There is provided an image processing method capable of generating an image representative of a magnetic field distribution. The method starts with acquiring phase images providing visualization of electromagnetic fields respectively in a plurality of columns. Then, each of the electromagnetic fields in the columns within the phase images is separated into magnetic field and electric field components. An image representative of a magnetic field distribution is created based on the separated magnetic field components. The step of separating each electromagnetic field includes separating the electromagnetic field in a first one of the columns into magnetic field and electric field components based on the electromagnetic field in a second one of the columns, the latter electromagnetic field having an electric field component oriented in the same direction as that in the first column.

A specimen for analyzing the shape of an antistatic antifouling layer and a method for preparing the same are provided. The specimen includes Pt coated on an antistatic antifouling layer comprising a conductive polymer formed on a polymer substrate, so that a contrast difference between the polymer substrate layer and the antistatic antifouling layer is caused by the diffusion of Pt by means of the conductive polymer and the dyeing effect of the antifouling layer. Accordingly, it is possible to clearly distinguish the shape of the antistatic antifouling layer formed on the polymer substrate by using TEM.

A multi-degree-of-freedom sample holder, comprising a housing and a rotating shaft, is disclosed. A frame is provided between the housing and the rotating shaft, and the frame is coaxial with the housing and rotating shaft. The present invention has multiple degrees of freedom such as high-precision translational freedom of the sample along the X-axis, Y-axis and Z-axis, and 360° rotation of the sample around the axis, etc. The sample is always aligned with the sample holder shaft during the rotation, and the static electricity accumulated on the sample can be led out.

An X-ray apparatus includes: a mounting unit upon which an object to be measured is mounted; an X-ray generation unit that irradiates X-rays, from above the mounting unit or from below the mounting unit, to the object to be measured upon the mounting unit; an X-ray detector that acquires a transmission image of the object to be measured being irradiated by the X-rays; a first movement unit that moves at least one of the mounting unit, the X-ray generation unit, and the X-ray detector along a direction of irradiation of the X-rays; a position detection unit that detects a relative position of the mounting unit, the X-ray generation unit, and the X-ray detector; and a calculation unit that calculates a magnification of a transmission image of the object to be measured acquired by the X-ray detector, in a state in which deflection of the mounting unit has occurred while the object to be measured is mounted upon the mounting unit.

An X-ray single-pixel camera based on X-ray computational correlated imaging, which belongs to the technical research fields of X-ray computational correlated imaging and X-ray single-pixel imaging. The X-ray single-pixel camera includes: an X-ray modulation system (3), an X-ray modulation control system (4), an X-ray single-pixel detector (5), a main control system unit (6), a time synchronization system (7) and a computational imaging system (8). The main control system unit (6) controls each module through software; the time synchronization system (7) controls synchronization of each module for automatic collection; and the computational imaging system (8) is configured to perform a second-order correlated computation or a compressed sensing computation or a deep learning computation on the signals collected by the X-ray single-pixel detector (5) and a preset modulation matrix, so as to obtain an image of an object under test. The X-ray single-pixel camera based on X-ray computational correlated imaging, provided by the present invention, realizes single-pixel imaging, greatly reduces the sampling number while ensuring the imaging quality, and reduces the X-ray radiation dose in an imaging process.

The present invention relates to a method of analyzing strain of a thin film by using a Strain Tensor Using Computational Fourier Transform Moiré (STC) method, and the method includes: receiving two Bragg peaks selected from a reciprocal lattice image obtained by Fourier transforming a two-dimensional (2D) lattice image of a thin film; shifting the two received Bragg peaks to an origin point of the reciprocal lattice image; calculating a moiré fringe pattern by Fourier-inverse-transforming the two Bragg peaks shifted to the origin point; calculating a strain tensor by differentiating the calculated moiré fringe pattern; and analyzing strain of the thin film by using the calculated strain tensor. The present invention, it is possible to obtain a considerably accurate strain analysis result with minimal errors even in the case where strain of a thin film is complex, and measure shear strain, as well as axial strain, of a thin film.

A transmission imaging detection device (10) is used to collect projection diagrams of measured objects (200) on a conveyor belt (100), comprising X-ray projection imaging devices and laser occlusion sensing devices, the measured objects (200) shifts across the X-ray projection imaging devices and laser occlusion sensing devices on the said conveyor belt (100), and the laser occlusion sensing devices determines whether the measured objects (200) enter the detection segments, the X-ray projection imaging devices collect projection data of the measured objects (200). The transmission imaging detection device (10) combines the translation motion of the measured objects (200) to complete the data acquisition required for real-time CT slice imaging. The computerized tomography system using the above-mentioned transmission imaging detection device (10) ultimately realizes the real-time reconstruction, storage and display of CT slices by bus data transmission and cluster operation.

The sample mounting system comprises a sample holder and a sample stage having a platform for supporting the sample holder. The sample can be fixed to the sample holder by a mount. The sample holder comprises a holder reference portion, which co-operates with a corresponding reference portion of the sample stage (the stage reference portion) to align the sample holder with the sample stage. When the sample holder is positioned on the platform such that the stage reference portion and the holder reference portion engage each other, the sample holder is aligned with the sample stage.

The invention relates to a method of preparing a sample for analysis. The method comprises: providing a sample comprising a surface region of interest on a first face of the sample and a second face oriented at an angle to the first face about a common edge between the first and second faces, the second face extending between the common edge and a second edge on the opposing side of the second face of the sample; and milling the second face of the sample to provide a trench in the surface of the second face, the trench extending from a first position on the second face between the common edge and the second edge to a second position adjacent to the common edge; wherein the trench is arranged so as to provide an electron transparent sample layer comprising the surface region of interest. By milling the second face of the sample only, a surface region of interest on the first face of the sample is fully preserved and remains free of milling beam induced damage. This allows for correlative characterisation work which requires both an electron transparent sample and a fully intact sample surface to obtain surface-sensitive data.

An X-ray collimator (30) that comprises: a collimator body (31) comprising: a collimation conduit (32) provided with an inlet (320), configured to be connected to an X-ray source (20) for the inlet of a beam (B) of X-rays, and an outlet (321), configured to emit a collimated portion (B1) of the X-ray beam (B); and a derivation conduit (33) inclined with respect to the collimation conduit (32), wherein the derivation conduit (33) is provided with an inlet (330), configured to be connected to the X-ray source (20) for the inlet of a peripheral portion (B2) of the same X-ray beam (B) emitted by the source (20), and an outlet (331); a reference detector (40) fixed to the collimator body (31) and provided with an inlet window (41) facing the outlet (331) of the derivation conduit (33).