G01N21/8422

Method to determine properties of a coating on a transparent film, method for manufacturing a capacitor film and device to determine properties of a coating on a transparent film

A method for determining properties of a coating on a transparent film, a method for manufacturing a capacitor film and a device configured to determine properties of a coating on a transparent film are disclosed. In an embodiment a method includes moving the transparent film with the coating on a path which passes between a light source and a sensor, illuminating, by the light source, the coating on the transparent film, detecting, by the sensor, an intensity of transmitted light from the light source and calculating, by a processor, the properties of the coating on the transparent film based on the detected intensity of transmitted light.

Method and system for analyzing 2D material thin film

A method for analyzing 2D material thin film and a system for analyzing 2D material thin film are disclosed. The detection method includes the following steps: capturing sample images of 2D material thin films; measuring the 2D material thin films by a Raman spectrometer; performing a visible light hyperspectral algorithm on the sample images by a processor to generate a plurality of visible light hyperspectral images; performing a training and validation procedure, performing an image feature algorithm on the visible light hyperspectral images, and establishing a thin film prediction model based on a validation; and capturing a thin-film image to be measured by the optical microscope, performing the visible light hyperspectral algorithm, and then generating a distribution result of the thin-film image to be measured according to an analysis of the thin film prediction model.

Spectroscopic ellipsometry system for thin film imaging

A spectroscopic ellipsometry system and method for thin film measurement with high spatial resolution. The system includes a rotating compensator so that spectroscopic ellipsometric and imaging ellipsometric data are collected simultaneously with the same measurement beam. Collecting both ellipsometric data sets simultaneously increases the information content for analysis and affords a substantial increase in measurement performance.

Method and System for Determining a Level of a Sanding Surface Preparation of a Carbon Fiber Composite Surface Prior to a Post-Processing Operation
20230211460 · 2023-07-06 · ·

There is provided a quantitative method for determining a level of a sanding surface preparation of a carbon fiber composite surface, prior to the carbon fiber composite surface undergoing a post-processing operation. The quantitative method includes fabricating a ladder panel of levels of sanding correlating to an amount of sanding of sanding surface preparation standards for a reference carbon fiber composite surface of reference carbon fiber composite structure(s); using surface analysis tools to create target values for quantifying the levels of sanding; measuring, with the surface analysis tools, sanding surface preparation location(s) on the carbon fiber composite surface of a test carbon fiber composite structure, to obtain test result measurement(s); comparing the test result measurement(s) to the levels, to obtain test result level(s); determining if the test result level(s) meet the target values; and determining whether the carbon fiber composite surface is acceptable to proceed with the post-processing operation.

METHOD FOR OPTICAL MONITORING AND/OR DETERMINATION OF PROPERTIES OF SAMPLE

In the method for optical monitoring and/or determination of properties on samples, monochromatic electromagnetic radiation with a predetermined wavelength is sequentially directed from several radiation sources onto a sample influenced by an electronic evaluation unit. The respective intensity specific to the wavelength of the electromagnetic radiation scattered and/or reflected by the sample is detected by at least one detector and fed to the electronic evaluation unit for spectrally resolved evaluation in order to use it to monitor and/or determine properties of the respective sample.

Inspection Device and Coating Apparatus Equipped With the Same
20230003666 · 2023-01-05 ·

An inspection device for inspecting a state of a coating agent applied to a target surface having a protruding portion includes: an image capture device configured to capture an image of a predetermined inspection target region of the target surface; and an illumination device configured to emit light possible to be captured by the image capture device, toward the inspection target region, wherein the illumination device includes: a first light source configured to emit diffuse light toward an entirety of the inspection target region; and a second light source configured to emit direct light toward a shadow that is cast by the protruding portion due to emission of the diffuse light by the first light source.

TOMOGRAPHIC IMAGING SYSTEM FOR TRANSPARENT MATERIAL COMPOSITE THIN FILM

A tomographic imaging system includes a light source, a light irradiation unit that irradiates light to a transparent material composite thin film sample and a reference mirror and acquires an interference signal between light reflected and scattered from the sample and light reflected from the reference mirror, a light measuring unit that measures the interference signal acquired by the light irradiation unit, a light transmission unit that transmits the light output from the light source to the light irradiation unit and transmits the interference signal of the light transmitted from the light irradiation unit to the light measuring unit; and a signal processing apparatus that converts the interference signal of the sample, outputs the converted interference signal as a tomographic image, and monitors the interference signal acquired by the light irradiation unit to modulate intensity and a polarization state of the light input to the light irradiation unit.

NON-DESTRUCTIVE GLASS PRIMING VERIFICATION METHOD FOR INSTALLED GLASS

A method of installing a glass panel on a vehicle that includes an opaque coating formed about a perimeter of the glass panel that includes a plurality of voids where the opaque coating is absent. The method includes determining whether a primer has been applied to the opaque coating by inspecting the glass panel to determine whether at least some of the plurality of voids have been covered by the primer. After determining whether a primer has been applied to the opaque coating, it is determined whether the primer has been correctly applied to the opaque coating by inspecting the glass panel to determine whether each of the plurality of voids has been covered by the primer. Then, after determining whether the primer has been correctly applied, an adhesive may be applied to the primer and the glass panel may be installed on the vehicle.

Method for inspection of a target object, control system and inspection system

A method for inspection of a target object, the method including irradiating a reference surface having a non-flat reference profile with radiation; determining reference response data based on detected radiation having interacted with the reference surface; irradiating a target object with radiation, the target object including a target surface having a non-flat target profile corresponding to the reference profile; determining inspection response data based on detected radiation having interacted with the target object; and determining at least one parameter of the target object based on the reference response data and the inspection response data. An alternative method; a control system for controlling an emitter system and a detector system; and an inspection system including a control system, an emitter system and a detector system, are also provided.

Optical monitor

A coating system may include a coating chamber; a substrate holder to move a substrate along a motion path; and a sensor device in the coating chamber, wherein the sensor device is configured to move along the motion path, and wherein the sensor device is to perform a spectral measurement on the substrate.