Patent classifications
G01R27/00
Power supply protection device and method thereof
A power supply protection device including a driving circuit, a logic control unit and a protection module is provided. The driving circuit adjusts an external voltage according to a first driving signal and a second driving signal and outputs a driving voltage. The logic control unit generates the first driving signal and the second driving signal according to a protection signal and a pulse signal. The protection module outputs a plurality of test currents orderly to detect a plurality of impedances of the driving circuit before the driving circuit receives the external voltage, generates a plurality of voltage signals according to the impedances and compares the voltage signals with a plurality of reference voltages to generate the protection signal. A power supply protecting method for protecting a driving circuit is also provided.
Power supply protection device and method thereof
A power supply protection device including a driving circuit, a logic control unit and a protection module is provided. The driving circuit adjusts an external voltage according to a first driving signal and a second driving signal and outputs a driving voltage. The logic control unit generates the first driving signal and the second driving signal according to a protection signal and a pulse signal. The protection module outputs a plurality of test currents orderly to detect a plurality of impedances of the driving circuit before the driving circuit receives the external voltage, generates a plurality of voltage signals according to the impedances and compares the voltage signals with a plurality of reference voltages to generate the protection signal. A power supply protecting method for protecting a driving circuit is also provided.
Capacitive based system to detect objects behind an obscuring surface
A capacitive detection and display device and method is used to simultaneously detect and display an image of an object hidden behind an obscuring surface. An electrode applies an electric field to a chamber having a visual display material which is located between the electrode and the obscuring surface. A sensitivity enhancement device is located within the electric field between the chamber and the obscuring surface to increase the sensitivity of the detection and display device and increase its depth of penetration through the obscuring surface. In one embodiment, the sensitivity device comprises an array of sensitivity electrodes formed on a nonconductive substrate. The shape of a hidden object is visually displayed by the visual display material.
Capacitive based system to detect objects behind an obscuring surface
A capacitive detection and display device and method is used to simultaneously detect and display an image of an object hidden behind an obscuring surface. An electrode applies an electric field to a chamber having a visual display material which is located between the electrode and the obscuring surface. A sensitivity enhancement device is located within the electric field between the chamber and the obscuring surface to increase the sensitivity of the detection and display device and increase its depth of penetration through the obscuring surface. In one embodiment, the sensitivity device comprises an array of sensitivity electrodes formed on a nonconductive substrate. The shape of a hidden object is visually displayed by the visual display material.
Method and apparatus for electrical impedance measurements
An impedance measurement method is provided having a certain level of measurement sensitivity across all ranges of impedance and capable of covering a wide measurement range. In the method, a device under test (DUT) is connected in series or in parallel to a signal line, a measurement signal is transmitted from a signal source, an input signal a.sub.1 into the DUT, a reflected signal reflected from the DUT, and a passed signal that passed through the DUT are measured, S-parameters S.sub.11 and S.sub.21 are calculated based on respective measured values of the input signal, the reflected signal, and the passed signal, and an impedance Z.sub.x of the DUT is calculated based on a formula: Z.sub.x=2Z.sub.0S.sub.11/S.sub.21, where Z.sub.0 is a characteristic impedance.
Method and apparatus for electrical impedance measurements
An impedance measurement method is provided having a certain level of measurement sensitivity across all ranges of impedance and capable of covering a wide measurement range. In the method, a device under test (DUT) is connected in series or in parallel to a signal line, a measurement signal is transmitted from a signal source, an input signal a.sub.1 into the DUT, a reflected signal reflected from the DUT, and a passed signal that passed through the DUT are measured, S-parameters S.sub.11 and S.sub.21 are calculated based on respective measured values of the input signal, the reflected signal, and the passed signal, and an impedance Z.sub.x of the DUT is calculated based on a formula: Z.sub.x=2Z.sub.0S.sub.11/S.sub.21, where Z.sub.0 is a characteristic impedance.
TOUCH STRUCTURE, TEST METHOD THEREOF, TOUCH PANEL AND DISPLAY APPARATUS
The present disclosure provides a touch structure, a test method thereof, a touch panel and a display apparatus. In the touch structure, by taking touch driving electrodes as an example, a plurality of third leads which are insulated from each other and are in one-to-one correspondence with various touch driving electrodes are additionally provided, wherein each of the third leads has one terminal electrically connected to a corresponding touch driving electrode and the other terminal serving as a test point for testing whether there is an open circuit on the corresponding touch driving electrode and the corresponding first lead. In this way, two probes may be placed at a test point in a third lead and a first wiring terminal in a binding area respectively when an open circuit test is conducted on each of the touch driving electrodes and a corresponding first lead.
Enabling a Trigger in a Test and Measurement Instrument
A test and measurement instrument, such as an oscilloscope, including one or more ports to receive one or more signals from a device under test, a trigger enable logic circuit configured to output a trigger enabled signal when a trigger enable event occurs within the one or more signals, the trigger enable event being a real-time event of the one or more signals, one or more trigger logic circuits configured to generate a plurality of trigger signals when the trigger enable signal is received, each trigger signal being generated when a trigger event occurs within one of the one or more signals, and an acquisition circuit configured to acquire and store data in a memory in response to each of the trigger signals.
SILVER NANOSTRUCTURE-BASED OPTICAL STACKS AND TOUCH SENSORS WITH UV PROTECTION
Disclosed herein are optical stacks that are stable to light exposure by incorporating one or more UV-blocking layers.
SILVER NANOSTRUCTURE-BASED OPTICAL STACKS AND TOUCH SENSORS WITH UV PROTECTION
Disclosed herein are optical stacks that are stable to light exposure by incorporating one or more UV-blocking layers.