G02B27/60

Appliance for the moiré measurement of an optical test object
10996566 · 2021-05-04 · ·

An appliance for moiré measurement of an object (12) includes a grating arrangement having a first grating (11) positioned upstream of the object and including test structures to be imaged, a second grating (14) positioned downstream of the object, and an evaluation unit having at least one detector evaluating moiré structures produced by superposing the two gratings in a detection plane situated downstream of the second grating. The object is an anamorphic imaging system, and the respective grating periods of the first grating and of the second grating are selected so that the grating period of the second grating corresponds to a common multiple or a common divisor of the respective periods of two test structure images of the test structures of the first grating produced by the imaging system in two different measurement positions. The two measurement positions differ in relative grating arrangement position and test object position.

Appliance for the moiré measurement of an optical test object
10996566 · 2021-05-04 · ·

An appliance for moiré measurement of an object (12) includes a grating arrangement having a first grating (11) positioned upstream of the object and including test structures to be imaged, a second grating (14) positioned downstream of the object, and an evaluation unit having at least one detector evaluating moiré structures produced by superposing the two gratings in a detection plane situated downstream of the second grating. The object is an anamorphic imaging system, and the respective grating periods of the first grating and of the second grating are selected so that the grating period of the second grating corresponds to a common multiple or a common divisor of the respective periods of two test structure images of the test structures of the first grating produced by the imaging system in two different measurement positions. The two measurement positions differ in relative grating arrangement position and test object position.

Optical element and display device using the same

An optical element including a first pattern is provided. The first pattern includes a film and a plurality of light deflection regions arranged on the film, wherein each light deflection region comprises a diffraction structure having two or more than two amplitudes.

Optical element and display device using the same

An optical element including a first pattern is provided. The first pattern includes a film and a plurality of light deflection regions arranged on the film, wherein each light deflection region comprises a diffraction structure having two or more than two amplitudes.

Display device, electronic apparatus and display method

A display device includes a display panel including a plurality of pixels arrayed along first and second directions, a distribution unit that distributes light emitted from each pixel configured to display a parallax image corresponding to each of a plurality of viewpoints, and a light blocking unit between the display panel and the distribution unit. The distribution unit distributes light emitted from each of the pixels to the plurality of viewpoints along the first direction in a first display state where the display panel displays a parallax image, or stops distributing emitted light in a second display state, displaying a planar image. The light blocking unit forms, along the first direction, a plurality of first light blocking areas each extending along the second direction blocking some emitted light in the first display state, and stops forming the first light blocking areas in the second display state.

Display device, electronic apparatus and display method

A display device includes a display panel including a plurality of pixels arrayed along first and second directions, a distribution unit that distributes light emitted from each pixel configured to display a parallax image corresponding to each of a plurality of viewpoints, and a light blocking unit between the display panel and the distribution unit. The distribution unit distributes light emitted from each of the pixels to the plurality of viewpoints along the first direction in a first display state where the display panel displays a parallax image, or stops distributing emitted light in a second display state, displaying a planar image. The light blocking unit forms, along the first direction, a plurality of first light blocking areas each extending along the second direction blocking some emitted light in the first display state, and stops forming the first light blocking areas in the second display state.

MOIRE PATTERN IMAGING DEVICE

A moiré pattern imaging device includes a light-transmitting film and an optical sensor. The light-transmitting film includes a plurality of microlenses, and a light-incident surface and a light-exit surface opposite to each other. The plurality of microlenses are disposed on the light-incident surface, the light-exit surface or a combination thereof, and the plurality of microlenses are arranged in two dimensions to form a microlens array. The optical sensor includes a photosurface. The photosurface faces the light-exit surface of the light-transmitting film, the photosurface is provided with a plurality of pixels, and the plurality of pixels are arranged in two dimensions to form a pixel array. The microlens array and the pixel array correspondingly form a moiré pattern effect to produce an imaging magnification effect, and the photosurface of the optical sensor senses light and forms a moiré pattern magnification image.

Systems and Methods for Structured Illumination Microscopy

The technology disclosed relates to structured illumination microscopy (SIM). In particular, the technology disclosed relates to capturing and processing, in real time, numerous image tiles across a large image plane, dividing them into subtiles, efficiently processing the subtiles, and producing enhanced resolution images from the subtiles. The enhanced resolution images can be combined into enhanced images and can be used in subsequent analysis steps.

Systems and Methods for Structured Illumination Microscopy

The technology disclosed relates to structured illumination microscopy (SIM). In particular, the technology disclosed relates to capturing and processing, in real time, numerous image tiles across a large image plane, dividing them into subtiles, efficiently processing the subtiles, and producing enhanced resolution images from the subtiles. The enhanced resolution images can be combined into enhanced images and can be used in subsequent analysis steps.

Increased Calculation Efficiency for Structured Illumination Microscopy

The technology disclosed relates to structured illumination microscopy (SIM). In particular, the technology disclosed relates to capturing and processing, in real time, numerous image tiles across a large image plane, dividing them into subtiles, efficiently processing the subtiles, and producing enhanced resolution images from the subtiles. The enhanced resolution images can be combined into enhanced images and can be used in subsequent analysis steps. The technology disclosed includes logic to reduce computing resources required to produce an enhanced resolution image from structured illumination of a target. A method is described for producing an enhanced resolution image from images of a target captured under structured illumination. This method applies one or more transformations to non-redundant data and then recovers redundant data from the non-redundant data after the transformations.