Horizontal current bipolar transistors with improved breakdown voltages

Abstract

A horizontal current bipolar transistor comprises a substrate of first conductivity type, defining a wafer plane parallel to said substrate; a collector drift region above said substrate, having a second, opposite conductivity type, forming a first metallurgical pn-junction with said substrate; a collector contact region having second conductivity type above said substrate and adjacent to said collector drift region; a base region comprising a sidewall at an acute angle to said wafer plane, having first conductivity type, and forming a second metallurgical pn-junction with said collector drift region; and a buried region having first conductivity type between said substrate and said collector drift region forming a third metallurgical pn-junction with the collector drift region. An intercept between an isometric projection of said base region on said wafer plane and an isometric projection of said buried region on said wafer plane is smaller than said isometric projection of said base region.

Claims

1. A horizontal current bipolar transistor comprising: a substrate having a first conductivity type and defining a wafer plane parallel to said substrate; an n-hill layer disposed on top of said substrate, having a second conductivity type opposite to said first conductivity type, and forming a first metallurgical pn-junction with said substrate; a n+ diffusion layer having second conductivity type disposed on top of said substrate and adjacent to said n-hill layer; a base layer comprising an extrinsic base layer, an intrinsic base layer, and a sidewall inclined at an acute angle to said wafer plane, having first conductivity type, and forming a second metallurgical pn-j unction with said n-hill layer; a buried local pwell substrate having first conductivity type disposed between said substrate and said n-hill layer forming a third metallurgical pn-junction with the n-hill layer; wherein a first intercept between an isometric projection of said base layer on said wafer plane and an isometric projection of said buried local pwell substrate on said wafer plane is smaller than said isometric projection of said base layer.

2. The horizontal current bipolar transistor of claim 1, wherein a second intercept between an isometric projection of said n+ diffusion layer on said wafer plane and an isometric projection of said buried local pwell substrate-on wafer plane is smaller than said isometric projection of said n+ diffusion layer.

3. The horizontal current bipolar transistor of claim 1, wherein at least one CMOS pwell layer of first conductivity type is disposed within said substrate and at least one MOS type transistor is disposed within said CMOS pwell layer.

4. The horizontal current bipolar transistor of claim 3, wherein said buried local pwell substrate and said CMOS pwell layer exhibit substantially equal impurity dopant distribution decay towards the substrate.

5. The horizontal current bipolar transistor of claim 1, further described as having a collector-emitter breakdown voltage, wherein for at least one value of collector-emitter voltage smaller than said collector-emitter breakdown voltage, a depletion region extends at least from said second metallurgical pn-junction to said third metallurgical pn-junction.

6. The horizontal current bipolar transistor of claim 1, further described as having a collector-emitter breakdown voltage, wherein for at least one value of collector-emitter voltage smaller than said collector-emitter breakdown voltage, a depletion region extends at least from said first metallurgical pn-junction to said second metallurgical pn-junction.

7. A horizontal current bipolar transistor comprising, a substrate having a first conductivity type and defining a wafer plane parallel to said substrate; an n-hill layer disposed on top of said substrate, having a second conductivity type opposite to said first conductivity type, forming a first metallurgical pn-j unction with said substrate; and surrounded by isolating oxide layer; at least one n+ diffusion layer having second conductivity type disposed on top of said substrate and adjacent to said n-hill layer; an intrinsic base layer disposed on top of said n-hill layer and comprising a portion of at least one of two opposing sidewalls inclined at an acute angle to said wafer plane, having first conductivity type, and forming a second metallurgical pn-junction with said n-hill layer; an extrinsic base layer disposed on top of the n-hill layer, having first conductivity type and forming a third metallurgical pn-junction with said n-hill layer and metallurgical p.sup.+p junction with said intrinsic base layer; a buried local pwell substrate having first conductivity type disposed between said substrate and said n-hill layer forming a fourth metallurgical pn-junction with said n-hill layer; wherein a first intercept between an isometric projection of said intrinsic base layer on said wafer plane and an isometric projection of said buried local pwell substrate on said wafer plane is smaller than said isometric projection of said intrinsic base layer; wherein isometric projection of said extrinsic base layer on said wafer plane not intercepted with isometric projection of said intrinsic base layer on said wafer plane consists of at least one polygon having finite area larger than zero.

