Black wheels for transporting ultra-thin silicon wafer
12489008 ยท 2025-12-02
Assignee
Inventors
Cpc classification
B65H3/48
PERFORMING OPERATIONS; TRANSPORTING
B28D5/0082
PERFORMING OPERATIONS; TRANSPORTING
B65H29/54
PERFORMING OPERATIONS; TRANSPORTING
B65H29/56
PERFORMING OPERATIONS; TRANSPORTING
B65G49/068
PERFORMING OPERATIONS; TRANSPORTING
International classification
B65H3/48
PERFORMING OPERATIONS; TRANSPORTING
B28D5/00
PERFORMING OPERATIONS; TRANSPORTING
B65G49/06
PERFORMING OPERATIONS; TRANSPORTING
B65H29/54
PERFORMING OPERATIONS; TRANSPORTING
B65H29/56
PERFORMING OPERATIONS; TRANSPORTING
Abstract
A black wheel for transporting an ultra-thin silicon wafer may include grooves provided on a side surface of the black wheel along a circumferential direction of the black wheel. Compressed air lines are respectively accommodated within the grooves, and an air outlet of each of the compressed air lines is provided to align with a side of the ultra-thin silicon wafer close to a next process device.
Claims
1. A black wheel for transporting an ultra-thin silicon wafer to a next process device, comprising grooves provided on a side surface of the black wheel along a circumferential direction of the black wheel, wherein compressed air lines are fixed onto a guard plate of the next process device and respectively accommodated within the grooves; during a process of transporting the ultra-thin silicon wafer, the black wheel is configured to keep rotating such that the ultra-thin silicon wafer is first absorbed onto the side surface of the black wheel and then transported towards the next process device; the grooves are configured to avoid the compressed air lines such that the black wheel, the ultra-thin silicon wafer absorbed onto the side surface of the black wheel, and the compressed air lines are not interfered with each other; and the compressed air lines are configured to blow an end of the ultra-thin silicon wafer absorbed onto the side surface of the black wheel away from the side surface when the end of the ultra-thin silicon wafer approaches the next process device, such that the end of the ultra-thin silicon wafer blown away from the side surface is transported onto the next process device.
2. The black wheel of claim 1, wherein the grooves are arranged parallel to an end surface of the black wheel.
3. The black wheel of claim 1, wherein the grooves are uniformly distributed on a side surface of the black wheel along an axial direction of the black wheel.
4. The black wheel of claim 1, wherein respective bottom surfaces of the grooves are at a same distance from a side surface of the black wheel, and the compressed air lines are provided at a same height from the side surface of black wheel.
5. The black wheel of claim 1, wherein the compressed air lines are in clearance fit with the grooves respectively.
6. The black wheel of claim 1, wherein each of the grooves has a depth larger than a diameter of each of the compressed air lines.
7. The black wheel of claim 1, wherein both side faces of each of the grooves are disposed vertically.
8. The black wheel of claim 1, wherein both side faces of each of the grooves are disposed symmetrically inclined with respect to a vertical direction.
9. The black wheel of claim 1, wherein when the ultra-thin silicon wafer is absorbed onto the side surface of the black wheel and approaches the next process device, an air outlet of each of the compressed air lines faces a side of the ultra-thin silicon wafer facing the black wheel and faces away from the next process device.
10. The black wheel of claim 1, wherein the black wheel is located between the ultra-thin silicon wafer to be transported and the next process device.
11. A black wheel for transporting an ultra-thin silicon wafer, wherein the black wheel is configured to convert the ultra-thin silicon wafer from a vertical state to a horizontal state and transport the ultra-thin silicon wafer onto a horizontal conveyor belt at a next process; wherein the black wheel comprises grooves provided on a side surface of the black wheel along a circumferential direction of the black wheel; compressed air lines are fixed onto a guard plate of the conveyor belt and respectively accommodated within the grooves; during a process of transporting the ultra-thin silicon wafer, the black wheel is configured to keep rotating such that the ultra-thin silicon wafer in the vertical state is first absorbed onto the side surface of the black wheel and then transported towards the conveyor belt; the grooves are configured to avoid the compressed air lines such that the black wheel, the ultra-thin silicon wafer absorbed onto the side surface of the black wheel, and the compressed air lines are not interfered with each other; and the compressed air lines are configured to blow an end of the ultra-thin silicon wafer absorbed onto the side surface of the black wheel away from the side surface when the end of the ultra-thin silicon wafer approaches the conveyor belt, such that the end of the ultra-thin silicon wafer blown away from the side surface is transported onto the conveyor belt.
12. The black wheel of claim 11, wherein the grooves are arranged parallel to an end surface of the black wheel.
13. The black wheel of claim 11, wherein the grooves are uniformly distributed on a side surface of the black wheel along an axial direction of the black wheel.
