention is to significantly improve the detection limits, the precision of measurement, and absence of chemical interferences for traditional organohalide target compounds (MC, VC, EC, AC, EDC in the EO production example). Improvements in the quality of target component measurements produces a commensurate improvement in the total effective halide TEX, or TEC (and Q, IFactor, and CCF) in the case of where organochlorides are used as modifiers.

[0056] The traditional process control parameters (Q, IFactor, CCF) represent the ratio of the total effective chlorides (TEC) being added to the catalyst and the chlorides being stripped away from the catalyst. This invention creates an alternative route to calculate these control parameters where the halide being stripped from the catalyst is measured directly in the outlet stream rather than being calculated using external hydrocarbon data and associated assumptions. Therefore, we introduce the terms K and D as new KPI reactor control parameters (or the inverse thereof), where in the case of chloride modifiers:

Total molar chlorides=TMC=[MC]+[VC]+[EC]+[AC]+[EDC]

K=[total molar chlorides].sub.out/[total molar chlorides].sub.in

D=[total molar chlorides].sub.in[total molar chlorides].sub.out.

[0057] Both K and D are derived directly from the measurement data of the current invention without assumption as to other hydrocarbon stripping processes.

[0058] Both K and D can be adjusted using empirical effectiveness factors for catalyst modification as is current practice for deriving Q, IFactor, or CCF resulting in K and D using the following:

Total effective chlorides=TEC=[MC]/3+[VC]+[EC]+[AC]/6+2[EDC]

[0059] The adjustment coefficients for modification effectiveness shown are typical of values currently used, but can be any properly determined value with respect to the current invention. The adjusted total effective chloride values can then be used in an analogous fashion to derive as new KPI parameters (or the inverse thereof), where in the case of chloride modifiers:

K=[total effective chlorides].sub.out/[total effective chlorides].sub.in

D=[total effective chlorides].sub.in[total effective chlorides].sub.out.

[0060] The ability to measure all halogenated modifier components in both the inlet and outlet streams forms the basis for new KPI parameters directed at the predictive ability to adjust modifier levels as a function of reactor temperature changes. It is well known that the temperature for reaction, and optimal selectivity, must be increased as a function of catalyst age. As discussed previously, this change in optimal modifier concentration as a function of reactor temperature is currently addressed either through existing algorithms or through empirical process changes used to locate new optimized modifier levels.

[0061] In the case of the EO process, using the current invention, total molar chlorides (TMC) on the inlet and outlet sample streams can be calculated from measured concentrations as:

[TMC]=[MC]+[VC]+[EC]+[AC]+[EDC]+[non-targeted chlorides]

[0062] Using complete halogenated component data an equilibrium expression follows where:

K.sub.eq=[TMC].sub.out/[TMC].sub.in

[0063] Without being bounded by theory, the Van't Hoff equation can be used to relate changes in equilibrium as a function of temperature change, where:

ln(K.sub.eq, T1/K.sub.eq, T2)=H.sup.0/R(1/T.sub.21/T.sub.1)

[0064] Therefore, an adjusted value for K.sub.eq, T2 at temperature T.sub.2 can be calculated as:

ln K.sub.eq, T2=H.sup.0/R(1/T.sub.21/T.sub.1)ln K.sub.eq, T1

[0065] Where H.sup.0=enthalpy of reaction; T.sub.1=a first reactor temperature at a first time; T.sub.2=a second reactor temperature at a second time; R=molar gas constant; K.sub.eq=[TMC.sub.out]/[TMC.sub.in].

[0066] The preceding is valid where the temperature range (T.sub.2-T.sub.1) is small enough so that .fwdarw.H.sup.0 is constant. When this condition is not met, there are numerous methods to generalize the Van't Hoff equation to consider the temperature dependence of H.sup.0. We recognize these methods and incorporate them into the current method invention.

[0067] While we describe here the use of molar quantities of modifier, the same treatment of data can be used where effectiveness coefficients are used to adjust molar concentrations for individual modifier species.

[0068] The use of complete halogenated modifier analyses to model and adjust for reactor temperature change can also be understood using Langmuir isotherm theory relating variations in catalyst surface coverage to temperature and pressure changes. It is shown experimentally that for a constant surface coverage, increases in temperature (T) require increases in partial pressure of the adsorbate (organohalide or halide). This is summarized in FIG. 1 which shows coverage () versus partial pressure of adsorbate ([TMC] under ideal gas conditions). Since each curve is data at a fixed temperature the plots are referred to as isotherms.

[0069] The Clausius-Clapeyon equation relates coverage to the change in partial pressure required for changes in temperature and can be used for determination of enthalpies of adsorption:

( ln P/1/T).sub.const =H.sub.abs/R

[0070] Where, P=partial pressure of adsorbate (modifier); =fraction surface coverage.

[0071] Theta () represents coverage, where at the maximum (saturation) surface coverage for a given adsorbate =1. Assume in FIG. 1, for instance, where a constant theta objective (horizontal line projection) is 0.3, that this fractional coverage represents that required to maintain optimum catalyst selectivity. The model thus provides a useful tool on an operating basis to maintain optimum selectivity through modest temperature changes and cumulative catalyst production for the charge. While this theory does not encompass subsurface migration, it can be considered part of this model since certain surface coverage must be maintained to yield any requisite subsurface population of halide.

