Patent classifications
G01N2223/645
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF PARTS
Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The x-ray backscatter apparatus comprises an x-ray source and an x-ray filter. The x-ray filter comprises a plurality of emission apertures and a detection aperture. The x-ray backscatter apparatus further comprises an x-ray intensity sensor that is fixed to the x-ray filter over the detection aperture such that any portion of an unfiltered x-ray emission filtered into the detection aperture is detected by the x-ray intensity sensor. The x-ray backscatter apparatus additionally comprises an emission alignment adjuster that is operable to adjust a position of the unfiltered x-ray emission relative to the plurality of emission apertures and the detection aperture in response to a position, relative to the detection aperture, of a peak intensity of the unfiltered x-ray emission passing into the detection aperture, detected by the x-ray intensity sensor.
Apparatus, method, computer-readable storage medium for non-destructive inspection of bicycle based on analyzing amount of scale value change
A non-destructive inspection apparatus is provided. The non-destructive inspection apparatus includes at least one memory configured to store commands for performing predetermined operations, and at least one processor operatively coupled to the at least one memory and configured to execute the commands. The at least one processor is configured to obtain information on a transmission amount of an X-ray by emitting the X-ray to a part of a bicycle, generate a gray scale image based on the information on the transmission, measure an amount of change in a gray value from one end to the other end of the part of the bicycle represented in the gray scale image along an extending direction of the part, and detect an area in which the amount of change in the gray value is equal to or greater than a threshold, as an abnormal area.
ELECTRODE TAB ALIGNMENT MECHANISM AND X-RAY INSPECTION APPARATUS COMPRISING SAME FOR INSPECTING CYLINDRICAL SECONDARY BATTERY
An X-ray inspection apparatus for a cylindrical secondary battery according to the present invention comprises: an inspection chamber; a transfer unit for transferring a cylindrical secondary battery into the inspection chamber; an inspection body moving while holding the secondary battery; an X-ray source; an X-ray detector; a discharge unit for discharging the inspected secondary battery outside the inspection chamber;
and an alignment mechanism arranged along a moving path of the inspection body so as to align the cylindrical secondary battery. Further, in the X-ray inspection apparatus for a cylindrical secondary battery according to the present invention, the alignment mechanism comprises: one or more sensing unit for sensing the position of a specific portion of the cylindrical secondary battery; and one or more contact unit operable between a standby position in which the contact unit do not come into contact with the secondary battery and a contact position in which the contact unit can come into contact with the secondary battery.
METHOD OF PRODUCING 3D TOMOSYNTHESIS IMAGES OF A COMPOSITE MATERIAL
To identify and/or assess structural integrity of a composite material comprising fiduciary markers which attenuate x-rays to an extent greater than the rest of the material, a method is provided wherein x-ray 3D tomosynthesis images of the composite material are created using an array of x-ray emitters and a digital x-ray detector wherein the array of x-ray emitters and the digital x-ray detector are maintained in fixed relation to one another and to the composite material, the 3D tomosynthesis images being used to determine the relative location of at least some of the fiduciary markers with respect to one another; a database is provided for storing the relative location of at least some of the fiduciary markers with respect to one another, further x-ray 3D tomosynthesis images of the same, or a different, composite material may be checked against the data in the database to ascertain structural integrity and/or identity of the material.
PROCESS FOR NON-DESTRUCTIVE QUALITY CONTROL INSPECTION OF SELF-PIERCING RIVET (SPR) JOINTS
A system and method for inspecting an assembly including components joined by self-piercing rivets by a computerized tomography (CT) scan of the joint is provided. The system includes a source of x-rays, a mounting unit for an assembly including the joint which is subject to the x-rays, and an x-ray detector disposed opposite the source for detecting the x-rays. The x-rays are provided at a high energy level of at least 200 kV to generate images having a resolution of at least 200 micrometers (μm). A computer stitches the images together to form reconstructive images which show details of the joint. The assembly to be inspected is not destroyed or modified prior to the inspection process. The resolution of the images generated by the x-rays is high enough to determine the presence of cracks, if any, the interlock (S.sub.H), minimum thickness (T.sub.min), and overall structure of the unmodified assembly.