14. The black wheel of claim 11, wherein respective bottom surfaces of the grooves are at a same distance from a side surface of the black wheel.
15. The black wheel of claim 11, wherein the compressed air lines are in clearance fit with the grooves.
16. The black wheel of claim 11, wherein each of the grooves has a depth larger than a diameter of each of the compressed air lines.
17. The black wheel of claim 11, wherein both side faces of each of the grooves are disposed vertically.
18. The black wheel of claim 11, wherein both side faces of each of the grooves are disposed symmetrically inclined with respect to a vertical direction.
19. The black wheel of claim 11, wherein when the ultra-thin silicon wafer is absorbed onto the side surface of the black wheel and approaches the conveyor belt, an air outlet of each of the compressed air lines faces a side of the ultra-thin silicon wafer facing the black wheel and faces away from the conveyor belt.
20. The black wheel of claim 11, wherein the black wheel is located between the ultra-thin silicon wafer to be transported and the conveyor belt.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
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LIST OF REFERENCE SIGNS
(8) TABLE-US-00001 1: Black wheel; 2: Groove; 3: Compressed air line; 3.1: Air outlet; 4: Silicon wafer; 5: Liquid tank; 6: Horizontal conveyor belt; 7: Guard plate; 41: End surface; 42 Side surface.
DETAILED DESCRIPTION
(9) An embodiment of the present disclosure provides a black wheel which may be configured to transport ultra-thin silicon wafers, and an embodiment of the present disclosure is described below with reference to accompanying drawings.
(10) As shown in
(11) In an embodiment of the present disclosure, as shown in
(12) In an embodiment of the present disclosure, the grooves 2 are uniformly distributed on the side surface 42 of the black wheel 1 along an axial direction of the black wheel 1, to obtain same surface adsorption forces from different portions of the black wheel 1.
(13) In an embodiment of the present disclosure, in order to make the compressed air lines installed at a same height in the grooves 2, bottom surfaces of the grooves 2 are at a same distance from the side surface 42 of the black wheel 1. In a sectional view, the bottom surface of each of the grooves 2 may have a straight line shape in a horizontal direction or a curve shape. When the bottom surfaces of the grooves 2 have the straight line shape in the horizontal direction in the sectional view, the straight lines have a same height from the side surface 42 of the black wheel 1. In a sectional view, when the bottom surfaces of the grooves 2 have the curve shape, the curves have a same shape, and the curves are at a same distance from the side surface 42 of the black wheel 1.
(14) In an embodiment of the present disclosure, the compressed air lines 3 are fixed onto guard plates 7 on both sides of the horizontal conveyor belt 6, and the black wheel 1 is rotated. Therefore, the compressed air lines 3 are in clearance fit with the grooves 2 on the black wheel 1. The manner for fixing the compressed air lines 3 is not limited herein, as long as the rotation of the black wheel 1 and the transport of the silicon wafer 4 are not interfered. For example, the compressed air line 3 may be supported by a bracket and fixed with a clamp, and the bracket may be fixed to the guard plates 7 on the both sides of the horizontal conveyor belt 6. In order to uniformly distribute the air flow, the compressed air lines 3 are disposed at middles of the grooves 2. In an embodiment of the present disclosure, the compressed air lines 3 may be provided at a same height from the side surface 42 of black wheel. The compressed air line 3 includes PE or stainless steel, and a material of the compressed air line 3 is not limited herein.
(15) In an embodiment of the present disclosure, as shown in
(16) In an embodiment of the present disclosure, in order that the compressed air lines 3 does not interfere with the transport of the silicon wafer 4, each of the grooves 2 has a depth larger than a diameter of each of the compressed air lines 3, so that the compressed air lines 3 may be received within the groove 2.
(17) Embodiment 1: as shown in
(18) Embodiment 2: As shown in
(19) A black wheel for transporting ultra-thin silicon wafers according to an embodiment of the present disclosure may achieve the following advantages effects:
(20) By providing the grooves 2, an adsorption area between the black wheel 1 and the ultra-thin silicon wafer 4 may be reduced. By providing the compressed air lines 3, the adsorption of the silicon wafer 4 by the black wheel 1 may be further reduced, and a side of the silicon wafer 4 close to the horizontal conveyor belt 6 is blown up, to avoid from being tightly attached on the black wheel 1, thereby reducing a bending degree of the silicon wafer 4, avoiding damage to the silicon wafer 4, and facilitating the silicon wafer 4 to be transported to the next process, thereby improving the efficiency.
(21) Some embodiments of the present disclosure have been described in detail above, but should not be considered as limiting the scope of the present disclosure. All equivalents and modifications made in accordance with the embodiments of the present disclosure shall still fall within the scope of the present disclosure.