8. The horizontal current bipolar transistor of claim 7, wherein a second intercept between an isometric projection of said n+ diffusion layer on said wafer plane and an isometric projection of said buried local pwell substrate on wafer plane is smaller than said isometric projection of said n+ diffusion layer.

9. The horizontal current bipolar transistor of claim 7, wherein at least one CMOS pwell layer of first conductivity type is disposed within said substrate and at least one MOS type transistor is disposed within said CMOS pwell layer.

10. The horizontal current bipolar transistor of claim 9, wherein said buried local pwell substrate and said CMOS pwell layer exhibit substantially equal impurity dopant distribution decay towards the substrate.

11. The horizontal current bipolar transistor of claim 7, further described as having a collector-emitter breakdown voltage, wherein for at least one value of collector-emitter voltage smaller than said collector-emitter breakdown voltage, a depletion region extends at least from said third metallurgical pn-junction to said fourth metallurgical pn-junction.

12. The horizontal current bipolar transistor of claim 7, further described as having a collector-emitter breakdown voltage, wherein for at least one value of collector-emitter voltage smaller than said collector-emitter breakdown voltage, a depletion region extends at least from said first metallurgical pn-junction to said second metallurgical pn-junction.

13. The horizontal current bipolar transistor of claim 7, further described as having a collector-emitter breakdown voltage, wherein for at least one value of collector-emitter voltage smaller than said collector-emitter breakdown voltage, a depletion region extends at least from said first metallurgical pn-junction to said third metallurgical pn-junction.

14. The horizontal current bipolar transistor of claim 7, further described as having a collector-emitter breakdown voltage, wherein for at least one value of collector-emitter voltage smaller than said collector-emitter breakdown voltage, a depletion region extends at least from said fourth metallurgical pn-junction to said wafer plane.

15. The horizontal current bipolar transistor of claim 7, further described as having a collector-emitter breakdown voltage, wherein for at least one value of collector-emitter voltage smaller than said collector-emitter breakdown voltage, a depletion region extends at least from said first metallurgical pn-junction to said wafer plane.

Description

BRIEF DESCRIPTION OF THE FIGURES

(1) FIG. 1: Schematic cross-section view of a SE HCBT with local substrate according to one embodiment.

(2) FIG. 2A: One example of a lithography mask for one embodiment.

(3) FIG. 2B: Another example of a lithography mask for one embodiment.

(4) FIG. 2C: Yet another example of a lithography mask for one embodiment.

(5) FIG. 3: Gummel characteristics of a transistor according to one embodiment.

(6) FIG. 4: Measured common emitter output characteristics of a transistor according to one embodiment.

(7) FIG. 5: Measured frequency characteristics of a transistor according to one embodiment.

(8) FIG. 6A: Cross-section view at one position of a transistor according to one embodiment.

(9) FIG. 6B: Cross-section view at another position of a transistor according to one embodiment.

(10) FIG. 6C: Cross-section view at yet another position of a transistor according to one embodiment.

(11) FIG. 7A: One example of a lithography mask for one embodiment.

(12) FIG. 7B: Another example of a lithography mask for one embodiment.

(13) FIG. 8A: Electric field profile along one path through a transistor according to one embodiment.

(14) FIG. 8B: Electric field profile along another path through a transistor according to one embodiment.

(15) FIG. 9: Gummel characteristics of a transistor according to another embodiment.

(16) FIG. 10: Measured common emitter output characteristics of transistors according to another embodiment.

