DECOMPOSABLE S-TETRAZINE BASED POLYMERS FOR SINGLE WALLED CARBON NANOTUBE APPLICATIONS
20180195997 ยท 2018-07-12
Inventors
Cpc classification
C08G61/02
CHEMISTRY; METALLURGY
H10K71/40
ELECTRICITY
C08G61/126
CHEMISTRY; METALLURGY
C08G2261/3243
CHEMISTRY; METALLURGY
C08G61/123
CHEMISTRY; METALLURGY
C08L65/00
CHEMISTRY; METALLURGY
C08G2261/3222
CHEMISTRY; METALLURGY
C08G73/06
CHEMISTRY; METALLURGY
C08G61/125
CHEMISTRY; METALLURGY
H10K10/466
ELECTRICITY
C08G61/122
CHEMISTRY; METALLURGY
C08L65/00
CHEMISTRY; METALLURGY
H10K10/488
ELECTRICITY
C08G2261/3223
CHEMISTRY; METALLURGY
International classification
Abstract
A process for purifying semiconducting single-walled carbon nanotubes (sc-SWCNTs) extracted with a conjugated polymer, the process comprising exchanging the conjugated polymer with an s-tetrazine based polymer in a processed sc-SWCNT dispersion that comprises the conjugated polymer associated with the sc-SWCNTs. The process can be used for production of thin film transistors and chemical sensors. In addition, disclosed herein is use of an s-tetrazine based polymer for purification of semiconducting single-walled carbon nanotubes (sc-SWCNTs).
Claims
1. A chemical sensor for detection of one or more chemicals in the ppt to ppb range, the sensor made by a process comprising the steps of: a) applying a dispersion of a sc-SWCNT/s-tetrazine based conjugated polymer composite to a substrate; b) applying heat and/or UV light to decompose the s-tetrazine based conjugated polymer; and c) removing the resulting decomposition products.
2. The chemical sensor of claim 1, wherein the sensor has a lower detection limit of from 4 ppt to 100 ppb.
3. The chemical sensor of claim 2, wherein the sensor has a lower detection limit of from 3 ppt to 1 ppb.
4. The chemical sensor of claim 1, wherein the one or more chemicals is in a gaseous phase or a liquid phase.
5. The chemical sensor of claim 4, wherein the one or more chemicals is gaseous ammonia or gaseous nitrogen dioxide (NO.sub.2).
6. The chemical sensor of claim 1, wherein the s-tetrazine based polymer has the following structure: ##STR00011## where A is O, S, Se or CC; n is an integer from 1 to 4; R.sub.1 is independently H, F, CN or a C1-C20 linear or branched aliphatic group; Ar is one or more substituted or unsubstituted aromatic units; and, m is an integer 5 or greater.
7. The chemical sensor of claim 1, wherein the s-tetrazine based polymer is PBDTFTz: ##STR00012##
8. The chemical sensor of claim 1, wherein the s-tetrazine based polymer is PDTSTTz: ##STR00013##
9. The chemical sensor of claim 1, wherein the s-tetrazine based polymer is: ##STR00014## and wherein: R.sub.1 and R.sub.2=2-ethylhexyl; or R.sub.1=2-ethylhexyl and R.sub.2=hexyl; or R.sub.1=hexyl and R.sub.2=2-ethylhexyl; or R.sub.1 and R.sub.2=hexyl; or R.sub.1=methyl and R.sub.2=2-ethylhexyl.
10. The chemical sensor of claim 1, wherein the s-tetrazine based polymer is PCPDTFTz: ##STR00015## in which Ar=cyclopenta[2,1-b;3.4-b]dithiophene.
11. (canceled)
12. The chemical sensor of claim 1, wherein the conjugated polymer comprises a polyfluorene or a polythiophene.
13. (canceled)
14. The chemical sensor of claim 1, wherein the conjugated polymer is poly(9,9-di-n-dodecylfluorene) (PFDD).
15. The chemical sensor of claim 1, wherein the weight ratio of the conjugated polymer to the sc-SWCNTs has a maximum value of 5.
