H01L27/00

Display apparatus including a shielding conductive layer
11482584 · 2022-10-25 · ·

A display apparatus including a shielding conductive layer is disclosed. The display apparatus includes a substrate, a driving thin film transistor disposed on the substrate, wherein the driving thin film transistor includes a driving semiconductor layer and a driving gate electrode, a scan line overlapping the substrate and extending in a first direction, a data line extending in a second direction crossing the first direction, wherein the data line is insulated from the scan line by an insulating layer, a node connection line disposed on a same layer as the scan line, and a shielding conductive layer disposed between the data line and the node connection line, in which a first end of the node connection line is connected to the driving gate electrode via a first node contact hole.

Metal-insulator-semiconductor-insulator-metal (MISIM) device, method of operation, and memory device including the same

A metal-insulator-semiconductor-insulator-metal (MISIM) device includes a semiconductor layer, an insulating layer disposed over an upper surface of the semiconductor layer, a back electrode disposed over a lower surface of the semiconductor layer opposing the upper surface, and first and second electrodes disposed over the insulating layer and spaced-apart from each other.

Display device
11605680 · 2023-03-14 · ·

A display device includes: a substrate having thereon a first subpixel, a second subpixel, and a third subpixel; a first electrode in each of the first to third subpixels on the substrate; a first bank between the first electrodes; a second bank on the first bank and having a width less than that of the first bank; a light emitting layer on the first electrodes, the first bank, and the second bank; and a second electrode on the light emitting layer. The light emitting layer provided on the second bank and the light emitting layer provided on the first bank are spaced apart from each other.

TEMPERATURE SENSING OF AN ARRAY FROM TEMPERATURE DEPENDENT PROPERTIES OF A PN JUNCTION

Methods and apparatus for extracting temperature information for an array from a signal through first and second contacts based on temperature dependent properties of the a PN junction. An example method includes connecting first and second PN junctions to a bias source to reverse bias the first and second PN junctions, connecting a first contact to the first PN junction, connecting a second contact to N type material forming a junction with P type material of the first PN junction, and extracting temperature information for the first PN junction from a signal through the first and second contacts based on temperature dependent properties of the first PN junction.

Back side illuminated image sensor with reduced sidewall-induced leakage

Provided is a method of fabricating an image sensor device. An exemplary includes forming a plurality of radiation-sensing regions in a substrate. The substrate has a front surface, a back surface, and a sidewall that extends from the front surface to the back surface. The exemplary method further includes forming an interconnect structure over the front surface of the substrate, removing a portion of the substrate to expose a metal interconnect layer of the interconnect structure, and forming a bonding pad on the interconnect structure in a manner so that the bonding pad is electrically coupled to the exposed metal interconnect layer and separated from the sidewall of the substrate.

Semiconductor device
11476249 · 2022-10-18 · ·

A semiconductor device including a semiconductor substrate, first and second transistor sections and a diode section provided on the substrate, is provided. The diode section is arranged to be adjacent to and sandwiched between the first and second transistor sections in a predetermined arrangement direction. The diode section includes a drift region; a base region above the drift region; first cathode regions and second cathode regions below the drift region. The first and second transistor sections each include a collector region. The first cathode regions are provided continuously between the collector regions of the first and second transistor sections. One end and another end of the first cathode regions in the arrangement direction are in contact with the collector regions of the first and second transistor sections, respectively. The first and second cathode regions are in contact with each other and alternating in a direction orthogonal to the arrangement direction.

Display device and production method for display device

A display device according to the disclosure includes a substrate, a first transistor provided on the substrate, and a second transistor provided on the substrate, not overlapping the first transistor. The first transistor includes a polycrystalline silicon layer provided on the substrate, a first insulating film provided on the polycrystalline silicon layer, a first gate electrode provided on the first insulating film, and a second insulating film provided on the first gate electrode. The second transistor includes an oxide semiconductor layer provided on the first insulating film, a third insulating film provided on the oxide semiconductor layer, and a second gate electrode provided on the third insulating film. The first and third insulating films are SiOx films. The second insulating film is an SiNx film including hydrogen, and is provided overlapping the polycrystalline silicon layer, and is provided not overlapping the oxide semiconductor layer.

Pin modification for standard cells

The present disclosure describes an example method for routing a standard cell with multiple pins. The method can include modifying a dimension of a pin of the standard cell, where the pin is spaced at an increased distance from a boundary of the standard cell than an original position of the pin. The method also includes routing an interconnect from the pin to a via placed on a pin track located between the pin and the boundary and inserting a keep out area between the interconnect and a pin from an adjacent standard cell. The method further includes verifying that the keep out area separates the interconnect from the pin from the adjacent standard cell by at least a predetermined distance.

Array substrate and method of manufacturing same

An array substrate and a method of manufacturing the same are provided. The array substrate includes an active island and a gate insulating layer, a gate, and an interlayer dielectric layer stacked on the active island. A color resist layer is disposed on the interlayer dielectric layer, and an orthographic projection of the color resist layer on a base substrate covers an orthographic projection of a channel region of the active island on the base substrate.

Display substrate and method for forming the same and display device

A display substrate, a method for forming the display substrate and a display device are provided. The display substrate includes: a first conductive pattern located on a base substrate, where a ring-shaped conductive protection structure is arranged at an edge of a preset region of the first conductive pattern and surrounds the preset region, and the conductive protection structure is made of an anti-dry-etching material; an insulation layer covering the first conductive pattern; and a second conductive pattern located on a side of the insulation layer away from the first conductive pattern, where the second conductive pattern is electrically connected to the first conductive pattern through the via-hole.