Sagnac Fourier Spectrometer (SAFOS)
20180120086 ยท 2018-05-03
Inventors
Cpc classification
G01J3/00
PHYSICS
International classification
G01N33/00
PHYSICS
G01N21/31
PHYSICS
Abstract
A technique and device to determine the spectrum of electromagnetic radiation in a certain range of wavelengths comprising: splitting said radiation into more than one beam; let these beams counter-propagate in a Sagnac-type ring interferometer; and imprinting a wavelength-dependent angular tilt onto the wavefront of each beam by at least one dispersive element which preferably is a transmission grating or grism; and re-combining the multiple beams on a detector that exhibits spatial resolution and can therefore resolve the fringes formed by interference; and perform the mathematical operations to determine the spectrum of said radiation from the obtained interferogram, wherein the dispersive element is mounted on a stage providing linear and/or rotational movement.
Claims
1. A Sagnac Fourier spectrometer for determining the spectrum of incident light comprising: means to collect the incoming light such that it propagates as a collimated beam; means to limit the wavelength band of the incoming light by a filter; means to split the incident light into a first beam and a second beam such that the two beams propagate on the same optical path in opposite directions; wherein on the optical path the two counter-propagating beams are angular or spatially dispersed by one ore more dispersive elements such that radiation of one wavelength propagates along said optical path in both directions; means to combine the light from the two optical paths overlapping spatially coherently to form an interference pattern; means to detect and record an spatially resolved image in one or two dimensions; means to receive the spatially resolved intensity information from the image sensor and computationally process it into a spectrum.
2. The apparatus of claim 1, wherein said filter comprises a band pass filter, a short pass filter, a long pass filter, and combinations thereof.
3. The apparatus of claim 1, wherein said dispersive devices are one or more transmission gratings.
4. The apparatus of claim 1, wherein said dispersive devices are one or more prisms or oppositely oriented pairs of prisms.
5. The apparatus of claim 1, wherein said dispersive devices are grisms (also called Carpenter's prisms) or oppositely oriented pairs of grisms.
6. The apparatus of claim 1, wherein said dispersive devices are mounted on a translation and/or rotation stage.
7. The apparatus of claim 1, wherein said dispersive devices are mounted in a fixed position, causing the apparatus to work in a fixed wavelength range.
8. The apparatus of claim 1, wherein the characteristic dependency between the angle of incidence onto the dispersive device and the wavelength propagating on the optical axis is utilized to determine the absolute wavelength position of an incident spectrum without the need for an additional device for spectral calibration.
9. The apparatus of claim 1, wherein the light source emits in the infrared part of the electromagnetic spectrum and the spectrometer is designed to process the infrared part of the spectrum.
10. The apparatus of claim 1, wherein the light source emits in the visible part of the electromagnetic spectrum and the spectrometer is designed to process the visible part of the spectrum.
11. The apparatus of claim 1, wherein the light source emits in the ultraviolet part of the electromagnetic spectrum and the spectrometer is designed to process the ultraviolet part of the spectrum.
12. The apparatus of claim 1, wherein said dispersive devices are adapted to determine the isotopic shift of emission lines in atoms and molecules.
13. The apparatus of claim 1, wherein said dispersive devices are adapted to measure the spectra of Uranium and Plutonium.
14. The apparatus of claim 1, wherein said dispersive devices are adapted to measure the spectra of aerosols.
Description
BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWING
[0010]
[0011]
[0012]
[0013]
[0014]
DETAILED DESCRIPTION OF THE INVENTION
[0015] The Sagnac Fourier Spectrometer (SAFOS) is basically a Sagnac interferometer (see
sin ?+sin ?=g?.sub.0,
where ? and are the angles which the beam forms with the grating normal, shown in
[0016] In contrast to the classical Fourier Transform Spectrometer, where the Fourier transform is performed from time to frequency, the Fourier transform is here performed from spatial frequency to wavelength. For this, we need to know the analytic dependence of the spatial frequency on the wavelength. In case of an asymmetric positioning of the grating (???), the two wave fronts originating from the two directions exit the spectrometer under different angles, as shown in
[0017] The two angles are (see
since ? is the diffraction angle for one direction and ? for the other. The fringe spacing ?f can be derived as in the symmetrical case by considering (?.sub.1+?.sub.2) to be twice the tilt of one wavefront:
In order to calculate the observed fringe spacing on a screen perpendicular to the optical axis, we need to know the angle between this axis and the fringes, which is:
which yields the observed fringe spacing (?x=?f/cos ?):
or, using a sum-to-product trigonometric identity:
or, using equation 1:
[0018] For the symmetric case (?=?), we get
From equation 2, we see that the factor quantifying the mapping of spatial fringe frequency (1/?x) to wavelength (??) depends on the angular position of the grating, i.e. on the diffraction angle ?. Expressing ? in equation 2 by the grating equation, we get:
while assuming that ??<<?.sub.0.
[0019] There are two ways to maximize the throughput of the system (i) operating the grating in first order and choose groove density and wavelength range such that only one first order is above the horizon of the grating or (ii) choose a blazed transmission grating for a higher order.
[0020] Due to the tilt of k-vector into and out of the grating, the energy front experiences a tilt that is different from the tilt of the wavefront [M. Lenzner and J. C. Diels, Optics Express, volume 24 (2016) page 1829]. The tilt angle of the energy front ? in the output arm can be calculated as tan ?=?.sub.0 d?/d? [Z. Bor and B. R?cz, Optics Communications, volume 54 (1985) page 165]. d?/d? is the angular dispersion, which in our case is ??/??. From the angular dispersion listed above, we get:
[0021] In one embodiment of the disclosed device, the grating can be rotated. As evident from
This equation shows, for a given initial spectrometer configuration (fixed ? and g), how the center wavelength changes when the grating is rotated by an angle ?. Again, if radiation at this wavelength is incident, no Fizeau fringes are observed, just a bright field. Only components that are off this center wavelength can be measured.
[0022] As an example,
[0023] The fact that the wavelength range under investigation must not overlap with the wavelength propagating along the optical axis dictates the operational conditions of the SAFOS. One embodiment of the disclosed device operates in the same way as the Spatial Heterodyne Spectrometer [J. Harlander, R. J. Reynolds, F. L. Roesler, The Astrophysical Journal, vol. 396 (1992) page 730]: the grating positioned under a fixed angle, covering a wavelength range to either side of the design wavelength. The distance between design wavelength and the limit of the usable wavelength ranges is dictated by the mathematical processing. If it is too small, the wavelength to be measured overlaps with the zero-frequency spike of the Fourier transform and cannot be sensibly extracted anymore. This configuration, for ?=?, is shown in
can be used. Consequently, we have a spectrometer without moving parts; however, there would still be the ambiguity that spectra mirrored on the design wavelength would yield the same interferogram.
[0024] In a further embodiment of the disclosed device, using the very weak dependence of the center wavelength on the grating angle as shown in
[0025] As can be seen from
[0026] An example for a mathematical sequence that serves this purpose is: [0027] 1. Coarsely set the design angle of the spectrometer to a value that corresponds to a wavelength larger than the peak wavelength of the incident radiation [0028] 2. Record interferograms in dependence on ??, which is the change of the grating angle referring to an arbitrarily chosen value. [0029] 3. A value ?.sub.D (the design wavelength) is required to perform the Fourier Transform. For the first run, an estimated value can be used. [0030] 4. Fit the equation