(17) FIG. 11: Dependence of cut-off frequency and maximum oscillation frequency on collector current for one embodiment

DESCRIPTION OF THE INVENTION

(18) HV HCBT is based on the double-emitter HCBT structure. Increase in the collector-emitter breakdown voltage with open base (BV.sub.CEO) is achieved by merging collectors of two HS HCBT transistors with opposite orientation of the intrinsic transistors. This geometry allows full depletion of the intrinsic collector in forward active region resulting in the increase of BV.sub.CEO to the value close to collector-base breakdown voltage with open emitter (BV.sub.CBO).

(19) This invention presents the new structure and method for fabrication of HCBT devices with high breakdown voltage by utilizing the substrate-collector junction field to achieve full depletion of the collector region. This principle is similar to the one used in REduced SURface Field (RESURF) devices [6]. Electric field is not necessarily reduced at the surface but at the plane where electric charges are geometrically limited. In general, charge can be limited by isolation material such as in [6, 7] or by opposing pn-junction such as in [5]. If electric charge of one side of the pn-junction is limited geometrically, maximum electric field at the junction is limited by the total amount of charge on that side. Maximum is reached when full depletion of this side of junction occurs.

(20) One way of increasing the BV.sub.CEO of bipolar transistor is to apply aforementioned effect to limit the electric field at the intrinsic base-collector junction below critical value for avalanche multiplication. Therefore, intrinsic collector has to be fully depleted before field at the junction reaches the critical value. Once intrinsic collector is fully depleted, field at the junction remains roughly constant. When electrons (in case of npn transistor) pass through the base-collector junction, direction of the electric field forces them to flow through the drift region, i.e. the region with reduced electric field. In case of DE HCBT the intrinsic collector is surrounded by the base region, which is the most important for full depletion of collector [5]. In case of the proposed HCBT structures, local substrate with increased doping concentration is placed near the intrinsic transistor. In this way collector charge is limited and the full depletion of collector region accomplished when transistor is operated in forward active region.

(21) This principle can be applied on both single emitter (SE) and double-emitter (DE) HCBTs. Collector charge is limited in different part of collector for two structures, yielding different values of BV.sub.CEO. In case of SE HCBT, substrate-collector junction is used to deplete intrinsic collector in order to limit the electric field at the intrinsic base-collector junction. A drift region which sustains collector voltage is formed toward the extrinsic collector. In case of DE HCBT it is used to deplete portion of extrinsic collector in order to limit the peak electric field in the drift region of DE HCBT, which is responsible for transistor breakdown. The second drift region is formed, which sustains collector voltage increasing the BV.sub.CEO.

(22) HCBT is fabricated in bulk silicon p-type wafers with the acceptor concentration around 10.sup.15 cm.sup.3. With this doping concentration in the substrate it is difficult to deplete collector which has the concentration on the order of 10.sup.17 cm.sup.3. In order to have efficient depletion action from the substrate, it should have the concentration on the same order of magnitude as in the collector or higher. CMOS pwell has a suitable concentration and can be used to form the local substrate region, which can be used to introduce collector charge sharing. Moreover, since HCBT is integrated with CMOS this process module is already available resulting in no additional costs.

I. The First Embodiment

(23) In the first embodiment, the local pwell substrate-collector junction 18 is used to change the electric field distribution of the SE HCBT. Cross-section of the SE HCBT with local substrate is shown in FIG. 1. The structure is similar to the reported single polysilicon region HCBT [3, 4]. The only difference is that the CMOS pwell implant is used to fabricate a local pwell substrate region 4A extending for a certain distance opposite to the intrinsic base 8 below the extended silicon island 5, representing the portion of the extrinsic collector. As shown in FIG. 1, the local pwell substrate does not extend all the way below the intrinsic base. This can be geometrically defined by using the isometric projections on the wafer surface defining the wafer plane. Therefore, the intercept between an isometric projection of a base layer comprising an extrinsic base layer, an intrinsic base layer, and a sidewall inclined at an acute angle to said wafer plane and an isometric projection of said buried local pwell substrate on said wafer plane is smaller than said isometric projection of said base layer.

