The present disclosure includes apparatuses and methods for data movement. An example apparatus comprises a memory device. The memory device includes an array of memory cells and sensing circuitry coupled to the array via a plurality of sense lines. The sensing circuitry includes a sense amplifier and a compute component coupled to a sense line and configured to implement operations. A controller in the memory device is configured to couple to the array and sensing circuitry. A shared I/O line in the memory device is configured to couple a source location to a destination location.

Disclosed are methods for reading data from a storage buffer. One such method may include retrieving a first set of data during a first period of time. The method may also include delaying data retrieval during a second period of time after the first period of time. The method may include outputting at least a portion of the first set of data during the first period of time and the second period of time. The first period of time is substantially similar to the second period of time.

A semiconductor device that can compensate for threshold fluctuations in memory cells using capacitive coupling. The flash memory includes a NAND-type memory cell array, a programing device, a reading device, and an offset voltage determining unit. The programing device programs the memory cells connected to a selected word line. The reading device reads the memory cells connected to a selected word line. The programing device programs the memory cells of a monitoring NAND string simultaneously when programing a word line. The reading device comprises a current detecting unit applying a read voltage to an unselected word line n+1, and detecting the current of the monitoring NAND string. The offset voltage determining unit determines the first and second offset voltage based on the detected current, and a reading pass voltage is applied to the unselected word line, a read voltage is applied to the selected word line.

A write circuit for writing to a plurality of memory cells of a non-volatile data memory, including a buffer memory forming a single memory element which is configured to buffer a first data value before storing said value in the plurality of non-volatile memory cells of the non-volatile data memory. The write circuit also includes a first write line, by means of which the buffer memory is connected to a first memory cell of the plurality of memory cells, and a second write line, which is different from the first write line and by means of which the buffer memory is connected to a second memory cell of the plurality of memory cells. The write circuit further includes a control circuit configured to concurrently write the first data value in the first memory cell and a second data value which depends on the first data value into the second memory cell, wherein the second data value is complementary to the first data value or is identical to the first data value depending on a selected one of a first option or a second option by the control circuit, respectively.

In one example a semiconductor device has a data latch that includes first and second transmission gates and first and second inverters. The first inverter is connected between a first terminal of the first transmission gate and a first terminal of the second transmission gate. The second inverter is connected between a second terminal of the first transmission gate and a second terminal of the second transmission gate. The data latch is configured to store a datum received at the connection between the first transmission gate and the second inverter, and to store a datum received at the connection between the second transmission gate and the first inverter.

According to one embodiment, a memory device includes a memory cell including a resistance change memory element in which a plurality of data values according to resistance are allowed to be set, and a selector element connected to the resistance change memory element in series, a word line supplying a select signal for selecting the resistance change memory element by the selector element to the memory cell, a bit line to which a data signal according to a data value set in the resistance change memory element is read, a load circuit connected to the memory cell in series and functioning as a load, and a comparator circuit which compares a voltage obtained by the load circuit with a plurality of reference voltages.

Systems, methods and apparatus to determine a programming mode of a set of memory cells that store an indicator of the programming mode. In response to a command to read the memory cells in a memory device, a first read voltage is applied to the memory cells to identify a first subset of the memory cells that become conductive under the first read voltage. The determination of the first subset is configured as an operation common to different programming modes. Based on whether the first subset of the memory cell includes one or more predefined memory cells, the memory device determines a programming mode of memory cells. Once the programming mode is identified from the common operation, the memory device can further execute the command to determine a data item stored, via the programming mode, in the memory cells.

A storage device comprising: a nonvolatile memory device including a plurality of memory blocks; and a device controller configured to control the nonvolatile memory device to determine a memory block to perform a refresh operation and to control the memory block to perform the refresh operation to recover data of the memory block.

An integrated circuit comprises a memory device including at least one memory point having a volatile memory cell and a single non-volatile memory cell coupled together to a common node, and a single selection transistor coupled between the common node and a single bit line. A first output of the volatile memory cell is coupled to the common node, and a second output of the volatile memory cell, complementary to the first output, is not connected to any node outside the volatile memory cell.

A non-volatile memory apparatus and corresponding method of operation are provided. The apparatus includes non-volatile memory cells in an integrated circuit device along with a microcontroller in communication with the non-volatile memory cells. The microcontroller is configured to receive a memory operation command and in response, determine a condition value of one of a plurality of conditions associated with the memory operation command and whether the one of the plurality of conditions is dynamic. In parallel, the microcontroller determines and outputs an output value using the condition value. The microcontroller then determines whether the one the plurality of conditions has changed. If the one of the plurality of conditions is dynamic and has changed, the microcontroller determines an updated condition value and in parallel, compares the condition value and the updated condition value and determines and outputs an updated output value using the updated condition value and the comparison.