Patent classifications
C23F1/04
CHEMICALLY SHARPENING BLADES
A method for forming a cutting tool includes masking a metal base with one or more masks, the one or more masks including at least one variable permeability mask, and chemically etching the masked metal base to form a blade of the cutting tool.
CHEMICALLY SHARPENING BLADES
A method for forming a cutting tool includes masking a metal base with one or more masks, the one or more masks including at least one variable permeability mask, and chemically etching the masked metal base to form a blade of the cutting tool.
INTERIOR VEHICLE COMPONENT WITH METAL SURFACE ELEMENT AND METHOD FOR PRODUCING THE INTERIOR VEHICLE COMPONENT
An interior component of a vehicle, the interior component including a metal surface element that includes at least one graphic feature, wherein the at least one graphic feature is configured as an engraving that is fabricated by material removal, and wherein the engraving includes a micro perforation made from a plurality of boreholes.
DOSE-BASED END-POINTING FOR LOW-KV FIB MILLING IN TEM SAMPLE PREPARATION
A method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae using a focused ion beam including directing a high energy focused ion beam toward a bulk volume of material; milling away the unwanted volume of material to produce an unfinished sample lamella with one or more exposed faces having a damage layer; characterizing the removal rate of the focused ion beam; subsequent to characterizing the removal rate, directing a low energy focused ion beam toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area from the low energy focused ion beam; and milling the unfinished sample lamella with the low energy focused ion beam to remove at least a portion of the damage layer to produce the finished sample lamella including at least a portion of the feature of interest.
DOSE-BASED END-POINTING FOR LOW-KV FIB MILLING IN TEM SAMPLE PREPARATION
A method, system, and computer-readable medium for forming transmission electron microscopy sample lamellae using a focused ion beam including directing a high energy focused ion beam toward a bulk volume of material; milling away the unwanted volume of material to produce an unfinished sample lamella with one or more exposed faces having a damage layer; characterizing the removal rate of the focused ion beam; subsequent to characterizing the removal rate, directing a low energy focused ion beam toward the unfinished sample lamella for a predetermined milling time to deliver a specified dose of ions per area from the low energy focused ion beam; and milling the unfinished sample lamella with the low energy focused ion beam to remove at least a portion of the damage layer to produce the finished sample lamella including at least a portion of the feature of interest.
SILENCING DEVICE, ROTARY MACHINE, AND METHOD FOR MANUFACTURING SILENCING DEVICE
A silencing device includes: a flow path forming plate having a flow path forming surface for forming a wall surface of a flow path through which fluid flows; and a cavity defining portion for defining a cavity on the reverse surface side of the flow path forming plate, the reverse surface being located on the reverse side of the flow path forming surface. The flow path forming plate has formed therein a plurality of fine through-holes which are configured to provide communication between the flow path forming surface and the reverse surface and which has a diameter from 0.01 mm to 0.5 mm.
Metal plate, method of manufacturing metal plate, and method of manufacturing mask by using metal plate
A metal plate for manufacturing a deposition mask with reduced variation in dimension of through-holes wherein an average value of plate thicknesses of the metal plate in a longitudinal direction is within a 3% range around a predetermined value. When an average value of the plate thicknesses of the metal plate in the longitudinal direction is represented as A, and a value obtained by multiplying a standard deviation of the plate thicknesses of the metal plate in the longitudinal direction by 3 is represented as B, (B/A)100 (%) is 5%. When a value obtained by multiplying a standard deviation of the plate thicknesses of the metal plate in the width direction by 3 is represented as C, and a value of a plate thickness of the metal plate at a central portion in the width direction is represented as X, (C/X)100(%) is 3%.
Method for surface-finishing plastically-deformed metal liner and metal liner surface-finished by the method
A method for surface-finishing one or more metal liners is provided, the method comprising chemical milling to remove wrinkled textures generated during the plastic deformation of the metal liners.
Method for surface-finishing plastically-deformed metal liner and metal liner surface-finished by the method
A method for surface-finishing one or more metal liners is provided, the method comprising chemical milling to remove wrinkled textures generated during the plastic deformation of the metal liners.
Method and device for etching patterns inside objects
Systems and methods for etching complex patterns on an interior surface of a hollow object are disclosed. A method generally includes positioning a laser system within the hollow object with a focal point of the laser focused on the interior surface, and operating the laser system to form the complex pattern on the interior surface. Motion of the laser system and the hollow object is controlled by a motion control system configured to provide rotation and/or translation about a longitudinal axis of one or both of the hollow object and the laser system based on the complex pattern, and change a positional relationship between a reflector and a focusing lens of the laser system to accommodate a change in distance between the reflector and the interior surface of the hollow object.