An example apparatus can include a memory array and a memory controller. The memory array can include a first portion including a first plurality of memory cells. The memory array can further include a second portion including a second plurality of memory cells. The memory controller can be coupled to the first portion and the second portion. The memory controller can be configured to operate the first plurality of memory cells for short-term memory operations. The memory controller can be further configured to operate the second plurality of memory cells for long-term memory operations.

A selective non-volatile memory device includes a first electrode, a second electrode and at least one layer made of an active material. The device has at least two programmable memory states associated with two voltage thresholds and also provides a selective role when it is in a highly resistive state.

The present invention relates to a neuromorphic circuit suitable for implementing a neural network, the neuromorphic circuit comprising: lines of words, pairs of complementary bit-lines, source lines, a set of elementary cells, an electronic circuit implementing a neurone having an output and including: a set of logic components, a counting unit, a comparison unit comprising a comparator and a comparison voltage generator, the comparator being suitable for comparing the output of the counting unit with the comparison voltage generated by the comparison voltage generator in order to output a signal dependent on the comparison and corresponding to the output of the electronic circuit which implements a neurone.

A memory device includes a memory array including a plurality of memory cells arranged in rows and columns. A closed loop bias generator is configured to output a column select signal to the memory array. A current limiter receives an output of the closed loop bias generator. The current limiter is coupled to a plurality of the columns of the memory array.

A memory device includes a memory cell and a first select transistor. The memory cell includes a variable resistance memory region, a first semiconductor layer being in contact with the variable resistance memory region, a first insulating layer being in contact with the first semiconductor layer, and a first voltage application electrode being in contact with the first insulating layer. The first select transistor includes a second semiconductor layer, a second insulating layer being in contact with the second semiconductor layer, and a second voltage application electrode extending in the second direction and being in contact with the second insulating layer.

A first command directed to a first package of a plurality of memory packages, wherein the first command is issued to a command processor to be applied to the first package is received. A total number of pending commands directed to the first package satisfies a first threshold criterion is determined. Responsive to determining that the total number of pending commands directed to the first package satisfies the first threshold criterion, whether a second command directed to a second package is requesting transmission is determined. Responsive to the second command directed to the second package is requesting transmission, whether the first command comprises a write command is determined. Responsive to determining that the first command comprises a write command, execute a command directed to the second package.

A method is presented for mapping weights for kernels of a neural network onto a crossbar array. In one example, the crossbar array is comprised of an array of non-volatile memory cells arranged in columns and rows, such that memory cells in each row of the array is interconnected by a respective drive line and each column of the array is interconnected by a respective bit line; and wherein each memory cell is configured to receive an input signal indicative of a multiplier and operates to output a product of the multiplier and a weight of the given memory cell onto the corresponding bit line of the given memory cell, where the value of the multiplier is encoded in the input signal and the weight of the given memory cell is stored by the given memory cell.

An object of the present invention is to provide a composition, a memory structure suitable for the composition, a manufacturing method, and an operating method for stable operation in a memory element including a chalcogen compound. In order to achieve the object, in a memory array with a cross-point structure including a first electrode line and a second electrode line intersecting each other, and a selective memory element disposed at each intersection of the first electrode line and the second electrode line and being a chalcogen compound, the present invention may provide the memory array with a cross-point structure including the first electrode line formed on a substrate, a first functional electrode formed between the first electrode line and the selective memory element, and a second functional electrode formed between the second electrode line and the selective memory element, wherein the first functional electrode is formed as a line along the first electrode line.

A method of correcting bias temperature instability in memory arrays may include applying a first bias to a memory cell, where the memory cell may include a memory element and a select element, and the first bias may causes a value to be stored in the memory element. The first bias causes a bias temperature instability (BTI) associated with the memory cell to increase. The method may also include applying a second bias to the memory cell, where the second bias may have a polarity that is opposite of the first bias, and the value stored in the memory element remains in the memory element after the second bias is applied. The second bias may also cause the BTI associated with the memory cell to decrease while maintaining any value stored in the memory cell.

The apparatuses and methods described herein may operate to measure a voltage difference between a selected access line and a selected sense line associated with a selected cell of a plurality of memory cells of a memory array. The voltage difference may be compared with a reference voltage specified for a memory operation. A selection voltage(s) applied to the selected cell for the memory operation may be adjusted responsive to the comparison, such as to dynamically compensate for parasitic voltage drop.