(24) Lithography masks important for the SE HCBT and high-voltage (HV) SE HCBT fabrication are shown in FIGS. 2A and 2B respectively. Standard HCBT process is described in [3, 4]. Transistors are fabricated in the silicon islands, called n-hills 5, which are defined by the shallow trench isolation (STI) using a CMOS active mask 101. The n-hill is implanted by using n-hill mask 102 during CMOS well implantations. The pwell regions 4A and 4B are obtained by using a CMOS pwell blocking mask 103 meaning that the pwell is implanted in the area not covered by the mask 103 shown in FIG. 2A and FIG. 2B. The CMOS pwell implant is also used for the isolation of HCBT devices as a channel stopper shown in FIG. 1, which forms a guard-ring around transistor. Oxide etching mask 105 is used for the formation of an emitter trench and it defines the length of the emitter (l.sub.E) which extends out of plane in the cross-section of FIG. 1. Base mask 104 and CMOS n.sup.+ collector mask 106 are used for intrinsic/extrinsic bases and n.sup.+ diffusion layer 12 implantations, respectively. The local pwell substrate 4A can be extended all the way below the n+ diffusion layer but better electrical performance is achieved if it is not extended. If the local pwell substrate 4A is not extended below the n+ diffusion layers then the intercept between an isometric projection of said n+ diffusion layer on said wafer plane and an isometric projection of said buried local pwell substrate on wafer plane is smaller than said isometric projection of said n+ diffusion layer. Standard CMOS contacts processing is used and masks are omitted from FIGS. 2A, 2B and 2C. Collector contact 15C and n+ diffusion layer 12 make up a region defined as the collector contact region.

(25) In the forward active region, the collector is connected to a higher potential than the base and the substrate is connected to the lowest potential. Both the base-collector and the collector-substrate junctions are reversely polarized and associated depletion regions spread on the intrinsic collector side. A portion of n-hill layer 5 positioned between intrinsic base 8 and local pwell substrate 4A and below the extrinsic base 7 acts as an intrinsic collector. Once the intrinsic collector is fully depleted, penetration of the collector electric field toward intrinsic base is blocked by the extrinsic base from the top and the local pwell substrate from the bottom. As a result, a voltage drop across the intrinsic base-collector junction is limited as well as the maximum electric field. It also results in the suppression of the basewidth modulation by the collector voltage.

(26) In the DE HCBT whose mask is shown in FIG. 2C electrons are flowing from the emitter and then they turn toward the extrinsic collector traveling laterally through the fully depleted intrinsic collector. Therefore, l.sub.E from FIG. 2C should be kept small to reduce the base-collector depletion region transit time and to maintain good high frequency performance. If a higher collector current drive is needed for circuit operation, transistors of unit size should be connected in parallel. In case of the HV SE HCBT depletion of the intrinsic collector occurs in a cross-section shown in FIG. 1 and base-collector depletion region transit time is independent of l.sub.E from FIG. 2B. Hence, the higher current drive can be easily obtained by increasing the l.sub.E giving more flexibility in the layout design.

