A system includes a measurement instrument including a first connector and a control module electrically connected to the first connector. A temperature probe including a shaft having a first end and a second end, a second connector being coupled to the first end, a thermocouple junction formed at a tip and configured to measure a change in temperature of a sample, and the second connector being received by the first connector when the temperature probe is attached to the measurement instrument. A storage module housed within the second connector and configured to store one or more parameters of the temperature probe. The control module being configured to: receive the one or more parameters; determine a temperature measurement based on a change in voltage; determine a first correction based on the one or more parameters; and determine an adjusted temperature measurement based on the temperature measurement and the first correction.

A system includes a measurement instrument including a first connector and a control module electrically connected to the first connector. A temperature probe including a shaft having a first end and a second end, a second connector being coupled to the first end, a thermocouple junction formed at a tip and configured to measure a change in temperature of a sample, and the second connector being received by the first connector when the temperature probe is attached to the measurement instrument. A storage module housed within the second connector and configured to store one or more parameters of the temperature probe. The control module being configured to: receive the one or more parameters; determine a temperature measurement based on a change in voltage; determine a first correction based on the one or more parameters; and determine an adjusted temperature measurement based on the temperature measurement and the first correction.

Apparatus, including a multiplexer, having a first output and multiple first inputs receiving analog input signals and an analog feedback signal and cycling through and selecting the signals for transfer in sequential signal groupings to the first output. The apparatus also includes an amplification circuit, having a second output and a second input connected to the multiplexer first output, that amplifies signals corresponding to the analog input signals with a selected gain so as to generate respective amplified analog signals at the second output. Circuitry selects a characteristic of the respective amplified analog signals from an initial signal grouping, feeds the characteristic back for input to the multiplexer as the analog feedback signal, selects a subsequent characteristic of the respective amplified analog signals from a subsequent signal grouping, and adjusts the amplification circuit gain so that the analog feedback signal and the subsequent characteristic have the same amplitude.

Apparatus, including a multiplexer, having a first output and multiple first inputs receiving analog input signals and an analog feedback signal and cycling through and selecting the signals for transfer in sequential signal groupings to the first output. The apparatus also includes an amplification circuit, having a second output and a second input connected to the multiplexer first output, that amplifies signals corresponding to the analog input signals with a selected gain so as to generate respective amplified analog signals at the second output. Circuitry selects a characteristic of the respective amplified analog signals from an initial signal grouping, feeds the characteristic back for input to the multiplexer as the analog feedback signal, selects a subsequent characteristic of the respective amplified analog signals from a subsequent signal grouping, and adjusts the amplification circuit gain so that the analog feedback signal and the subsequent characteristic have the same amplitude.

A sensor system included in an integrated circuit includes multiple sensor circuits and a control circuit. Using characterization data, a model may be generated that defines a relationship between measurable parameters of the integrated circuit and an operating characteristic of the integrated circuit. The control circuit can combine, using a function included in the model, data from the multiple sensor circuits to determine a value of the operating characteristic that is more accurate than a sensor circuit configured to measure a single parameter of the integrated circuit that varies with the operating characteristic.

A sensor system included in an integrated circuit includes multiple sensor circuits and a control circuit. Using characterization data, a model may be generated that defines a relationship between measurable parameters of the integrated circuit and an operating characteristic of the integrated circuit. The control circuit can combine, using a function included in the model, data from the multiple sensor circuits to determine a value of the operating characteristic that is more accurate than a sensor circuit configured to measure a single parameter of the integrated circuit that varies with the operating characteristic.

A thermistor drive circuit includes a plurality of driving resistors, at least one current correction resistor, a voltage measurement unit and a controller. The driving resistors are selectively connected to a thermistor for correcting a temperature characteristic of the thermistor whose resistance value changes in accordance with a temperature to be detected. The current correction resistor is selectively connected between a power supply and a ground. The voltage measurement unit measures a terminal voltage of the thermistor. The controller switches connection states of the driving resistors according to the terminal voltage. When switching the connection states of the driving resistors, the controller also switches a connection state of the current correction resistor to suppress a fluctuation of a power supply current before and after the switching of the connection states of the driving resistors.

A thermistor drive circuit includes a plurality of driving resistors, at least one current correction resistor, a voltage measurement unit and a controller. The driving resistors are selectively connected to a thermistor for correcting a temperature characteristic of the thermistor whose resistance value changes in accordance with a temperature to be detected. The current correction resistor is selectively connected between a power supply and a ground. The voltage measurement unit measures a terminal voltage of the thermistor. The controller switches connection states of the driving resistors according to the terminal voltage. When switching the connection states of the driving resistors, the controller also switches a connection state of the current correction resistor to suppress a fluctuation of a power supply current before and after the switching of the connection states of the driving resistors.

An apparatus is provided which comprises: a thermal sensor comprising one or more n-type devices or p-type devices that suffer from subthreshold factor variation, wherein the thermal sensor is to generate an output digital code representing a temperature; and a calibration circuitry coupled to the thermal sensor, wherein the calibration circuitry is to trim the effects of subthreshold factor variation from the output digital code.

An apparatus is provided which comprises: a thermal sensor comprising one or more n-type devices or p-type devices that suffer from subthreshold factor variation, wherein the thermal sensor is to generate an output digital code representing a temperature; and a calibration circuitry coupled to the thermal sensor, wherein the calibration circuitry is to trim the effects of subthreshold factor variation from the output digital code.