Disclosed is a weld portion inspection method using thermal image sensing, wherein the method includes heating the weld portion using Joule heat; and determining whether the weld portion is defective based on a temperature increase pattern of the weld portion by the heating.

A method and apparatus permit the testing of electrochemical cells. The apparatus includes a heat source, a chamber, and a diffuser coupling the heat source to the chamber. The heat source applies heat via the diffuser to a pin-point section of the electrochemical cell. This application of heat causes a thermal runaway condition due to a localized internal short circuit in the electrochemical cell. It is then determined whether the electrochemical cell has vented, ruptured, or exploded in response to the application of the heat source to the thermal runaway pin-point section of the electrochemical cell.

An inspection apparatus includes: a light emitter to emit light to a sealing portion of a package containing a light energy absorbing material, the light having a wavelength absorbable by the light energy absorbing material; a light receiver to receive thermal radiation from the sealing portion as thermal information; and circuitry including multiple image processing algorithms, the circuitry to: acquire the thermal information on the sealing portion from the light receiving unit as a two-dimensional image; determine whether the sealing portion is pass or fail based on the two-dimensional image acquired; and discriminate a type of a sealing defect from other types of sealing defects previously set in the multiple image processing algorithms in response to a determination that the sealing portion is fail.

An inspection apparatus includes: a light emitter to emit light to a sealing portion of a package containing a light energy absorbing material, the light having a wavelength absorbable by the light energy absorbing material; a light receiver to receive thermal radiation from the sealing portion as thermal information; and circuitry including multiple image processing algorithms, the circuitry to: acquire the thermal information on the sealing portion from the light receiving unit as a two-dimensional image; determine whether the sealing portion is pass or fail based on the two-dimensional image acquired; and discriminate a type of a sealing defect from other types of sealing defects previously set in the multiple image processing algorithms in response to a determination that the sealing portion is fail.

A system and method for distillation testing of a liquid sample at atmospheric pressure for the improved prediction of the heating necessary to reach the initial boiling point (IBP) and ensure the IBP is observed within certain time constraints, and regardless of sample composition. This monitors the sample by the camera during different heating phases of the test to obtain visual images of the sample and a computer analyzes image data observed to regulate the optimal distillation process.

A candidate detection unit 118 detects, for each of a plurality of target images, candidate regions representing a specific detection target region using a discriminator. A region-label acquisition unit 120 acquires, for a part of the target images, position information of a search region as a teacher label. A region specifying unit 121 imparts, based on the part of the target images and the acquired position information of the search region, the position information of the search region to each of the target images, which are not the part of the target images, in semi-supervised learning processing. A filtering unit 122 outputs, for each of the acquired plurality of target images, among the candidate regions, a candidate region, an overlapping degree of which with the search region is equal to or larger than a fixed threshold.

An apparatus for detecting cracks in a plurality of samples includes: a temperature source configured to heat or cool a section of the samples; one or more infrared cameras positioned near one or both sides of the samples and configured to receive infrared image data from the samples; a data acquisition and processing unit configured to generate a two-dimensional image out of the infrared image data to detect cracks in the samples; and a conveyor unit configured to transport the samples past the temperature source and the one or more infrared cameras.

The present invention discloses a thermal fatigue crack generator for a large pipe. According to the present invention, the thermal fatigue crack generator for a large pipe precisely manages and controls the heating and cooling conditions for the large size test pipes having a diameter of 250 to 610 mm to significantly improve the reliability of the accuracy and a reproducibility of the thermal fatigue cycle so that a useful advantage is expected to ensure the reliability and the effectiveness of the skill verification of the non-destructive testing.

The present invention discloses a thermal fatigue crack generator for a large pipe. According to the present invention, the thermal fatigue crack generator for a large pipe precisely manages and controls the heating and cooling conditions for the large size test pipes having a diameter of 250 to 610 mm to significantly improve the reliability of the accuracy and a reproducibility of the thermal fatigue cycle so that a useful advantage is expected to ensure the reliability and the effectiveness of the skill verification of the non-destructive testing.

In an method for inspecting the coating of an electronic component, wherein the electronic component includes at least one electrical resistance element and wherein the layer thickness of at least one coating is determined thermographically, it is provided as essential to the invention that the electrical resistance element is contacted electrically, an electrical voltage is applied to the resistance element, the temperature of the electronic component in the area of the resistance element is captured as a function of time, and a conclusion is drawn about the layer thickness of the coating of the electronic component in the area of the resistance element based on the temperature variation over time.