(27) Electrical Characteristics

(28) Gummel characteristics of the HV SE HCBT are shown in FIG. 3. showing near ideal behavior down to very small currents. Electrons injected from the emitter diffuse through the base and enter the base-collector depletion region. Electric field associated with the extrinsic basecollector junction is pushing electrons downwards, whereas field associated with the local pwell substratecollector junction is pushing electrons upwards and laterally towards the intrinsic base. Therefore electrons traveling through the base-collector depletion region are crowded somewhere in the middle. Since the electric field lines meet along the middle, this border is the plane of zero electric field because no field lines are crossing that border. Direction of the field forces electrons to flow there. Lateral component of the electric field is induced towards extrinsic collector forming the drift region. Therefore, electrons flow toward the extrinsic collector through the region with reduced electric field. After the full depletion of the intrinsic collector, the voltage drop across the intrinsic base-collector junction remains roughly constant and is not increased if the collector voltage is raised. Collector voltage is blocked by the extrinsic base and the local pwell substrate. Due to availability of donor charge in the extrinsic collector, the voltage is dropped in the drift region and the second peak of the electric field appears there and causes the transistor's breakdown, eventually. As in the case of DE HCBT [5], electric field at the curvature of the extrinsic base-collector junction near the top surface (see FIG. 1) is higher than the field in the drift region. Avalanche hole current that is generated at the extrinsic base-collector junction is injected to the emitter, which causes large back-injection of electrons from the emitter. These electrons flow through the base, then base-collector junction with limited electric field and through the drift region with reduced electric field ending up in the extrinsic collector. They do not flow through the junction which is the source of initial avalanche current. Therefore, positive feedback loop is not closed and BV.sub.CEO does not occur unless critical field appear on the current path in the drift region. Therefore, breakdown occurs either if hard breakdown at the extrinsic base-collector junction is reached or when the critical electric field appears in the drift region. In the later case, BV.sub.CEO occurs involving the classical positive feedback due to transistor current gain and in the former case BV.sub.CBO occurs, meaning that BV.sub.CEO is not observed. In that case measured breakdown voltage in the common-emitter output characteristics is actually BV.sub.CBO.

(29) Measured common emitter output characteristics of the HV SE HCBT are shown in FIG. 4. High common-emitter breakdown voltage (BV.sub.CEO), and flat output characteristics are observed. Electrical characteristics of the HV SE HCBT and the high-speed (HS) HCBT are given in Table.1. BV.sub.CEO and V.sub.A are improved in case of HV SE HCBT. BV.sub.CEO of 10.5 V is measured by forced V.sub.BE method as listed in Table 1. Flatness of the output characteristics indicates suppression of the basewidth modulation as a result of the fully depleted collector. A high V.sub.A of 105 V is measured for V.sub.CE between 4 and 5 V. Since the intrinsic base is protected from punchthrough when the collector is fully depleted, the same thin implanted base profile as in other HCBT devices is used. As a result, high of 133 and high .Math.V.sub.A of around 14 kV are obtained indicating transistor's high-performance for analog applications. Additionally, short base transit time is maintained resulting in high f.sub.T and f.sub.max of 15.8 and 32.7 GHz respectively (see FIG. 5.). Of course, the high frequency performance is degraded compared to the HS HCBT device due to aforementioned current crowding effects as well as the increased base-collector depletion region transit time. However a high value of f.sub.T BV.sub.CEO of 166 GHzV is obtained, the result close to the Johnson's limit.

(30) TABLE-US-00001 TABLE I MEASURED ELECTRICAL PARAMETERS OF HIGH VOLTAGE SINGLE-EMITTER (HV SE) HCBT AND HIGH SPEED (HS) HCBT HV SE HCBT HS HCBT .sub.max 133 151 V.sub.A, (V) 105 10.6 (V.sub.CE = 4~5 V) BV.sub.CEO (V) 10.5 3.95 (forced V.sub.BE) f.sub.T (GHz) 15.8 35.7 f.sub.max (GHz) 32.7 61 f.sub.TBV.sub.CEO(GHzV) 166 141 .Math. V.sub.A, (kV), 13.97 1.6

II. The Second Embodiment

(31) In the second embodiment local pwell substrate-collector junction 18 is used to change the electric field distribution of the DE HCBT.

