A setpoint adjustment apparatus for a displacement meter (10) includes a determiner (343) to determine whether a measurement value acquired by an acquirer (341) in measurement of a reference workpiece using an applying setpoint, to be used in measurement of the reference workpiece, is within the range of a desired measurement value (352), and a changer (345) to change the applying setpoint. When the measurement value is within the range of the desired measurement value (352), the applying setpoint used in acquisition of the measurement value is employed as an applying setpoint for inspection of a measurement target (1). When the measurement value is out of this range, the applying setpoint used in acquisition of the measurement value is changed to a different applying setpoint, and whether the measurement value from the reference workpiece using this applying setpoint is within the range of the desired measurement value (352) is determined.

A state estimation apparatus includes: a current information acquisition part that acquires information about a current at a power supply part of a refrigerating/freezing apparatus; a current information storage part that holds current information in a normal state of the refrigerating/freezing apparatus; an evaluation part that derives a degree of change based on the acquired current information and the current information in the normal state of the refrigerating/freezing apparatus; a filter cleaning determination part that estimates a clogging state of a filter of the refrigerating/freezing apparatus based on the degree of change to determine whether cleaning of the filter is necessary; and an output part that provides, for a determination result indicating that the cleaning of the filter is necessary, an output to that effect.

A state estimation apparatus includes: a current information acquisition part that acquires information about a current at a power supply part of a refrigerating/freezing apparatus; a current information storage part that holds current information in a normal state of the refrigerating/freezing apparatus; an evaluation part that derives a degree of change based on the acquired current information and the current information in the normal state of the refrigerating/freezing apparatus; a filter cleaning determination part that estimates a clogging state of a filter of the refrigerating/freezing apparatus based on the degree of change to determine whether cleaning of the filter is necessary; and an output part that provides, for a determination result indicating that the cleaning of the filter is necessary, an output to that effect.

An automatic monitoring system for a medical treatment device helps to ensure that an a medical treatment device operated at a treatment location away from a clinic is preformed safely. The monitoring system may verify that an assistant is present during treatment of the patient. Among the features disclosed biometric authentication to verify that a trained assistant is present, a presence detector to ensure the assistant is continuously present during treatment, and warning and recovery processes that allow intermittent lapses in the continuous presence of the assistant. The treatment device also communicates with a remote server or terminal.

An automatic monitoring system for a medical treatment device helps to ensure that an a medical treatment device operated at a treatment location away from a clinic is preformed safely. The monitoring system may verify that an assistant is present during treatment of the patient. Among the features disclosed biometric authentication to verify that a trained assistant is present, a presence detector to ensure the assistant is continuously present during treatment, and warning and recovery processes that allow intermittent lapses in the continuous presence of the assistant. The treatment device also communicates with a remote server or terminal.

According to some embodiments, an available algorithm data store may contain information about a pool of available algorithms. An algorithm selection platform coupled to the available algorithm data store may access the information about the pool of available algorithms and compare the information about each of the pool of available algorithms with at least one requirement associated with the current algorithm executing in the real environment. The algorithm selection platform may then automatically determine algorithm execution context information and, based on said comparison and the algorithm execution context information, select at least one of the pool of available algorithms as a potential replacement algorithm. An indication of the selected at least one potential replacement algorithm may then be transmitted (e.g., to be evaluated in a shadow environment by an algorithm evaluation platform).

According to some embodiments, an available algorithm data store may contain information about a pool of available algorithms. An algorithm selection platform coupled to the available algorithm data store may access the information about the pool of available algorithms and compare the information about each of the pool of available algorithms with at least one requirement associated with the current algorithm executing in the real environment. The algorithm selection platform may then automatically determine algorithm execution context information and, based on said comparison and the algorithm execution context information, select at least one of the pool of available algorithms as a potential replacement algorithm. An indication of the selected at least one potential replacement algorithm may then be transmitted (e.g., to be evaluated in a shadow environment by an algorithm evaluation platform).

Example implementations include a method of pre-bootup fault monitor of a LASER diode driver output, by applying a first power to a pre-bootup fault monitor device, setting a fault condition at the pre-bootup fault monitor device to a no-fault state, initiating the pre-bootup fault monitor device, determining whether a first impedance of driver output satisfies an impedance threshold, and in response to a determination that the first impedance satisfies the impedance threshold, applying a second power to the output device. Example implementations also include a system with a LASER output device, and a pre-bootup fault monitor device operatively coupled to the LASER output device, and operable to activate in response to receiving a first power, set a fault condition to a no-fault state, determine whether a first impedance of the output driver satisfies an impedance threshold, and, in response to a determination that the first impedance satisfies the impedance threshold, apply a second power to the LASER output device, and a power-on reset controller operatively coupled to the pre-bootup fault monitor and operable to, in response to the determination that the first impedance satisfies the impedance threshold, deactivate the pre-bootup fault monitor.

Example implementations include a method of pre-bootup fault monitor of a LASER diode driver output, by applying a first power to a pre-bootup fault monitor device, setting a fault condition at the pre-bootup fault monitor device to a no-fault state, initiating the pre-bootup fault monitor device, determining whether a first impedance of driver output satisfies an impedance threshold, and in response to a determination that the first impedance satisfies the impedance threshold, applying a second power to the output device. Example implementations also include a system with a LASER output device, and a pre-bootup fault monitor device operatively coupled to the LASER output device, and operable to activate in response to receiving a first power, set a fault condition to a no-fault state, determine whether a first impedance of the output driver satisfies an impedance threshold, and, in response to a determination that the first impedance satisfies the impedance threshold, apply a second power to the LASER output device, and a power-on reset controller operatively coupled to the pre-bootup fault monitor and operable to, in response to the determination that the first impedance satisfies the impedance threshold, deactivate the pre-bootup fault monitor.

Example implementations include a method of pre-bootup fault monitor of a LASER diode driver output, by applying a first power to a pre-bootup fault monitor device, setting a fault condition at the pre-bootup fault monitor device to a no-fault state, initiating the pre-bootup fault monitor device, determining whether a first impedance of driver output satisfies an impedance threshold, and in response to a determination that the first impedance satisfies the impedance threshold, applying a second power to the output device. Example implementations also include a system with a LASER output device, and a pre-bootup fault monitor device operatively coupled to the LASER output device, and operable to activate in response to receiving a first power, set a fault condition to a no-fault state, determine whether a first impedance of the output driver satisfies an impedance threshold, and, in response to a determination that the first impedance satisfies the impedance threshold, apply a second power to the LASER output device, and a power-on reset controller operatively coupled to the pre-bootup fault monitor and operable to, in response to the determination that the first impedance satisfies the impedance threshold, deactivate the pre-bootup fault monitor.