The disclosure provides a calibration assembly for a scan device. The calibration assembly includes a plurality of light-permeable plates and a reflection plate. The light-permeable plates are different in size, and the light-permeable plates are arranged along thicknesses directions thereof to form a step shape. The light-permeable plates define a plurality of light-permeable areas that respectively have different numbers of layers of the light-permeable plates inversely proportional to transmittances of the light-permeable areas. The light-permeable areas are configured to be permeable to a light having a predetermined frequency. The reflection plate is disposed at a side of one of the light-permeable plates in the thickness direction thereof. The reflection plate has a plurality of first holes having different sizes, and the reflection plate is configured to block the light having the predetermined frequency. The disclosure also provides a calibration system having the calibration assembly.

The present disclosure provides systems and methods for calibration. In one example, the method may comprise optical image analysis for calibration. The method may comprise generating an optical projection of one or more calibration features onto a material surface provided in a material fabrication or processing machine, and determining one or more spatial characteristics of the calibration features. The one or more spatial characteristics may comprise a distance, a position, an orientation, an alignment, a size, or a shape of one or more calibration features. The one or more spatial characteristics may be used to adjust at least one of (i) a position or an orientation of an imaging unit relative to the material surface and the material fabrication or processing machine, (ii) an angle or an inclination of the material surface relative to the imaging unit, and (iii) one or more imaging parameters of the imaging unit.

Implementations disclosed describe an optical inspection device comprising a source of light to direct a light beam to a location on a surface of a wafer, the wafer being transported from a processing chamber, wherein the light beam is to generate, a reflected light, an optical sensor to collect a first data representative of a direction of the first reflected light, collect a second data representative of a plurality of values characterizing intensity of the reflected light at a corresponding one of a plurality of wavelengths, and a processing device, in communication with the optical sensor, to determine, using the first data, a position of the surface of the wafer; retrieve calibration data, and determine, using the position of the surface of the wafer, the second data, and the calibration data, a characteristic representative of a quality of the wafer.

A method of measuring optical properties of a specimen, for example, a uniaxial specimen, includes generating a plurality of illumination patterns incident on the specimen and, for each of the plurality of illumination patterns, collecting sample light passing through the specimen and detecting the collected sample light using a polarization state analyzer to form a set of polarization channels. The method also includes receiving a calibration tensor, converting the set of polarization channels for each of the illumination patterns into Stokes parameter maps using the calibration tensor, and deconvolving the Stokes parameter maps to provide volumetric measurement of permittivity tensor of the specimen, specifically, absorption, optical path length, optical anisotropy, and 3D orientation of the specimen.

Methods and assemblies may be used for determining and using standardized spectral responses for calibration of spectroscopic analyzers. The methods and assemblies may be used to calibrate or recalibrate a spectroscopic analyzer when the spectroscopic analyzer changes from a first state to a second state, the second state being defined as a period of time after a change to the spectroscopic analyzer causing a need to calibrate or recalibrate the spectroscopic analyzer. The calibration or recalibration may result in the spectroscopic analyzer outputting a standardized spectrum, such that the spectroscopic analyzer outputs a corrected material spectrum for an analyzed material, and defining the standardized spectrum. The corrected material spectrum may include signals indicative of material properties of an analyzed material, the material properties of the material being substantially consistent with material properties of the material output by the spectroscopic analyzer in the first state.

Provided herein is an air monitoring system with a venturi pump including an air supply passageway, a sample passageway, and a discharge passageway, the discharge passageway in fluid communication with the air supply passageway and the sample passageway, and a detection device including a biochip, a light emitting source, a photodetector, and a controller electronically coupled to the photodetector. Also provided herein is a photonic biogel and uses thereof for spectroscopic detection of airborne pathogens.

A system includes a light source, a first lens, a second lens, a third lens, a beam splitter, a first image collection device, and a second image collection device. The first lens is configured to collimate a light beam and to direct the collimated light beam through a test sample. The beam splitter is configured to split the light beam from the test sample and to transmit a first portion of the light beam toward the second lens and reflect a second portion of the light beam toward the third lens. The first image collection device is positioned adjacent to a first obstruction and configured to record an obstructed first image formed by the first portion of the light beam. The second image collection device is positioned adjacent to a second obstruction and configured to record an obstructed second image formed by the second portion of the light beam.

A luminometer (400) includes a light detector (630) configured to sense photons (135). The luminometer (400) includes an analog circuit (915a) configured to provide an analog signal (965) based on the photons (135) emitted from assay reactions over a time period and a counter circuit (915b) configured to provide a photon count (970) based on the photons (135) emitted from the assay reactions over the time period. The luminometer (400) includes a luminometer controller (905) configured to, in response to an analog signal value of the analog signal (965) being greater than a predetermined value, determine and report a measurement value of the photons (135) emitted from the assay reactions over the time period based on the analog signal value of the analog signal (965) and a linear function (1010). Optionally, the linear function (1010) is derived from a relationship between the analog signal (965) and the photon count (970).

Disclosed herein are a communication system, a monitoring system for in-situ monitoring of a substance used in a gas scrubbing process, and related methods. The monitoring system can be used to monitor the at least one substance and provide treatment data for treating the at least one substance. The communication system includes a cloud server, a first server, a second server, and a third server. The first and second servers respectively include first and second communication interfaces configured to provide spectral information to the cloud server.

The cloud server is configured to generate a calibration model including at least one parameter; apply the calibration model to the spectral information provided by the second server, whereby at least one value for the at least one parameter is extracted; and provide the at least one value for the at least one parameter to the first server via the first communication interface.

An optical measurement device includes an irradiation optical system, a detection optical system, and a cancel circuit. In a fluorescence detection process, a sample is designated as an irradiation target, the sample is irradiated with irradiation light, measurement target light including fluorescence generated from the sample irradiated with the irradiation light and light scattered from the sample irradiated with the irradiation light is detected as detection light, a signal component corresponding to the scattered light is removed from a measurement signal corresponding to the measurement target light in consideration of a result of performing a calibration process during a preliminary process. In the preliminary process, the calibration process for removing a signal component corresponding to the scattered light from the measurement signal is performed on the basis of a calibration signal having a higher signal intensity than a signal corresponding to the scattered light in the measurement signal.