(32) Intrinsic part of the proposed structure is the same as in standard DE HCBT and is shown in FIG. 6A. Intrinsic bases 8 and emitters 10 are processed on two opposing sidewalls, whereas extrinsic bases are merged on top forming single extrinsic base 7. Extrinsic base layer 7, and base contact 15B make up a region defined as the base contact region. Extrinsic base layer 7 forms a metallurgical pn-junction with n-hill layer 5 and a metallurgical p+p junction with intrinsic base 8 as shown in FIG. 6A. Two intrinsic collectors are merged, and extrinsic collectors are folded to front and back in the plane perpendicular to the intrinsic transistor, which is shown in FIG. 6B in case of standard DE HCBT. In this way, low resistive path for setting the collector potential is achieved. Extrinsic base layer 7 extends laterally with respect to the intrinsic base layers as shown in FIG. 6B and FIG. 6C. This means that isometric projection of said extrinsic base layer on said wafer plane which is not intercepted with isometric projection of said intrinsic base layer on said wafer plane consists of at least one polygon having finite area larger than zero. As noted above, collector contact 15C and n+ diffusion layer 12 make up a region defined as the collector contact region. The intrinsic collector shown in the cross-section of FIG. 6A is surrounded by two intrinsic bases 8 from two sides as well as the extrinsic base 7 and the substrate 1 from the top and bottom, respectively. The basic idea is that the total intrinsic collector charge in the plane shown in FIG. 6A is confined in space and therefore can be changed by the geometry of the transistor. Since the vertical doping profile is set by the technology of HS HCBT, only the distance between two intrinsic bases can be changed to modulate total intrinsic collector charge. This can be easily accomplished by the design of lithography masks and without any additional processing. In forward active region of operation collector-base junction is reverse biased. For a certain voltage, depletion regions of two opposite junctions merge in the middle and the intrinsic collector is fully depleted. Further increase in the collector voltage causes the voltage drop toward extrinsic collector in direction perpendicular to the intrinsic transistor shown in cross-section in FIG. 6B. and drift regions DR1 are formed. Therefore, when intrinsic collector becomes fully depleted, voltage drop across the intrinsic base-collector junction is limited as well as the electric field. Due to the voltage drop across the drift region, electric field can be increased there causing the second peak of the electric field at the end of the drift region [5], which appears along the current path in the base-collector depletion region. If critical electric field is achieved along the current path, classical BV.sub.CEO breakdown involving positive feedback due to transistor gain occurs. If electric field at extrinsic base-collector junction rises to critical value for hard breakdown prior to critical field in the drift region, then BV.sub.CBO occurs and BV.sub.CEO does not occur. This can be controlled by transistor geometry and collector doping profile.

(33) In the second embodiment presented here, the local pwell substrate-collector junction 18 is used to deplete top portion of the n-hill in order to limit the electric field which is formed in the drift region DR1 of DE HCBT. At the same time, the peak electric field at the curvature of the extrinsic base-collector junction near the top surface which is responsible for the BV.sub.CBO is limited as well. This is done in a similar manner as in RESURF devices and we will call this device DE HCBT with RESURF region.

(34) Cross-sections at the symmetry lines of the DE HCBT with RESURF region are shown in FIG. 6A and FIG. 6C. Cross-section along the middle of the n-hill 5 is shown in FIG. 6C. Since the structure is symmetrical with respect to the base contact, only one half is shown. Compared to standard DE HCBT shown in FIG. 6B this one has extended extrinsic collector under which CMOS pwell is implanted, which serves as a local substrate 4A with increased doping concentration. As shown in FIG. 6C, this pwell substrate 4A is placed locally and it does not extend all the way below the intrinsic bases 8. Therefore, the intercept between an isometric projection of said intrinsic base layer on said wafer plane and an isometric projection of said buried local pwell substrate on said wafer plane is smaller than said isometric projection of said intrinsic base layer. The local pwell substrate can be extended all the way below n+ diffusion layer 12 but better electrical performance is achieved if it is not completely extended. If local pwell substrate 4A is not extended below n+ diffusion layer 12 then the intercept between an isometric projection of said n+ diffusion layer on said wafer plane and an isometric projection of said buried local pwell substrate on wafer plane is smaller than said isometric projection of said n+ diffusion layer. Pwell implant is also used as a channel stopper in all HCBT devices, which is shown in the cross-section in FIG. 6A. Lithography masks important for the standard DE HCBT and DE HCBT with RESURF region are shown in FIG. 7A and FIG. 7B. The same mask set and the same process is used for all HCBT structures.

(35) In normal operation substrate is connected to the ground potential. By increasing the collector voltage, junction between local pwell substrate 4A and n-hill 5 is reversely polarized. The basic idea is that the n-hill above the local pwell substrate is fully depleted if collector voltage is increased and that the second drift region DR2 (FIG. 6C) is formed.