16. (canceled)
17. (canceled)
18. A process for producing a chemical sensor that detects one or more chemicals in the ppt to ppb range, the process comprising: a) applying a dispersion of a sc-SWCNT/s-tetrazine based conjugated polymer composite to a substrate; b) applying heat and/or UV light to decompose the s-tetrazine based conjugated polymer; and c) removing the resulting decomposition products.
19. The process of claim 18, wherein the sensor has a lower detection limit of from 4 ppt to 100 ppb.
20. (canceled)
21. (canceled)
22. The process of claim 18, wherein the one or more chemicals is gaseous ammonia or gaseous nitrogen dioxide (NO.sub.2).
23. The process of claim 18, wherein the s-tetrazine based polymer has the following structure: ##STR00016## where A is O, S, Se or CC; n is an integer from 1 to 4; R.sub.1 is independently H, F, CN or a C1-C20 linear or branched aliphatic group; Ar is one or more substituted or unsubstituted aromatic units; and, m is an integer 5 or greater.
24. The process of claim 18, wherein the s-tetrazine based polymer is PBDTFTz: ##STR00017##
25. The process of claim 18, wherein the s-tetrazine based polymer is PDTSTTz: ##STR00018##
26. (canceled)
27. The process of claim 18, wherein the s-tetrazine based polymer is PCPDTFTz: ##STR00019## in which Ar=cyclopenta[2,1-b;3.4-b]dithiophene.
28. (canceled)
29. The process of claim 18, wherein the conjugated polymer comprises a polyfluorene or polythiophene.
30. (canceled)
31. (canceled)
32. (canceled)
33. (canceled)
34. (canceled)
35. A chemical sensor for detection of gaseous ammonia or gaseous nitrogen dioxide in the ppt to ppb range, the sensor comprising a network of semiconducting single-walled carbon nanotubes (sc-SWCNTs).
36. The chemical sensor of claim 35, wherein the sensor has a lower detection limit of from 4 ppt to 100 ppb.
37. The chemical sensor of claim 36, wherein the sensor has a lower detection limit of from 3 ppt to 1 ppb.
Description
BRIEF DESCRIPTION OF DRAWINGS
[0045] For clearer understanding, preferred embodiments will now be described in detail by way of example, with reference to the accompanying drawings, in which:
[0046]
[0047]
[0048]
[0049]
[0050]
[0051]
[0052]
[0053]
[0054]
[0055]
DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
[0056] The following s-tetrazine based polymers can be used for SWCNT purification, dispersion and device fabrication:
##STR00005##
where each A is O, S, Se or CC; each n is an integer from 1 to 4; each R1 is independently H, F, CN or a C1-C20 linear or branched aliphatic group; Ar is one or more substituted or unsubstituted aromatic units; and, m is an integer 5 or greater.
[0057] Examples of s-tetrazine based polymers include poly[2,6-(4,4-bis(2-ethylhexyl)dithieno[3,2-b:2,3-d]silole)-alt-5,5-(3,6-bis[4-(2-ethylhexyl)thienyl-2-yl]-s-tetrazine)], also identified with the acronym PDTSTTz:
##STR00006##
[0058] The synthesis, characterization and photovltaic applications of PDTSTTz are disclosed by J. Ding et al. in Chem. Commun., 2010, 45, 8668-8670, the contents of which are incorporated herein by reference.
[0059] Another class of s-tetrazine based polymers include the following five, which are disclosed by Z. Li et al. iin Chem. Mater. 2011, 23, 1977-1984, the contents of which are incorporate herein by reference:
##STR00007##
[0060] In particular, P4, also known as PCPDTTTz, is used in the production of efficient solar cells, as disclosed by Z. Li et al. in J. Am. Chem. Soc., 2010, 132, 13160-13161, the contents of which are incorporate herein by reference.