[0072] Therefore, in consideration of both equilibrium and adsorption isotherm models we arrive at the same relationship since adsorption is an equilibrium process. FIG. 2 is a PT plot of ln P (partial pressure of organohalide) vs 1/T where the slope is H.sub.abs/R. Note that the same plot type for the equilibrium model of ln K.sub.eq vs 1/T produces the same relationship where the slope is H.sup.0/R. Either method can be used as a predictive means for ongoing organohalide changes required as a function of reactor temperature changes to keep product selectivity optimized. We do not wish to be bound to the method of data treatment since several other methods may also produce acceptable results. The present invention uses a reactor modifier control method where both reactor inlet and reactor outlet halide analyses can be used in combination to model catalyst modifier requirements for optimal reaction selectivity.

[0073] Considering the survey nature of the present method invention, another set of KPI parameters may be derived, namely the identification and trend analysis for reactor performance based halogenated marker compounds Since weakly bound (physisorbed) modifier is likely bound to the catalyst surface, and when near an active site on the catalyst, may be part of a thermodynamic transition state leading to product formation, it can be assumed that various adducts formed from the modifier may be indicative of conditions relating to which oxidative products are formed. Using a standardized set of chromatographic conditions, libraries of chemical structure and retention indices for common halide adducts are developed using GC/MS to support further use of these halides in process understanding. The correlation of all halide species (targeted, non-targeted, and ratios thereof) to process conditions and reactor performance is part of the invented method.

[0074] There are three sampling points in the EO production process where samples using this invention are commonly measured. FIG. 3 shows these as cycle gas sample point, inlet sample point, and outlet sample point. Samples at these locations have meaningful information content regarding the process. While measurements of inlet and outlet samples support halide ratio or differential expressions across the reactor, and the extended calculations described here-in, measurement of outlet and cycle gas samples permit a delta halide calculation across the downstream processing units. Since these process steps often involve aqueous systems, the delta halide in this loop provides an indication of polar halide adducts. Polar halide adducts are formed from reaction of the halides with O.sub.2, the oxidation product (EO in the case of our example), other polar by-products such as aldehyde species, or CO.sub.2. These adducts may be measured and tracked as KPI data and related to reactor performance.

[0075] In the case where halide speciation is not required, a total halogen or halide concentration may be measured using the invention. Rapid fraction of the organohalides from the bulk sample matrix is accomplished using the separating column, followed by backflush of the organohalide fraction directly to the halogen selective detector where response is correlated to total halogen in the sample.

[0076] The preferred embodiment utilizes a single packed or capillary column chosen such that halogenated components are retained preferentially, over the bulk matrix hydrocarbons and water. Optionally, a pre-column may be used to backflush any heavier chemical components if necessary prior to introduction onto the main separation column. FIG. 4 shows an example valve configuration using a single chromatographic column without backflush.

[0077] FIG. 4 shows a configuration using a single 10 port 2 position switching valve and a single separation column. In this preferred embodiment the column comprises a porous polymer packed column which is resistively heated. The use of resistive heating provides for rapid temperature programming with a wide selection of stationary phase. Three electronic mass flow controllers control gas flows in the fluidics, two for column carrier gas, and one for detector oxidation gas.

[0078] A gas sample loop is filled in one valve position and injected onto the column in the other. In the inject position the effluent from the column flows to a vent line and gas flow is regulated by EFC1 (vent flow). The fluidics remain in this position after sample injection until most of the process matrix hydrocarbons elute to vent. Prior to the elution of the halides the two position valve is switched back to the fill position where the column effluent is delivered to the halogen selective detector using EFC2 (detector flow). This process is iterated for two injections, the first injection being that of a drift correction reference gas (no process gas matrix exists in reference gas so that it may be switched back to the fill position quickly), and a second injection being that of the process gas sample. In the case where screening for inorganic halogenated components is desired, the entire sample matrix may be directed to the detector and any corrections for matrix co-elution made, if necessary.

[0079] A typical chromatogram of the five EO process target compounds (MC, VC, EC, AC, and EDC) blended at 2-5 ppm in a simulated process gas background using this preferred embodiment is shown in FIG. 5. The chromatography shows the separation of the target species without interference from the reactor inlet process gas matrix components (ethylene, ethane, CO.sub.2). The method provides for superior data quality for organohalides in terms of both sensitivity and selectivity, thereby generating more robust reactor performance metrics (TEX, or TEC in the case of organochlorides, and Q (Ifactor or CCF). The detector used is the OI Instruments XSD (Halogen Selective Detector) thermionic device (a type 2 halogen selective detector).

[0080] With the use of automated stream selection equipment and software the method is used to analyze reactor inlet and reactor outlet gas samples on an alternating basis. Since the method is a survey method (all components containing a halogen atom are detected), and since uniform response to the halogen is an attribute of type 2 halogen selective detectors, a total molar organohalide is determined for both reactor inlet and outlet samples. In this manner, an equilibrium constant (K.sub.eq=TMC.sub.out/TMC.sub.in) at a given reactor temperature is computed. At catalyst startup, or at any time after startup, while keeping reactor feed constant and varying reactor temperature in small increments, K.sub.eq is recomputed throughout the reactor temperature changes. These data when plotted (ln K.sub.eq vs. 1/T) is linear with a slope of H.sub.0/R. This method provides a predictive pathway for ongoing reactor control of organohalide modifiers during reactor temperature changes during the lifetime of the catalyst.

[0081] Although the invention has been described in detail for the purpose of illustration based on what is currently considered to be the most practical and preferred embodiments, it is to be understood that such detail is solely for that purpose and that the invention is not limited to the disclosed embodiments, but, on the contrary, is intended to cover modifications and equivalent arrangements that are within the spirit and scope of the appended claims. For example, it is to be understood that the present invention contemplates that, to the extent possible, one or more features of any embodiment can be combined with one or more features of any other embodiment.