Patent classifications
G01B2290/45
OPTICAL INTERFEROMETRIC SYSTEM FOR MEASUREMENT OF A FULL-FIELD THICKNESS OF A PLATE-LIKE OBJECT IN REAL TIME
An optical interferometric system for measurement of a full-field thickness of a plate-like object in real time includes two light sources, two screens, two image capturing devices, and an image processing module. The light sources radiate incident lights toward a reference point on the plate-like object in respective directions to produce respective interference fringe patterns (IFPs). The image capturing devices capture light intensity distribution images respectively of the IFPS imaged respectively on the screens. The image processing module calculates a fringe order at the reference point according to the light intensity distribution images, and obtains a full-field thickness distribution of the plate-like object according to the fringe order.
Axial length measurement monitor
An OCT axial length measurement device is configured to measure an area of the retina within a range from about 0.05 mm to about 2.0 mm. The area can be measured with a scanned measurement beam or plurality of substantially fixed measurement beams. The OCT measurement device may comprise a plurality of reference optical path lengths, in which a first optical path length corresponds to a first position of a cornea, and a second optical path length corresponds to a second position of the retina, in which the axial length is determined based on a difference between the first position and the second position. An axial length map can be generated to determine alignment of the eye with the measurement device and improve accuracy and repeatability of the measurements. In some embodiments, the OCT measurement device comprises a swept source vertical cavity surface emitting laser (“VCSEL”).
Interferometric distance sensing device and method with less dependency on environment disturbances on a fiber
Distance to a target is sensed using a common path interferometer, wherein a first fraction of light from a light source is collected after reflection by a partially reflective element together with reflection from a target of a second fraction of light from the light source that has been transmitted by the partially reflective element. The collected light is split in two parts, both containing a part of the first fraction and part of the reflection from the target. The parts are fed through a first and second optical branch path to an input side of a three-way optical coupler respectively. Light from at three terminals on a second side of the N way coupler is fed to respective light intensity detectors. Information representing an excess distance traveled by the first fraction from detection signals determined by the least three light intensity detectors.
Polarization-based coherent gradient sensing systems and methods
Polarization-based coherent gradient-sensing systems and methods for measuring at least one surface-shape property of a specularly reflective surface are disclosed. The method includes: reflecting a first circularly polarized laser beam from a sample surface to form a second circularly polarized laser beam that contains surface-shape information; converting the second circularly polarized laser beam to a linearly polarized reflected laser beam; directing respective first and second portions of the linearly polarized reflected laser beam to first and second relay assemblies that constitute first and second interferometer arms. The first and second relay assemblies each use a pair of axially spaced-apart gratings to generate respective first and second interference patterns at respective first and second image sensors. Respective first and second signals from the first and second image sensors are processed to determine the at least one surface-shape property.
SYNCHRONIZED DUAL MODE OCT SYSTEM
The present application in some embodiments relates to methods for reducing noise and/or clutter when measuring a spectrum, particularly but not only for OCT imaging. In some embodiments a light source is synchronized with a detector. For example a narrow band light source is synchronized with a narrow band detector. For example, the light source may scan over multiple frequency bands and/or the detector may be tuned to a frequency band synergetic to the band of the light source. For example the light source and detector may be tuned to overlapping narrow bands. Optionally the detector has a sensor set for each frequency band. Optionally some sensor sets are individually resettable. For example each set may have a reset circuit. For example, a sensor set for a band not currently being measured is deactivated.
AXIAL LENGTH MEASUREMENT MONITOR
An OCT axial length measurement device is configured to measure an area of the retina within a range from about 0.05 mm to about 2.0 mm. The area can be measured with a scanned measurement beam or plurality of substantially fixed measurement beams. The OCT measurement device may comprise a plurality of reference optical path lengths, in which a first optical path length corresponds to a first position of a cornea, and a second optical path length corresponds to a second position of the retina, in which the axial length is determined based on a difference between the first position and the second position. An axial length map can be generated to determine alignment of the eye with the measurement device and improve accuracy and repeatability of the measurements. In some embodiments, the OCT measurement device comprises a swept source vertical cavity surface emitting laser (“VCSEL”).
DEVICE AND METHOD FOR MEASURING HEIGHT PROFILES ON AN OBJECT
An optical device for sensing a surface profile of an object surface of an object by means of interferometric distance measurement, including a beam splitter for splitting a light beam of a light source into first and second sub-beams, a beam divider for dividing each sub-beam into a reference and a measuring beam, a mirror for reflecting the two reference beams, wherein each measuring beam is directed onto a measuring area on the object surface for reflection and after reflection is directed as object beam to the beam divider, each reference beam reflected by the mirror and directed as mirror beam to the beam divider, the object and mirror beams each interfere and are each fed as an evaluation beam to a detector unit for evaluation. Further include a light source for generating a monochromatic light beam, a detector unit, a signal evaluation unit and for determining the surface profile.
Optical sensor and method of manufacture
An optical sensor and method of manufacture are provided herein. The optical sensor includes an optical fiber comprising a terminating end surface, and a photonic crystal coupled to the terminating end surface of the optical fiber.
Method and apparatus for performing optical imaging using frequency-domain interferometry
Exemplary apparatus and method are provided. In particular, an electromagnetic radiation can be emitted with, e.g. a light source arrangement. For example, the light source arrangement can include a cavity and a filter, and a spectrum of the electromagnetic radiation can be controlled, e.g., with such cavity and filter, to have a mean frequency that changes (i) at an absolute rate that is greater than about 100 terahertz per millisecond, and (ii) over a range that is greater than about 10 terahertz. Additionally or alternatively, the light source arrangement can include a frequency shifting device which can shift the mean frequency of the electromagnetic radiation.
System and method for performing tear film structure measurement and evaporation rate measurements
A system and method are described for performing tear film structure measurement. A broadband light source illuminates the tear film. A spectrometer measures respective spectra of reflected light from at least one point of the tear film. A color camera performs large field of view imaging of the tear film, so as to obtain color information for all points of the tear film imaged by the color camera. A processing unit calibrates the camera at the point measured by the spectrometer so that the color obtained by the camera at the point matches the color of the spectrometer at the same point. The processing unit determines, from the color of respective points of the calibrated camera, thicknesses of one or more layers of the tear film at the respective points. Other applications are also described.