[0061] Another example includes PCPDTFTz, the synthesis, characterization and photovoltaic properties of which are disclosed by Z. Li et al. in Macromol. Chem. Phys. 2011, 212, 2260-2267, the contents of which are incorporate herein by reference:
##STR00008##
[0062] In one embodiment, the following s-tetrazine based polymer (PBDTFTz), which contains alternating bisfuran-s-tetrazine and benzo [1,2-b:4,b-b]dithiophene units, can be used for SWCNT purification, dispersion and device fabrication:
##STR00009##
Decomposition of s-Tetrazine Based Polymers
[0063] Differential scanning calorimetry (DSC) curves demonstrate that s-tetrazine polymer can be decomposed thermally at around 250 C.
[0064] This is illustrated in
[0065] The product contains 90% of dicyano compound (1): It has much shorter conjugation length than PBDTFTz so the absorption spectrum is blue shifted and contains well-resolved peaks. The decomposition scheme is shown as follows:
##STR00010##
[0066] Furthermore, s-tetrazine polymer is sensitive to strong UV light. This is illustrated in
Displacement of PFDD with s-Tetrazine Based Polymers
[0067] The interaction between s-tetrazine based polymers and SWCNT is quite strong, but not strong enough to disrupt the SWCNT structure. Other polymers, such as those of the polyfluorene class (PFDD), can be easily displaced by treating the PFDD dispersion with s-tetrazine polymer solution.
[0068] In one embodiment, a simple polymer exchange process can be used to replace poly(9,9-di-n-dodecylfluorene) (PFDD) on SWCNTs with PBDTFTz by a simple polymer exchange.
[0069] The polymer PBDTFTz was synthesized as disclosed in Z. Li et al., Macromol. Chem. Phys., 2011, 212, 2260. High purity PFDD/sc-SWCNT solution was prepared as disclosed by Ding, Z et al. Nanoscale, 2014, 6, 2328, with a polymer/tube ratio of 1.3 and tube concentration at 165 mg/L. A PBDTFTz solution (1 g at 0.87 mg/mL) and toluene (3 g) was added to above solution (1 g), and the mixture was bath sonicated for 30 min. Then the solution was filtered on a Teflon membrane with pore size of 200 nm and washed with toluene (10 mL). The filter cake was then dispersed in toluene (4 g) and labeled as the product after first exchange. This process was repeated to obtain the product from a second polymer exchange. The polymer/tube ratio and solution concentration can be easily adjusted by filtration, dilution or addition of polymer. The final PBDTFTz/SWCNT dispersion has tube concentration at 25.5 mg/L and polymer/tube ratio at 4/1. A similar PFDD/SWCNT dispersion was also prepared.
[0070]
Clean SWCNT Networks
[0071] As discussed above, s-tetrazine based polymers can be decomposed by photo irradiation or heating. After decomposition, the resulting small molecules can be washed away in solution or evaporated under laser irradiation or heating under vacuum if it is in the solid state. In this manner, clean SWCNT networks can be obtained, which is desirable for electrical devices application, such as thin film transistors (TFTs) or sensors. This is discussed further below in reference to
Use of PBDTFTz/SWCNT Dispersions for Preparation of TFT
[0072] PBDTFTz/SWCNT dispersions can be used to prepare electronic devices.
[0073] The use of decomposable s-tetrazine based polymer for producing SWCNT thin film transistors with enhanced contact, is summarized in
[0074] In-situ transistor characterization under laser reveals the decomposition of PBDTFTz and evaporation of the small molecule compounds formed. Further investigation of the resistance from different channel length devices demonstrates dramatically improved contact between tubes due to removal of wrapping polymers. This fully exposed tube network can be particularly attractive for sensor applications, and results in improved contact.
