An example apparatus includes a circuit and calibration circuitry. The circuit has complementary input ports to receive input signals including a monotonously rising and/or falling wave reference signal and a voltage-test signal to test at least one direct current (DC) voltage associated with the circuit by comparing the input signals using a first polarity and second polarity associated with the circuit to produce a first output signal and a second output signal. During operation, the circuit manifests an input voltage offset and a signal delay with each comparison of the input signals. The calibration circuitry processes the first and second output signals and, in response, calibrates or sets an adjustment for at least one signal path associated with the circuit in order to account for the input offset voltage and signal delay during normal operation of the circuit.

A power distribution network monitoring system includes a plurality of measuring instruments that are installed at predetermined positions on power lines constituting a power distribution network and configured to perform electrical measurement of the power lines; a data collection relay configured to receive data related to measurement results from the plurality of measuring instruments; an imaging unit that is disposed near the data collection relay and configured to capture an image including the data collection relay; an abnormality detector configured to use the image captured by the imaging unit to detect an abnormality in the data collection relay; and a storage unit configured to store image data taken by the imaging unit. The image data consists of a single image previously captured by the imaging unit. The abnormality detector compares the latest image captured by the imaging unit and the image data stored by the storage unit and determines whether or not an appearance of the data collection relay changes. If it is determined that there is no change in the appearance of the data collection relay, the image data in the storage unit is updated with the latest image captured by the imaging unit.

An inspection system includes a plurality of inspection apparatuses, and a data processing apparatus capable of communicating with the plurality of inspection apparatuses. The data processing apparatus includes a storage part storing a model that determines a causal relationship between an apparatus parameter related to setting of the plurality of inspection apparatuses and index data obtained when the plurality of inspection apparatuses are operated, a collection part collecting the apparatus parameter and the index data, a determination part determining whether or not the index data is included in a predetermined allowable range, and a calculation part calculating an adjustment amount for adjusting the apparatus parameter, based on the apparatus parameter and the index data, and the model, when it is determined that the index data is not included in the predetermined allowable range.

An inspection system includes a plurality of inspection apparatuses, and a data processing apparatus capable of communicating with the plurality of inspection apparatuses. The data processing apparatus includes a storage part storing a model that determines a causal relationship between an apparatus parameter related to setting of the plurality of inspection apparatuses and index data obtained when the plurality of inspection apparatuses are operated, a collection part collecting the apparatus parameter and the index data, a determination part determining whether or not the index data is included in a predetermined allowable range, and a calculation part calculating an adjustment amount for adjusting the apparatus parameter, based on the apparatus parameter and the index data, and the model, when it is determined that the index data is not included in the predetermined allowable range.

A calibration method for calibrating a magnetizable core, wherein the magnetizable core is coupled to a magnetic transducer; the method comprising applying a pulse of magnetomotive force to the core such that a distinct value of remanence is produced in the core, wherein the value of remanence in the core depends on a strength of the pulse.

A measurement system includes a gain chain configured to amplify an analog input signal; a range selector configured to select a gain between the analog input signal and a plurality of analog-to-digital converter (ADC) outputs from a plurality of ADCs, wherein each ADC output has a path, and a gain of each output path is made up of a plurality of gain stages in the gain chain; and a mixer configured to combine the plurality of ADC outputs into a single mixed output.

A system for calibration management is described. The system includes at least one measurement instrument for testing a device under test and a monitoring device. The monitoring device is connected with the measurement instrument. The monitoring device collects parameters from the measurement instrument during the testing. The monitoring device creates a calibration fingerprint based on the parameters collected, which is indicative of the calibration status of the measurement instrument. The system includes an interface via which information based on the calibration fingerprint is outputted, indicating if a new calibration of the measurement instrument is necessary or not. Further, a method of managing calibration of a measurement instrument is described.

A system and method for phase and gain calibration of a current sensor system. The system comprises a microcontroller configured to execute software in an energy measurement component and a calibration computer having a calibration application. The energy measurement component receives first and second digital signals representing current and voltage signals, respectively, received from a test source, and calculates active power and a power factor, and provides those values to the calibration computer. The power factor is converted to a converted phase angle. Based on the information received from the energy measurement component, the calibration application calculates parameters used to update components within the microcontroller to maximize the accuracy of the current sensor system.

In an electric battery assembly plant, including a battery assembly line having a station that receives battery cells or modules to be assembled together, a measuring apparatus is configured for measuring the electrical resistance and the electrical voltage of a single battery cell or a battery module. The correct operation of the measuring apparatus is verified by arranging at least one dummy battery cell configured and sized to emulate a real battery cell, and having an electrical resistance of a predetermined value and/or including a voltage generator to generate a voltage of a strictly predetermined value at the terminals of the dummy battery cell. The dummy battery cell may then be used as a gauge to check in a simple and rapid way whether the measuring apparatus is operating correctly and reliably.

A magnetic sensor device comprises a substrate. A first magnetic sensor, a second magnetic sensor, and one or more inductors are disposed over the substrate and are controlled by a magnetic sensor controller having a control circuit. The control circuit is adapted for controlling the first magnetic sensor to measure magnetic fields under presence of a first set of magnetic fields, and for controlling the second magnetic sensor to measure magnetic fields under presence of a second set of magnetic fields generated by the inductors. The control circuit calculates a relative sensitivity matching value that converts magnetic field values measured by the second magnetic sensor to a comparable magnetic field value measured by the first magnetic sensor or vice versa. The control circuit is further adapted for correcting a measurement by the second magnetic sensor using the relative sensitivity matching value to produce a corrected measurement, and for calculating a magnetic field gradient by combining a measurement by the first magnetic sensor with the corrected measurement.