Examples disclosed herein illustrate systems and methods to determine and evaluate the quality of mechanical splices of optical fibers using insertion loss estimation. In at least some of the disclosed systems and methods, an optical fiber termination system may include a reference fiber coupling a light source and a stub fiber of a fiber optic connector, a digital camera sensor and lens to capture images of scattered light emanating from a portion of the fiber optic connector and a portion of the reference fiber both in a field of view (FOV) of the digital camera sensor, and a processor. The processor may analyze digital images of scatter light emitted from at least a portion of the fiber optic connector and the reference fiber to estimate insertion loss at the fiber optic connector.

Embodiments described herein relate to apparatus for measuring and characterizing performance of augmented and virtual reality waveguide structures utilizing glass substrates. The waveguide performance measuring systems generally include a light source configured to direct light towards an incoupling grating area on waveguide and one or more light detectors configured to collect light from an outcoupling grating area on a second side of the waveguide. The light source and one or more light detectors are disposed on one or more adjustable stages positioned about the waveguide. In certain embodiments, the one or more adjustable stages are configured to move in a linear fashion or revolve and/or rotate around the waveguide in an orbital motion.

The disclosure provides a method of forming an erasable optical coupler in a photonic device comprising a conventional optical waveguide formed in a crystalline wafer. The method comprises selectively implanting ions in a localized region of the wafer material adjacent to the conventional waveguide of the photonic device, to cause modification of the crystal lattice structure of, and a change in refractive index in, the ion implanted region of the wafer material to thereby form an ion implanted waveguide optically coupled to the adjacent conventional waveguide to couple light out therefrom, or in thereto. The crystalline wafer material and ion implanted waveguide are such that the crystal lattice structure or composition can be modified to adjust or remove the optical coupling with the conventional waveguide by further modification of the refractive index in the ion implanted region.

Brightness profile data are extracted based on side view image data of an optical fiber, machine learning is performed by using teacher data indicating a correspondence relationship between brightness profile in a radial direction of the optical fiber and a type of the optical fiber, the teacher data being created based on the brightness profile data, a classification model is created to be able to determine the type of the optical fiber for an arbitrary optical fiber based on the brightness profile data indicating brightness profile in the radial direction of the arbitrary optical fiber, and the type of the optical fiber is determined for each of a pair of optical fibers by using the classification model based on the brightness profile data that is extracted based on side view image data of the pair of optical fibers as a target. The pair of optical fibers are fusion-spliced based on a fusion condition that is set in accordance with a combination of respective determined types of the optical fibers.

A system for measuring an absorption coefficient of a doped optical fiber may include: a laser source configured to transmit laser light at a selectable wavelength; a single-mode optical fiber including an end configured to splice to the doped optical fiber; two or more multimode fibers at a side of the doped optical fiber, spaced apart along the side of the doped optical fiber, configured to collect spontaneous emissions from the side of the doped optical fiber; and/or a photodiode or power meter connected to the two or more multimode fibers. A method for measuring an absorption coefficient of a doped optical fiber may include: collecting, from a side of the doped optical fiber, an emission spectrum using two or more multimode fibers; and/or calculating the absorption coefficient form using the emission spectrum and McCumber theory.

An integrating sphere-equipped optical measurement device and optical connector polarity and type identification and loss measurement are provided. The optical measurement device receives one or more optical signals that respectively emanate from one or more optical fibers of a plurality of optical fibers of an optical fiber cable. The optical measurement device determines one or more respective positions where the one or more optical signals impinged on a sensor. The optical measurement device determines based on the one or more positions, one or more receiving positions of the one or more optical signals, respectively. The optical measurement device determines a polarity of the optical fiber cable based on both the one or more receiving positions and one or more or transmitting positions of the one or more optical signals, respectively.

Examples disclosed herein illustrate systems and methods to determine and evaluate the quality of mechanical splices of optical fibers using insertion loss estimation. In at least some of the disclosed systems and methods, an optical fiber termination system may include a reference fiber coupling a light source and a stub fiber of a fiber optic connector, a digital camera sensor and lens to capture images of scattered light emanating from a portion of the fiber optic connector and a portion of the reference fiber both in a field of view (FOV) of the digital camera sensor, and a processor. The processor may analyze digital images of scatter light emitted from at least a portion of the fiber optic connector and the reference fiber to estimate insertion loss at the fiber optic connector.

A method for determining the refractive index profile of a preform is provided. The method involves: preparing the measured deflection angle distribution, including an extreme value determination of the deflection angle distribution, to obtain a prepared deflection angle distribution; transforming the prepared deflection angle distribution into a prepared refractive-index profile; evaluating the prepared refractive-index profile for the fixation of orientation values for the layer radius and for the layer refractive index of a hypothetical refractive index profile; generating a simulated deflection angle distribution on the basis of the hypothetical refractive-index profile with the orientation values, and transforming the deflection angle distribution into a simulated refractive-index profile; fitting the simulated refractive index profile to the prepared refractive-index profile by iterative adaptation of parameters to obtain a fitted, simulated refractive-index profile which is defined by adapted parameters, and obtaining the refractive index profile as the hypothetical refractive-index profile with the adapted parameters.

The ability to efficiently and reliably transmit, route and receive data across telecommunication networks is essential for existing and evolving applications where connectivity to these networks is a ubiquitous aspect of society today. However, limitations in existing telecommunication networks impact this through performance, cost, and speed. To address this the inventor has established improvements with respect to routing (switching), processing, and monitoring. For routing low latency switch architectures for improving packet-based data switching are described. For processing digital optical logic devices and digital optical processing structures for enhanced functionality and processing within optical telecommunication networks are described. For monitoring improved optical connectors which provide embedded monitoring and analytical functionality for improved management of optical telecommunication networks are described.

A method of optical device metrology is provided. The method includes introducing a first type of light into a first optical device during a first time period, the first optical device including an optical substrate and an optical film disposed on the optical substrate, the first optical device further including a first surface, a second surface, and one or more sides connecting the first surface with the second surface; and measuring, during the first time period, a quantity of the first type of light transmitted from a plurality of locations on the first surface or the second surface during the first time period, wherein the measuring is performed by a detector coupled to one or more fiber heads positioned to collect the light transmitted from the plurality of locations.