[0075] TFT devices were fabricated using prefabricated devices with a 230 nm thick thermal oxide layer. The chip has pre-patterned Au electrodes with 44 TFT devices at channel lengths of 20, 10, 5, 2.5 m and a channel width of 2,000 m respectively. The chip was soaked in a 5% Hellmanex solution for 20 min at 60 C. before rinsed with water and isopropanol, blow-dried with nitrogen. The polymer/tube dispersion (0.1 mL) was then spread on the chip surface and the chip was soaked for 10 min under toluene vapor. The chip was then rinsed with toluene (5 mL) and blow dried with nitrogen before annealed at 140 C. for 10 min in air.
[0076] As an example, the PBDTFTz/SWCNT dispersion prepared above was used to prepare thin film transistors (TFT) on a freshly cleaned and pre-patterned SiO.sub.2 substrate according a procedure disclosed by Z. Li, J. Ding et al., in Org. Electron. 2015, 26, 15. The resulting TFT devices have a bottom contact and common bottom gate configuration. For comparison, devices prepared from a PFDD/SWCNT dispersion were also fabricated at the same concentration and polymer/tube ratio.
[0077] The degradation of the PBDTFTz on the SWCNT network was monitored by resonance Raman spectroscopy as shown in
[0078] The TFT transistor was also characterized simultaneously under 405 nm laser irradiation.
[0079] In the first 2 min, the on-current (at V.sub.g=10V) of the TFT increased gradually from 70 to 170 A while the off-current at V.sub.g=10V increased more dramatically by several orders of magnitude, which resulted to very poor on/off ratio. The hysteresis of the transfer curve also became more severe. However, this change reached plateau at 2 min and then slowly moved back.
[0080] This phenomenon can be explained by the degradation of PBDTFTz. Under 405 nm laser irradiation, PBDTFTz begins to decompose with the formation of dicyano (compound (1)) and release of nitrogen gas according to the decomposition scheme above. Compound (1) contains two cyano groups in each molecule and is a very strong p-doping agent for SWCNT. During PBDTFTz degradation, compound (1) that is formed will adhere on tubes first, and this will cause more p-doping effect (in addition to oxygen from the air) and shift the threshold voltage towards a positive direction. Longer time laser irradiation will further evaporate compound (1) that is formed and this p-doping effect will then alleviate.
[0081] Since the resulting TFTs always show a low on/off ratio, this suggests that compound (1) may not be completely removed from tube surface by simple laser irradiation. However, this decomposition reaction can be accelerated at a higher temperature; compound (1) can be completely removed at 300 C. under vacuum. The TFTs from PFDD/SWCNT was also characterized under laser irradiation, only slightly decreasing of on-current was observed, which can be attributed to the decreased p-doping of O.sub.2 under laser light as all measurements were carried out in ambient conditions.
Comparison of Networks Based on PFDD/SWCNT and PBDTFTz/SWCNT
[0082] In general, the TFTs from PFDD/SWCNT have higher current and mobility, although their SEM images show quite similar tube density to those of PBDTFTz/SWCNT (see
[0083] Further examination reveals a higher degree of bundles and curved tube conformation in the PBDTFTz/SWCNT network, which may limit the contact between tubes.
[0084]
[0085] More detailed characterization of the TFTs with different channel length from PBDTFTz/SWCNT before, and after, decomposition is shown in
[0086] For PBDTFTz/SWCNT TFTs, after degradation, R.sub. decreased from 0.481 to 0.296 M while R.sub.c decreased more dramatically from 0.960 to 0.242 K m. It is interesting that the removal of insulating polymer layer on tubes has more effect on R.sub.c than R.sub.. This also demonstrates the significance of removal of the insulation polymer layer on the tube surface within a network.
[0087] For PFDD/SWCNT TFTs, after similar treatment, on the contrary, R.sub. increased from 0.117 to 0.164 M, while R.sub.c remained almost unchanged, which can be attributed to decreased p-doping level after vacuum and thermal treatment.
[0088] The complete and easy removal of dispersant from the tube surface not only improves the device performance of transistors, but also benefits the sensitivity of the devices. This kind of wholly exposed tube surfaces is highly desired for sensor applications.
