Disclosed are an apparatus and method for diagnosing electric power equipment. The apparatus includes a measuring unit including a pan/tilt module mounted on the top of a vehicle and an imaging module mounted on an upper portion of the pan/tilt module, a determination unit for determining whether electric power equipment is detected by the measuring unit, a controller for performing control to capture a thermal image of the electric power equipment using the measuring unit, and a processing unit for dividing the thermal image into an analysis target equipment region, a non-interest equipment region, and a background noise region through pattern analysis of the thermal image and diagnosing the electric power equipment as being normal or as being abnormal on the basis of temperature information included in the analysis target equipment region.

An apparatus is disclosed that comprises an integrated circuit and a thermal detector array configured to detect thermal radiation from the integrated circuit. A method is disclosed that comprises providing an integrated circuit and disposing a thermal detector array so as to detect thermal radiation from the integrated circuit. Another apparatus is disclosed that comprises means for processing and means for detecting thermal radiation from the means for processing.

What are disclosed here are a method and its embodiments to assess the loading of distribution transformers in one area using autonomous drones that can be automatically piloted according to GPS coordinates to measure every target transformer's temperature data or thermal images in one area. The drone has a GPS system and can send its GPS coordinates wirelessly to ground crews' computing device. The computing device compares the drone's current GPS coordinates with the GPS coordinates of target transformers and guide the drone to fly to each target transformer location. The drone stops above each target transformer and use its thermography camera to measure the transformer's temperature data or thermal images. The temperature data or thermal images can be processed to identify overloaded transformers, transformers with outages and transformers with loading deviations that can be considered for load balance.

A remote monitoring system can include a plurality of infrared cables, where each of the infrared cables can have a respective first opening at a first end of the cable and a respective second opening at a second end of the infrared cable that is opposite the first end. The infrared cables can be configured to conduct infrared light emitted from a respective one of a plurality of monitored locations into the respective first opening to exit at the respective second opening. An infrared camera including an infrared sensor array can be optically coupled to each of the second openings of the plurality of infrared cables.

Methods, apparatuses and systems for imaging a battery pack is disclosed herein. An example imaging device may include an infrared sensor configured to sense reflected infrared radiation from an imaging area. The imaging device may include a prism configured to form an infrared image of a surface of the battery pack on the imaging area. A thermal map of the surface may be generated and used for determining a battery cell with a temperature that may indicate a thermal runaway. A fuse electronically coupled to the battery cell may be cut off to prevent and/or mitigate a hazardous condition for the battery.

A temperature measurement and a method for measuring the temperature of a semiconductor substrate, or semiconductor substrate, of a power switch assembly, which is delay free. The power switch assembly includes a circuit and a printed circuit board (PCB), where the circuit is mounted to the PCB. A lead frame is part of the circuit, at least one semiconductor substrate is part of the circuit and mounted to the lead frame, and a sensor is part of the circuit and mounted to the lead frame. A chamber is located between the sensor and the semiconductor substrate, such that the chamber galvanically isolates the sensor from the semiconductor substrate. The sensor detects the temperature of the semiconductor substrate.

A device providing a temperature control and/or monitoring and a method for use of the device are disclosed. In the disclosed method and device, a controller receives a minimum temperature value and a maximum temperature value of a temperature range to be measured. The controller correlates a known output signal range of a temperature sensor to the temperature range to be measured. Further, the controller receives an output signal from the temperature sensor, and generates a measured temperature value based on the output signal of the temperature sensor.

An apparatus for monitoring a switchgear includes: an input unit; a processing unit; and an output unit. The input unit is provides the processing unit with a monitor infra-red image of the switchgear. The processing unit implements a machine learning classifier algorithm to analyse the monitor infra-red image and determine if there is one or more anomalous hot spots in the switchgear. The machine learning classifier algorithm has been trained based on a plurality of different training infra-red images. The plurality of training infra-red images include a plurality of modified infra-red images generated from a corresponding plurality of infra-red images, each of the modified infra-red images having been modified to remove an effect of obscuration in the image. The output unit outputs information relating to the one or more anomalous hot spots.

A method for determining change in temperature of different parts of an electronic or optoelectronic device between un-energized and energized states without contacting the device. The method includes establishing a reference image form an unexcited device by illuminating the device with an optical signal and capturing the reference image from the device in an un-energized state, illuminating the device with an optical signal during an energization pulse having a predetermined pulse width and pulse magnitude and capturing a plurality of on images from the device at different time delays, determining a transient temperature profile, calibrating the temperature profile for one or more regions of the device with unknown thermoreflectance coefficient based on the determined transient temperature profile for the one or more regions of the device with known thermoreflectance coefficient.

An optical nondestructive testing method includes: a laser emitting step involving emitting a heating laser from a laser output device such that the intensity of the heating laser applied to a measurement point changes sinusoidally; a laser intensity measuring step involving measuring the intensity of the heating laser by a phase difference detector; an infrared radiation intensity measuring step involving measuring, by the phase difference detector, the intensity of infrared radiation radiating from the measurement point; a phase difference measuring step involving determining, by the phase difference detector, a phase difference between the intensity of the heating laser and the intensity of the infrared radiation, and outputting the phase difference determined to a determiner from the phase difference detector; and a connection area calculating step involving determining, by the determiner, a connection area in accordance with the phase difference and phase difference-connection area correlation information.