Patent classifications
G01R13/029
ENTROPY ON ONE-DIMENSIONAL AND TWO-DIMENSIONAL HISTOGRAMS
A test and measurement device has a port to receive a signal from a device under test (DUT), one or more analog-to-digital converters (ADC) to digitize the signal to create one or more waveforms, a display, and one or more processors configured to execute code that causes the one or more processors to: generate a histogram from the waveform, the histogram having one or more dimensions; and calculate one or more entropy values for each of the one or more dimensions. A method includes receiving a signal from a device under test (DUT) at a test and measurement device, digitizing the signal using one or more analog-to-digital converters (ADC) to produce a waveform, generating a histogram from the waveform, the histogram having one or more dimensions, and calculating one or more entropy values for each of the one or more dimensions,.
Graphic actuation of test and measurement triggers
A system and method are provided for graphically actuating a trigger in a test and measurement device. The method includes displaying a visual representation of signal properties for one or more time-varying signals. A graphical user input is received, in which a portion of the visual representation is designated. The method further includes configuring a trigger of the test and measurement device in response to the graphical user input, by setting a value for a trigger parameter of the trigger. The set value for the trigger parameters varies with and is dependent upon the particular portion of the visual representation that is designated by the graphical user input. The trigger is then employed in connection with subsequent monitoring of signals within the test and measurement device.
Electronic device having multi-touch interface for spectral analysis
A electronic device that is operable to communicate with a spectrum analyzer. In one or more implementations, the electronic device includes a touch-sensitive display, the touch-sensitive display configured to receive one or more inputs, a memory operable to store one or more modules, and a processor communicatively coupled to the touch-sensitive display and to the memory. The processor is operable to execute the one or more modules to cause generation of a graphical representation of frequency-domain characteristics of an input signal at the touch-sensitive display. The processor is also operable to execute the one or more modules to dynamically adjust the graphical representation of the frequency-domain characteristics of the input signal at the touch-sensitive display in response to input received at the touch-sensitive display.
METHOD AND DEVICE FOR ACCESSING DATA ACQUIRED BY DIGITAL OSCILLOSCOPE, AND DIGITAL OSCILLOSCOPE
A method for accessing data acquired by a digital oscilloscope, consists of the following, steps: sampling signals based on a preset sampling frequency and converting into binary data by an ADC, continuously storing the data into a buffer based on preset rules: simultaneously, generating one trigger event based on preset timebase parameters and trigger conditions each time when acquired data meets the, trigger, conditions; reading a data segment from the buffer corresponding to the trigger event, and forming a waveform and then displaying. The procedure of storing, the acquired data into the buffer is independent of the procedure of generating the trigger event or reading the data segment or displaying the waveform. The implementation of the method and device for accessing data acquired by a digital oscilloscope as well as the digital oscilloscope brings the following advantages: seamless acquisition is achieved, the sampling rate is not restricted by timebase parameters, and the memory depth is not restricted by the waveform processing speed as traditional oscilloscope.
METHOD OF ANALYZING A SIGNAL AND SIGNAL ANALYSIS DEVICE
A method of analyzing a signal is described. The method includes: setting a trigger condition to be applied; applying the trigger condition; acquiring at least two acquisitions associated with the input signal, each acquisition including a trigger event that matches the trigger condition set; determining a trigger time for each trigger event; storing a time stamp with each trigger event; and generating a histogram based on the time stamps stored, the histogram providing number of trigger events versus time. Further, a signal analysis device for analyzing a signal is described.
MEASUREMENT SYSTEM THAT STORES PRE- AND POST-QUALIFICATION SIGNAL DATA
A measurement system is provided that performs a qualified store algorithm. When performing the algorithm, the measurement system stores in memory digital data samples acquired during a time window while a qualification signal is valid, a preselected number of digital data samples acquired prior to and adjacent in time to the time window, and a preselected number of digital data samples acquired subsequent to and adjacent in time to the time window.
MEASUREMENT SYSTEM THAT STORES SAMPLES ACQUIRED DURING A TIME WINDOW THAT INCLUDES A TRIGGER EVENT AND DURING A SUBSEQUENT USER-SPECIFIED TIME WINDOW
A measurement system is provided that performs a trigger data acquisition algorithm. When the measurement system performs the trigger event data acquisition algorithm, it causes a preselected number of digital data samples acquired during a first time window that includes a trigger event and during a second time window that is specified by the user and that is subsequent in time to the first time window to be stored in memory. Digital data samples acquired after the end of the first time window and before the beginning of the second time window are not stored in memory. By not storing digital data samples acquired after the end of the first time window and before the beginning of the second time window, the possibility of overwriting samples that surround the trigger event is prevented and the memory is used very efficiently.
Measurement apparatus and method for analyzing a measurement signal
The present invention relates to an enhanced control of a measurement device displaying a signal waveform of a measurement signal. For this purpose, the waveform of the measurement signal is displayed on a touch-screen. The touch-screen receives multi-digit touch gestures comprising at least two touch gestures. The touch gestures of the multi-digit touch gesture are analyzed in order to determine simultaneously an operation and a range of the measurement signal on which the determined operation has to be applied. In this way, the control of the measurement device can be simplified.
Method for selecting waveforms on electronic test equipment
A method for operating a data processing system having a touch enabled display screen that displays a plurality of waveforms to alter the display of one of the waveforms without altering the display of the remaining waveforms is disclosed. The method includes determining a selected waveform in response to a user touching the display screen in a first location thereby defining a touch area that determines the selected waveform. An operation that is to be performed on the selected waveform is then defined by a gesture on the screen. The selected waveform is determined by a touch area that is defined by the user touching the screen. If more than one waveform is defined by the touch area, the possible waveforms are sequentially selected until the correct one is presented to the user in response to the user repeating the touching that defines the touch area.
Method for probe equalization
A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.