(36) The change of the electric field with the increase of the collector-emitter voltage (V.sub.SE) is shown in FIG. 8A and FIG. 8B. For small V.sub.CE, peak electric field at the intrinsic base-collector junction increases with V.sub.CE as shown in FIG. 8A and depletion regions spread into the intrinsic collector. After intrinsic collector is fully depleted, there is no available donor charge in this cross-section (FIG. 6A) and maximum electric field at junctions remains unchanged. The voltage is dropped in the perpendicular cross-section across the 1.sup.st drift region (DR 1 in FIG. 6C) toward extrinsic collector. Electric field along the current path at the middle of the n-hill is shown in FIG. 8B. As the V.sub.CE is increased, the 2.sup.nd peak of the electric field appears in DR 1, whereas the 1.sup.st peak at the intrinsic base-collector junction (FIG. 8A) remains the same because collector voltage is blocked by the extrinsic base extensions above DR 1 [5]. Further increase in V.sub.CE increases the 2.sup.nd peak up to the voltage for which extrinsic collector above local pwell substrate becomes fully depleted and the 2.sup.nd drift region (DR 2) is formed. Additional increase in V.sub.CE causes the voltage drop across the DR 2. Collector voltage is partially blocked by the pwell region reducing its impact on the value of the electric field 2.sup.nd peak. Since there is enough available charge in the extrinsic collector, the 3.sup.rd peak of the electric field appears at the end of the DR 2 (FIG. 8B). The ability of the pwell region to block the collector voltage determines weather the critical field first appears in the 2.sup.nd or the 3.sup.rd peak of the electric field resulting in different values of BV.sub.CEO. This can be controlled by the collector concentration in the DR 2 and the length of DR 2. Another result of the formation of DR2 and its ability to block the collector voltage is that the peak electric field responsible for BV.sub.CBO, which is placed at the extrinsic base-collector junction, is limited as well.

Electrical Characteristics

(37) Gummel characteristics of the transistor with the length of local pwell substrate (i.e. DR 2 from FIG. 6C) l.sub.pw=0.5 m is shown in FIG. 9. Measured common emitter output characteristics of fabricated transistors with different l.sub.pw are shown in FIG. 10. Breakdown occurs around 26 V for the transistor with l.sub.pw=0.5 m and around 36 V for transistor with d.sub.pw=3 m. Summary of electrical characteristics is given in Table II.

(38) TABLE-US-00002 TABLE II MEASURED ELECTRICAL PARAMETERS OF DOUBLE-EMITTER (DE) HCBT WITH RESURF R REGION FOR N-HILL WIDTH OF 0.36 m AND DIFFERENT LENGTH d.sub.pw. Emitter area (m.sup.2) l.sub.pw = 0.5 m l.sub.pw = 3 m .sub.max 123 129 V.sub.A, (V), (I.sub.B = 15 nA) 1928 2233 (V.sub.CE = 6~7 V) (V.sub.CE = 6~7 V) BV.sub.CEO (V), output 26 36 BV.sub.CS (V) 33 36 f.sub.T (GHz) 5.26 2.68 f.sub.max (GHz) 10.55 4.55 f.sub.TBV.sub.CEO(GHzV) 137 164 .Math. V.sub.A, (kV), 2.37 2.88