APPARATUS, METHOD, COMPUTER-READABLE STORAGE MEDIUM FOR NON-DESTRUCTIVE INSPECTION OF BICYCLE BASED ON ANALYZING AMOUNT OF SCALE VALUE CHANGE
A non-destructive inspection apparatus is provided. The non-destructive inspection apparatus includes at least one memory configured to store commands for performing predetermined operations, and at least one processor operatively coupled to the at least one memory and configured to execute the commands. The at least one processor is configured to obtain information on a transmission amount of an X-ray by emitting the X-ray to a part of a bicycle, generate a gray scale image based on the information on the transmission, measure an amount of change in a gray value from one end to the other end of the part of the bicycle represented in the gray scale image along an extending direction of the part, and detect an area in which the amount of change in the gray value is equal to or greater than a threshold, as an abnormal area.
METHOD TO USE ARTIFICIAL INTELLIGENCE TO ENHANCE VISUAL INSPECTION OF OXYGEN SENSORS
A system configured to detect defects in a first oxygen sensor is disclosed. The system is configured to detect defects in a first oxygen sensor. The system includes an X-ray imaging device configured to capture a production X-ray image of the first oxygen sensor and an electronic processor configured to use a trained oxygen sensor defect detection model to identify a defect of the first oxygen sensor by producing a pseudo X-ray image by simulating a projection of a fan beam through CT data of a second oxygen sensor. The electronic processor is also configured to measure, via the trained oxygen sensor defect detection model, a fan-beam distortion in the production X-ray image; select, via the trained oxygen sensor defect detection model, the pseudo X-ray image based on the fan-beam distortion; perform a comparison, via the trained oxygen sensor defect detection model, of the production X-ray image to the pseudo X-ray image; and, classify, based on the comparison, the production X-ray image as representing an improperly assembled oxygen sensor.
X-ray inspection device
An X-ray inspection apparatus suppresses anomalies in inspection results caused by the X-ray inspection apparatus being used while an unsuitable setting is in effect. The X-ray inspection apparatus is provided with an inspection unit, a setting unit, a storage unit, an assessment unit, and a notification unit. The inspection unit inspects an irradiated article using detection data obtained by detecting X-rays. The setting unit sets a setting value used in inspection of the article by the inspection unit. The storage unit stores a detection value based on the detection data. The assessment unit assesses, on the basis of the detection value stored in the storage unit, whether or not the setting value set by the setting unit is suitable. When the assessment unit has assessed that the setting value is not suitable, the notification unit issues a notification to indicate that the setting value is not suitable.
ROTATION MECHANISM FOR X-RAY INSPECTION APPARATUS, X-RAY INSPECTION APPARATUS, AND METHOD OF ADJUSTING ROTATION MECHANISM FOR X-RAY INSPECTION APPARATUS
In the rotation mechanism for an X-ray inspection apparatus, a plurality of adjustment members configured to adjust the shape of an outer race of a bearing by deforming the outer race are arranged in a circumferential direction of the bearing. The adjustment members are movable relative to an adjustment member holder in a diameter direction of the bearing and contactable with an outer circumferential surface of the outer race. A gap S configured to allow deformation of the outer race is formed between the outer circumferential surface of the outer race and the adjustment member holder in the diameter direction of the bearing.
INSPECTION DEVICE
In an inspection device having a storage unit and an exposure dose calculation unit, the exposure dose calculation unit executes a first step for calculating the dose when an image is acquired by irradiating radiation from a radiation generator based on the reference dose stored in the storage unit, a second step for calculating the dose when the relative position between the radiation generator and an inspection object is changed, a third step for calculating the total value of the dose irradiated to the inspection object, and a fourth step for outputting the total value.