[0089] In the aforementioned TFT device characterization: I-V curves were collected on a probe station at ambient condition and the mobility was calculated from the I.sub.sdV.sub.g transfer curve in the linear regime based on a parallel plate model. Due to high channel width/length ratio (100), the contribution arising from tubes outside the defined channel area can be ignored. For TFT testing under laser irradiation, a 405 nm LDCU laser control unit was used and the laser beam was reflected onto the active channel as shown in
[0090] Raman spectra were acquired with an InVia Raman microscope (Renishaw) on finished devices, using 514 nm laser excitation source and 100 magnification objective lens. SEM images were obtained using Hitachi SU-5000 operated at 1 kV (charge contrast imaging mode on SiO.sub.2/Si substrate). UV absorption spectra were collected on a UV-Vis NIR spectrophotometer (Cary 5000, Varian) over a wavelength range from 300 to 2100 nm.
[0091] For the sensor tests, the polymer/SWCNT networks on chips were put into a chamber (volume 20 mL) mounted with an Ossila chip and circuit board. The device channel length and width were 30 m and 1 mm, respectively. The concentration of input ammonia gas was controlled with two mass flow controllers: one with a constant flow of 1 slm dry air/nitrogen and the other with 10 second pulse of 10, 20, 40, 80 and 160 sccm of 5 ppm ammonia in nitrogen.
Chemical Sensors Based on Sc-SWCNT Networks
[0092] Although the removal of polymer leads to a modest gain in transistor performance, the exposed nanotube surfaces provide a desirable platform for several applications, including chemical sensing of molecules. The novel chemistry described herein and its ability to yield bare high purity sc-SWCNT thin films can enable the optimized performance of a variety of devices, especially: high performance transistors based on aligned SWCNT, photovoltaic, and opto-electronic devices and foremost, sensors that are capable of ppb sensing, which can be applied to both environmental and health monitoring applications.
[0093] As an example, sc-SWCNT networks demonstrated rapid and reversible responses in ammonia (NH.sub.3) sensing experiments, while the unwrapped nanotube networks proving superior in terms of signal to noise ratio and a detection limit calculated to be 2.5 ppb, almost four times better than polymer wrapped nanotubes.
[0094] sc-SWCNT network transistors were tested as sensors for ammonia using gas pulses. It was found that under continuous exposure, the transistor sensitivity is so pronoucned that complete current suppression was observed, and recovery occurred upon exposure to ambient air. With a pulse experiment, a reversible response is observed under dry air flow.
[0095] These devices were first tested as chemiresistors. Severe current drift was often found, mainly attributable to water/O.sub.2 redox process at the SiO.sub.2/nanotube/air interface, which may related to the initial doping state of the SWCNT materials due to uncontrollable variations in the process history during device fabrication. The transistor configuration, with the gate voltage as a tuning knob, permits a path towards finding the best operation condition and minimize baseline drifts. In these experiments, transistors were also heated to 96 C. to accelerate the release of adsorbed NH.sub.3.
[0096]
[0097] Using the response curve from the 50 ppb NH.sub.3 pulse, the detection limit for pristine SWCNTs and PFDD/SWCNTs networks was calculated at 2.5 and 9.3 ppb, respectively (considering the detectable response to be three times of the noise). Such sensitivity limits would make these SWCNT transistors suitable for medical applications. This high sensitivity may be attributed to the high purity of sc-SWCNTs obtained from the conjugated polymer extraction process, which reduces the unwanted current baseline from metallic nanotubes. Tracking the sensor response near the threshold voltage and adjusting gate bias to flatten the baseline may further improve sensitivity, thereby mitigating drift.
[0098]
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[0165] The novel features will become apparent to those of skill in the art upon examination of the description. It should be understood, however, that the scope of the claims should not be limited by the embodiments, but should be given the broadest interpretation consistent with the wording of the claims and the specification as a whole.