(39) In case of transistor with l.sub.pw=0.5 m classical BV.sub.CEO occurs between collector and emitter and in the case of transistor with l.sub.pw=3 m, the breakdown occurs between local pwell substrate and n-hill and basically transistors' BV.sub.CEO which involves positive feedback due to transistor current gain is not observed. This means that neither the 2.sup.nd nor the 3.sup.rd peak from FIG. 8B. generate holes which can close the positive feedback loop and cause BV.sub.CEO. The 2.sup.nd peak is limited below critical value for avalanche, whereas holes generated at the 3.sup.rd peak are collected by the substrate since they have to travel through the DR2 to end up in the extrinsic base, which is less probable for structure with l.sub.pw=3 m than for structure with l.sub.pw=0.5 m, because strong vertical electric field component acts in the DR2. This is confirmed by the measurement of collector-substrate breakdown voltage (BV.sub.CS) which equals BV.sub.CEO measured from the output characteristics for the structure with l.sub.pw 3 m, meaning that breakdown voltage observed in the output characteristics is actually BV.sub.CS. In case of l.sub.pw=0.5 m transistor BV.sub.CS is slightly smaller compared to transistor with l.sub.pw=3 m due to smaller distance between local pwell substrate and n+ diffusion layer. Intrinsic base-collector junction is electrostatically shielded and basewidth modulation is suppressed resulting in very large value of Early voltage, which equals around 1.93 kV and 2.23 kV for transistor with l.sub.pw=0.5 m and l.sub.pw=3 m, respectively. Since the value of current gain is high, considering that transistor has implanted base, the .Math.V.sub.A product is remarkable. Dependence of cut-off frequency (f.sub.T) and maximum oscillation frequency (f.sub.max) on collector current are shown in FIG. 11. In this structure, speed is traded for higher BV and f.sub.T and f.sub.max are reduced accordingly. Nevertheless, f.sub.T.Math.BV.sub.CEO products show results close to the Johnson's limit.

DESCRIPTION OF SYMBOLS

(40) 1: Silicon substrate 2: Shallow trench isolation (device isolating oxide film) 3: CMOS nwell 4A: Local pwell substrate 4B: CMOS pwell layer 5: n-hill layer 6: CMOS gate polysilicon 7: Extrinsic base layer 8: Intrinsic base layer 9: Emitter polysilicon 10: Emitter diffusion layer 11: Sidewall spacer 12: n+ diffusion layer 13: p+ diffusion layer 14: Silicide 15A: Emitter contact 15B: Base contact 15C: Collector contact 15D: Substrate contact 16: First metallurgical pn junction 17: Second metallurgical pn junction 18: Third metallurgical pn junction 101: CMOS active mask 102: n-hill mask 103: CMOS pwell-block mask 104: Base mask 105: Oxide etching mask 106: CMOS n+ collector mask

REFERENCES

(41) [1] T. Suligoj et al, U.S. Pat. No. 7,038,249, 2006 [2] T. Suligoj, P. Biljanovic, J. K. O. Sin, K. L. Wang. A New HCBT with a Partially Etched Collector, IEEE Electron Dev. Letters, Vol. 26, No. 3, pp. 200-202, March 2005 [3] T. Suligoj et al, U.S. Pat. No. 8,569,866, 2013 Hybrid-integrated lateral bipolar transistor and CMOS transistor and method for manufacturing the same [4] T. Suligoj, M. Kori{hacek over (c)}i, H. Mochizuki, S. Morita, K. Shinomura, and H. Imai, Horizontal Current Bipolar Transistor (HCBT) with a Single Polysilicon Region for Improved High-Frequency Performance of BiCMOS ICs, IEEE Electron Device Lett., vol. 31, no. 6, pp. 534-536, June 2010. [5] M. Kori{hacek over (c)}i, T. Suligoj, H. Mochizuki, S. Morita, K. Shinomura, and H. Imai, Double-Emitter HCBT StructureA High-Voltage Bipolar Transistor for BiCMOS Integration,, IEEE Trans. Electron Devices, vol. 59, no. 12 pp. 3647-3650, December 2012. [6] J. A. Appels, and H. M. J Vaes, High Voltage Thin Layer Devices (RESURF Devices), in IEDM Tech. Dig., 1979, pp. 238-241. [7] J. Cai, M. Kumar, M. Steigenvalt, H. Ho, K. Schonenberg, K. Stein, H. Chen, K. Jenkins, Q. Ouyang, P. Oldiges, and T. Ning, Vertical SiGe-Base Bipolar Transistors on CMOS-Compatible SOI Substrate, BCTM 2003, pp. 215-218.