The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.

A test system implemented method removes intrinsic noise from a waveform representation of a repeating signal under test (SUT). The method includes obtaining an oversampled equivalent-time waveform representation of the repeating SUT. The method further includes obtaining a time-domain representation of a combined noise of the equivalent-time waveform above the deterministic maximum frequency by applying the equivalent-time waveform to a high-pass filter. The method further includes determining a standard deviation of the time-domain representation of the combined noise, and determining a correction factor in accordance with the standard deviation of the digitizer noise, and the standard deviation of the time-domain representation of the combined noise. The method further includes applying the equivalent-time waveform representation to a low-pass filter having a unity magnitude response at frequencies below the cutoff frequency and a correction factor magnitude response at frequencies above the cutoff frequency.

An analog front-end chip and an oscilloscope are provided. The analog front-end chip is integrated with an input buffer module, a variable gain amplification module, and at least two output branches. An input end of the input buffer module is configured as an input end of the analog front-end chip, and an output end of the input buffer module is electrically connected to an input end of the variable gain amplification module. An input end of each of the output branches is electrically connected to an output end of the variable gain amplification module, and an output end of each of the output branches is configured as an output end of the analog front-end chip, wherein each of the output branches includes an output buffer module.

A signal processing method for selectively removing noise from a digital input signal is provided. The method includes the steps of, for example, receiving, by a signal input, a digital input signal of a device under test, determining, by an analysis circuit, a DUT noise contribution to noise of the digital input signal, wherein the DUT noise contribution is associated with noise originating from the device under test, reducing, by the analysis circuit, a noise level of the digital input signal to a noise level of the DUT noise contribution determined, thereby obtaining a noise-reduced output signal, and providing the noise-reduced output signal to a measurement application for further processing. A signal processing system for carrying out the method or others is also provided.

A test and measurement device has a communications port configured to connect the test and measurement device to a network, a memory, and one or more processors configured to execute code to cause the processors to receive an original waveform through the communications port, the original waveform having an identified file type, store the original waveform in the memory, the original waveform having an original file size, compress the original waveform to a compressed waveform having a compressed file size that is smaller than the original file size, notify one or more users that the compressed waveform is available, and upon receiving a request, transmitting the compressed waveform to a user device. A method of providing waveform data across a network includes receiving an original waveform through a communications port, the original waveform having an identified file type, storing the original waveform in a memory, the original waveform having an original file size, compressing the original waveform to a compressed waveform having a compressed file size that is smaller than the original file size, notifying one or more users that the compressed waveform is available, and upon receiving a request, transmit the compressed waveform to a user device.

A test and measurement device has an input port to receive a signal from a device under test (DUT), the signal having a symbol rate, one or more analog-to-digital converters (ADC) to convert the signal to waveform samples at a sampling rate, and one or more processors, when aliasing is present: up-sample a portion of the signal having aliased samples to produce up-sampled samples; use the up-sampled samples to produce a real-time waveform; perform clock recovery on the real-time waveform to produce a recovered clock; and resample the aliased samples to produce a non-aliased waveform.

A test and measurement instrument, such as an oscilloscope, having a Nyquist frequency lower than an analog bandwidth, the test and measurement instrument having an input configured to receive a signal under test having a repeating pattern, a single analog-to-digital converter configured to receive the signal under test and sample the signal under test over a plurality of repeating patterns at a sample rate, and one or more processors configured to determine a frequency of the signal under test and reconstruct the signal under test based on the determined frequency of the signal, the pattern length of the signal under test, and/or the sample rate without a trigger.

Methods, systems, and computer readable media for measuring voltage and current waveforms at devices under test. An example method includes outputting an electrical signal from a signal generator of a measurement instrument; measuring a first voltage at an input to an output resistance of the measurement instrument; measuring a second voltage at an output of the output resistance of the measurement instrument; and determining a test measurement voltage at a device under test (DUT) electrically connected to the measurement instrument using the first voltage, the second voltage, and a propagation delay of a transmission line electrically connecting the measurement instrument to the DUT.

A computing device includes one or more memories including test and measurement knowledge, a generative artificial intelligence (AI) model having access to the one or more memories, a display, user controls to allow the user to provide inputs, and one or more processors configured to execute that code that causes the one or more processors to: access an application programming interface (API) of an AI assistant for the generative AI model to allow the user to interact with the AI assistant, receive one or more user inputs through one or more of the API or a user interface, the user inputs providing a description of one or more waveforms to be generated, use the AI assistant to develop each waveform definition from the description and access the generative AI model, receive one or more waveforms from the AI assistant, and store the one or more waveforms.

A test and measurement instrument includes one or more ports to connect one or more devices under test (DUTs) through a bus to one or more channels of the test and measurement instrument, a user interface to allow a user to provide user inputs to the test and measurement instrument, a display to allow a user to view information about the one or more DUTs, one or more processors configured to execute code that causes the one or more processors to: receive a signal from one DUT of the one or more DUTs and convert the signal to a waveform, receive a user input indicating a bus type, use the bus type to identify parameters for autoset detection, autoset one or more parameter values for the bus, decode the waveform using the parameter values to produce decoded results, and display the decoded results on the user interface.