The present invention relates to calibration in X-ray phase contrast imaging. In order to remove the disturbance due to individual gain factors, a calibration filter grating (10) for a slit-scanning X-ray phase contrast imaging arrangement is provided that comprises a first plurality of filter segments (11) comprising a filter material (12) and a second plurality of opening segments (13). The filter segments and the opening segments are arranged alternating as a filter pattern (15). The filter material is made from a material with structural elements (14) comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X-ray source grating (54) and an analyzer grating (60) of an interferometer unit in a slit-scanning system of a phase contrast imaging arrangement. The slit-scanning system is provided with a pre-collimator (55) comprising a plurality of bars (57) and slits (59). The filter pattern is aligned with the pre-collimator pattern (61).

Described is a computer-implemented method for measuring an object comprising the following steps: determining measurement data by means of a device for measuring the object, wherein the measurement data generates a digital representation of the object with a plurality of image data of the object; and carrying out the following steps at least before the step of determining measurement data has ended: analyzing at least one dimensional measurement variable of at least one part of the digital representation of the object, determining at least one conformity result relating to the analyzed part of the digital representation of the object, wherein the conformity result indicates to what extent the analyzed at least one dimensional measurement variable fulfils at least one predefined conformity criterion for the object, and adapting the step of determining measurement data taking the at least one conformity result into account.

This disclosure presents systems and processes to collect elemental composition of target fluid and solid material located downhole of a borehole. Waveguides can be utilized that include capillary optics to deliver emitted high energy into a container or a conduit and then to detect the high energy. A source waveguide can be used to emit the high energy into the target fluid and a detector waveguide can collect resulting measurements. Each waveguide can include a protective sheath and a pressure cap on the end of the capillary optics that are proximate the target fluid, to protect against abrasion and target fluid pressure. In other aspects, a pulsed neutron tool can be utilized in place of the waveguides to collect measurements. The collected measurements can be utilized to generate chemical signature results that can be utilized to determine the elemental composition of the target fluid or of the solid material.

A method of determining the spatial orientation of a two-dimensional detector in an X-ray diffractometry system, and calibrating the detector position in response thereto, uses diffraction patterns from a powder sample collected at a plurality of detector swing angles. The overlapping of the detected patterns indicates relative errors in the detector orientation. In particular, intersection points between the different diffraction patterns may be located, and their relative locations may be used to identify errors. Such errors may be in the detector position, or they may be errors in different rotational directions, such as roll, pitch or yaw. Determination and correction of the detector orientation using this method may be part of a calibration routine for the diffractometry system. Roll error may also be determined using a single measurement with the detector at a swing angle perpendicular to the X-ray beam.

A method of making a gauge for verifying or calibrating an x-ray computed tomography device positions a first plurality of objects on a first substrate, and a second plurality of objects on a second substrate. The method also certifies the positions of both the first plurality of objects on the first substrate, and the second plurality of objects on the second substrate. After certifying both the first and second plurality of objects, the method couples the first substrate with the second substrate.

A method for X-ray measurement includes, in a calibration phase, scanning a first X-ray beam, having a first beam profile, across a feature of interest on a calibration sample and measuring first X-ray fluorescence (XRF) emitted from the feature and from background areas of the calibration sample surrounding the feature. Responsively to the first XRF and the first beam profile, a relative emission factor is computed. In a test phase, a second X-ray beam, having a second beam profile, different from the first beam profile, is directed to impinge on the feature of interest on a test sample and second XRF emitted from the test sample is measured in response to the second X-ray beam. A property of the feature of interest on the test sample is computed by applying the relative emission factor together with the second beam profile to the measured second XRF.

Described is a computer-implemented method for monitoring the status of a device for investigating objects, wherein the investigation of an object involves determining measurement data by measuring the object and operating data of the device is determined during the investigation of the object. The method includes: determining measurement data of the object by means of the device; determining operating data of the device during the determining measurement data of the object; determining at least one quality parameter from the measurement data; analysing the operating data and the at least one quality parameter; and determining a status characteristic value based on the analysing in order to monitor the status of the device, wherein the status characteristic value indicates a status of the device. The computer-implemented method comparatively easily monitors the functionality of devices for investigating objects during adaptive measurements.

Provided are operation guide system for X-ray analysis to enable users to easily understand measurement of X-ray optical system to be selected. The operation guide system includes: measurement information acquisition unit for acquiring information on a sample and each X-ray measurement optical system part; sample magnification acquisition unit for acquiring magnification for display; incident X-ray shape deformation unit for determining distorted shape of an incident X-ray obtained by magnifying shape of the incident X-ray based on the magnification in a plane perpendicular to an optical axis direction; scattered X-ray shape deformation unit for determining distorted shape of a scattered X-ray obtained by magnifying shape of the scattered X-ray based on the magnification in the plane; and X-ray measurement optical system modeling unit for modeling a deformed shape of the sample, the distorted shape of the incident X-ray, and the distorted shape of the scattered X-ray.

A three-dimensional (3D) x-ray tomographic imaging system includes an x-ray source fixedly attached to a first unmanned vehicle, which can be aerial or otherwise configured for locomotion, and an x-ray detector. A vehicle controller is configured to be operated by an operator, and an optical camera is mounted to the first unmanned vehicle at a fixed position relative to the x-ray source, and an optical pattern is fixed at a position relative to the x-ray detector. The x-ray source and x-ray detector are configured to be positioned on substantially opposite sides of the object, while the x-ray source is rotated radially around the object to one or more imaging positions.

The subject of the invention comprises of a method of mapping of distribution of reference physical parameters used in tests applying electromagnetic waves, in particular in planar or spatial tests of objects imagined using a computer tomograph, wherein the entire reference (1) or its fragments of components used in its design and forming determinants of its physical parameters are imaged by high-resolution scanning, that is, at least twice, preferably five times higher than the resolution in which the reference will be used in future studies and a collection of layered images of a reference or its fragment or component is obtained, on the basis of which, by reading information out of the image of the particular cross-section, material distribution and/or absorption coefficient distribution is determined directly, with the information about the absorption coefficient, together with coordinates for every voxel, which form so called spatial distribution of the absorption coefficient for the particular reference element are stored in a three-dimensional matrix, in electronic memory, with said information being used to calculate the correction coefficient, which defines for every voxel the deviation of parameters of the particular part of element of the reference from the theoretical value resulting from manufacturing assumptions, forming so called map of manufacturing precision, individual for the particular fragment or element of the reference, and then the individual manufacturing precision map for a part of the reference or its elements is written into a common file forming the manufacturing precision definition for the entire reference.