A light beam measurement device includes: a polarization measurement unit including a first measurement beam splitter provided on an optical path of a laser beam and configured to measure a polarization state of the laser beam having been partially reflected by the first measurement beam splitter; a beam profile measurement unit including a second measurement beam splitter provided on the optical path of the laser beam and configured to measure a beam profile of the laser beam having been partially reflected by the second measurement beam splitter; and a laser beam-directional stability measurement unit configured to measure a stability in a traveling direction of the laser beam, while the first measurement beam splitter and the second measurement beam splitter are made of a material containing CaF.sub.2.

A light beam measurement device includes: a polarization measurement unit including a first measurement beam splitter provided on an optical path of a laser beam and configured to measure a polarization state of the laser beam having been partially reflected by the first measurement beam splitter; a beam profile measurement unit including a second measurement beam splitter provided on the optical path of the laser beam and configured to measure a beam profile of the laser beam having been partially reflected by the second measurement beam splitter; and a laser beam-directional stability measurement unit configured to measure a stability in a traveling direction of the laser beam, while the first measurement beam splitter and the second measurement beam splitter are made of a material containing CaF.sub.2.

A system and method for detecting laser pulses is disclosed. According to one embodiment, the present system detects an extrasolar laser pulse, ideally repeated pulses, by observing the pulse, characterizing the pulse, and confirming the data related to the pulse.

A system and method for detecting laser pulses is disclosed. According to one embodiment, the present system detects an extrasolar laser pulse, ideally repeated pulses, by observing the pulse, characterizing the pulse, and confirming the data related to the pulse.

The disclosure relates to the measurement of temporal characteristics of optical pulses. Embodiments may be used for single-shot characterization of picosecond optical pulses. The optical pulse may be split into a plurality of ancillary pulses. Amounts of distortion may be added to the plurality of ancillary pulses. An instantaneous power of the plurality of ancillary pulses may be measured. Thereafter, an experimental trace with the measured instantaneous powers may be constructed and the experimental trace may be outputted. The experimental trace may be processed to calculate temporal characteristics of the input optical pulse. A fiber assembly may be used to split the pulse into the plurality of ancillary pulses. The fiber assembly may include one or more splitters. The one or more splitters may direct the ancillary pulses along different optical paths having different lengths to temporally separate the ancillary pulses and to add amounts of distortion.

A pulse analysis system or method includes a frequency filter that receives an ultrafast pulse under test and disperses the pulse under test over a frequency range. The frequency filter separates the pulse under test into component frequency slices and provides the frequency slices to a detector coupled to a digitizer, which processes the digitized signal and collects a sonogram characteristic of the pulse under test. The frequency slices are arranged to overlap. Ptychography is performed on the sonogram to obtain characteristics of the pulse under test.

A method and a system for measurement of high laser field intensity, the method comprising tight focusing a non-Gaussian azimuthally polarized laser mode beam to a focusing spot, measuring a spectral line shape of a selected ionization state induced by a longitudinal oscillating magnetic field created by the tight focusing in the focusing spot; and determining the laser intensity from the spectral line shape. The system comprises a laser source of a peak power in a range between 100 terawatt and 10 petawatt; a converter unit; a tight focusing optics; and spectral measurement means; wherein the converter unit polarizes a main laser beam from the laser source into a non-Gaussian azimuthally polarized laser mode beam; the tight focusing optics focuses the azimuthally polarized laser mode beam to a focusing spot, yielding a longitudinal oscillating magnetic field of an intensity proportional to the laser intensity, the spectral measurement means measuring a line shape of a selected ionization state induced by the longitudinal oscillating magnetic field in focusing spot.

A femtosecond laser based laser processing system having a femtosecond laser, frequency conversion optics, beam manipulation optics, target motion control, processing chamber, diagnostic systems and system control modules. The femtosecond laser based laser processing system allows for the utilization of the unique heat control in micromachining, and the system has greater output beam stability, continuously variable repetition rate and unique temporal beam shaping capabilities.

A femtosecond laser based laser processing system having a femtosecond laser, frequency conversion optics, beam manipulation optics, target motion control, processing chamber, diagnostic systems and system control modules. The femtosecond laser based laser processing system allows for the utilization of the unique heat control in micromachining, and the system has greater output beam stability, continuously variable repetition rate and unique temporal beam shaping capabilities.

The invention relates to a device (2) and to a method for characterizing an ultrashort laser pulse. Furthermore, the invention relates to use of a self-contained optical assembly in a device (2) for characterizing an ultrashort laser pulse. The device (2) comprises an imaging optical element (4) configured to image the incident laser pulse (6) in a direction of a straight line (L). A first optical element (10) is configured to apply predetermined varying group delay dispersion on the line focused laser pulse. A non-linear optical element (14) is configured to generate a second harmonic laser pulse (30). An optical grating (20) generates a diffraction of the second harmonic laser pulse, which is imaged on a flat sensor (24). A processing unit (36) determines a best fit for the captured image thereby calculating a frequency spectrum and a spectral phase of the laser pulse.