A recording medium includes simulation data input into a computing device executing a simulation of a semiconductor device, wherein the simulation data includes part shape information describing a shape of a part included in a simulation target circuit, model information describing operation and connection information of the simulation target circuit, and symbol information of the part included in the simulation target circuit, and the computing device causes the part shape information, the model information, and the symbol information to correspond to each other to execute the simulation of the semiconductor device.

Circuit designs are emulated to verify the functionality of the circuit design. Emulating the circuit design includes obtaining a circuit design. The circuit design includes clock signals. Each of the clock signals is a data path clock signal. Further, a first clock signal of the clock signals is determined to be faster than a second clock signal of the clock signals. Rising edges and falling edges of the second clock signal are aligned with rising edges of the first clock signal to generate a realigned clock signal based on determining that the first clock signal is faster than the second clock signal. The circuit design is emulated using the realigned clock signal.

Fabrication of an electronic circuit is facilitated by providing a computer tool to enhance design of the electronic circuit to meet a design criteria. The computer tool facilitates obtaining one or more hybrid logical entities, where a hybrid logical entity includes a pull-up circuit and a pull-down circuit formed of transistors with different transistor types for pull-up versus pull-down, and different voltage thresholds for pull-up versus pull-down. Further, the facilitating includes incorporating the hybrid logical entity into the electronic circuit design to produce a revised electronic circuit design. The method further includes initiating manufacture of the electronic circuit pursuant, at least in part, to the revised electronic circuit design.

A circuit and method are provided to monitor a clock for a data processor. The method includes receiving a clock signal and producing a first voltage proportional to a frequency of the clock signal. The first voltage is converted to a digital signal. During an initialization mode, the method ensures the clock signal is at a desired frequency and scales the digital signal using a first configurable ratio to produce a high threshold value. When changing from the initialization mode to an operating mode, the method ceases to scale the digital signal and maintains the high threshold value. During the operating mode, the method compares the digital signal to the high threshold value to determine if the clock signal has been increased in frequency beyond a desired level, and if so, triggers an overclock alert to a system management circuit of the data processor.

Pattern matching using anchors during integrated circuit (IC) verification is disclosed. According to one embodiment, a method includes obtaining match time estimates associated with pattern anchors of different anchor types for an IC pattern, generating revised match time estimates based on a target IC layout, and then selecting the pattern anchor associated with the shortest revised match time estimate. Then, target anchors of the same anchor type as the selected pattern anchor are generated for the target IC layout, and the target IC layout is searched for the IC pattern using the selected pattern anchor and the target anchors.

Methods, apparatus, systems and articles of manufacture are disclosed to simulate metastability for circuit design verification. An example apparatus includes an input handler to receive circuit design data indicative of a circuit design, a circuit modeler to generate a simulation model based on the circuit design data, a simulator to simulate operation of the circuit design based on the simulation model, a metastability injector to insert metastability logic into the simulation model during the simulation, and a metastability controller to control the metastability logic during the simulation.

The present invention discloses a method and system for processing simulation data. The method includes: simultaneously collecting the simulation waveform data of said multiple FPGAs and adding a time stamp to the waveform data of each FPGA collected in each collection period, and storing the waveform data of the multiple FPGAs in the form of a link list according to the time stamp. The technical solution of the present invention can ensure no disorder of the waveform data of multiple FPGAs.

To facilitate crosstalk analysis for an IC design, a plurality of input vectors are input into a gate-level simulation. In response, the gate-level simulation determines timing windows for all nets within the IC design, may perform aggressor pruning, and may then determine and output aggressor/victim pairs and associated features for the IC design. This gate-level simulation may be accelerated utilizing one or more graphics processor units (GPUs). Additionally, the aggressor/victim pairs and associated features for the IC design are then input into a trained machine learning environment, which outputs predicted delta delays for each of the aggressor/victim pairs. In this way, crosstalk analysis may be performed more accurately and efficiently.

A method is provided to increase processor frequency in an integrated circuit (IC). The method includes identifying a gate included in the IC, the gate having a gate threshold voltage and performing a plasma process to form an antenna signal path in signal communication with the gate. The method further comprises adjusting the plasma process or circuit design to increase plasma induced damage (PID) applied to the gate so as to alter the gate threshold voltage.

Embodiments for power generation include defining a power tile within a power distribution network having a grid of power rails, the power tile having logic gates, and applying an initial power grid pattern from a plurality of power grid patterns for the power tile such that initial power grid pattern relates to timing characteristics of the logic gates of the power tile. The power grid patterns each have a different number of connectors connecting one power rail to another power rail in the grid of power rails. A subsequent power grid pattern is selected from the power grid patterns for the power tile such that the subsequent power grid pattern meets a threshold condition for the timing characteristics of the logic gates of the power tile. The timing characteristics for the logic gates are determined based on a voltage drop associated with the subsequent power grid pattern.