According to an aspect of the present invention, provided is an information processing apparatus, comprising: a processor configured to execute a program so as to output a diagnostic result diagnosing an analysis profile result by inputting an input profile result in relation to an intensity of X-ray from a thin film and the analysis result of the input profile result to a neural network, wherein the neural network is a neural network that is allowed to machine-learn teacher data using input profile data in relation to an intensity of X-ray from a thin film and analysis profile data obtained from the input profile data as input data, and using diagnostic data obtained by diagnosing the analysis profile data as output data.

Methods and systems for generating inspection results for a specimen with an adaptive nuisance filter are provided. One method includes selecting a portion of events detected during inspection of a specimen having values for at least one feature of the events that are closer to at least one value of at least one parameter of the nuisance filter than the values for at least one feature of another portion of the events. The method also includes acquiring output of an output acquisition subsystem for the sample of events, classifying the events in the sample based on the acquired output, and determining if one or more parameters of the nuisance filter should be modified based on results of the classifying. The nuisance filter or the modified nuisance filter can then be applied to results of the inspection of the specimen to generate final inspection results for the specimen.

The present invention provides a method of generating a fingerprint for a gemstone (5), for example a diamond, using x-ray imaging. The fingerprint comprises a three-dimensional map of a crystal or crystals present within the gemstone (5) including internal imperfections of the crystals and may also comprise further information about the gemstone (5). The method comprising the steps of: mounting the gemstone (5) in a sample holder (4) of an imaging apparatus, the imaging apparatus comprising a detector (6), a sample holder (4) mounted on a sample stage (3), an x-ray source (1), the sample holder (4) and the x-ray source (1) aligned along an optical axis, wherein the sample holder (4) is movable relative to the at least one x-ray source (1) and the detector (6); exposing the gemstone (5) to x-ray radiation from the x-ray source (1), whilst moving the sample holder (4) according to a search strategy that is predetermined for the gemstone (5) based on known physical characteristics of the gemstone (5); using the detector (6) to locate diffraction and/or extinction spots generated by the lattice of the crystals; utilising the located diffraction and/or extinction spots to calculate information about the position, orientation, and phase of the crystals; generating a suitable x-ray diffraction scanning strategy from the calculated information, the strategy including moving the sample holder (4) relative to the x-ray source (1) and the detector (6) and exposing the gemstone (5) to appropriate x-ray radiation as the sample holder (4) is moved, wherein the strategy is generated to locate and classify internal imperfections in the at least one crystal; scanning the gemstone according to the scanning strategy and recording the diffraction and/or extinction images using the detector (6); and generating a fingerprint from the recorded diffraction and/or extinction images.

For evaluating a polycrystalline silicon rod to be used as a raw material for production of FZ Si single crystals, novel evaluation values (values of characteristics×amount of crystals) including the amount of crystals grown in the growth direction (radial direction) are defined and the homogeneity in crystal characteristics in the growth direction (radial direction) is evaluated. Specifically, the homogeneity of the polycrystalline rod is evaluated by sampling a plurality of specimen plates each having, as a principal plane thereof, a cross-section perpendicular to a radial direction of the polycrystalline rod grown by a Siemens method at equal intervals in the radial direction, determining values of characteristics of the crystals of the specimen plates by measurements, and by using evaluation values obtained by multiplying amounts of the crystals (relative amounts of the crystals) at sites where the specimen plates have been sampled by the values of the crystal characteristics.

For evaluating a polycrystalline silicon rod to be used as a raw material for production of FZ Si single crystals, novel evaluation values (values of characteristics×amount of crystals) including the amount of crystals grown in the growth direction (radial direction) are defined and the homogeneity in crystal characteristics in the growth direction (radial direction) is evaluated. Specifically, the homogeneity of the polycrystalline rod is evaluated by sampling a plurality of specimen plates each having, as a principal plane thereof, a cross-section perpendicular to a radial direction of the polycrystalline rod grown by a Siemens method at equal intervals in the radial direction, determining values of characteristics of the crystals of the specimen plates by measurements, and by using evaluation values obtained by multiplying amounts of the crystals (relative amounts of the crystals) at sites where the specimen plates have been sampled by the values of the crystal characteristics.

A Talbot imaging apparatus includes a radiation source, a plurality of gratings, a capturing control unit, a radiation detector, a setting unit and an irradiation control unit. The radiation source irradiates radiation. The capturing control unit relatively shifts the plurality of gratings and performs control of capturing a plurality of Moire images of a subject to generate a reconstructed image. The radiation detector acquires a captured Moire image. The setting unit sets a capturing condition for capturing a second and further Moire images by making a capturing result of a first Moire image be a reference, or sets a capturing condition for the plurality of Moire images by making another Moire image captured before capturing the plurality of Moire images be a reference. The irradiation control unit controls irradiation of radiation from the radiation source based on the capturing condition set by the setting unit.

The present invention comprises a method for automated, high throughput molecular identification of macromolecular organic compounds. The method may provide an approximate solution to a momentum transfer cross section of an analyte in a buffer gas as measured by an ion mobility spectrometer that has low computational demand, has a high level of accuracy, and is adaptable for a variety of drift gases.

A sample analysis cup, sample cup assembly, and method is provided including a cell body with an open top end including an outer top wall and an inner top wall, each extending axially and positioned in concentric relationship; a bottom wall extending from the outer top wall to the inner top wall, the bottom wall and the inner and outer top walls defining an internal reservoir therebetween; a transverse wall extending a selected distance from the inner top wall, the transverse wall partially closing the open top end; an open bottom end including an outer bottom wall and an inner bottom wall, each extending axially and positioned in concentric relationship, the outer and inner bottom walls defining an internal channel therebetween; and a hollow chamber defined between the open top end and the open bottom end.

Provided are operation guide system for X-ray analysis to enable users to easily understand measurement of X-ray optical system to be selected. The operation guide system includes: measurement information acquisition unit for acquiring information on a sample and each X-ray measurement optical system part; sample magnification acquisition unit for acquiring magnification for display; incident X-ray shape deformation unit for determining distorted shape of an incident X-ray obtained by magnifying shape of the incident X-ray based on the magnification in a plane perpendicular to an optical axis direction; scattered X-ray shape deformation unit for determining distorted shape of a scattered X-ray obtained by magnifying shape of the scattered X-ray based on the magnification in the plane; and X-ray measurement optical system modeling unit for modeling a deformed shape of the sample, the distorted shape of the incident X-ray, and the distorted shape of the scattered X-ray.

Provided are operation guide system for X-ray analysis to enable users to easily understand measurement of X-ray optical system to be selected. The operation guide system includes: measurement information acquisition unit for acquiring information on a sample and each X-ray measurement optical system part; sample magnification acquisition unit for acquiring magnification for display; incident X-ray shape deformation unit for determining distorted shape of an incident X-ray obtained by magnifying shape of the incident X-ray based on the magnification in a plane perpendicular to an optical axis direction; scattered X-ray shape deformation unit for determining distorted shape of a scattered X-ray obtained by magnifying shape of the scattered X-ray based on the magnification in the plane; and X-ray measurement optical system modeling unit for modeling a deformed shape of the sample, the distorted shape of the incident X-ray, and the distorted shape of the scattered X-ray.