Low-cost devices for measuring radar transmission and/or reflectance of coated articles are provided. An exemplary low-cost radar transmission and reflection measurement device includes a radar transmitter that emits a radar signal, a radar target to which the radar signal is directed, and a radar receiver that receives the radar signal. Further, the exemplary low-cost device includes a sample holder located between the radar transmitter and the radar target and between the radar target and the radar receiver. The sample holder receives a sample including a coating. The low-cost device also includes a controller connected to the radar transmitter and radar receiver. The controller measures a radar signal loss due to the coating.

Methods and devices for estimating a component transmission loss are provided. In an exemplary embodiment, a method includes receiving a desired substrate criterion of a desired substrate, and receiving a desired coating criterion of a desired coating. A component includes the desired substrate and the desired coating. A coating criterion value is received, where the coating criterion value quantifies the desired coating criterion. A desired coating permittivity is estimated for the desired coating, using the coating criterion value, and an estimated component transmission loss of radar signal through the component is produced.

A sensor for detecting a volatile compound or gas. The sensor includes a transducer having: a planar resonator including a plurality of metal tracks, on a printed circuit, of the coplanar type; and a sensitive layer deposited on a predetermined portion of the resonator. The sensitive layer is configured so that the presence of a volatile compound or of a gas to be detected implies a modification of the permittivity of the sensitive layer resulting in a modification of the features of the sensor during its electrical power supply.

A method of protecting humans in an environment of a moving machine is provided that comprises the environment being monitored by means of a protective device that is configured to detect one or more kinematic parameters of a respective object located in the environment and controlling the moving machine in dependence on detected kinematic parameters of the respective object to initiate a protective measure. The protective equipment here detects the polarization properties and a movement modulation of the respective object in dependence on which the respective object is classified with respect to whether the respective object is a human. In particular only when the respective object was classified as a human, the protective equipment controls the moving machine to initiate the protective measure in dependence on detected kinematic parameters of this respective object.

Various examples related to microwave dielectric analyzers and their use are provided. In one example, a microwave dielectric analyzer includes a measurement apparatus having a conductive electrode that can couple to a microwave analyzer and processing circuitry that can determine a dielectric characteristic of the dielectric specimen using a reflection coefficient measured by the microwave analyzer. The dielectric characteristic can be determined using a computational electromagnetic model of the measurement apparatus. The reflection coefficient can be measured by the microwave analyzer with the dielectric specimen in contact with the conductive electrode and/or sandwiched between conductive electrodes. The conductive electrodes can be axially aligned, and the second electrode may not be coupled to the microwave analyzer.

Various examples related to microwave dielectric analyzers and their use are provided. In one example, a microwave dielectric analyzer includes a measurement apparatus having a conductive electrode that can couple to a microwave analyzer and processing circuitry that can determine a dielectric characteristic of the dielectric specimen using a reflection coefficient measured by the microwave analyzer. The dielectric characteristic can be determined using a computational electromagnetic model of the measurement apparatus. The reflection coefficient can be measured by the microwave analyzer with the dielectric specimen in contact with the conductive electrode and/or sandwiched between conductive electrodes. The conductive electrodes can be axially aligned, and the second electrode may not be coupled to the microwave analyzer.

Provided is a method of evaluating a silicon wafer manufacturing process for mass-producing multiple silicon wafers. Lifetime measurement to silicon wafers mass-produced in the silicon wafer manufacturing process is performed in different locations within a surface of each of the silicon wafers and multiple measurement values are obtained. The representative value is determined for each of the silicon wafers from the multiple measurement values. The determination threshold is obtained for each wafer group including multiple silicon wafers using the representative value for each of the silicon wafers included in the wafer group. Whether the wafer group includes a silicon wafer having a lifetime outlier determined on the basis of the determination threshold among the multiple measurement values obtained for each of the silicon wafers is determined, and whether the manufacturing process may cause a defective product to be produced is determined.

The present disclosure relates to a steady-state microwave conductivity method that includes modulating a light beam to form an amplitude modulated light having a modulation frequency ω.sub.1, producing a microwave waveform, exposing a sample to the amplitude modulated light and a first portion of the microwave waveform to produce an amplitude modulation signal on the first portion of the microwave waveform, and mixing a second portion of the microwave waveform and the amplitude modulation signal to produce a first signal and a second signal.

An apparatus for measuring an electromagnetic property of a material sample, includes: a housing having an internal cavity and a removable cover, wherein the housing with cover forms an electromagnetic resonance chamber; a container configured to receive the material sample, wherein the container extends along a y-axis of the housing through opposing sidewalls of the housing and passes through an x-y-z center point of the cavity; two opposing electrical signal lines oriented along an x-axis of the housing are disposed and configured to couple to an electromagnetic resonant mode of the cavity; at least one resonator concentrically disposed about the container and disposed within the cavity, wherein the at least one resonator is fixed or fixedly movable relative to the y-axis; and, a frequency tuner concentrically disposed about the container and at least partially disposed within the cavity, wherein the frequency tuner is fixedly movable along the y-axis.

A NEMS readout system includes a sensor array comprising a plurality of sensors. Each sensor of the plurality of sensors including a resonator with frequency characteristics different from the resonator of each other sensor of the plurality of sensors. A readout signal indicative of a plurality of output signals is collected from the sensor array. Each output signal of the plurality of output signals corresponding to one of the plurality of sensors. An analysis of the plurality of output signals is performed to identify a plurality of resonant frequencies and to detect a frequency shift associated with at least one of the plurality of resonant frequencies.